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G01B11/007

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

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Patents Grantslast 30 patents

Information Patent Grant
Transparent coating removal through laser ablation
- Patent number 12,194,569
- Issue date Jan 14, 2025
- Lockheed Martin Corporation
- Jeffrey P. Langevin
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe for three-dimensional coordinate measuring device, three-dime...
- Patent number 12,061,076
- Issue date Aug 13, 2024
- Keyence Corporation
- Yuji Miyaki
- G01 - MEASURING TESTING
Information Patent Grant
Configuration of a non-destructive testing device
- Patent number 11,898,835
- Issue date Feb 13, 2024
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Michel Cardoso
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic distance measurement equipment
- Patent number 11,874,099
- Issue date Jan 16, 2024
- SECOND BRIDGE INC.
- Dennis Palatov
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Coordinate measurement system with auxiliary axis
- Patent number 11,853,028
- Issue date Dec 26, 2023
- Faro Technologies, Inc.
- Kishore Lankalapalli
- G05 - CONTROLLING REGULATING
Information Patent Grant
Modular configuration for coordinate measuring machine probe
- Patent number 11,733,021
- Issue date Aug 22, 2023
- Mitutoyo Corporation
- Dawn Alisa Keehnel
- G01 - MEASURING TESTING
Information Patent Grant
Home security response using biometric and environmental observations
- Patent number 11,663,888
- Issue date May 30, 2023
- DISH Ukraine L.L.C.
- Zane Eaton
- G08 - SIGNALLING
Information Patent Grant
Method of calibrating a surface sensing device, corresponding calib...
- Patent number 11,650,050
- Issue date May 16, 2023
- Renishaw plc
- Martin Simon Rees
- G01 - MEASURING TESTING
Information Patent Grant
Articulating probe
- Patent number 11,543,230
- Issue date Jan 3, 2023
- Carl Zeiss Industrielle Messtechnik GmbH
- Dominik Seitz
- G01 - MEASURING TESTING
Information Patent Grant
Coordinate measuring machine with vision probe for performing point...
- Patent number 11,499,817
- Issue date Nov 15, 2022
- Mitutoyo Corporation
- Travis Matthew Eiles
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
MEMS tunable VCSEL powered swept source OCT for 3D metrology applic...
- Patent number 11,353,318
- Issue date Jun 7, 2022
- Thorlabs, Inc.
- James Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensor head
- Patent number 11,340,059
- Issue date May 24, 2022
- Omron Corporation
- Shinya Furukawa
- G01 - MEASURING TESTING
Information Patent Grant
Aligning components in relation to a coordinate measuring machine
- Patent number 11,274,913
- Issue date Mar 15, 2022
- Carl Zeiss Industrielle Messtechnik GmbH
- Jochen Mühlbacher
- G01 - MEASURING TESTING
Information Patent Grant
Multi-mode portable coordinate measuring machine
- Patent number 11,215,442
- Issue date Jan 4, 2022
- Hexagon Metrology, Inc.
- Paul Ferrari
- G01 - MEASURING TESTING
Information Patent Grant
Articulating probe head for measuring system
- Patent number 11,204,229
- Issue date Dec 21, 2021
- TESA SA
- Dikran Antreasyan
- G01 - MEASURING TESTING
Information Patent Grant
Rotating chromatic range sensor system with calibration object and...
- Patent number 11,187,521
- Issue date Nov 30, 2021
- Mitutoyo Corporation
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact probe and method of operation
- Patent number 11,105,607
- Issue date Aug 31, 2021
- Renishaw plc
- Nicholas John Weston
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Articulating measuring arm with laser scanner
- Patent number 11,029,142
- Issue date Jun 8, 2021
- Hexagon Metrology, Inc.
- Paul Ferrari
- G01 - MEASURING TESTING
Information Patent Grant
Home security response using biometric and environmental observations
- Patent number 11,022,422
- Issue date Jun 1, 2021
- DISH Ukraine L.L.C.
- Zane Eaton
- G01 - MEASURING TESTING
Information Patent Grant
Coordinate measurement system with auxiliary axis
- Patent number 10,969,760
- Issue date Apr 6, 2021
- Faro Technologies, Inc.
- Kishore Lankalapalli
