External testing equipment for static stores

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CPC
G11C29/56

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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/56External testing equipment for static stores

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Automated test equipment comprising a plurality of communication in...
- Patent number 12,315,585
- Issue date May 27, 2025
- Advantest Corporation
- Frank Hensel
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device, memory device test method, and test system
- Patent number 12,300,344
- Issue date May 13, 2025
- Samsung Electronics Co., Ltd.
- Hong-Jun Jin
- G11 - INFORMATION STORAGE
Information Patent Grant
Chip socket, testing fixture and chip testing method thereof
- Patent number 12,292,455
- Issue date May 6, 2025
- NANYA TECHNOLOGY CORPORATION
- Shih-Ting Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for memory testing
- Patent number 12,283,334
- Issue date Apr 22, 2025
- Winbond Electronics Corp.
- Shih-Hung Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Block family error avoidance bin designs addressing error correctio...
- Patent number 12,277,984
- Issue date Apr 15, 2025
- Micron Technology, Inc.
- Guang Hu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory controller performing training to improve communication and...
- Patent number 12,272,425
- Issue date Apr 8, 2025
- SK Hynix Inc.
- Nam Hyeok Jeong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test board
- Patent number 12,266,416
- Issue date Apr 1, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Huipeng Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Test system and test method for dynamic random access memory module...
- Patent number 12,254,944
- Issue date Mar 18, 2025
- SQ Technology (Shanghai) Corporation
- Wei-Guo Zhao
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory with parallel main and test interfaces
- Patent number 12,243,610
- Issue date Mar 4, 2025
- Micron Technology, Inc.
- James Brian Johnson
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test method, memory test apparatus, memory test device, and...
- Patent number 12,237,036
- Issue date Feb 25, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xiaolei Li
- G11 - INFORMATION STORAGE
Information Patent Grant
Signal generator and memory
- Patent number 12,231,129
- Issue date Feb 18, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jianyong Qin
- G11 - INFORMATION STORAGE
Information Patent Grant
Burst indicator systems and methods
- Patent number 12,211,573
- Issue date Jan 28, 2025
- Micron Technology, Inc.
- Kai Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and memory system
- Patent number 12,211,572
- Issue date Jan 28, 2025
- Samsung Electronics Co., Ltd.
- Kyoungho Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor wafer testing system and related method for improving...
- Patent number 12,210,055
- Issue date Jan 28, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Harry-Hak-Lay Chuang
- G11 - INFORMATION STORAGE
Information Patent Grant
On-die testing for a memory device
- Patent number 12,211,571
- Issue date Jan 28, 2025
- Micron Technology, Inc.
- David W. Overgaard
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test system and memory test method
- Patent number 12,190,977
- Issue date Jan 7, 2025
- NANYA TECHNOLOGY CORPORATION
- Cheng-Ting Hsu
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test system and memory test method
- Patent number 12,190,978
- Issue date Jan 7, 2025
- NANYA TECHNOLOGY CORPORATION
- Cheng-Ting Hsu
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus, systems, and methods for dynamically reconfigured semico...
- Patent number 12,174,717
- Issue date Dec 24, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Clock generating circuit and method for trimming period of oscillat...
- Patent number 12,169,419
- Issue date Dec 17, 2024
- Samsung Electronics Co., Ltd.
- Hyunil Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test equipment comprising a plurality of communication in...
- Patent number 12,165,728
- Issue date Dec 10, 2024
- Advantest Corporation
