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G11C29/56
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Information storage
G11C
STATIC STORES
G11C29/00
Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation
Current Industry
G11C29/56
External testing equipment for static stores
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Patents Grants
last 30 patents
Information
Patent Grant
Slave communication apparatus and master communication apparatus
Patent number
12,007,825
Issue date
Jun 11, 2024
Fuji Electric Co., Ltd.
Masashi Akahane
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Semiconductor memory device and test system including the same
Patent number
11,989,459
Issue date
May 21, 2024
Samsung Electronics Co., Ltd.
Hongjun Jin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor device and test method thereof, and non-transitory co...
Patent number
11,977,463
Issue date
May 7, 2024
Kioxia Corporation
Kunihiko Suzuki
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Chip socket, testing fixture and chip testing method thereof
Patent number
11,959,939
Issue date
Apr 16, 2024
NANYA TECHNOLOGY CORPORATION
Shih-Ting Lin
G11 - INFORMATION STORAGE
Information
Patent Grant
Test device and test method thereof
Patent number
11,961,578
Issue date
Apr 16, 2024
NANYA TECHNOLOGY CORPORATION
Jyun-Da Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Path based controls for ATE mode testing of multicell memory circuit
Patent number
11,933,844
Issue date
Mar 19, 2024
Texas Instruments Incorporated
Wilson Pradeep
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Reference bits test and repair using memory built-in self-test
Patent number
11,929,136
Issue date
Mar 12, 2024
SIEMENS INDUSTRY SOFTWARE INC.
Jongsin Yun
G11 - INFORMATION STORAGE
Information
Patent Grant
Method for testing memory
Patent number
11,929,137
Issue date
Mar 12, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Yangyang Dai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Error avoidance based on voltage distribution parameters of block f...
Patent number
11,915,776
Issue date
Feb 27, 2024
Micron Technology, Inc.
Michael Sheperek
G11 - INFORMATION STORAGE
Information
Patent Grant
Dynamic generation of ATPG mode signals for testing multipath memor...
Patent number
11,879,940
Issue date
Jan 23, 2024
Texas Instruments Incorporated
Wilson Pradeep
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Test method for control chip and related device
Patent number
11,867,758
Issue date
Jan 9, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Chuanqi Shi
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory sub-system including an in-package sequencer to perform erro...
Patent number
11,869,618
Issue date
Jan 9, 2024
Micron Technology, Inc.
Samir Mittal
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for verifying and analyzing memory for high perfo...
Patent number
11,862,275
Issue date
Jan 2, 2024
KingTiger Technology (Canada) Inc.
Bosco Chun Sang Lai
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory test systems and memory test methods
Patent number
11,862,278
Issue date
Jan 2, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Hao He
G11 - INFORMATION STORAGE
Information
Patent Grant
Test method for control chip and related device
Patent number
11,862,268
Issue date
Jan 2, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Chuanqi Shi
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory test methods and related devices
Patent number
11,854,642
Issue date
Dec 26, 2023
Changxin Memory Technologies, Inc.
Heng-Chia Chang
G11 - INFORMATION STORAGE
Information
Patent Grant
Storage devices and methods of operating storage devices
Patent number
11,830,561
Issue date
Nov 28, 2023
Samsung Electronics Co., Ltd.
Youngmin Lee
G11 - INFORMATION STORAGE
Information
Patent Grant
Command clock gate implementation with chip select signal training...
Patent number
11,823,729
Issue date
Nov 21, 2023
Micron Technology, Inc.
Liang Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Delay fault testing of pseudo static controls
Patent number
11,768,726
Issue date
Sep 26, 2023
Texas Instruments Incorporated
Aravinda Acharya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for correcting data errors in memory
Patent number
11,755,410
Issue date
Sep 12, 2023
Taiwan Semiconductor Manufacturing Company Limited
Yu-Der Chih
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Quick configurable universal register for a configurable integrated...
Patent number
11,749,368
Issue date
Sep 5, 2023
Intel Corporation
Bee Yee Ng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Carrier based high volume system level testing of devices with pop...
