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CPC
G01R31/286

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/286External aspects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Electromagnetic wave test device and electromagnetic wave test method
- Patent number 12,241,928
- Issue date Mar 4, 2025
- TDK Corporation
- Shotaro Hamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Work press assembly for test handler
- Patent number 12,241,929
- Issue date Mar 4, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yi-Neng Chang
- G01 - MEASURING TESTING
Information Patent Grant
Test system support component exchange system and method
- Patent number 12,235,315
- Issue date Feb 25, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Paul Ferrari
- G01 - MEASURING TESTING
Information Patent Grant
Probe station capable of maintaining stable and accurate contact to...
- Patent number 12,228,608
- Issue date Feb 18, 2025
- NANYA TECHNOLOGY CORPORATION
- Yi-Kai Chao
- G01 - MEASURING TESTING
Information Patent Grant
Contact pins for test sockets and test sockets comprising the same
- Patent number 12,222,367
- Issue date Feb 11, 2025
- Okins Electronics Co., Ltd.
- Jin Kook Jun
- G01 - MEASURING TESTING
Information Patent Grant
Active thermal interposer device
- Patent number 12,216,154
- Issue date Feb 4, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Test socket for semiconductor integrated circuits
- Patent number 12,210,036
- Issue date Jan 28, 2025
- Smiths Interconnect Americas, Inc.
- Peter Ursu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermal array with gimbal features and enhanced thermal performance
- Patent number 12,210,056
- Issue date Jan 28, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Gregory Cruzan
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer testing system and related method for improving...
- Patent number 12,210,055
- Issue date Jan 28, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Harry-Hak-Lay Chuang
- G11 - INFORMATION STORAGE
Information Patent Grant
Flexible sideband support systems and methods
- Patent number 12,203,978
- Issue date Jan 21, 2025
- Advantest Corporation
- Srdjan Malisic
- G01 - MEASURING TESTING
Information Patent Grant
Multiple circuit board tester
- Patent number 12,188,975
- Issue date Jan 7, 2025
- LAT Enterprises Inc.
- Laura Thiel
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe, probe holder and probe unit
- Patent number 12,188,977
- Issue date Jan 7, 2025
- NHK Spring Co., Ltd.
- Tsuyoshi Inuma
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device testing apparatus and electronic device testing m...
- Patent number 12,180,018
- Issue date Dec 31, 2024
- CHROMA ATE INC.
- Chin-Yi Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for testing a semiconductor package
- Patent number 12,169,219
- Issue date Dec 17, 2024
- TSE CO., LTD.
- Min Cheol Kim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 12,163,999
- Issue date Dec 10, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic test system and automatic test method for integrated-circ...
- Patent number 12,158,494
- Issue date Dec 3, 2024
- Kingston Digital, Inc.
- Chao-Kun Lee
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Test system, test method, and non-transitory computer readable medium
- Patent number 12,146,910
- Issue date Nov 19, 2024
- Kioxia Corporation
- Kazuhiko Nakahara
- G01 - MEASURING TESTING
Information Patent Grant
Semi-automatic prober
- Patent number 12,135,335
- Issue date Nov 5, 2024
- QualiTau, Inc.
- Edward McCloud
- G01 - MEASURING TESTING
Information Patent Grant
Module substrate for semiconductor module, semiconductor module and...
- Patent number 12,130,306
- Issue date Oct 29, 2024
- Samsung Electronics Co., Ltd.
- Kwangkyu Bang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for RF built-in test system for a beamforming...
- Patent number 12,111,350
- Issue date Oct 8, 2024
- Andrew John Bonthron
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device pick-and-place system and electronic device testi...
- Patent number 12,103,789
- Issue date Oct 1, 2024
- CHROMA ATE INC.
- Chien-Ming Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test socket
- Patent number 12,105,138
- Issue date Oct 1, 2024
- Leeno Industrial Inc.
- Young taek Shin
- G01 - MEASURING TESTING
Information Patent Grant
Test device, change kit, and method of exchanging change kit
- Patent number 12,106,997
- Issue date Oct 1, 2024
- Tokyo Electron Limited
- Hiroki Hosaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing devices and method for testing semiconductor devices
- Patent number 12,092,655
- Issue date Sep 17, 2024
- NANYA TECHNOLOGY CORPORATION
- Wu-Der Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Picker device
- Patent number 12,085,608
- Issue date Sep 10, 2024
- Intekplus Co., Ltd.
- Byeong Gwon Joo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Workpiece positioning mechanism and workpiece inspection apparatus
- Patent number 12,078,673
- Issue date Sep 3, 2024
- TAKAOKA TOKO CO., LTD.
- Taichi Aranami
- G01 - MEASURING TESTING
Information Patent Grant
Heat spreaders for use in semiconductor device testing, such as bur...
- Patent number 12,078,672
- Issue date Sep 3, 2024
- Micron Technology, Inc.
- Xiaopeng Qu
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor package test apparatus and method
- Patent number 12,072,370
- Issue date Aug 27, 2024
- Samsung Electronics Co., Ltd.
- Sung Ok Kim
- G01 - MEASURING TESTING
Information Patent Grant
Socket for electrical component
- Patent number 12,066,482
- Issue date Aug 20, 2024
- Enplas Corporation
- Yoshinobu Hagiwara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test socket for performing a test on an electronic device
- Patent number 12,038,473
- Issue date Jul 16, 2024
