External testing equipment for static stores

Industry

CPC
G11C29/56

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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/56External testing equipment for static stores

Industries

Patents Grantslast 30 patents

Information Patent Grant
Apparatus, systems, and methods for dynamically reconfigured semico...
- Patent number 12,174,717
- Issue date Dec 24, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Clock generating circuit and method for trimming period of oscillat...
- Patent number 12,169,419
- Issue date Dec 17, 2024
- Samsung Electronics Co., Ltd.
- Hyunil Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test equipment comprising a plurality of communication in...
- Patent number 12,165,728
- Issue date Dec 10, 2024
- Advantest Corporation
- Frank Hensel
- G11 - INFORMATION STORAGE
Information Patent Grant
Test system for dynamic random access memory module of AMD system
- Patent number 12,148,499
- Issue date Nov 19, 2024
- SQ Technology (Shanghai) Corporation
- Wei-Guo Zhao
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing system and testing method
- Patent number 12,142,340
- Issue date Nov 12, 2024
- Realtek Semiconductor Corporation
- Shih-Chieh Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Intelligent memory device test rack
- Patent number 12,142,336
- Issue date Nov 12, 2024
- Micron Technology, Inc.
- Gary D. Hamor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analog signals monitoring for functional safety
- Patent number 12,131,792
- Issue date Oct 29, 2024
- Infineon Technologies LLC
- Yoram Betser
- G11 - INFORMATION STORAGE
Information Patent Grant
Test devices, test systems, and operating methods of test systems
- Patent number 12,111,351
- Issue date Oct 8, 2024
- Samsung Electronics Co., Ltd.
- Ungjin Jang
- G11 - INFORMATION STORAGE
Information Patent Grant
Latch performance detection method, device and electronic device
- Patent number 12,106,816
- Issue date Oct 1, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Tao Du
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus, systems, and methods for dynamically reconfigured semico...
- Patent number 12,099,424
- Issue date Sep 24, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device having syndrome generator
- Patent number 12,040,039
- Issue date Jul 16, 2024
- Micron Technology, Inc.
- Kenya Adachi
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for receiver equalization and stressed eye testin...
- Patent number 12,032,018
- Issue date Jul 9, 2024
- Huawei Technologies Co., Ltd.
- Gang Zhao
- G11 - INFORMATION STORAGE
Information Patent Grant
Slave communication apparatus and master communication apparatus
- Patent number 12,007,825
- Issue date Jun 11, 2024
- Fuji Electric Co., Ltd.
- Masashi Akahane
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Semiconductor memory device and test system including the same
- Patent number 11,989,459
- Issue date May 21, 2024
- Samsung Electronics Co., Ltd.
- Hongjun Jin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and test method thereof, and non-transitory co...
- Patent number 11,977,463
- Issue date May 7, 2024
- Kioxia Corporation
- Kunihiko Suzuki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chip socket, testing fixture and chip testing method thereof
- Patent number 11,959,939
- Issue date Apr 16, 2024
- NANYA TECHNOLOGY CORPORATION
- Shih-Ting Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Test device and test method thereof
- Patent number 11,961,578
- Issue date Apr 16, 2024
- NANYA TECHNOLOGY CORPORATION
- Jyun-Da Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Path based controls for ATE mode testing of multicell memory circuit
- Patent number 11,933,844
- Issue date Mar 19, 2024
- Texas Instruments Incorporated
- Wilson Pradeep
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reference bits test and repair using memory built-in self-test
- Patent number 11,929,136
- Issue date Mar 12, 2024
- SIEMENS INDUSTRY SOFTWARE INC.
- Jongsin Yun
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing memory
- Patent number 11,929,137
- Issue date Mar 12, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yangyang Dai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Error avoidance based on voltage distribution parameters of block f...
- Patent number 11,915,776
- Issue date Feb 27, 2024
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic generation of ATPG mode signals for testing multipath memor...
- Patent number 11,879,940
- Issue date Jan 23, 2024
- Texas Instruments Incorporated
- Wilson Pradeep
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test method for control chip and related device
- Patent number 11,867,758
- Issue date Jan 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chuanqi Shi
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory sub-system including an in-package sequencer to perform erro...
- Patent number 11,869,618
- Issue date Jan 9, 2024
- Micron Technology, Inc.
- Samir Mittal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for verifying and analyzing memory for high perfo...
- Patent number 11,862,275
- Issue date Jan 2, 2024
- KingTiger Technology (Canada) Inc.
- Bosco Chun Sang Lai
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test systems and memory test methods
- Patent number 11,862,278
- Issue date Jan 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Hao He
- G11 - INFORMATION STORAGE
Information Patent Grant
Test method for control chip and related device
- Patent number 11,862,268
- Issue date Jan 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chuanqi Shi
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test methods and related devices
- Patent number 11,854,642
- Issue date Dec 26, 2023
- Changxin Memory Technologies, Inc.
- Heng-Chia Chang
- G11 - INFORMATION STORAGE
Information Patent Grant
Storage devices and methods of operating storage devices
- Patent number 11,830,561
- Issue date Nov 28, 2023
- Samsung Electronics Co., Ltd.
- Youngmin Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Command clock gate implementation with chip select signal training...
- Patent number 11,823,729
- Issue date Nov 21, 2023
- Micron Technology, Inc.
- Liang Chen
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
HOST-TO-DEVICE INTERFACE CIRCUITRY TESTING
- Publication number 20250006290
- Publication date Jan 2, 2025
- ADVANCED MICRO DEVICES, INC.
- Nehal Patel
- G11 - INFORMATION STORAGE
Information Patent Application
MIRRORING STORAGE IMPLEMENTATION METHOD AND APPARATUS FOR MEMORY MO...
- Publication number 20240412807
- Publication date Dec 12, 2024
- BEIJING BAIDU NETCOM SCIENCE TECHNOLOGY CO., LTD.
- Xin JIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE
- Publication number 20240395355
- Publication date Nov 28, 2024
- ETRON TECHNOLOGY, INC.
- Chun Shiah
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR STORAGE DEVICE
- Publication number 20240395354
- Publication date Nov 28, 2024
- Sony Semiconductor Solutions Corporation
- DAISHI ISOGAI
- G11 - INFORMATION STORAGE
Information Patent Application
TEST SYSTEM FOR DYNAMIC RANDOM ACCESS MEMORY MODULE OF AMD SYSTEM
- Publication number 20240386987
- Publication date Nov 21, 2024
- SQ TECHNOLOGY (SHANGHAI) CORPORATION
- WEI-GUO ZHAO
- G11 - INFORMATION STORAGE
Information Patent Application
TEST SYSTEM AND TEST METHOD FOR DYNAMIC RANDOM ACCESS MEMORY MODULE...
- Publication number 20240386986
- Publication date Nov 21, 2024
- SQ TECHNOLOGY (SHANGHAI) CORPORATION
- WEI-GUO ZHAO
- G11 - INFORMATION STORAGE
Information Patent Application
SEQUENTIAL ACCESS TO LINKED MEMORY DICE FOR BUS TRAINING
- Publication number 20240371460
- Publication date Nov 7, 2024
- Micron Technology, Inc.
- Smruti Subhash Jhaveri
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20240355404
- Publication date Oct 24, 2024
- WINBOND ELECTRONICS CORP.
- Yutaka ITO
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEMS AND METHODS FOR REDUCING ERROR LOG REQUIRED SPACE AT LOW TE...
- Publication number 20240347129
- Publication date Oct 17, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY WITH ELECTRICALLY PROGRAMMABLE FUSES AND RELATED TESTER
- Publication number 20240331797
- Publication date Oct 3, 2024
- ETRON TECHNOLOGY, INC.
- Ho-Yin Chen
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR MEMORY TESTING
- Publication number 20240312556