- Frank Hensel
- G11 - INFORMATION STORAGE
Information Patent Grant
Test system for dynamic random access memory module of AMD system
- Patent number 12,148,499
- Issue date Nov 19, 2024
- SQ Technology (Shanghai) Corporation
- Wei-Guo Zhao
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing system and testing method
- Patent number 12,142,340
- Issue date Nov 12, 2024
- Realtek Semiconductor Corporation
- Shih-Chieh Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Intelligent memory device test rack
- Patent number 12,142,336
- Issue date Nov 12, 2024
- Micron Technology, Inc.
- Gary D. Hamor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analog signals monitoring for functional safety
- Patent number 12,131,792
- Issue date Oct 29, 2024
- Infineon Technologies LLC
- Yoram Betser
- G11 - INFORMATION STORAGE
Information Patent Grant
Test devices, test systems, and operating methods of test systems
- Patent number 12,111,351
- Issue date Oct 8, 2024
- Samsung Electronics Co., Ltd.
- Ungjin Jang
- G11 - INFORMATION STORAGE
Information Patent Grant
Latch performance detection method, device and electronic device
- Patent number 12,106,816
- Issue date Oct 1, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Tao Du
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus, systems, and methods for dynamically reconfigured semico...
- Patent number 12,099,424
- Issue date Sep 24, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device having syndrome generator
- Patent number 12,040,039
- Issue date Jul 16, 2024
- Micron Technology, Inc.
- Kenya Adachi
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for receiver equalization and stressed eye testin...
- Patent number 12,032,018
- Issue date Jul 9, 2024
- Huawei Technologies Co., Ltd.
- Gang Zhao
- G11 - INFORMATION STORAGE
Information Patent Grant
Slave communication apparatus and master communication apparatus
- Patent number 12,007,825
- Issue date Jun 11, 2024
- Fuji Electric Co., Ltd.
- Masashi Akahane
- B60 - VEHICLES IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
MEMORY WITH PARALLEL MAIN AND TEST INTERFACES
- Publication number 20250182839
- Publication date Jun 5, 2025
- Micron Technology, Inc.
- James Brian Johnson
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE TEST SYSTEM
- Publication number 20250174295
- Publication date May 29, 2025
- NANYA TECHNOLOGY CORPORATION
- Yi-Kai HUANG
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS AND METHODS FOR MANAGING WEAR LEVELING IN MEMORY
- Publication number 20250166722
- Publication date May 22, 2025
- Micron Technology, Inc.
- Mohammed A. Khan
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY CHECKING METHOD AND APPARATUS
- Publication number 20250157565
- Publication date May 15, 2025
- NXP B.V.
- Nicholas Justin Mountford Spence
- G11 - INFORMATION STORAGE
Information Patent Application
TEST DEVICE, OPERATING METHOD OF TEST DEVICE, AND SEMICONDUCTOR DEV...
- Publication number 20250149107
- Publication date May 8, 2025
- Samsung Electronics Co., Ltd.
- Sehoon Park
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM AND METHOD FOR TESTING MEMORY
- Publication number 20250140335
- Publication date May 1, 2025
- NANYA TECHNOLOGY CORPORATION
- Chien Yu CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST DEVICE, OPERATING METHOD OF THE SAME, AND TEST SYSTEM
- Publication number 20250118390
- Publication date Apr 10, 2025
- Samsung Electronics Co., Ltd.
- Sunggu Lee
- G11 - INFORMATION STORAGE
Information Patent Application
Systems and Methods to Perform Automatic Test Pattern Generation on...
- Publication number 20250118389
- Publication date Apr 10, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Nitesh Mishra
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY MODULE, OPERATING METHOD OF MEMORY MODULE, AND MEMORY SYSTEM...
- Publication number 20250087293
- Publication date Mar 13, 2025
- Samsung Electronics Co., Ltd.
- JINSEONG YUN
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY TESTING FLOW SET UP WITH COMPUTATIONAL INTELLIGENCE
- Publication number 20250078951
- Publication date Mar 6, 2025
- Western Digital Technologies, Inc.
- Cuili Fu
