Error indication, logging circuits

Industry

CPC
G01R31/318569

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/318569Error indication, logging circuits

Industries

Patents Grantslast 30 patents

Information Patent Grant
Boundary scan test method and storage medium
- Patent number 11,933,845
- Issue date Mar 19, 2024
- SHENZHEN PANGO MICROSYSTEMS CO., LTD.
- Shiyjun Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Using scan chains to read out data from integrated sensors during s...
- Patent number 11,921,160
- Issue date Mar 5, 2024
- Synopsys, Inc.
- Bartosz Grzegorz Gajda
- G01 - MEASURING TESTING
Information Patent Grant
Single-pass diagnosis for multiple chain defects
- Patent number 11,789,077
- Issue date Oct 17, 2023
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING
Information Patent Grant
Signal path monitor
- Patent number 11,561,257
- Issue date Jan 24, 2023
- ALLEGRO MICROSYSTEMS, LLC
- Ezequiel Rubinsztain
- G01 - MEASURING TESTING
Information Patent Grant
Error rate measuring apparatus and data division display method
- Patent number 11,506,711
- Issue date Nov 22, 2022
- Anritsu Corporation
- Hiroyuki Onuma
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System-on-chip for AT-SPEED test of logic circuit and operating met...
- Patent number 11,442,107
- Issue date Sep 13, 2022
- Samsung Electronics Co., Ltd.
- Beom Seok Shin
- G01 - MEASURING TESTING
Information Patent Grant
Optimized scan chain diagnostic pattern generation for reversible s...
- Patent number 11,041,906
- Issue date Jun 22, 2021
- SIEMENS INDUSTRY SOFTWARE INC.
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Grant
System-on-chip for at-speed test of logic circuit and operating met...
- Patent number 10,969,432
- Issue date Apr 6, 2021
- Samsung Electronics Co., Ltd.
- Beom Seok Shin
- G01 - MEASURING TESTING
Information Patent Grant
Built-in device testing of integrated circuits
- Patent number 10,768,230
- Issue date Sep 8, 2020
- International Business Machines Corporation
- Robert M. Casatuta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit fault detection
- Patent number 10,613,926
- Issue date Apr 7, 2020
- NXP B.V.
- Jan-Peter Schat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, device and article to test digital circuits
- Patent number 10,578,672
- Issue date Mar 3, 2020
- STMicroelectronics (Grenoble 2) SAS
- David Jacquet
- G01 - MEASURING TESTING
Information Patent Grant
Method for identifying a fault at a device output and system therefor
- Patent number 10,436,839
- Issue date Oct 8, 2019
- NXP B.V.
- Robert Meyer
- G01 - MEASURING TESTING
Information Patent Grant
Highly accurate defect identification and prioritization of fault l...
- Patent number 10,338,137
- Issue date Jul 2, 2019
- Cadence Design Systems, Inc.
- Sameer Chakravarthy Chillarige
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, electronic device, and self-diagnosis method...
- Patent number 10,317,466
- Issue date Jun 11, 2019
- Renesas Electronics Corporation
- Takuro Nishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Debugging method executed via scan chain for scan test and related...
- Patent number 10,234,503
- Issue date Mar 19, 2019
- Realtek Semiconductor Corp.
- Chun-Yi Kuo
- G01 - MEASURING TESTING
Information Patent Grant
Scan test multiplexing
- Patent number 10,114,075
- Issue date Oct 30, 2018
- Advantest Corporation
- Matthias Werner
- G01 - MEASURING TESTING
Information Patent Grant
Scan test multiplexing
- Patent number 10,101,392
- Issue date Oct 16, 2018
- Advantest Corporation
- Matthias Werner
- G01 - MEASURING TESTING
Information Patent Grant
Generating test sets for diagnosing scan chain failures
- Patent number 9,977,080
- Issue date May 22, 2018
- Mentor Graphics Corporation
- Ruifeng Guo
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for generating reference scan chain test data and te...
- Patent number 9,885,752
- Issue date Feb 6, 2018
- Advantest Corporation
- Markus Seuring
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, electronic device, and self-diagnosis method...
- Patent number 9,797,950
- Issue date Oct 24, 2017