Patent number
11,742,055
Issue date
Aug 29, 2023
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G11 - INFORMATION STORAGE
Information
Patent Grant
Shared error correction coding circuitry
Patent number
11,742,047
Issue date
Aug 29, 2023
Micron Technology, Inc.
Marco Sforzin
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and device for testing memory chip by calculating resistance...
Patent number
11,721,411
Issue date
Aug 8, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC.
Jinghong Xu
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor wafer testing system and related method for improving...
Patent number
11,719,742
Issue date
Aug 8, 2023
Taiwan Semiconductor Manufacturing Company, Ltd
Harry-Hak-Lay Chuang
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory device and memory system controlling generation of data stro...
Patent number
11,636,909
Issue date
Apr 25, 2023
SK hynix Inc.
Hyun Seung Kim
G11 - INFORMATION STORAGE
Information
Patent Grant
Redundancy analysis method and redundancy analysis apparatus
Patent number
11,631,474
Issue date
Apr 18, 2023
UIF (University Industry Foundation), Yonsei University
Sung Ho Kang
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor memory training methods and related devices
Patent number
11,631,451
Issue date
Apr 18, 2023
Changxin Memory Technologies, Inc.
Guangteng Long
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatus for testing semiconductor device and method of testing th...
Patent number
11,626,184
Issue date
Apr 11, 2023
NANYA TECHNOLOGY CORPORATION
Chen-Yen Tsai
G11 - INFORMATION STORAGE
Information
Patent Grant
System and method for receiver equalization and stressed eye testin...
Patent number
11,624,780
Issue date
Apr 11, 2023
Huawei Technologies Co., Ltd.
Gang Zhao
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
CHIP SOCKET, TESTING FIXTURE AND CHIP TESTING METHOD THEREOF
Publication number
20240192252
Publication date
Jun 13, 2024
NANYA TECHNOLOGY CORPORATION
SHIH-TING LIN
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, SYSTEMS, AND METHODS FOR DYNAMICALLY RECONFIGURED SEMICO...
Publication number
20240193058
Publication date
Jun 13, 2024
Intelligent Memory Limited
Mike Hossein Amidi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FAILURE ANALYSIS AND DETECTION METHOD FOR MEMORY
Publication number
20240185944
Publication date
Jun 6, 2024
Powerchip Semiconductor Manufacturing Corporation
Chingching Shih
G11 - INFORMATION STORAGE
Information
Patent Application
Latch Performance Detection Method, Device and Electronic Device
Publication number
20240170092
Publication date
May 23, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC
Tao Du
G11 - INFORMATION STORAGE
Information
Patent Application
TEST DEVICE AND TEST METHOD THEREOF
Publication number
20240079082
Publication date
Mar 7, 2024
NANYA TECHNOLOGY CORPORATION
Jyun-Da Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEMORY WITH PARALLEL MAIN AND TEST INTERFACES
Publication number
20240071556
Publication date
Feb 29, 2024
Micron Technology, Inc.
James Brian Johnson
G11 - INFORMATION STORAGE
Information
Patent Application
FAILURE ANALYSIS METHOD, COMPUTER EQUIPMENT, AND STORAGE MEDIUM
Publication number
20240071557
Publication date
Feb 29, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Zhi YANG
G11 - INFORMATION STORAGE
Information
Patent Application
Dynamic Address Scramble
Publication number
20240071464
Publication date
Feb 29, 2024
Micron Technology, Inc.
Erik T. Barmon
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR DEVICE HAVING SYNDROME GENERATOR
Publication number
20240062843
Publication date
Feb 22, 2024
Micron Technology, Inc.
KENYA ADACHI
G11 - INFORMATION STORAGE
Information
Patent Application
SIGNAL SKEW CORRECTION IN INTEGRATED CIRCUIT MEMORY DEVICES
Publication number
20240055068
Publication date
Feb 15, 2024
Rambus Inc.
Srinivas Satish Babu Bamdhamravuri
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY TEST METHOD, MEMORY TEST APPARATUS, MEMORY TEST DEVICE, AND...
