Fault-finding or characterising

Industry

CPC
G01R31/2836

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2836Fault-finding or characterising

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for fault detection and reporting through seria...
- Patent number 12,169,218
- Issue date Dec 17, 2024
- Maxim Integrated Products, Inc.
- Ling Liu
- G01 - MEASURING TESTING
Information Patent Grant
Power source combination circuit, diagnosis method and apparatus, a...
- Patent number 12,160,134
- Issue date Dec 3, 2024
- Huawei Technologies Co., Ltd.
- Jia Cheng
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Fault tolerance decision-making method and system for sensor failur...
- Patent number 12,126,286
- Issue date Oct 22, 2024
- Zhejiang University of Science and Technology
- Zihui Wang
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Apparatus for detecting malfunction and method therefor
- Patent number 12,077,063
- Issue date Sep 3, 2024
- LG Innotek Co., Ltd
- Hyoung Dong Kim
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method and device for monitoring gate signal of power semiconductor
- Patent number 12,013,428
- Issue date Jun 18, 2024
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- G01 - MEASURING TESTING
Information Patent Grant
Diagnosis of mobile devices using built-in actuators and sensors
- Patent number 11,946,968
- Issue date Apr 2, 2024
- BLANCCO TECHNOLOGY GROUP IP OY
- Timo Sairiala
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for locating open circuit failure point of test structure
- Patent number 11,852,674
- Issue date Dec 26, 2023
- Shanghai Huali Microelectronics Corporation
- Cheng Wu
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Eye diagram capture test during production
- Patent number 11,828,787
- Issue date Nov 28, 2023
- Advantest Corporation
- Justin Treon
- G01 - MEASURING TESTING
Information Patent Grant
Display device and a testing method thereof
- Patent number 11,763,710
- Issue date Sep 19, 2023
- Samsung Display Co., Ltd.
- Kwang Sae Lee
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Scan apparatus capable of fault diagnosis and scan chain fault diag...
- Patent number 11,567,132
- Issue date Jan 31, 2023
- UIF (University Industry Foundation), Yonsei University
- Sungho Kang
- G01 - MEASURING TESTING
Information Patent Grant
Mismatch detection using replica circuit
- Patent number 11,519,956
- Issue date Dec 6, 2022
- pSemi Corporation
- Dan William Nobbe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Systems and methods for fault detection and reporting through seria...
- Patent number 11,422,182
- Issue date Aug 23, 2022
- Maxim Integrated Products, Inc.
- Ling Liu
- G01 - MEASURING TESTING
Information Patent Grant
Abnormality prompting method and intelligent socket
- Patent number 11,374,368
- Issue date Jun 28, 2022
- Gree Electric Appliances, Inc. of Zhuhai
- Dechao Song
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display device and a testing method thereof
- Patent number 11,341,875
- Issue date May 24, 2022
- Samsung Display Co., Ltd.
- Kwang Sae Lee
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Model driven estimation of faulted area in electric distribution sy...
- Patent number 11,289,942
- Issue date Mar 29, 2022
- Operation Technology Incorporated
- Mohammad Reza Dadash Zadeh
- G01 - MEASURING TESTING
Information Patent Grant
Probe device for improving transfer accuracy of needle traces of pr...
- Patent number 11,221,350
- Issue date Jan 11, 2022
- Tokyo Electron Limited
- Tomohiro Ota
- G01 - MEASURING TESTING
Information Patent Grant
IC dies with parallel PRBS testing of interposer
- Patent number 11,199,584
- Issue date Dec 14, 2021
- CREDO TECHNOLOGY GROUP LIMITED
- Calvin Xiong Fang
- G01 - MEASURING TESTING
Information Patent Grant
Detecting failure using multiple monitoring modules
- Patent number 11,181,560
- Issue date Nov 23, 2021
- Infineon Technologies AG
- Cristian Garbossa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for isolating high impedance fault in multi-tap electrica...
- Patent number 11,181,567
- Issue date Nov 23, 2021
- Electrical Materials Company
- Timothy M O'Regan
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Camera module inspector of rotating type distributing load of proce...
- Patent number 11,143,673
- Issue date Oct 12, 2021
