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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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G01J2003/1213Filters in general

Industries

Patents Grantslast 30 patents

Information Patent Grant
Focus plane equalizer apparatus with prismatic focus corrector
- Patent number 12,206,963
- Issue date Jan 21, 2025
- Urugus S.A.
- Gerardo Gabriel Richarte
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Concealment component for an optical sensor device
- Patent number 12,196,611
- Issue date Jan 14, 2025
- Viavi Solutions Inc.
- William D. Houck
- G01 - MEASURING TESTING
Information Patent Grant
Multi-order diffractive Fresnel lens (MOD-DFL) and systems that inc...
- Patent number 12,189,141
- Issue date Jan 7, 2025
- Arizona Board of Regents on behalf of the University of Arizona
- Thomas D. Milster
- G01 - MEASURING TESTING
Information Patent Grant
Optical filter and spectrometer
- Patent number 12,135,239
- Issue date Nov 5, 2024
- Viavi Solutions Inc.
- Paula Smith
- G02 - OPTICS
Information Patent Grant
In-situ infra-red and ultra-violet photometer
- Patent number 12,104,957
- Issue date Oct 1, 2024
- Protea Ltd
- Chris Daw
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for color indentification
- Patent number 12,104,958
- Issue date Oct 1, 2024
- Northeastern University
- Swastik Kar
- G01 - MEASURING TESTING
Information Patent Grant
Spectral reconstruction with multi-channel color sensors
- Patent number 12,098,952
- Issue date Sep 24, 2024
- ams Sensors Germany GmbH
- Gunter Siess
- G01 - MEASURING TESTING
Information Patent Grant
FTIR spectrometer with optical filter for low level gas detection s...
- Patent number 12,085,448
- Issue date Sep 10, 2024
- MLS ACQ, Inc
- Martin L. Spartz
- G01 - MEASURING TESTING
Information Patent Grant
Extraordinary IR-absorption in SiO2 thin films with a foreign or at...
- Patent number 12,085,504
- Issue date Sep 10, 2024
- Halliburton Energy Services, Inc.
- Jian Li
- E21 - EARTH DRILLING MINING
Information Patent Grant
Trace microanalysis microscope systems and methods
- Patent number 12,025,498
- Issue date Jul 2, 2024
- SPECTRICON IKE
- Konstantinos Balas
- G01 - MEASURING TESTING
Information Patent Grant
Systems, devices, and methods for time-resolved fluorescent spectro...
- Patent number 12,025,557
- Issue date Jul 2, 2024
- Black Light Surgical, Inc.
- Pramod Butte
- G01 - MEASURING TESTING
Information Patent Grant
On-chip temperature-insensitive read-out
- Patent number 12,018,984
- Issue date Jun 25, 2024
- Universiteit Gent
- Fabio Pavanello
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer and computer program
- Patent number 11,976,974
- Issue date May 7, 2024
- Seiko Epson Corporation
- Tsugio Gomi
- G01 - MEASURING TESTING
Information Patent Grant
Imaging device provided with light source that emits pulsed light a...
- Patent number 11,965,778
- Issue date Apr 23, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Toshiya Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for producing laminates, layers and coatings in...
- Patent number 11,945,189
- Issue date Apr 2, 2024
- Face International Corporation
- Clark D Boyd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spectrometer apparatus and a corresponding method for operating a s...
- Patent number 11,946,805
- Issue date Apr 2, 2024
- Robert Bosch GmbH
- Thomas Buck
- G01 - MEASURING TESTING
Information Patent Grant
Multi-spectral method for detection of anomalies during powder bed...
- Patent number 11,940,325
- Issue date Mar 26, 2024
- The Penn State Research Foundation
- Abdalla R. Nassar
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Systems and methods for producing objects incorporating selective e...
- Patent number 11,938,700
- