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Fabry-Perot in interferometer
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G01B2290/25
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PHYSICS
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Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B2290/00
Aspects of interferometers not specifically covered by any group under G01B9/02
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G01B2290/25
Fabry-Perot in interferometer
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Patents Grants
last 30 patents
Information
Patent Grant
Broadband interferometry and method for measurement range extension...
Patent number
12,196,551
Issue date
Jan 14, 2025
Automated Precision Inc.
Yongwoo Park
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for measuring laser displacement
Patent number
12,158,340
Issue date
Dec 3, 2024
National Institute of Metrology, China
Jianjun Cui
G01 - MEASURING TESTING
Information
Patent Grant
Mirror unit and optical module
Patent number
12,152,878
Issue date
Nov 26, 2024
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Optical systems and methods for measuring turbine blade tip clearance
Patent number
12,060,865
Issue date
Aug 13, 2024
Parker-Hannifin Corporation
Lewis J. Boyd
G01 - MEASURING TESTING
Information
Patent Grant
Miniature 3D position-to-optical displacement sensor
Patent number
12,025,438
Issue date
Jul 2, 2024
The Curators of the University of Missouri
Genda Chen
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for determining the position of a target stru...
Patent number
11,927,891
Issue date
Mar 12, 2024
ASML Netherlands B.V.
Nitesh Pandey
G01 - MEASURING TESTING
Information
Patent Grant
Mirror unit and optical module
Patent number
11,879,731
Issue date
Jan 23, 2024
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Optomechanical inertial reference mirror for atom interferometer an...
Patent number
11,867,713
Issue date
Jan 9, 2024
Arizona Board of Regents on behalf of the University of Arizona
Felipe Guzmán
G01 - MEASURING TESTING
Information
Patent Grant
Optical module
Patent number
11,635,290
Issue date
Apr 25, 2023
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Optical device
Patent number
11,629,947
Issue date
Apr 18, 2023
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Mirror unit and optical module
Patent number
11,629,946
Issue date
Apr 18, 2023
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Mirror unit and optical module
Patent number
11,624,605
Issue date
Apr 11, 2023
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Compressed ultrafast imaging velocity interferometer system for any...
Patent number
11,313,668
Issue date
Apr 26, 2022
East China Normal University
Shi'an Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Self-mix module utilizing filters
Patent number
11,307,019
Issue date
Apr 19, 2022
Vixar, Inc.
Klein Johnson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical device
Patent number
11,187,579
Issue date
Nov 30, 2021
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Optical fibre sensor for measuring deformation, said sensor operati...
Patent number
11,099,005
Issue date
Aug 24, 2021
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Guy Cheymol
G01 - MEASURING TESTING
Information
Patent Grant
Optical module
Patent number
11,067,380
Issue date
Jul 20, 2021
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Optical filtering device including Fabry-Perot cavities and structu...
Patent number
10,895,674
Issue date
Jan 19, 2021
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Laurent Frey
G02 - OPTICS
Information
Patent Grant
Inspecting a multilayer sample
Patent number
10,890,434
Issue date
Jan 12, 2021
APPLEJACK 199 L.P.
Wojciech Jan Walecki
G01 - MEASURING TESTING
Information
Patent Grant
Light source failure identification in an optical metrology device
Patent number
10,775,149
Issue date
Sep 15, 2020
Onto Innovation Inc.
George Andrew Antonelli
G01 - MEASURING TESTING
Information
Patent Grant
Inspecting a multilayer sample
Patent number
10,655,949
Issue date
May 19, 2020
APPLEJACK 199 L.P.
Wojciech Jan Walecki
G01 - MEASURING TESTING
Information
Patent Grant
Optical filtering device including fabry-perot cavities comprising...
Patent number
10,571,612
Issue date
Feb 25, 2020
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Laurent Frey
G02 - OPTICS
Information
Patent Grant
Mirror plate for a fabry-perot interferometer and a fabry-perot int...
Patent number
10,495,514
Issue date
Dec 3, 2019
Teknologian tutkimuskeskus VTT Oy
Aapo Varpula
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Automatic calibration systems and methods of use
Patent number
10,206,585
Issue date
Feb 19, 2019
Volcano Corporation
Nathaniel Kemp
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Apparatus to reduce pressure and thermal sensitivity of high precis...
