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CPC
G01R31/286

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/286External aspects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Electronic device testing apparatus and electronic device testing m...
- Patent number 12,180,018
- Issue date Dec 31, 2024
- CHROMA ATE INC.
- Chin-Yi Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for testing a semiconductor package
- Patent number 12,169,219
- Issue date Dec 17, 2024
- TSE CO., LTD.
- Min Cheol Kim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 12,163,999
- Issue date Dec 10, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic test system and automatic test method for integrated-circ...
- Patent number 12,158,494
- Issue date Dec 3, 2024
- Kingston Digital, Inc.
- Chao-Kun Lee
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Test system, test method, and non-transitory computer readable medium
- Patent number 12,146,910
- Issue date Nov 19, 2024
- Kioxia Corporation
- Kazuhiko Nakahara
- G01 - MEASURING TESTING
Information Patent Grant
Semi-automatic prober
- Patent number 12,135,335
- Issue date Nov 5, 2024
- QualiTau, Inc.
- Edward McCloud
- G01 - MEASURING TESTING
Information Patent Grant
Module substrate for semiconductor module, semiconductor module and...
- Patent number 12,130,306
- Issue date Oct 29, 2024
- Samsung Electronics Co., Ltd.
- Kwangkyu Bang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for RF built-in test system for a beamforming...
- Patent number 12,111,350
- Issue date Oct 8, 2024
- Andrew John Bonthron
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device pick-and-place system and electronic device testi...
- Patent number 12,103,789
- Issue date Oct 1, 2024
- CHROMA ATE INC.
- Chien-Ming Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test socket
- Patent number 12,105,138
- Issue date Oct 1, 2024
- Leeno Industrial Inc.
- Young taek Shin
- G01 - MEASURING TESTING
Information Patent Grant
Test device, change kit, and method of exchanging change kit
- Patent number 12,106,997
- Issue date Oct 1, 2024
- Tokyo Electron Limited
- Hiroki Hosaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing devices and method for testing semiconductor devices
- Patent number 12,092,655
- Issue date Sep 17, 2024
- NANYA TECHNOLOGY CORPORATION
- Wu-Der Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Picker device
- Patent number 12,085,608
- Issue date Sep 10, 2024
- Intekplus Co., Ltd.
- Byeong Gwon Joo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Workpiece positioning mechanism and workpiece inspection apparatus
- Patent number 12,078,673
- Issue date Sep 3, 2024
- TAKAOKA TOKO CO., LTD.
- Taichi Aranami
- G01 - MEASURING TESTING
Information Patent Grant
Heat spreaders for use in semiconductor device testing, such as bur...
- Patent number 12,078,672
- Issue date Sep 3, 2024
- Micron Technology, Inc.
- Xiaopeng Qu
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor package test apparatus and method
- Patent number 12,072,370
- Issue date Aug 27, 2024
- Samsung Electronics Co., Ltd.
- Sung Ok Kim
- G01 - MEASURING TESTING
Information Patent Grant
Socket for electrical component
- Patent number 12,066,482
- Issue date Aug 20, 2024
- Enplas Corporation
- Yoshinobu Hagiwara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test socket for performing a test on an electronic device
- Patent number 12,038,473
- Issue date Jul 16, 2024
- Samsung Electronics Co., Ltd.
- Kiljoong Yun
- G01 - MEASURING TESTING
Information Patent Grant
Testing device and method for testing a device under test
- Patent number 12,032,001
- Issue date Jul 9, 2024
- Advanced Semiconductor Engineering, Inc.
- Jia Jin Lin
- G01 - MEASURING TESTING
Information Patent Grant
Chip detection device, chip detection system, and control method
- Patent number 12,032,017
- Issue date Jul 9, 2024
- Shandong Caiju Electronic Technology Co., Ltd.
- Meng Meng
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Electronic component testing apparatus, sockets, and replacement pa...
- Patent number 12,025,654
- Issue date Jul 2, 2024
- Advantest Corporation
- Natsuki Shiota
- G01 - MEASURING TESTING
Information Patent Grant
Thermoelectric device with Seebeck effect
- Patent number 12,025,648
- Issue date Jul 2, 2024
- Hutchinson
- Fabrice Chopard
- G01 - MEASURING TESTING
Information Patent Grant
Test socket having an automated lid
- Patent number 12,007,411
- Issue date Jun 11, 2024
- Teradyne, Inc.
- John P. Toscano
- G01 - MEASURING TESTING
Information Patent Grant
Mechanical arm and mechanical arm assembly, test system and method,...
- Patent number 12,007,433
- Issue date Jun 11, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yu Yu
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Burn-in board seating
- Patent number 12,007,434
- Issue date Jun 11, 2024
- Micro Control Company
- Aidan Michael Fawcett
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in board and burn-in apparatus
- Patent number 11,994,552
- Issue date May 28, 2024
- Advantest Corporation
- Hiroaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for semiconductor package
- Patent number 11,994,554
- Issue date May 28, 2024
- TSE CO., LTD.
- Sol Lee
- G01 - MEASURING TESTING
Information Patent Grant
Inspection jig and board inspection apparatus including the same
- Patent number 11,988,687
- Issue date May 21, 2024
- NIDEC READ CORPORATION
- Kohei Tsumura
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, transfer method, chamber and frame for semiconductor bur...
- Patent number 11,982,706
- Issue date May 14, 2024
- MSV SYSTEMS & SERVICES PTE LTD
- Teck Huat Tan
- G01 - MEASURING TESTING
Information Patent Grant
Spring contact and test socket with same
- Patent number 11,982,688
- Issue date May 14, 2024
- Hicon Co., Ltd.
