field-effect magnetic sensors

Industry

CPC
G01R33/066

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R33/00Arrangements or instruments for measuring magnetic variables

Current Industry

G01R33/066field-effect magnetic sensors

Industries

Patents Grantslast 30 patents

Information Patent Grant
Silicon-based spin-qubit quantum magnetometer and radar system with...
- Patent number 11,894,475
- Issue date Feb 6, 2024
- Pierre Gandolfo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic circuit to communicate information as an electrical curr...
- Patent number 11,770,322
- Issue date Sep 26, 2023
- ALLEGRO MICROSYSTEMS, LLC
- Leandro Fuentes
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Frequency detection on sensor integrated circuits
- Patent number 11,686,783
- Issue date Jun 27, 2023
- ALLEGRO MICROSYSTEMS, LLC
- Jan Palascak
- G01 - MEASURING TESTING
Information Patent Grant
Isolated hall sensor structure
- Patent number 11,486,944
- Issue date Nov 1, 2022
- TDK-MICRONAS GMBH
- Maria-Cristina Vecchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for scanning artificial structure
- Patent number 11,175,354
- Issue date Nov 16, 2021
- National Central University
- Chien-Chih Chen
- E21 - EARTH DRILLING MINING
Information Patent Grant
GSR sensor element
- Patent number 11,156,676
- Issue date Oct 26, 2021
- Asahi Intecc Co., Ltd.
- Yoshinobu Honkura
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Angle sensor using eddy currents
- Patent number 11,112,230
- Issue date Sep 7, 2021
- ALLEGRO MICROSYSTEMS, LLC
- Alexander Latham
- G01 - MEASURING TESTING
Information Patent Grant
Spinning current method for MagFET-sensor
- Patent number 10,739,417
- Issue date Aug 11, 2020
- Infineon Technologies AG
- Udo Ausserlechner
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensor and apparatus for measuring magnetic field
- Patent number 10,466,313
- Issue date Nov 5, 2019
- Korea Research Institute of Standards and Science
- Wan-Seop Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a metal detection apparatus and metal detection...
- Patent number 10,444,174
- Issue date Oct 15, 2019
- Mettler-Toledo Safeline Ltd.
- Daren Butterworth
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz detector using field-effect transistor
- Patent number 10,211,511
- Issue date Feb 19, 2019
- UNIST (ULSAN NATIONAL INSTITUTE OF SCIENCE AND TECHNOLOGY)
- Kyung Rok Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for crossed-fins FinFET device for sensing and measuring ma...
- Patent number 9,964,605
- Issue date May 8, 2018
- GLOBALFOUNDRIES Inc.
- Min-hwa Chi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure for thermally assisted MRAM
- Patent number 9,917,247
- Issue date Mar 13, 2018
- International Business Machines Corporation
- Anthony J. Annunziata
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic sensors
- Patent number 9,702,958
- Issue date Jul 11, 2017
- NXP B.V.
- Victor Zieren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Differential lateral magnetic field sensor system with offset cance...
- Patent number 9,696,390
- Issue date Jul 4, 2017
- NXP B.V.
- Victor Zieren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure for thermally assisted MRAM
- Patent number 9,515,251
- Issue date Dec 6, 2016
- International Business Machines Corporation
- Anthony J. Annunziata
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuits and methods for processing signals generated by a pluralit...
- Patent number 9,285,438
- Issue date Mar 15, 2016
- Allegro Microsystems, LLC
- Mark J. Donovan
- G01 - MEASURING TESTING
Information Patent Grant
Vertical hall sensor with series-connected hall effect regions
- Patent number 9,285,439
- Issue date Mar 15, 2016
- Infineon Technologies AG
- Mario Motz
- G01 - MEASURING TESTING
Information Patent Grant
Hall sensor having serially connected hall elements
- Patent number 9,097,753
- Issue date Aug 4, 2015
- Micronas GmbH
- Roiy Raz
- G01 - MEASURING TESTING
Information Patent Grant
Vertical hall sensor with series-connected hall effect regions
- Patent number 8,981,504
- Issue date Mar 17, 2015
- Infineon Technologies AG
- Mario Motz
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor magnetic field sensors
- Patent number 8,981,442
- Issue date Mar 17, 2015
- NXP B.V.
- Victor Zieren
- G01 - MEASURING TESTING
Information Patent Grant
Field-effect magnetic sensor
- Patent number 8,659,104
- Issue date Feb 25, 2014
- NXP B.V.
- Gilberto Curatola
- G01 - MEASURING TESTING
Information Patent Grant
Hall effect device and method
- Patent number 7,782,050
- Issue date Aug 24, 2010
- Infineon Technologies AG
- Udo Ausserlechner
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor having vertical hall device and method for manufact...
- Patent number 7,253,490
- Issue date Aug 7, 2007
- Denso Corporation
- Satoshi Oohira
- G01 - MEASURING TESTING
Information Patent Grant
Method for making collector arrangement for magnetotransistor
- Patent number 5,393,678
- Issue date Feb 28, 1995
- Motorola, Inc.
- Ljubisa Ristic
- G01 - MEASURING TESTING
Information Patent Grant
Collector arrangement for magnetotransistor
- Patent number 5,323,050
- Issue date Jun 21, 1994