- Publication date Sep 19, 2024
- WINBOND ELECTRONICS CORP.
- Shih-Hung Chen
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY WITH BUILT-IN SYNCHRONOUS-WRITE-THROUGH REDUNDANCY AND ASSOC...
- Publication number 20240312557
- Publication date Sep 19, 2024
- MEDIATEK INC.
- Che-Wei Chou
- G11 - INFORMATION STORAGE
Information Patent Application
ELECTRONIC DEVICE INCLUDING DRAM AND METHOD FOR OPERATING THE SAME
- Publication number 20240304274
- Publication date Sep 12, 2024
- Samsung Electronics Co., Ltd.
- Jiyong YOO
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE, CONTROL METHOD FOR SEMICONDUCTOR DEVICE AND C...
- Publication number 20240296901
- Publication date Sep 5, 2024
- RENESAS ELECTRONICS CORPORATION
- Takuro NISHIKAWA
- G11 - INFORMATION STORAGE
Information Patent Application
MOKE MEASUREMENT APPARATUS
- Publication number 20240274221
- Publication date Aug 15, 2024
- Industry-University Cooperation Foundation Hanyang University ERICA Campus
- Bum Jin JANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUE TO ANALYZE AND REPORT ACCURATE DATA, SYNCHRONIZING MULTIP...
- Publication number 20240274222
- Publication date Aug 15, 2024
- Tektronix, Inc.
- Swapnil Jhawar
- G11 - INFORMATION STORAGE
Information Patent Application
MODE REGISTER UPDATE (MRUPD) MODE
- Publication number 20240249795
- Publication date Jul 25, 2024
- Intel Corporation
- Saravanan SETHURAMAN
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE, OPERATION METHOD OF MEMORY DEVICE, AND OPERATION MET...
- Publication number 20240233857
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Kuihan Ko
- G11 - INFORMATION STORAGE
Information Patent Application
DIGITAL VERIFY FAILBIT COUNT (VFC) CIRCUIT
- Publication number 20240221859
- Publication date Jul 4, 2024
- Yangtze Memory Technologies Co., Ltd.
- Teng CHEN
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND SYSTEM FOR DETECTING MEMORY ERROR, AND DEVICE
- Publication number 20240212783
- Publication date Jun 27, 2024
- KINGTIGER Testing Technology (SZ) Ltd.
- Bosco Chun Sang LAI
- G11 - INFORMATION STORAGE
Information Patent Application
CALIBRATE SYSTEM WITH CALCULATED RECEIVE EYE FOR VOLUME TESTING BAS...
- Publication number 20240212784
- Publication date Jun 27, 2024
- Intel NDTM US LLC
- Ashish SHUKLA
- G11 - INFORMATION STORAGE
Information Patent Application
CHIP SOCKET, TESTING FIXTURE AND CHIP TESTING METHOD THEREOF
- Publication number 20240192252
- Publication date Jun 13, 2024
- NANYA TECHNOLOGY CORPORATION
- SHIH-TING LIN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, SYSTEMS, AND METHODS FOR DYNAMICALLY RECONFIGURED SEMICO...
- Publication number 20240193058
- Publication date Jun 13, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAILURE ANALYSIS AND DETECTION METHOD FOR MEMORY
- Publication number 20240185944
- Publication date Jun 6, 2024
- Powerchip Semiconductor Manufacturing Corporation
- Chingching Shih
- G11 - INFORMATION STORAGE
Information Patent Application
Latch Performance Detection Method, Device and Electronic Device
- Publication number 20240170092
- Publication date May 23, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Tao Du
- G11 - INFORMATION STORAGE
Information Patent Application
TEST DEVICE AND TEST METHOD THEREOF
- Publication number 20240079082
- Publication date Mar 7, 2024
- NANYA TECHNOLOGY CORPORATION
- Jyun-Da Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY WITH PARALLEL MAIN AND TEST INTERFACES
- Publication number 20240071556
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- James Brian Johnson
- G11 - INFORMATION STORAGE
Information Patent Application
FAILURE ANALYSIS METHOD, COMPUTER EQUIPMENT, AND STORAGE MEDIUM
- Publication number 20240071557
- Publication date Feb 29, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Zhi YANG
- G11 - INFORMATION STORAGE
Information Patent Application
Dynamic Address Scramble
- Publication number 20240071464
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- Erik T. Barmon
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE HAVING SYNDROME GENERATOR
- Publication number 20240062843
- Publication date Feb 22, 2024
- Micron Technology, Inc.
- KENYA ADACHI
- G11 - INFORMATION STORAGE