- Samsung Electronics Co., Ltd.
- Kiljoong Yun
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTIPLE CIRCUIT BOARD TESTER
- Publication number 20250116696
- Publication date Apr 10, 2025
- LAT Enterprises Inc., d/b/a MediPak Energy Systems
- Laura Thiel
- G01 - MEASURING TESTING
Information Patent Application
TEST ENVIRONMENT CONTROL SYSTEM
- Publication number 20250116699
- Publication date Apr 10, 2025
- YISHI Industrial Co.,Ltd
- WEN-HSIN LEE
- G01 - MEASURING TESTING
Information Patent Application
METHODS, SYSTEMS, ARTICLES OF MANUFACTURE, AND APPARATUS FOR IMPROV...
- Publication number 20250110173
- Publication date Apr 3, 2025
- Intel Corporation
- Gregorio R. Murtagian
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE TILE TWO-LAYERED MOTHERBOARD TESTER
- Publication number 20250102564
- Publication date Mar 27, 2025
- Intelligent Memory Limited
- Peter Poechmueller
- G01 - MEASURING TESTING
Information Patent Application
SHELL FOR WAFER LEVEL BURN-IN (WLBI) CHIP TEST, METHOD FOR LOADING...
- Publication number 20250093405
- Publication date Mar 20, 2025
- Microtest S.p.A.
- Giuseppe AMELIO
- G01 - MEASURING TESTING
Information Patent Application
WAFER TEST CASSETTE, WAFER TEST SYSTEM AND WAFER TEST METHOD
- Publication number 20250093406
- Publication date Mar 20, 2025
- XINGR TECHNOLOGIES (ZHEJIANG) LIMITED
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
- Publication number 20250093408
- Publication date Mar 20, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TEST...
- Publication number 20250076366
- Publication date Mar 6, 2025
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TEST...
- Publication number 20250076367
- Publication date Mar 6, 2025
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE, PROBE HOLDER AND PROBE UNIT
- Publication number 20250035699
- Publication date Jan 30, 2025
- NHK Spring Co., Ltd.
- Tsuyoshi Inuma
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20250035698
- Publication date Jan 30, 2025
- JCET STATS ChipPAC Korea Limited
- SeungHyeon JEONG
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS TO DISENGAGE A TEST HEAD FROM AN INTEGRATED C...
- Publication number 20250012853
- Publication date Jan 9, 2025
- Intel Corporation
- David Daniel Wieneke
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE AND SEMICONDUCTOR MANUFACTURING APPARATUS INCLUDING TES...
- Publication number 20250012854
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Jihyun CHOI
- G01 - MEASURING TESTING
Information Patent Application
WLCSP DEVICE ENCLOSURE
- Publication number 20240426900
- Publication date Dec 26, 2024
- Silicon Laboratories Inc.
- Wenshui Zhang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...
- Publication number 20240402217
- Publication date Dec 5, 2024
- Smiths Interconnect Americas, Inc.
- Khaled Elmadbouly
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE ADJUSTING SYSTEM, CONTROLLER, ELECTRONIC DEVICE HANDLIN...
- Publication number 20240402240
- Publication date Dec 5, 2024
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Application
CONTACTOR FOR MULTI DEVICE SOCKETS AND RELATED
- Publication number 20240377454
- Publication date Nov 14, 2024
- SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Raffy CELIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER TEST SYSTEM AND METHODS
- Publication number 20240369620
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jyu-Hua HSIAO
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET AND ASSEMBLY DEVICE THEREOF
- Publication number 20240361352
- Publication date Oct 31, 2024
- okins electronics Co.,Ltd
- Jin Kook JUN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TUNING TEST SYSTEM USING PARALLEL OVEN PIPELINES WITH PARAL...
- Publication number 20240353491
- Publication date Oct 24, 2024
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
WORK PRESS ASSEMBLY FOR TEST HANDLER
- Publication number 20240353477
- Publication date Oct 24, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi-Neng Chang
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING AND/OR OPERATING ELECTRONIC DEVICES
- Publication number 20240329121
- Publication date Oct 3, 2024
- KIUTRA GMBH
- Jan Spallek
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT MANUFACTURING METHOD, MANUFACTURING FILM, AND...
- Publication number 20240312848
- Publication date Sep 19, 2024
- MITSUI CHEMICALS TOHCELLO, INC.
- Eiji Hayashishita
- G01 - MEASURING TESTING
Information Patent Application
PROBE MOUNTING STRUCTURE AND RELIABILITY TEST SYSTEM FOR WAFER-LEVE...
- Publication number 20240310433
- Publication date Sep 19, 2024
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
DEVICE COOLING ENCLOSURE AND ADAPTER FOR HOUSING DEVICES OF DIFFERE...
- Publication number 20240302430
- Publication date Sep 12, 2024
- Advantest Corporation
- Brad EMBERGER
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING DEVICE AND PACKAGE TESTING MACHINE
- Publication number 20240295600
- Publication date Sep 5, 2024
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED ACTUATOR TEST SYSTEM AND METHOD FOR OPERATING THE SAME
- Publication number 20240264223
- Publication date Aug 8, 2024
- PAMTEK Co., Ltd.
- Jae Woong KIM
- G01 - MEASURING TESTING
Information Patent Application
CONTACT INSPECTION DEVICE
- Publication number 20240248117
- Publication date Jul 25, 2024
- SAMSUNG DISPLAY CO., LTD.
- Byungsu KIM
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE CIRCUIT BOARD TESTER
- Publication number 20240241171
- Publication date Jul 18, 2024
- LAT Enterprises Inc., d/b/a MediPak Energy Systems
- Laura Thiel
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROBE STATION CAPABLE OF MAINTAINING STABLE AND ACCURATE CONTACT TO...
- Publication number 20240230754
- Publication date Jul 11, 2024
- NANYA TECHNOLOGY CORPORATION
- Yi-Kai CHAO
- G01 - MEASURING TESTING