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE INCLUDING REPAIR CIRCUIT AND OPERATING METHOD THEREOF
- Publication number 20250069682
- Publication date Feb 27, 2025
- Samsung Electronics Co., Ltd.
- Wonyoung Jang
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY
- Publication number 20250069681
- Publication date Feb 27, 2025
- CXMT Corporation
- Jia WANG
- G11 - INFORMATION STORAGE
Information Patent Application
ADAPTIVE TEMPERATURE COMPENSATION FOR A MEMORY DEVICE
- Publication number 20250014654
- Publication date Jan 9, 2025
- Micron Technology, Inc.
- Patrick R. Khayat
- G11 - INFORMATION STORAGE
Information Patent Application
HOST-TO-DEVICE INTERFACE CIRCUITRY TESTING
- Publication number 20250006290
- Publication date Jan 2, 2025
- ADVANCED MICRO DEVICES, INC.
- Nehal Patel
- G11 - INFORMATION STORAGE
Information Patent Application
MIRRORING STORAGE IMPLEMENTATION METHOD AND APPARATUS FOR MEMORY MO...
- Publication number 20240412807
- Publication date Dec 12, 2024
- BEIJING BAIDU NETCOM SCIENCE TECHNOLOGY CO., LTD.
- Xin JIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE
- Publication number 20240395355
- Publication date Nov 28, 2024
- ETRON TECHNOLOGY, INC.
- Chun Shiah
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR STORAGE DEVICE
- Publication number 20240395354
- Publication date Nov 28, 2024
- Sony Semiconductor Solutions Corporation
- DAISHI ISOGAI
- G11 - INFORMATION STORAGE
Information Patent Application
TEST SYSTEM FOR DYNAMIC RANDOM ACCESS MEMORY MODULE OF AMD SYSTEM
- Publication number 20240386987
- Publication date Nov 21, 2024
- SQ TECHNOLOGY (SHANGHAI) CORPORATION
- WEI-GUO ZHAO
- G11 - INFORMATION STORAGE
Information Patent Application
TEST SYSTEM AND TEST METHOD FOR DYNAMIC RANDOM ACCESS MEMORY MODULE...
- Publication number 20240386986
- Publication date Nov 21, 2024
- SQ TECHNOLOGY (SHANGHAI) CORPORATION
- WEI-GUO ZHAO
- G11 - INFORMATION STORAGE
Information Patent Application
SEQUENTIAL ACCESS TO LINKED MEMORY DICE FOR BUS TRAINING
- Publication number 20240371460
- Publication date Nov 7, 2024
- Micron Technology, Inc.
- Smruti Subhash Jhaveri
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20240355404
- Publication date Oct 24, 2024
- WINBOND ELECTRONICS CORP.
- Yutaka ITO
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEMS AND METHODS FOR REDUCING ERROR LOG REQUIRED SPACE AT LOW TE...
- Publication number 20240347129
- Publication date Oct 17, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY WITH ELECTRICALLY PROGRAMMABLE FUSES AND RELATED TESTER
- Publication number 20240331797
- Publication date Oct 3, 2024
- ETRON TECHNOLOGY, INC.
- Ho-Yin Chen
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR MEMORY TESTING
- Publication number 20240312556
- Publication date Sep 19, 2024
- WINBOND ELECTRONICS CORP.
- Shih-Hung Chen
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY WITH BUILT-IN SYNCHRONOUS-WRITE-THROUGH REDUNDANCY AND ASSOC...
- Publication number 20240312557
- Publication date Sep 19, 2024
- MEDIATEK INC.
- Che-Wei Chou
- G11 - INFORMATION STORAGE
Information Patent Application
ELECTRONIC DEVICE INCLUDING DRAM AND METHOD FOR OPERATING THE SAME
- Publication number 20240304274
- Publication date Sep 12, 2024
- Samsung Electronics Co., Ltd.
- Jiyong YOO
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE, CONTROL METHOD FOR SEMICONDUCTOR DEVICE AND C...
- Publication number 20240296901
- Publication date Sep 5, 2024
- RENESAS ELECTRONICS CORPORATION
- Takuro NISHIKAWA
- G11 - INFORMATION STORAGE
Information Patent Application
MOKE MEASUREMENT APPARATUS
- Publication number 20240274221
- Publication date Aug 15, 2024
- Industry-University Cooperation Foundation Hanyang University ERICA Campus
- Bum Jin JANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUE TO ANALYZE AND REPORT ACCURATE DATA, SYNCHRONIZING MULTIP...
- Publication number 20240274222
- Publication date Aug 15, 2024
- Tektronix, Inc.
- Swapnil Jhawar
- G11 - INFORMATION STORAGE
Information Patent Application
MODE REGISTER UPDATE (MRUPD) MODE
- Publication number 20240249795
- Publication date Jul 25, 2024
- Intel Corporation
- Saravanan SETHURAMAN
- G11 - INFORMATION STORAGE