- Renesas Electronics Corporation
- Takuro Nishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Localizing fault flop in circuit by using modified test pattern
- Patent number 9,329,235
- Issue date May 3, 2016
- Synopsys, Inc.
- Parthajit Bhattacharya
- G01 - MEASURING TESTING
Information Patent Grant
Digital integrated circuit testing and characterization system and...
- Patent number 9,188,627
- Issue date Nov 17, 2015
- King Fahd University of Petroleum & Minerals
- Muhammad E. S. Elrabaa
- G01 - MEASURING TESTING
Information Patent Grant
Isolating failing latches using a logic built-in self-test
- Patent number 9,057,766
- Issue date Jun 16, 2015
- International Business Machines Corporation
- Ra'ed M. Al-omari
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for logic device defect tolerant redundancy
- Patent number 9,037,931
- Issue date May 19, 2015
- Advanced Micro Devices, Inc.
- Angel Socarras
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuits capable of generating test mode control signals...
- Patent number 8,972,807
- Issue date Mar 3, 2015
- Texas Instruments Incorporated
- Rajesh Mittal
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain fault diagnosis
- Patent number 8,892,972
- Issue date Nov 18, 2014
- Teseda Corporation
- Rich Ackerman
- G01 - MEASURING TESTING
Information Patent Grant
Profiling-based scan chain diagnosis
- Patent number 8,843,796
- Issue date Sep 23, 2014
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced diagnosis with limited failure cycles
- Patent number 8,595,574
- Issue date Nov 26, 2013
- Mentor Graphics Corporation
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain fault diagnosis
- Patent number 8,560,904
- Issue date Oct 15, 2013
- Teseda Corporation
- Rich Ackerman
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced diagnosis with limited failure cycles
- Patent number 8,438,438
- Issue date May 7, 2013
- Mentor Graphics Corporation
- Yu Huang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MANAGING DATA PROTECTION SETTINGS FOR AN ELECTRONIC CONTROL UNIT
- Publication number 20230368588
- Publication date Nov 16, 2023
- Rivian IP Holdings, LLC
- Jack Austin Doan
- B60 - VEHICLES IN GENERAL
Information Patent Application
METHOD AND APPARATUS OF ANALYZING DATA, AND STORAGE MEDIUM
- Publication number 20230288476
- Publication date Sep 14, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Huan LU
- G01 - MEASURING TESTING
Information Patent Application
BOUNDARY SCAN TEST METHOD AND STORAGE MEDIUM
- Publication number 20230120955
- Publication date Apr 20, 2023
- SHENZHEN PANGO MICROSYSTEMS CO.,LTD.
- Shiyjun ZHAO
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PATH MONITOR
- Publication number 20220196739
- Publication date Jun 23, 2022
- ALLEGRO MICROSYSTEMS, LLC
- Ezequiel Rubinsztain
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-PASS DIAGNOSIS FOR MULTIPLE CHAIN DEFECTS
- Publication number 20220128628
- Publication date Apr 28, 2022
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING
Information Patent Application
ERROR RATE MEASURING APPARATUS AND DATA DIVISION DISPLAY METHOD
- Publication number 20210293883
- Publication date Sep 23, 2021
- Anritsu Corporation
- Hiroyuki ONUMA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM-ON-CHIP FOR AT-SPEED TEST OF LOGIC CIRCUIT AND OPERATING MET...
- Publication number 20210223315
- Publication date Jul 22, 2021
- Samsung Electronics Co., Ltd.
- Beom Seok SHIN
- G01 - MEASURING TESTING
Information Patent Application
Optimized Scan Chain Diagnostic Pattern Generation for Reversible S...
- Publication number 20200333398
- Publication date Oct 22, 2020
- Mentor Graphics Corporation
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, ELECTRONIC DEVICE, AND SELF-DIAGNOSIS METHOD...
- Publication number 20180003771
- Publication date Jan 4, 2018
- Renesas Electronics Corporation
- Takuro NISHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
Localizing Fault Flop in Circuit by Using Modified Test Pattern
- Publication number 20140281777
- Publication date Sep 18, 2014
- Synopsys, Inc.
- Parthajit Bhattacharya