External aspects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electromagnetic wave test device and electromagnetic wave test method

Work press assembly for test handler

Test system support component exchange system and method

Probe station capable of maintaining stable and accurate contact to...

Contact pins for test sockets and test sockets comprising the same

Active thermal interposer device

Test socket for semiconductor integrated circuits

Thermal array with gimbal features and enhanced thermal performance

Semiconductor wafer testing system and related method for improving...

Flexible sideband support systems and methods

Multiple circuit board tester

Contact probe, probe holder and probe unit

Electronic device testing apparatus and electronic device testing m...

Apparatus for testing a semiconductor package

Apparatus for testing electronic devices

Automatic test system and automatic test method for integrated-circ...

Test system, test method, and non-transitory computer readable medium

Semi-automatic prober

Module substrate for semiconductor module, semiconductor module and...

Method and apparatus for RF built-in test system for a beamforming...

Electronic device pick-and-place system and electronic device testi...

Test socket

Test device, change kit, and method of exchanging change kit

Testing devices and method for testing semiconductor devices

Picker device

Workpiece positioning mechanism and workpiece inspection apparatus

Heat spreaders for use in semiconductor device testing, such as bur...

Semiconductor package test apparatus and method

Socket for electrical component

Test socket for performing a test on an electronic device

Patents Applicationslast 30 patents

MULTIPLE CIRCUIT BOARD TESTER

TEST ENVIRONMENT CONTROL SYSTEM

METHODS, SYSTEMS, ARTICLES OF MANUFACTURE, AND APPARATUS FOR IMPROV...

MULTIPLE TILE TWO-LAYERED MOTHERBOARD TESTER

SHELL FOR WAFER LEVEL BURN-IN (WLBI) CHIP TEST, METHOD FOR LOADING...

WAFER TEST CASSETTE, WAFER TEST SYSTEM AND WAFER TEST METHOD

ACTIVE THERMAL INTERPOSER DEVICE

SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TEST...

SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TEST...

CONTACT PROBE, PROBE HOLDER AND PROBE UNIT

APPARATUS FOR TESTING ELECTRONIC DEVICES

METHODS AND APPARATUS TO DISENGAGE A TEST HEAD FROM AN INTEGRATED C...

TEST DEVICE AND SEMICONDUCTOR MANUFACTURING APPARATUS INCLUDING TES...

WLCSP DEVICE ENCLOSURE

SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...

TEMPERATURE ADJUSTING SYSTEM, CONTROLLER, ELECTRONIC DEVICE HANDLIN...

CONTACTOR FOR MULTI DEVICE SOCKETS AND RELATED

WAFER TEST SYSTEM AND METHODS

TEST SOCKET AND ASSEMBLY DEVICE THEREOF

OPTICAL TUNING TEST SYSTEM USING PARALLEL OVEN PIPELINES WITH PARAL...

WORK PRESS ASSEMBLY FOR TEST HANDLER

APPARATUS FOR TESTING AND/OR OPERATING ELECTRONIC DEVICES

ELECTRONIC COMPONENT MANUFACTURING METHOD, MANUFACTURING FILM, AND...

PROBE MOUNTING STRUCTURE AND RELIABILITY TEST SYSTEM FOR WAFER-LEVE...

DEVICE COOLING ENCLOSURE AND ADAPTER FOR HOUSING DEVICES OF DIFFERE...

CHIP TESTING DEVICE AND PACKAGE TESTING MACHINE

INTEGRATED ACTUATOR TEST SYSTEM AND METHOD FOR OPERATING THE SAME

CONTACT INSPECTION DEVICE

MULTIPLE CIRCUIT BOARD TESTER

PROBE STATION CAPABLE OF MAINTAINING STABLE AND ACCURATE CONTACT TO...