Patent number
10,209,057
Issue date
Feb 19, 2019
Baker Hughes, a GE company, LLC
Carl M. Edwards
E21 - EARTH DRILLING MINING
Information
Patent Grant
Optical coherence tomography laser with integrated clock
Patent number
10,184,783
Issue date
Jan 22, 2019
Axsun Technologies, Inc.
Dale C. Flanders
G01 - MEASURING TESTING
Information
Patent Grant
Inspecting a multilayer sample
Patent number
10,113,860
Issue date
Oct 30, 2018
APPLEJACK 199, L.P.
Wojciech Jan Walecki
G01 - MEASURING TESTING
Information
Patent Grant
Atomic interferometric accelerometer with enhanced vibrational stab...
Patent number
10,107,936
Issue date
Oct 23, 2018
Honeywell International Inc.
Robert Compton
G01 - MEASURING TESTING
Information
Patent Grant
Fiber-optic measurement system and methods based on ultra-short cav...
Patent number
10,101,202
Issue date
Oct 16, 2018
University of Maribor
Denis Donlagic
G01 - MEASURING TESTING
Information
Patent Grant
Airway adaptor with optical pressure transducer and method of maufa...
Patent number
10,086,163
Issue date
Oct 2, 2018
Koninklijke Philips N.V.
James T. Russell
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Patents Applications
last 30 patents
Information
Patent Application
MIRROR UNIT AND OPTICAL MODULE
Publication number
20250044074
Publication date
Feb 6, 2025
HAMAMATSU PHOTONICS K. K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
OPTICAL INTERFERENCE MEASUREMENT DEVICE
Publication number
20250035427
Publication date
Jan 30, 2025
Panasonic Intellectual Property Management Co., Ltd.
YASUHIRO KABETANI
G01 - MEASURING TESTING
Information
Patent Application
HIGH TEMPERATURE MOLD GAP MEASUREMENT USING OPTICAL FIBER INTERFERO...
Publication number
20250003735
Publication date
Jan 2, 2025
THE CURATORS OF THE UNIVERSITY OF MISSOURI
Jie Huang
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETER WITH ABSORBING LAYER
Publication number
20240175671
Publication date
May 30, 2024
Murata Manufacturing Co., Ltd.
Ville KAAJAKARI
G01 - MEASURING TESTING
Information
Patent Application
PHOTOLITHOGRAPHY MASK AND PHOTOLITHOGRAPHY SYSTEM COMPRISING SAID P...
Publication number
20240085776
Publication date
Mar 14, 2024
TECHNOLOGIES DIGITHO INC.
Richard BEAUDRY
G01 - MEASURING TESTING
Information
Patent Application
BROADBAND INTERFEROMETRY AND METHOD FOR MEASUREMENT RANGE EXTENSION...
Publication number
20230324165
Publication date
Oct 12, 2023
Automated Precision Inc.
Yongwoo PARK
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DEVICE
Publication number
20230221106
Publication date
Jul 13, 2023
HAMAMATSU PHOTONICS K. K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MINIATURE 3D POSITION-TO-OPTICAL DISPLACEMENT SENSOR
Publication number
20230160685
Publication date
May 25, 2023
THE CURATORS OF THE UNIVERSITY OF MISSOURI
Genda CHEN
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR MEASURING LASER DISPLACEMENT
Publication number
20230047877
Publication date
Feb 16, 2023
NATIONAL INSTITUTE OF METROLOGY, CHINA
Jianjun CUI
G01 - MEASURING TESTING
Information
Patent Application
MIRROR UNIT AND OPTICAL MODULE
Publication number
20230003504
Publication date
Jan 5, 2023
HAMAMATSU PHOTONICS K. K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
OPTOMECHNICAL INERTIAL REFERENCE MIRROR FOR ATOM INTERFEROMETER AND...
Publication number
20220163557
Publication date
May 26, 2022
Arizona Board of Regents on Behalf of the University of Arizona
Felipe Guzmán
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SYSTEMS AND METHODS FOR MEASURING TURBINE BLADE TIP CLEARANCE
Publication number
20220090582
Publication date
Mar 24, 2022
Parker-Hannifin Corporation
Lewis J. Boyd
G01 - MEASURING TESTING
Information
Patent Application
Interferometer Device and Method for Producing an Interferometer De...