- ISMedia Co., Ltd.
- Seong Cheol Hong
- G01 - MEASURING TESTING
Information Patent Grant
Thermal abnormality detection system and method
- Patent number 11,118,850
- Issue date Sep 14, 2021
- Delta Electronics, Inc.
- Lei-Chung Hsing
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Real time operational leakage current measurement for probe heater...
- Patent number 11,061,080
- Issue date Jul 13, 2021
- Rosemount Aerospace Inc.
- Magdi A. Essawy
- G01 - MEASURING TESTING
Information Patent Grant
Autonomous electric power fault detection, isolation and restoratio...
- Patent number 11,063,425
- Issue date Jul 13, 2021
- Southern States, LLC
- Jiyuan Fan
- G01 - MEASURING TESTING
Information Patent Grant
Circuit working state testing method and testing device
- Patent number 11,017,700
- Issue date May 25, 2021
- ORDOS YUANSHENG OPTOELECTRONICS CO., LTD.
- Haifeng Bi
- G01 - MEASURING TESTING
Information Patent Grant
Method and control system for fault direction detection
- Patent number 11,016,136
- Issue date May 25, 2021
- ABB Power Grids Switzerland AG
- Kai Liu
- G01 - MEASURING TESTING
Information Patent Grant
Self-test for a piezoelectric device
- Patent number 10,996,254
- Issue date May 4, 2021
- Honeywell International Inc.
- David Cada
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for verifying operation of air data probes
- Patent number 10,948,511
- Issue date Mar 16, 2021
- Honeywell International Inc.
- Grant Gordon
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method, inspection device, and marking forming method
- Patent number 10,923,404
- Issue date Feb 16, 2021
- Hamamatsu Photonics K.K.
- Shinsuke Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Direction-to-fault and zone-based distance-to-fault electric power...
- Patent number 10,923,907
- Issue date Feb 16, 2021
- Southern States, LLC
- Jiyuan Fan
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Detecting deterioration of an electrical circuit in an aggressive e...
- Patent number 10,884,054
- Issue date Jan 5, 2021
- Nokia of America Corporation
- Chen Xu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SHORT-CIRCUIT DETECTION DEVICE
- Publication number 20240421584
- Publication date Dec 19, 2024
- STMicroelectronics International N.V.
- Ghafour BENABDELAZIZ
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
APPARATUS FOR DETECTING MALFUNCTION AND METHOD THEREFOR
- Publication number 20240391351
- Publication date Nov 28, 2024
- LG Innotek Co., Ltd.
- Hyoung Dong KIM
- B60 - VEHICLES IN GENERAL
Information Patent Application
MODEL DRIVEN ESTIMATION OF FAULTED AREA IN ELECTRIC DISTRIBUTION SY...
- Publication number 20240348088
- Publication date Oct 17, 2024
- Operation Technology Inc.
- Mohammad Reza Dadash Zadeh
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
POSITIVE TEMPERATURE COEFFICIENT (PTC) HEATER HEALTH MONITORING SYSTEM
- Publication number 20240264220
- Publication date Aug 8, 2024
- GOODRICH CORPORATION
- Gururaja Bambila
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
DIAGNOSIS OF MOBILE DEVICES USING BUILT-IN ACTUATORS AND SENSORS
- Publication number 20240248130
- Publication date Jul 25, 2024
- Blancco Technology Group IP Oy
- Timo Sairiala
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR PERFORMING CRACK DETECTION OPER...
- Publication number 20240183896
- Publication date Jun 6, 2024
- SK HYNIX INC.
- Hyun Seung KIM
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DESIGNING FAULT DETECTION CIRCUIT
- Publication number 20230394206
- Publication date Dec 7, 2023
- Rohm Co., Ltd.
- Kazuya IOKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAULT TOLERANCE DECISION-MAKING METHOD AND SYSTEM FOR SENSOR FAILUR...
- Publication number 20230278366
- Publication date Sep 7, 2023
- Zhejiang University of Science and Technology
- Zihui WANG
- B60 - VEHICLES IN GENERAL
Information Patent Application
Method for Locating Open Circuit Failure Point of Test Structure
- Publication number 20230160951
- Publication date May 25, 2023
- SHANGHAI HUALI MICROELECTRONICS CORPORATION
- Cheng Wu
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY PANEL AND DISPLAY APPARATUS
- Publication number 20230044101
- Publication date Feb 9, 2023
- CHENGDU BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Linhong HAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Power Source Combination Circuit, Diagnosis Method and Apparatus, a...