- G01 - MEASURING TESTING
Information Patent Application
SCAN DIAGNOSIS ANALYSIS USING CALLOUT CLUSTERING
- Publication number 20140245066
- Publication date Aug 28, 2014
- Lionel J. Riviere-Cazaux
- G01 - MEASURING TESTING
Information Patent Application
Isolating Failing Latches Using a Logic Built-In Self-Test
- Publication number 20140149814
- Publication date May 29, 2014
- International Business Machines Corporation
- Ra'ed M. Al-omari
- G01 - MEASURING TESTING
Information Patent Application
SCAN CHAIN FAULT DIAGNOSIS
- Publication number 20140115412
- Publication date Apr 24, 2014
- TESEDA CORPORATION
- Rich Ackerman
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUITS CAPABLE OF GENERATING TEST MODE CONTROL SIGNALS...
- Publication number 20130305106
- Publication date Nov 14, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Rajesh Mittal
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED DIAGNOSIS WITH LIMITED FAILURE CYCLES
- Publication number 20130246869
- Publication date Sep 19, 2013
- Mentor Graphics Corporation
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Application
SCAN CHAIN FAULT DIAGNOSIS
- Publication number 20130219237
- Publication date Aug 22, 2013
- TESEDA CORPORATION
- Rich Ackerman
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR LOGIC DEVICE DEFECT TOLERANT REDUNDANCY
- Publication number 20130166974
- Publication date Jun 27, 2013
- Advanced Micro Devices, Inc.
- Angel SOCARRAS
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL INTEGRATED CIRCUIT TESTING AND CHARACTERIZATION SYSTEM AND...
- Publication number 20130116961
- Publication date May 9, 2013
- KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS
- MUHAMMAD E.S. ELRABAA
- G01 - MEASURING TESTING
Information Patent Application
Scan Chain Fault Diagnosis
- Publication number 20130061103
- Publication date Mar 7, 2013
- TESEDA CORPORATION
- Rich Ackerman
- G01 - MEASURING TESTING
Information Patent Application
Profiling-Based Scan Chain Diagnosis
- Publication number 20110307751
- Publication date Dec 15, 2011
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Application
Communication of a diagnostic signal and a functional signal by an...
- Publication number 20110288809
- Publication date Nov 24, 2011
- ARM Limited
- Ashley Miles Stevens
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENHANCED DIAGNOSIS WITH LIMITED FAILURE CYCLES
- Publication number 20110126064
- Publication date May 26, 2011
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Application
TESTABLE INTEGRATED CIRCUIT AND IC TEST METHOD
- Publication number 20100231252
- Publication date Sep 16, 2010
- NXP B.V.
- Sandeepkumar Goel
- G01 - MEASURING TESTING
Information Patent Application
Probeless DC testing of CMOS I/O circuits
- Publication number 20100045329
- Publication date Feb 25, 2010
- Dialog Semiconductor GmbH
- Hans Martin Von Staudt
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR IMPLEMENTING DETERMINIS...
- Publication number 20080189583
- Publication date Aug 7, 2008
- International Business Machines Corporation
- Adrian C. Anderson
- G01 - MEASURING TESTING
Information Patent Application
Communication of a diagnostic signal and a functional signal by an...
- Publication number 20080162071
- Publication date Jul 3, 2008
- Ashley Miles Stevens
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESS FOR IDENTIFYING THE LOCATION OF A BREAK IN A SCAN CHAIN IN...
- Publication number 20080141085
- Publication date Jun 12, 2008
- Inovys Corporation
- Richard C. Dokken
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Device Performance Characterization in Physic...
- Publication number 20080126896
- Publication date May 29, 2008
- Inovys Corporation
- Richard C. Dokken
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Detecting and Correcting Soft-Error Upsets...
- Publication number 20080120525
- Publication date May 22, 2008
- Kanak B. Agarwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT LOCALIZATION BASED ON DEFECTIVE CELL DIAGNOSIS
- Publication number 20080111558
- Publication date May 15, 2008
- Manish Sharma
- G01 - MEASURING TESTING