Publication number
20220003534
Publication date
Jan 6, 2022
ROBERT BOSCH GmbH
Benedikt Stein
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and Methods for Determining the Position of a Target Stru...
Publication number
20210364936
Publication date
Nov 25, 2021
ASML NETHERLANDS B.V.
Nitesh PANDEY
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
SELF-MIX MODULE UTILIZING FILTERS
Publication number
20210223027
Publication date
Jul 22, 2021
Vixar, Inc.
Klein JOHNSON
G02 - OPTICS
Information
Patent Application
OPTICAL FIBRE SENSOR FOR MEASURING DEFORMATION, SAID SENSOR OPERATI...
Publication number
20210156673
Publication date
May 27, 2021
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Guy CHEYMOL
G01 - MEASURING TESTING
Information
Patent Application
IMPROVED SELF-MIX MODULE UTILIZING FILTERS
Publication number
20190331473
Publication date
Oct 31, 2019
VIXAR, LLC
Klein Johnson
G01 - MEASURING TESTING
Information
Patent Application
INSPECTING A MULTILAYER SAMPLE
Publication number
20190120611
Publication date
Apr 25, 2019
Applejack 199 L.P.
WOJCIECH JAN WALECKI
G01 - MEASURING TESTING
Information
Patent Application
INSPECTING A MULTILAYER SAMPLE
Publication number
20190094012
Publication date
Mar 28, 2019
Applejack 199 L.P.
Wojciech Jan WALECKI
G01 - MEASURING TESTING
Information
Patent Application
INSPECTING A MULTILAYER SAMPLE
Publication number
20180299255
Publication date
Oct 18, 2018
Applejack 199 L.P.
WOJCIECH JAN WALECKI
G01 - MEASURING TESTING
Information
Patent Application
Optical Coherence Tomography Laser with Integrated Clock
Publication number
20180051978
Publication date
Feb 22, 2018
Axsun Technologies, Inc.
Dale C. Flanders
G01 - MEASURING TESTING
Information
Patent Application
A MIRROR PLATE FOR A FABRY-PEROT INTERFEROMETER AND A FABRY-PEROT I...
Publication number
20180052049
Publication date
Feb 22, 2018
Teknologian Tutkimuskeskus VTT Oy
Aapo Varpula
G02 - OPTICS
Information
Patent Application
Methods and Apparatus for Swept-Source Optical Coherence Tomography
Publication number
20180003482
Publication date
Jan 4, 2018
LightLab Imaging, Inc.
Joseph M. Schmitt
G01 - MEASURING TESTING
Information
Patent Application
FIBER-OPTIC MEASUREMENT SYSTEM AND METHODS BASED ON ULTRA-SHORT CAV...
Publication number
20170336255
Publication date
Nov 23, 2017
University of Maribor
Denis Donlagic
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS TO REDUCE PRESSURE AND THERMAL SENSITIVITY OF HIGH PRECIS...
Publication number
20170082422
Publication date
Mar 23, 2017
BAKER HUGHES INCORPORATED
CARL M. EDWARDS
G01 - MEASURING TESTING
Information
Patent Application
Methods and Apparatus for Swept-Source Optical Coherence Tomography
Publication number
20150192405
Publication date
Jul 9, 2015
LightLab Imaging, Inc.
Joseph M. Schmitt
G01 - MEASURING TESTING
Information
Patent Application
Fabry-Perot interferometer and a method for producing the same
Publication number
20150124263
Publication date
May 7, 2015
TEKNOLOGIAN TUTKIMUSKESKUS VTT
Tapani Antila
G01 - MEASURING TESTING
Information
Patent Application
ACOUSTIC SIGNAL RECEIVING APPARATUS AND PHOTO-ACOUSTIC TOMOGRAPHY
Publication number
20140253927
Publication date
Sep 11, 2014
Takeshi Uchida
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR THE ABSOLUTE MEASUREMENT OF THE FLATNESS OF THE SURFACES...
Publication number
20140160491
Publication date
Jun 12, 2014
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENE. ALT.
Stephane Bouillet
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL FIBER SENSORS HAVING LONG ACTIVE LENGTHS, SYSTEMS, AND METHODS
Publication number
20140153865
Publication date
Jun 5, 2014
Denis Donlagic
G01 - MEASURING TESTING