- Motorola, Inc.
- Ljubisa Ristic
- G01 - MEASURING TESTING
Information Patent Grant
Magnetically sensitive semiconductor device
- Patent number 5,099,298
- Issue date Mar 24, 1992
- Mitsubishi Petrochemical Company Ltd.
- Tetsuro Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Integrable Hall element
- Patent number 4,829,352
- Issue date May 9, 1989
- LGZ Landis & Gyr Zug AG
- Radivoje Popovic
- G01 - MEASURING TESTING
Information Patent Grant
Sensitive magnetotransistor magnetic field sensor
- Patent number 4,700,211
- Issue date Oct 13, 1987
- LGZ Landis & Gyr Zug AG
- Radivoje Popovic
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR MEASURING VISCOSITY
- Publication number 20240183766
- Publication date Jun 6, 2024
- QUANTUM BIOMETRONICS PRIVATE COMPANY
- Iannis KOMINIS
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR TESTING A CELL CONTACT OF BATTERY CELLS OF...
- Publication number 20230384388
- Publication date Nov 30, 2023
- Acculogic Inc.
- Bogdan PARASCHIV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICRO-FLUXGATE SENSOR
- Publication number 20220260652
- Publication date Aug 18, 2022
- NINGBO CRRC TIMES TRANSDUCER TECHNOLOGY CO., LTD.
- Juping LI
- G01 - MEASURING TESTING
Information Patent Application
ISOLATED HALL SENSOR STRUCTURE
- Publication number 20200393523
- Publication date Dec 17, 2020
- TDK - Micronas GmbH
- Maria-Cristina VECCHI
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for scanning artificial structure
- Publication number 20200110139
- Publication date Apr 9, 2020
- National Central University
- Chien-Chih CHEN
- E21 - EARTH DRILLING MINING
Information Patent Application
GSR SENSOR ELEMENT
- Publication number 20190302195
- Publication date Oct 3, 2019
- ASAHI INTECC CO., LTD.
- Yoshinobu HONKURA
- G01 - MEASURING TESTING
Information Patent Application
ANGLE SENSOR USING EDDY CURRENTS
- Publication number 20190265018
- Publication date Aug 29, 2019
- ALLEGRO MICROSYSTEMS, LLC
- Alexander Latham
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING A METAL DETECTION APPARATUS AND METAL DETECTION...
- Publication number 20180136152
- Publication date May 17, 2018
- Mettler-Toledo Safeline Ltd.
- Daren Butterworth
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR CROSSED-FINS FINFET DEVICE FOR SENSING AND MEASURING MA...
- Publication number 20170371002
- Publication date Dec 28, 2017
- GLOBALFOUNDRIES INC.
- Min-hwa CHI
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD SENSOR AND APPARATUS FOR MEASURING MAGNETIC FIELD
- Publication number 20170371003
- Publication date Dec 28, 2017
- Korea Research Institute of Standards and Science
- Wan-Seop KIM
- G01 - MEASURING TESTING
Information Patent Application
SPINNING CURRENT METHOD FOR MAGFET-SENSOR
- Publication number 20170343623
- Publication date Nov 30, 2017
- INFINEON TECHNOLOGIES AG
- Udo Ausserlechner
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD SENSOR
- Publication number 20160018477
- Publication date Jan 21, 2016
- AU OPTRONICS CORPORATION
- Tokuro OZAWA
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL LATERAL MAGNETIC FIELD SENSOR SYSTEM WITH OFFSET CANCE...
- Publication number 20160003923
- Publication date Jan 7, 2016
- NXP B.V.
- Victor Zieren
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MAGNETIC FIELD SENSORS
- Publication number 20140175528
- Publication date Jun 26, 2014
- NXP B.V.
- Victor Zieren
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL HALL SENSOR WITH SERIES-CONNECTED HALL EFFECT REGIONS
- Publication number 20130342194
- Publication date Dec 26, 2013
- INFINEON TECHNOLOGIES AG
- Mario Motz
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSORS
- Publication number 20130338956
- Publication date Dec 19, 2013
- NXP B.V.
- Victor Zieren
- G01 - MEASURING TESTING
Information Patent Application
Circuits and Methods for Processing Signals Generated by a Pluralit...
- Publication number 20130080087
- Publication date Mar 28, 2013
- ALLEGRO MICROSYSTEMS, INC.
- Mark J. Donovan
- G01 - MEASURING TESTING
Information Patent Application
HALL SENSOR
- Publication number 20130015853
- Publication date Jan 17, 2013
- Roiy Raz
- G01 - MEASURING TESTING
Information Patent Application
FIELD-EFFECT MAGNETIC SENSOR
- Publication number 20120154019
- Publication date Jun 21, 2012
- Gilberto Curatola
- G01 - MEASURING TESTING
Information Patent Application
HALL EFFECT DEVICE AND METHOD
- Publication number 20090256559
- Publication date Oct 15, 2009
- INFINEON TECHNOLOGIES AG
- Udo Ausserlechner
- G01 - MEASURING TESTING
Information Patent Application
Magnetic sensor having vertical hall device
- Publication number 20070267709
- Publication date Nov 22, 2007
- DENSO CORPORATION
- Satoshi Oohira
- G01 - MEASURING TESTING
Information Patent Application
Vertical Hall device and method for adjusting offset voltage of ver...
- Publication number 20060097715
- Publication date May 11, 2006
- DENSO CORPORATION
- Satoshi Oohira
- G01 - MEASURING TESTING
Information Patent Application
Magnetic sensor having vertical hall device and method for manufact...
- Publication number 20050230770
- Publication date Oct 20, 2005
- DENSO Corporation
- Satoshi Oohira
- G01 - MEASURING TESTING