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring features on workpieces
- Patent number 10,935,366
- Issue date Mar 2, 2021
- Werth Messtechnik GmbH
- Ralf Christoph
- G01 - MEASURING TESTING
Information Patent Grant
Inductive position detection configuration for indicating a measure...
- Patent number 10,914,570
- Issue date Feb 9, 2021
- Mitutoyo Corporation
- Christopher Richard Hamner
- G01 - MEASURING TESTING
Information Patent Grant
Coordinate measuring machine probe identification apparatus and method
- Patent number 10,907,949
- Issue date Feb 2, 2021
- Hexagon Metrology, Inc.
- Gurpreet Singh
- G01 - MEASURING TESTING
Information Patent Grant
MEMS tunable VCSEL powered swept source OCT for 3D metrology applic...
- Patent number 10,890,431
- Issue date Jan 12, 2021
- Thorlabs, Inc.
- James Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact measurement device configuration for integrating complex ci...
- Patent number 10,876,829
- Issue date Dec 29, 2020
- Mitutoyo Corporation
- Bernadette Baqui Qi
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring apparatus
- Patent number 10,852,128
- Issue date Dec 1, 2020
- Mitutoyo Corporation
- Masaoki Yamagata
- G01 - MEASURING TESTING
Information Patent Grant
Modular micro optics for optical probes
- Patent number 10,845,182
- Issue date Nov 24, 2020
- Hexagon Technology Center GmbH
- Alexandre Paduch
- G02 - OPTICS
Information Patent Grant
Optical sensor element for a measuring machine, and coupling elemen...
- Patent number 10,845,183
- Issue date Nov 24, 2020
- Hexagon Technology Center GmbH
- Thomas Jensen
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional coordinate measuring device
- Patent number 10,837,757
- Issue date Nov 17, 2020
- Keyence Corporation
- Masayasu Ikebuchi
- G01 - MEASURING TESTING
Information Patent Grant
Coordinate measuring apparatus with optical sensor and correspondin...
- Patent number 10,830,574
- Issue date Nov 10, 2020
- Klingelnberg AG
- Georg Mies
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
STYLUS FOR THREE-DIMENSIONAL SCANNING SYSTEM
- Publication number 20240200930
- Publication date Jun 20, 2024
- One Ortho
- Pierre VACHER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT SYSTEM
- Publication number 20240151518
- Publication date May 9, 2024
- DENSO WAVE INCORPORATED
- Shoji KATSURA
- G01 - MEASURING TESTING
Information Patent Application
COORDINATE MEASUREMENT SYSTEM WITH AUXILIARY AXIS
- Publication number 20240061393
- Publication date Feb 22, 2024
- FARO TECHNOLOGIES, INC.
- Kishore Lankalapalli
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD OF CALIBRATING A SURFACE SENSING DEVICE, CORRESPONDING CALIB...
- Publication number 20230236010
- Publication date Jul 27, 2023
- RENISHAW PLC
- Martin Simon REES
- G01 - MEASURING TESTING
Information Patent Application
COORDINATE MEASURING SYSTEM
- Publication number 20230194240
- Publication date Jun 22, 2023
- HEXAGON TECHNOLOGY CENTER GMBH
- Claudio ISELI
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASURING APPARATUS AND SHAPE MEASURING METHOD
- Publication number 20230194247
- Publication date Jun 22, 2023
- Hitachi, Ltd
- Masahiro WATANABE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODULAR CONFIGURATION FOR COORDINATE MEASURING MACHINE PROBE
- Publication number 20230194235
- Publication date Jun 22, 2023
- MITUTOYO CORPORATION
- Dawn Alisa KEEHNEL
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR THREE-DIMENSIONAL COORDINATE MEASURING DEVICE, THREE-DIME...
- Publication number 20220412721
- Publication date Dec 29, 2022
- KEYENCE CORPORATION
- Yuji MIYAKI
- G01 - MEASURING TESTING
Information Patent Application
Measuring Head for a Tactile Coordinate Measurement Device, Method...
- Publication number 20220397385
- Publication date Dec 15, 2022
- Hans-Georg Grün
- Hans-Georg Grün
- G01 - MEASURING TESTING
Information Patent Application
SENSOR HEAD
- Publication number 20220155053
- Publication date May 19, 2022
- Omron Corporation
- Shinya FURUKAWA
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURATION OF A NON-DESTRUCTIVE TESTING DEVICE
- Publication number 20210389119
- Publication date Dec 16, 2021