- Dong Weon Hwang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WLCSP DEVICE ENCLOSURE
- Publication number 20240426900
- Publication date Dec 26, 2024
- Silicon Laboratories Inc.
- Wenshui Zhang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...
- Publication number 20240402217
- Publication date Dec 5, 2024
- Smiths Interconnect Americas, Inc.
- Khaled Elmadbouly
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE ADJUSTING SYSTEM, CONTROLLER, ELECTRONIC DEVICE HANDLIN...
- Publication number 20240402240
- Publication date Dec 5, 2024
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Application
CONTACTOR FOR MULTI DEVICE SOCKETS AND RELATED
- Publication number 20240377454
- Publication date Nov 14, 2024
- SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Raffy CELIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER TEST SYSTEM AND METHODS
- Publication number 20240369620
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jyu-Hua HSIAO
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET AND ASSEMBLY DEVICE THEREOF
- Publication number 20240361352
- Publication date Oct 31, 2024
- okins electronics Co.,Ltd
- Jin Kook JUN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TUNING TEST SYSTEM USING PARALLEL OVEN PIPELINES WITH PARAL...
- Publication number 20240353491
- Publication date Oct 24, 2024
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
WORK PRESS ASSEMBLY FOR TEST HANDLER
- Publication number 20240353477
- Publication date Oct 24, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi-Neng Chang
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING AND/OR OPERATING ELECTRONIC DEVICES
- Publication number 20240329121
- Publication date Oct 3, 2024
- KIUTRA GMBH
- Jan Spallek
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT MANUFACTURING METHOD, MANUFACTURING FILM, AND...
- Publication number 20240312848
- Publication date Sep 19, 2024
- MITSUI CHEMICALS TOHCELLO, INC.
- Eiji Hayashishita
- G01 - MEASURING TESTING
Information Patent Application
PROBE MOUNTING STRUCTURE AND RELIABILITY TEST SYSTEM FOR WAFER-LEVE...
- Publication number 20240310433
- Publication date Sep 19, 2024
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
DEVICE COOLING ENCLOSURE AND ADAPTER FOR HOUSING DEVICES OF DIFFERE...
- Publication number 20240302430
- Publication date Sep 12, 2024
- Advantest Corporation
- Brad EMBERGER
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING DEVICE AND PACKAGE TESTING MACHINE
- Publication number 20240295600
- Publication date Sep 5, 2024
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED ACTUATOR TEST SYSTEM AND METHOD FOR OPERATING THE SAME
- Publication number 20240264223
- Publication date Aug 8, 2024
- PAMTEK Co., Ltd.
- Jae Woong KIM
- G01 - MEASURING TESTING
Information Patent Application
CONTACT INSPECTION DEVICE
- Publication number 20240248117
- Publication date Jul 25, 2024
- SAMSUNG DISPLAY CO., LTD.
- Byungsu KIM
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE CIRCUIT BOARD TESTER
- Publication number 20240241171
- Publication date Jul 18, 2024
- LAT Enterprises Inc., d/b/a MediPak Energy Systems
- Laura Thiel
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROBE STATION CAPABLE OF MAINTAINING STABLE AND ACCURATE CONTACT TO...
- Publication number 20240230754
- Publication date Jul 11, 2024
- NANYA TECHNOLOGY CORPORATION
- Yi-Kai CHAO
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLING ALIGNMENT DURING A THERMAL CYCLE
- Publication number 20240230714
- Publication date Jul 11, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR A VACUUM COMPATIBLE ELECTRICAL INTERFACE, ENA...
- Publication number 20240219452
- Publication date Jul 4, 2024
- Intel Corporation
- Prasoon JOSHI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TESTING OPTICAL COMMUNICATION DEVICES
- Publication number 20240201249
- Publication date Jun 20, 2024
- Bouchaib Hraimel
- G01 - MEASURING TESTING
Information Patent Application
MULTIPHASE THERMAL INTERFACE COMPONENT, METHOD OF FORMING THE SAME...
- Publication number 20240192268
- Publication date Jun 13, 2024
- CHROMA ATE INC.
- Yu-Wei Chuang
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE WITH THERMAL ISOLATION STRUCTURES
- Publication number 20240183898
- Publication date Jun 6, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED JET IMPINGEMENT LEAK PREVENTION FOR INTEGRATED CIRCUIT
- Publication number 20240175917
- Publication date May 30, 2024
- Intel Corporation
- Ruben NUNEZ BLANCO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MEASURING CHIP CHARACTERISTICS, TEST DEVICE AND NON-TRANS...
- Publication number 20240159822
- Publication date May 16, 2024
- Global Unichip Corporation
- Ting-Hao WANG
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS FOR IMAGE SENSOR PACKAGE
- Publication number 20240151769
- Publication date May 9, 2024
- TSE CO., LTD
- Min Cheol KIM
- G01 - MEASURING TESTING
Information Patent Application
SOCKET FOR TESTING SEMICONDUCTOR DEVICE
- Publication number 20240142493
- Publication date May 2, 2024
- Samsung Electronics Co., Ltd.
- Sanguk Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIQUID COOLED TEST SYSTEM FOR TESTING SEMICONDUCTOR INTEGRATED CIRC...
- Publication number 20240142513
- Publication date May 2, 2024
- Antares Advanced Test Technologies (Suzhou) Limited
- Jiachun Zhou
- G01 - MEASURING TESTING
Information Patent Application
MODULAR LOW LEVEL CONTACT RESISTANCE TESTING APPARATUS FOR PROCESS...
- Publication number 20240133945
- Publication date Apr 25, 2024
- Mohanraj Prabhugoud
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...
- Publication number 20240133943
- Publication date Apr 25, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik RANGANATHAN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20240103068
- Publication date Mar 28, 2024
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING

External aspects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electronic device testing apparatus and electronic device testing m...

Apparatus for testing a semiconductor package

Apparatus for testing electronic devices

Automatic test system and automatic test method for integrated-circ...

Test system, test method, and non-transitory computer readable medium

Semi-automatic prober

Module substrate for semiconductor module, semiconductor module and...

Method and apparatus for RF built-in test system for a beamforming...

Electronic device pick-and-place system and electronic device testi...

Test socket

Test device, change kit, and method of exchanging change kit

Testing devices and method for testing semiconductor devices

Picker device

Workpiece positioning mechanism and workpiece inspection apparatus

Heat spreaders for use in semiconductor device testing, such as bur...

Semiconductor package test apparatus and method

Socket for electrical component

Test socket for performing a test on an electronic device

Testing device and method for testing a device under test

Chip detection device, chip detection system, and control method

Electronic component testing apparatus, sockets, and replacement pa...

Thermoelectric device with Seebeck effect

Test socket having an automated lid

Mechanical arm and mechanical arm assembly, test system and method,...

Burn-in board seating

Burn-in board and burn-in apparatus

Test apparatus for semiconductor package

Inspection jig and board inspection apparatus including the same

Apparatus, transfer method, chamber and frame for semiconductor bur...

Spring contact and test socket with same

Patents Applicationslast 30 patents

WLCSP DEVICE ENCLOSURE

SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...

TEMPERATURE ADJUSTING SYSTEM, CONTROLLER, ELECTRONIC DEVICE HANDLIN...

CONTACTOR FOR MULTI DEVICE SOCKETS AND RELATED

WAFER TEST SYSTEM AND METHODS

TEST SOCKET AND ASSEMBLY DEVICE THEREOF

OPTICAL TUNING TEST SYSTEM USING PARALLEL OVEN PIPELINES WITH PARAL...

WORK PRESS ASSEMBLY FOR TEST HANDLER

APPARATUS FOR TESTING AND/OR OPERATING ELECTRONIC DEVICES

ELECTRONIC COMPONENT MANUFACTURING METHOD, MANUFACTURING FILM, AND...

PROBE MOUNTING STRUCTURE AND RELIABILITY TEST SYSTEM FOR WAFER-LEVE...

DEVICE COOLING ENCLOSURE AND ADAPTER FOR HOUSING DEVICES OF DIFFERE...

CHIP TESTING DEVICE AND PACKAGE TESTING MACHINE

INTEGRATED ACTUATOR TEST SYSTEM AND METHOD FOR OPERATING THE SAME

CONTACT INSPECTION DEVICE

MULTIPLE CIRCUIT BOARD TESTER

PROBE STATION CAPABLE OF MAINTAINING STABLE AND ACCURATE CONTACT TO...

CONTROLLING ALIGNMENT DURING A THERMAL CYCLE

METHOD AND SYSTEM FOR A VACUUM COMPATIBLE ELECTRICAL INTERFACE, ENA...

SYSTEMS AND METHODS FOR TESTING OPTICAL COMMUNICATION DEVICES

MULTIPHASE THERMAL INTERFACE COMPONENT, METHOD OF FORMING THE SAME...

ACTIVE THERMAL INTERPOSER DEVICE WITH THERMAL ISOLATION STRUCTURES

ENHANCED JET IMPINGEMENT LEAK PREVENTION FOR INTEGRATED CIRCUIT

METHOD OF MEASURING CHIP CHARACTERISTICS, TEST DEVICE AND NON-TRANS...

TEST APPARATUS FOR IMAGE SENSOR PACKAGE

SOCKET FOR TESTING SEMICONDUCTOR DEVICE

LIQUID COOLED TEST SYSTEM FOR TESTING SEMICONDUCTOR INTEGRATED CIRC...

MODULAR LOW LEVEL CONTACT RESISTANCE TESTING APPARATUS FOR PROCESS...

INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...

APPARATUS FOR TESTING ELECTRONIC DEVICES