field-effect magnetic sensors

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Silicon-based spin-qubit quantum magnetometer and radar system with...

Electronic circuit to communicate information as an electrical curr...

Frequency detection on sensor integrated circuits

Isolated hall sensor structure

Apparatus and method for scanning artificial structure

GSR sensor element

Angle sensor using eddy currents

Spinning current method for MagFET-sensor

Magnetic field sensor and apparatus for measuring magnetic field

Method for testing a metal detection apparatus and metal detection...

Terahertz detector using field-effect transistor

Methods for crossed-fins FinFET device for sensing and measuring ma...

Structure for thermally assisted MRAM

Magnetic sensors

Differential lateral magnetic field sensor system with offset cance...

Structure for thermally assisted MRAM

Circuits and methods for processing signals generated by a pluralit...

Vertical hall sensor with series-connected hall effect regions

Hall sensor having serially connected hall elements

Vertical hall sensor with series-connected hall effect regions

Semiconductor magnetic field sensors

Field-effect magnetic sensor

Hall effect device and method

Magnetic sensor having vertical hall device and method for manufact...

Method for making collector arrangement for magnetotransistor

Collector arrangement for magnetotransistor

Magnetically sensitive semiconductor device

Integrable Hall element

Sensitive magnetotransistor magnetic field sensor

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR MEASURING VISCOSITY

APPARATUS AND METHOD FOR TESTING A CELL CONTACT OF BATTERY CELLS OF...

MICRO-FLUXGATE SENSOR

ISOLATED HALL SENSOR STRUCTURE

Apparatus and method for scanning artificial structure

GSR SENSOR ELEMENT

ANGLE SENSOR USING EDDY CURRENTS

METHOD FOR TESTING A METAL DETECTION APPARATUS AND METAL DETECTION...

METHODS FOR CROSSED-FINS FINFET DEVICE FOR SENSING AND MEASURING MA...

MAGNETIC FIELD SENSOR AND APPARATUS FOR MEASURING MAGNETIC FIELD

SPINNING CURRENT METHOD FOR MAGFET-SENSOR

MAGNETIC FIELD SENSOR

DIFFERENTIAL LATERAL MAGNETIC FIELD SENSOR SYSTEM WITH OFFSET CANCE...

SEMICONDUCTOR MAGNETIC FIELD SENSORS

VERTICAL HALL SENSOR WITH SERIES-CONNECTED HALL EFFECT REGIONS

MAGNETIC SENSORS

Circuits and Methods for Processing Signals Generated by a Pluralit...

HALL SENSOR

FIELD-EFFECT MAGNETIC SENSOR

HALL EFFECT DEVICE AND METHOD

Magnetic sensor having vertical hall device

Vertical Hall device and method for adjusting offset voltage of ver...

Magnetic sensor having vertical hall device and method for manufact...