Publication number
20240021265
Publication date
Jan 18, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Xiaolei LI
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR TEST APPARATUS CAPABLE OF INDUCING REDUCTION OF POWER...
Publication number
20230420068
Publication date
Dec 28, 2023
YIK Corporation
Hyo Sang JO
G11 - INFORMATION STORAGE
Information
Patent Application
Burst Indicator Systems and Methods
Publication number
20230343407
Publication date
Oct 26, 2023
Micron Technology, Inc.
Kai Wang
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...
Publication number
20230333157
Publication date
Oct 19, 2023
Taiwan Semiconductor Manufacturing Company, Ltd.
Harry-Hak-Lay Chuang
G01 - MEASURING TESTING
Information
Patent Application
System and Method for Receiver Equalization and Stressed Eye Testin...
Publication number
20230324457
Publication date
Oct 12, 2023
Huawei Technologies Co., Ltd
Gang Zhao
G11 - INFORMATION STORAGE
Information
Patent Application
HOST CONTROLLED MEDIA TESTING OF MEMORY
Publication number
20230290427
Publication date
Sep 14, 2023
Micron Technology, Inc.
Danilo Caraccio
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Analog Signals Monitoring for Functional Safety
Publication number
20230268023
Publication date
Aug 24, 2023
Infineon Technologies LLC
Yoram Betser
G11 - INFORMATION STORAGE
Information
Patent Application
TESTING SYSTEM AND TESTING METHOD
Publication number
20230230652
Publication date
Jul 20, 2023
REALTEK SEMICONDUCTOR CORPORATION
Shih-Chieh LIN
G11 - INFORMATION STORAGE
Information
Patent Application
TEST DEVICE, TEST METHOD, AND TEST MACHINE
Publication number
20230215510
Publication date
Jul 6, 2023
Yangtze Memory Technologies Co., Ltd.
Xiao TONG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
Publication number
20230197185
Publication date
Jun 22, 2023
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G11 - INFORMATION STORAGE
Information
Patent Application
REFERENCE BITS TEST AND REPAIR USING MEMORY BUILT-IN SELF-TEST
Publication number
20230178172
Publication date
Jun 8, 2023
Siemens Industry Software Inc.
Jongsin Yun
G11 - INFORMATION STORAGE
Information
Patent Application
STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES
Publication number
20230094273
Publication date
Mar 30, 2023
Samsung Electronics Co., Ltd.
Youngmin LEE
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR MEMORY DEVICE AND TEST SYSTEM INCLUDING THE SAME
Publication number
20230091567
Publication date
Mar 23, 2023
Samsung Electronics Co., Ltd.
Hongjun JIN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
Publication number
20230062440
Publication date
Mar 2, 2023
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY TEST SYSTEMS AND MEMORY TEST METHODS
Publication number
20230055639
Publication date
Feb 23, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC.
Hao He
G11 - INFORMATION STORAGE
Information
Patent Application
SIGNAL GENERATOR AND MEMORY
Publication number
20230026826
Publication date
Jan 26, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC
Jianyong QIN
G11 - INFORMATION STORAGE
Information
Patent Application
ERROR AVOIDANCE BASED ON VOLTAGE DISTRIBUTION PARAMETERS OF BLOCK F...
Publication number
20230012855
Publication date
Jan 19, 2023
Micron Technology, Inc.
Michael Sheperek
G11 - INFORMATION STORAGE
Information
Patent Application
SHARED ERROR CORRECTION CODING CIRCUITRY
Publication number
20220415426
Publication date
Dec 29, 2022
Micron Technology, Inc.
Marco Sforzin
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...
Publication number
20220373594
Publication date
Nov 24, 2022
Taiwan Semiconductor Manufacturing Company, Ltd.
Harry-Hak-Lay Chuang
G11 - INFORMATION STORAGE
Information
Patent Application
Systems and Methods for Correcting Data Errors in Memory
Publication number
20220358013
Publication date
Nov 10, 2022
Taiwan Semiconductor Manufacturing Company Limited
Yu-Der Chih
G06 - COMPUTING CALCULATING COUNTING