- Publication number 20230015317
- Publication date Jan 19, 2023
- Huawei Technologies Co., Ltd
- Jia Cheng
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
METHOD FOR ANALYZING AN ELECTRICAL CIRCUIT
- Publication number 20220404413
- Publication date Dec 22, 2022
- ROBERT BOSCH GmbH
- Benedikt Stein
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR FAULT DETECTION AND REPORTING THROUGH SERIA...
- Publication number 20220390507
- Publication date Dec 8, 2022
- Maxim Integrated Products, Inc.
- Ling LIU
- G01 - MEASURING TESTING
Information Patent Application
MODEL DRIVEN ESTIMATION OF FAULTED AREA IN ELECTRIC DISTRIBUTION SY...
- Publication number 20220285983
- Publication date Sep 8, 2022
- Operation Technology Inc.
- Mohammad Reza Dadash Zadeh
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
DISPLAY DEVICE AND A TESTING METHOD THEREOF
- Publication number 20220262290
- Publication date Aug 18, 2022
- SAMSUNG DISPLAY CO., LTD.
- Kwang Sae Lee
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MONITORING GATE SIGNAL OF POWER SEMICONDUCTOR
- Publication number 20220091177
- Publication date Mar 24, 2022
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
APPARATUS FOR DETECTING MALFUNCTION AND METHOD THEREFOR
- Publication number 20220024344
- Publication date Jan 27, 2022
- LG Innotek Co., Ltd.
- Hyoung Dong KIM
- B60 - VEHICLES IN GENERAL
Information Patent Application
Diagnosis of Mobile Devices Using Built-In Actuators and Sensors
- Publication number 20220018895
- Publication date Jan 20, 2022
- Blancco Technology Group IP Oy
- Timo Sairiala
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEMS AND METHODS FOR FAULT DETECTION AND REPORTING THROUGH SERIA...
- Publication number 20210302488
- Publication date Sep 30, 2021
- Maxim Integrated Products, Inc.
- Ling LIU
- G01 - MEASURING TESTING
Information Patent Application
EYE DIAGRAM CAPTURE TEST DURING PRODUCTION
- Publication number 20210270888
- Publication date Sep 2, 2021
- Justin TREON
- G01 - MEASURING TESTING
Information Patent Application
TEST PATTERN GENERATING METHOD, TEST PATTERN GENERATING DEVICE AND...
- Publication number 20210132147
- Publication date May 6, 2021
- Realtek Semiconductor Corp.
- Ying-Yen Chen
- G01 - MEASURING TESTING
Information Patent Application
Mismatch Detection using Replica Circuit
- Publication number 20210048474
- Publication date Feb 18, 2021
- pSemi Corporation
- Dan William Nobbe
- G01 - MEASURING TESTING
Information Patent Application
IC Dies With Parallel PRBS Testing of Interposer
- Publication number 20200379044
- Publication date Dec 3, 2020
- CREDO TECHNOLOGY GROUP LIMITED
- Calvin Xiong FANG
- G01 - MEASURING TESTING
Information Patent Application
DETECTING FAILURE USING MULTIPLE MONITORING MODULES
- Publication number 20200363457
- Publication date Nov 19, 2020
- INFINEON TECHNOLOGIES AG
- Cristian Garbossa
- G01 - MEASURING TESTING
Information Patent Application
FAULT DETECTION IN ELECTRIC POWER DELIVERY SYSTEMS USING UNDERREACH...
- Publication number 20200350760
- Publication date Nov 5, 2020
- Schweitzer Engineering Laboratories, Inc.
- Edmund O. Schweitzer
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR ISOLATING HIGH IMPEDANCE FAULT IN MULTI-TAP ELECTRICA...
- Publication number 20200300905
- Publication date Sep 24, 2020
- Electrical Materials Company
- Timothy M O'REGAN
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
REAL TIME OPERATIONAL LEAKAGE CURRENT MEASUREMENT FOR PROBE HEATER...
- Publication number 20200191851
- Publication date Jun 18, 2020
- Rosemount Aerospace Inc.
- Magdi A. Essawy
- G01 - MEASURING TESTING
Information Patent Application
INTRALAYER CONDUCTIVE DEFECT DETECTION STRUCTURE
- Publication number 20200166566
- Publication date May 28, 2020
- QUALCOMM Incorporated
- Samit SENGUPTA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD, INSPECTION DEVICE, AND MARKING FORMING METHOD
- Publication number 20200152525
- Publication date May 14, 2020
- HAMAMATSU PHOTONICS K. K.
- Shinsuke SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Camera Module Inspector of Rotating Type Distributing Load of Proce...
- Publication number 20200141973
- Publication date May 7, 2020
- ISMEDIA CO., LTD.
- Seong Cheol Hong
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Fault-finding or characterising