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Michel CARDOSO
- G01 - MEASURING TESTING
Information Patent Application
COORDINATE MEASURING MACHINE WITH VISION PROBE FOR PERFORMING POINT...
- Publication number 20210372769
- Publication date Dec 2, 2021
- MITUTOYO CORPORATION
- Travis Matthew Eiles
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ROTATING CHROMATIC RANGE SENSOR SYSTEM WITH CALIBRATION OBJECT AND...
- Publication number 20210333093
- Publication date Oct 28, 2021
- MITUTOYO CORPORATION
- Joseph Daniel Tobiason
- G01 - MEASURING TESTING
Information Patent Application
HOME SECURITY RESPONSE USING BIOMETRIC AND ENVIRONMENTAL OBSERVATIONS
- Publication number 20210247173
- Publication date Aug 12, 2021
- Dish UKRAINE L.L.C.
- Zane Eaton
- G01 - MEASURING TESTING
Information Patent Application
COORDINATE MEASUREMENT SYSTEM WITH AUXILIARY AXIS
- Publication number 20210165389
- Publication date Jun 3, 2021
- FARO TECHNOLOGIES, INC.
- Kishore Lankalapalli
- G01 - MEASURING TESTING
Information Patent Application
MEMS TUNABLE VCSEL POWERED SWEPT SOURCE OCT FOR 3D METROLOGY APPLIC...
- Publication number 20210102799
- Publication date Apr 8, 2021
- THORLABS, INC.
- James JIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DISTANCE MEASUREMENT EQUIPMENT
- Publication number 20210041223
- Publication date Feb 11, 2021
- SECOND BRIDGE INC.
- DENNIS PALATOV
- G01 - MEASURING TESTING
Information Patent Application
MULTI-MODE PORTABLE COORDINATE MEASURING MACHINE
- Publication number 20200386536
- Publication date Dec 10, 2020
- Hexagon Metrology, Inc.
- Paul Ferrari
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL COORDINATE MEASURING DEVICE
- Publication number 20200363188
- Publication date Nov 19, 2020
- KEYENCE CORPORATION
- Masayasu Ikebuchi
- G01 - MEASURING TESTING
Information Patent Application
Aligning Components in Relation to a Coordinate Measuring Machine
- Publication number 20200333125
- Publication date Oct 22, 2020
- Carl Zeiss Industrielle Messtechnik GmbH
- Jochen MÜHLBACHER
- G01 - MEASURING TESTING
Information Patent Application
ARTICULATING PROBE HEAD FOR MEASURING SYSTEM
- Publication number 20200191541
- Publication date Jun 18, 2020
- Tesa SA
- Dikran ANTREASYAN
- G01 - MEASURING TESTING
Information Patent Application
INDUCTIVE POSITION DETECTION CONFIGURATION FOR INDICATING A MEASURE...
- Publication number 20200141717
- Publication date May 7, 2020
- MITUTOYO CORPORATION
- Christopher Richard Hamner
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CALIBRATING A SURFACE SENSING DEVICE, CORRESPONDING CALIB...
- Publication number 20200132452
- Publication date Apr 30, 2020
- RENISHAW PLC
- Martin Simon REES
- G01 - MEASURING TESTING
Information Patent Application
HOME SECURITY RESPONSE USING BIOMETRIC AND ENVIRONMENTAL OBSERVATIONS
- Publication number 20200116468
- Publication date Apr 16, 2020
- Dish UKRAINE L.L.C.
- Zane Eaton
- G01 - MEASURING TESTING
Information Patent Application
MEMS TUNABLE VCSEL POWERED SWEPT SOURCE OCT FOR 3D METROLOGY APPLIC...
- Publication number 20200109938
- Publication date Apr 9, 2020
- THORLABS, INC.
- James JIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THREE-DIMENSIONAL COORDINATE MEASURING DEVICE
- Publication number 20200042161
- Publication date Feb 6, 2020
- KEYENCE CORPORATION
- Masayasu Ikebuchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL COORDINATE MEASURING DEVICE
- Publication number 20200041250
- Publication date Feb 6, 2020
- KEYENCE CORPORATION
- Masayasu IKEBUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING WORKPIECES
- Publication number 20190360795
- Publication date Nov 28, 2019
- WERTH MESSTECHNIK GMBH
- Ralf Christoph
- G01 - MEASURING TESTING
Information Patent Application
ARTICULATING MEASURING ARM WITH LASER SCANNER
- Publication number 20190323824
- Publication date Oct 24, 2019
- Hexagon Metrology, Inc.
- Paul Ferrari
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
COORDINATE MEASUREMENT SYSTEM WITH AUXILIARY AXIS
- Publication number 20190317470
- Publication date Oct 17, 2019
- FARO TECHNOLOGIES, INC.
- Kishore Lankalapalli
- G05 - CONTROLLING REGULATING