External testing equipment for static stores

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus, systems, and methods for dynamically reconfigured semico...

Clock generating circuit and method for trimming period of oscillat...

Automated test equipment comprising a plurality of communication in...

Test system for dynamic random access memory module of AMD system

Testing system and testing method

Intelligent memory device test rack

Analog signals monitoring for functional safety

Test devices, test systems, and operating methods of test systems

Latch performance detection method, device and electronic device

Apparatus, systems, and methods for dynamically reconfigured semico...

Semiconductor device having syndrome generator

System and method for receiver equalization and stressed eye testin...

Slave communication apparatus and master communication apparatus

Semiconductor memory device and test system including the same

Semiconductor device and test method thereof, and non-transitory co...

Chip socket, testing fixture and chip testing method thereof

Test device and test method thereof

Path based controls for ATE mode testing of multicell memory circuit

Reference bits test and repair using memory built-in self-test

Method for testing memory

Error avoidance based on voltage distribution parameters of block f...

Dynamic generation of ATPG mode signals for testing multipath memor...

Test method for control chip and related device

Memory sub-system including an in-package sequencer to perform erro...

System and method for verifying and analyzing memory for high perfo...

Memory test systems and memory test methods

Test method for control chip and related device

Memory test methods and related devices

Storage devices and methods of operating storage devices

Command clock gate implementation with chip select signal training...

Patents Applicationslast 30 patents

HOST-TO-DEVICE INTERFACE CIRCUITRY TESTING

MIRRORING STORAGE IMPLEMENTATION METHOD AND APPARATUS FOR MEMORY MO...

MEMORY DEVICE

SEMICONDUCTOR STORAGE DEVICE

TEST SYSTEM FOR DYNAMIC RANDOM ACCESS MEMORY MODULE OF AMD SYSTEM

TEST SYSTEM AND TEST METHOD FOR DYNAMIC RANDOM ACCESS MEMORY MODULE...

SEQUENTIAL ACCESS TO LINKED MEMORY DICE FOR BUS TRAINING

SEMICONDUCTOR MEMORY DEVICE

SYSTEMS AND METHODS FOR REDUCING ERROR LOG REQUIRED SPACE AT LOW TE...

MEMORY WITH ELECTRICALLY PROGRAMMABLE FUSES AND RELATED TESTER

METHOD AND APPARATUS FOR MEMORY TESTING

MEMORY WITH BUILT-IN SYNCHRONOUS-WRITE-THROUGH REDUNDANCY AND ASSOC...

ELECTRONIC DEVICE INCLUDING DRAM AND METHOD FOR OPERATING THE SAME

SEMICONDUCTOR DEVICE, CONTROL METHOD FOR SEMICONDUCTOR DEVICE AND C...

MOKE MEASUREMENT APPARATUS

TECHNIQUE TO ANALYZE AND REPORT ACCURATE DATA, SYNCHRONIZING MULTIP...

MODE REGISTER UPDATE (MRUPD) MODE

MEMORY DEVICE, OPERATION METHOD OF MEMORY DEVICE, AND OPERATION MET...

DIGITAL VERIFY FAILBIT COUNT (VFC) CIRCUIT

METHOD AND SYSTEM FOR DETECTING MEMORY ERROR, AND DEVICE

CALIBRATE SYSTEM WITH CALCULATED RECEIVE EYE FOR VOLUME TESTING BAS...

CHIP SOCKET, TESTING FIXTURE AND CHIP TESTING METHOD THEREOF

APPARATUS, SYSTEMS, AND METHODS FOR DYNAMICALLY RECONFIGURED SEMICO...

FAILURE ANALYSIS AND DETECTION METHOD FOR MEMORY

Latch Performance Detection Method, Device and Electronic Device

TEST DEVICE AND TEST METHOD THEREOF

MEMORY WITH PARALLEL MAIN AND TEST INTERFACES

FAILURE ANALYSIS METHOD, COMPUTER EQUIPMENT, AND STORAGE MEDIUM

Dynamic Address Scramble

SEMICONDUCTOR DEVICE HAVING SYNDROME GENERATOR