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for fault detection and reporting through seria...

Power source combination circuit, diagnosis method and apparatus, a...

Fault tolerance decision-making method and system for sensor failur...

Apparatus for detecting malfunction and method therefor

Method and device for monitoring gate signal of power semiconductor

Diagnosis of mobile devices using built-in actuators and sensors

Method for locating open circuit failure point of test structure

Eye diagram capture test during production

Display device and a testing method thereof

Scan apparatus capable of fault diagnosis and scan chain fault diag...

Mismatch detection using replica circuit

Systems and methods for fault detection and reporting through seria...

Abnormality prompting method and intelligent socket

Display device and a testing method thereof

Model driven estimation of faulted area in electric distribution sy...

Probe device for improving transfer accuracy of needle traces of pr...

IC dies with parallel PRBS testing of interposer

Detecting failure using multiple monitoring modules

Apparatus for isolating high impedance fault in multi-tap electrica...

Camera module inspector of rotating type distributing load of proce...

Thermal abnormality detection system and method

Real time operational leakage current measurement for probe heater...

Autonomous electric power fault detection, isolation and restoratio...

Circuit working state testing method and testing device

Method and control system for fault direction detection

Self-test for a piezoelectric device

Apparatus and method for verifying operation of air data probes

Inspection method, inspection device, and marking forming method

Direction-to-fault and zone-based distance-to-fault electric power...

Detecting deterioration of an electrical circuit in an aggressive e...

Patents Applicationslast 30 patents

SHORT-CIRCUIT DETECTION DEVICE

APPARATUS FOR DETECTING MALFUNCTION AND METHOD THEREFOR

MODEL DRIVEN ESTIMATION OF FAULTED AREA IN ELECTRIC DISTRIBUTION SY...

POSITIVE TEMPERATURE COEFFICIENT (PTC) HEATER HEALTH MONITORING SYSTEM

DIAGNOSIS OF MOBILE DEVICES USING BUILT-IN ACTUATORS AND SENSORS

SEMICONDUCTOR DEVICE AND METHOD FOR PERFORMING CRACK DETECTION OPER...

METHOD FOR DESIGNING FAULT DETECTION CIRCUIT

FAULT TOLERANCE DECISION-MAKING METHOD AND SYSTEM FOR SENSOR FAILUR...

Method for Locating Open Circuit Failure Point of Test Structure

DISPLAY PANEL AND DISPLAY APPARATUS

Power Source Combination Circuit, Diagnosis Method and Apparatus, a...

METHOD FOR ANALYZING AN ELECTRICAL CIRCUIT

SYSTEMS AND METHODS FOR FAULT DETECTION AND REPORTING THROUGH SERIA...

MODEL DRIVEN ESTIMATION OF FAULTED AREA IN ELECTRIC DISTRIBUTION SY...

DISPLAY DEVICE AND A TESTING METHOD THEREOF

METHOD AND DEVICE FOR MONITORING GATE SIGNAL OF POWER SEMICONDUCTOR

APPARATUS FOR DETECTING MALFUNCTION AND METHOD THEREFOR

Diagnosis of Mobile Devices Using Built-In Actuators and Sensors

SYSTEMS AND METHODS FOR FAULT DETECTION AND REPORTING THROUGH SERIA...

EYE DIAGRAM CAPTURE TEST DURING PRODUCTION

TEST PATTERN GENERATING METHOD, TEST PATTERN GENERATING DEVICE AND...

Mismatch Detection using Replica Circuit

IC Dies With Parallel PRBS Testing of Interposer

DETECTING FAILURE USING MULTIPLE MONITORING MODULES

FAULT DETECTION IN ELECTRIC POWER DELIVERY SYSTEMS USING UNDERREACH...

APPARATUS FOR ISOLATING HIGH IMPEDANCE FAULT IN MULTI-TAP ELECTRICA...

REAL TIME OPERATIONAL LEAKAGE CURRENT MEASUREMENT FOR PROBE HEATER...

INTRALAYER CONDUCTIVE DEFECT DETECTION STRUCTURE

INSPECTION METHOD, INSPECTION DEVICE, AND MARKING FORMING METHOD

Camera Module Inspector of Rotating Type Distributing Load of Proce...