feeler heads therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Transparent coating removal through laser ablation

Probe for three-dimensional coordinate measuring device, three-dime...

Configuration of a non-destructive testing device

Electronic distance measurement equipment

Coordinate measurement system with auxiliary axis

Modular configuration for coordinate measuring machine probe

Home security response using biometric and environmental observations

Method of calibrating a surface sensing device, corresponding calib...

Articulating probe

Coordinate measuring machine with vision probe for performing point...

MEMS tunable VCSEL powered swept source OCT for 3D metrology applic...

Sensor head

Aligning components in relation to a coordinate measuring machine

Multi-mode portable coordinate measuring machine

Articulating probe head for measuring system

Rotating chromatic range sensor system with calibration object and...

Non-contact probe and method of operation

Articulating measuring arm with laser scanner

Home security response using biometric and environmental observations

Coordinate measurement system with auxiliary axis

Method and device for measuring features on workpieces

Inductive position detection configuration for indicating a measure...

Coordinate measuring machine probe identification apparatus and method

MEMS tunable VCSEL powered swept source OCT for 3D metrology applic...

Compact measurement device configuration for integrating complex ci...

Shape measuring apparatus

Modular micro optics for optical probes

Optical sensor element for a measuring machine, and coupling elemen...

Three-dimensional coordinate measuring device

Coordinate measuring apparatus with optical sensor and correspondin...

Patents Applicationslast 30 patents

STYLUS FOR THREE-DIMENSIONAL SCANNING SYSTEM

THREE-DIMENSIONAL MEASUREMENT SYSTEM

COORDINATE MEASUREMENT SYSTEM WITH AUXILIARY AXIS

METHOD OF CALIBRATING A SURFACE SENSING DEVICE, CORRESPONDING CALIB...

COORDINATE MEASURING SYSTEM

SHAPE MEASURING APPARATUS AND SHAPE MEASURING METHOD

MODULAR CONFIGURATION FOR COORDINATE MEASURING MACHINE PROBE

PROBE FOR THREE-DIMENSIONAL COORDINATE MEASURING DEVICE, THREE-DIME...

Measuring Head for a Tactile Coordinate Measurement Device, Method...

SENSOR HEAD

CONFIGURATION OF A NON-DESTRUCTIVE TESTING DEVICE

COORDINATE MEASURING MACHINE WITH VISION PROBE FOR PERFORMING POINT...

ROTATING CHROMATIC RANGE SENSOR SYSTEM WITH CALIBRATION OBJECT AND...

HOME SECURITY RESPONSE USING BIOMETRIC AND ENVIRONMENTAL OBSERVATIONS

COORDINATE MEASUREMENT SYSTEM WITH AUXILIARY AXIS

MEMS TUNABLE VCSEL POWERED SWEPT SOURCE OCT FOR 3D METROLOGY APPLIC...

ELECTRONIC DISTANCE MEASUREMENT EQUIPMENT

MULTI-MODE PORTABLE COORDINATE MEASURING MACHINE

THREE-DIMENSIONAL COORDINATE MEASURING DEVICE

Aligning Components in Relation to a Coordinate Measuring Machine

ARTICULATING PROBE HEAD FOR MEASURING SYSTEM

INDUCTIVE POSITION DETECTION CONFIGURATION FOR INDICATING A MEASURE...

METHOD OF CALIBRATING A SURFACE SENSING DEVICE, CORRESPONDING CALIB...

HOME SECURITY RESPONSE USING BIOMETRIC AND ENVIRONMENTAL OBSERVATIONS

MEMS TUNABLE VCSEL POWERED SWEPT SOURCE OCT FOR 3D METROLOGY APPLIC...

THREE-DIMENSIONAL COORDINATE MEASURING DEVICE

THREE-DIMENSIONAL COORDINATE MEASURING DEVICE

DEVICE AND METHOD FOR MEASURING WORKPIECES

ARTICULATING MEASURING ARM WITH LASER SCANNER

COORDINATE MEASUREMENT SYSTEM WITH AUXILIARY AXIS