Error indication, logging circuits

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Boundary scan test method and storage medium

Using scan chains to read out data from integrated sensors during s...

Single-pass diagnosis for multiple chain defects

Signal path monitor

Error rate measuring apparatus and data division display method

System-on-chip for AT-SPEED test of logic circuit and operating met...

Optimized scan chain diagnostic pattern generation for reversible s...

System-on-chip for at-speed test of logic circuit and operating met...

Built-in device testing of integrated circuits

Integrated circuit fault detection

Method, device and article to test digital circuits

Method for identifying a fault at a device output and system therefor

Highly accurate defect identification and prioritization of fault l...

Semiconductor device, electronic device, and self-diagnosis method...

Debugging method executed via scan chain for scan test and related...

Scan test multiplexing

Scan test multiplexing

Generating test sets for diagnosing scan chain failures

Test apparatus for generating reference scan chain test data and te...

Semiconductor device, electronic device, and self-diagnosis method...

Localizing fault flop in circuit by using modified test pattern

Digital integrated circuit testing and characterization system and...

Isolating failing latches using a logic built-in self-test

Methods and systems for logic device defect tolerant redundancy

Integrated circuits capable of generating test mode control signals...

Scan chain fault diagnosis

Profiling-based scan chain diagnosis

Enhanced diagnosis with limited failure cycles

Scan chain fault diagnosis

Enhanced diagnosis with limited failure cycles

Patents Applicationslast 30 patents

MANAGING DATA PROTECTION SETTINGS FOR AN ELECTRONIC CONTROL UNIT

METHOD AND APPARATUS OF ANALYZING DATA, AND STORAGE MEDIUM

BOUNDARY SCAN TEST METHOD AND STORAGE MEDIUM

SIGNAL PATH MONITOR

SINGLE-PASS DIAGNOSIS FOR MULTIPLE CHAIN DEFECTS

ERROR RATE MEASURING APPARATUS AND DATA DIVISION DISPLAY METHOD

SYSTEM-ON-CHIP FOR AT-SPEED TEST OF LOGIC CIRCUIT AND OPERATING MET...

Optimized Scan Chain Diagnostic Pattern Generation for Reversible S...

SEMICONDUCTOR DEVICE, ELECTRONIC DEVICE, AND SELF-DIAGNOSIS METHOD...

Localizing Fault Flop in Circuit by Using Modified Test Pattern

SCAN DIAGNOSIS ANALYSIS USING CALLOUT CLUSTERING

Isolating Failing Latches Using a Logic Built-In Self-Test

SCAN CHAIN FAULT DIAGNOSIS

INTEGRATED CIRCUITS CAPABLE OF GENERATING TEST MODE CONTROL SIGNALS...

ENHANCED DIAGNOSIS WITH LIMITED FAILURE CYCLES

SCAN CHAIN FAULT DIAGNOSIS

METHODS AND SYSTEMS FOR LOGIC DEVICE DEFECT TOLERANT REDUNDANCY

DIGITAL INTEGRATED CIRCUIT TESTING AND CHARACTERIZATION SYSTEM AND...

Scan Chain Fault Diagnosis

Profiling-Based Scan Chain Diagnosis

Communication of a diagnostic signal and a functional signal by an...

ENHANCED DIAGNOSIS WITH LIMITED FAILURE CYCLES

TESTABLE INTEGRATED CIRCUIT AND IC TEST METHOD

Probeless DC testing of CMOS I/O circuits

APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR IMPLEMENTING DETERMINIS...

Communication of a diagnostic signal and a functional signal by an...

PROCESS FOR IDENTIFYING THE LOCATION OF A BREAK IN A SCAN CHAIN IN...

System and Method for Device Performance Characterization in Physic...

Method and Apparatus for Detecting and Correcting Soft-Error Upsets...

DEFECT LOCALIZATION BASED ON DEFECTIVE CELL DIAGNOSIS