External testing equipment for static stores

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Automated test equipment comprising a plurality of communication in...

Memory device, memory device test method, and test system

Chip socket, testing fixture and chip testing method thereof

Method and apparatus for memory testing

Block family error avoidance bin designs addressing error correctio...

Memory controller performing training to improve communication and...

Test board

Test system and test method for dynamic random access memory module...

Memory with parallel main and test interfaces

Memory test method, memory test apparatus, memory test device, and...

Signal generator and memory

Burst indicator systems and methods

Semiconductor device and memory system

Semiconductor wafer testing system and related method for improving...

On-die testing for a memory device

Memory test system and memory test method

Memory test system and memory test method

Apparatus, systems, and methods for dynamically reconfigured semico...

Clock generating circuit and method for trimming period of oscillat...

Automated test equipment comprising a plurality of communication in...

Test system for dynamic random access memory module of AMD system

Testing system and testing method

Intelligent memory device test rack

Analog signals monitoring for functional safety

Test devices, test systems, and operating methods of test systems

Latch performance detection method, device and electronic device

Apparatus, systems, and methods for dynamically reconfigured semico...

Semiconductor device having syndrome generator

System and method for receiver equalization and stressed eye testin...

Slave communication apparatus and master communication apparatus

Patents Applicationslast 30 patents

MEMORY WITH PARALLEL MAIN AND TEST INTERFACES

MEMORY DEVICE TEST SYSTEM

APPARATUS AND METHODS FOR MANAGING WEAR LEVELING IN MEMORY

MEMORY CHECKING METHOD AND APPARATUS

TEST DEVICE, OPERATING METHOD OF TEST DEVICE, AND SEMICONDUCTOR DEV...

SYSTEM AND METHOD FOR TESTING MEMORY

TEST DEVICE, OPERATING METHOD OF THE SAME, AND TEST SYSTEM

Systems and Methods to Perform Automatic Test Pattern Generation on...

MEMORY MODULE, OPERATING METHOD OF MEMORY MODULE, AND MEMORY SYSTEM...

MEMORY TESTING FLOW SET UP WITH COMPUTATIONAL INTELLIGENCE

MEMORY DEVICE INCLUDING REPAIR CIRCUIT AND OPERATING METHOD THEREOF

MEMORY

ADAPTIVE TEMPERATURE COMPENSATION FOR A MEMORY DEVICE

HOST-TO-DEVICE INTERFACE CIRCUITRY TESTING

MIRRORING STORAGE IMPLEMENTATION METHOD AND APPARATUS FOR MEMORY MO...

MEMORY DEVICE

SEMICONDUCTOR STORAGE DEVICE

TEST SYSTEM FOR DYNAMIC RANDOM ACCESS MEMORY MODULE OF AMD SYSTEM

TEST SYSTEM AND TEST METHOD FOR DYNAMIC RANDOM ACCESS MEMORY MODULE...

SEQUENTIAL ACCESS TO LINKED MEMORY DICE FOR BUS TRAINING

SEMICONDUCTOR MEMORY DEVICE

SYSTEMS AND METHODS FOR REDUCING ERROR LOG REQUIRED SPACE AT LOW TE...

MEMORY WITH ELECTRICALLY PROGRAMMABLE FUSES AND RELATED TESTER

METHOD AND APPARATUS FOR MEMORY TESTING

MEMORY WITH BUILT-IN SYNCHRONOUS-WRITE-THROUGH REDUNDANCY AND ASSOC...

ELECTRONIC DEVICE INCLUDING DRAM AND METHOD FOR OPERATING THE SAME

SEMICONDUCTOR DEVICE, CONTROL METHOD FOR SEMICONDUCTOR DEVICE AND C...

MOKE MEASUREMENT APPARATUS

TECHNIQUE TO ANALYZE AND REPORT ACCURATE DATA, SYNCHRONIZING MULTIP...

MODE REGISTER UPDATE (MRUPD) MODE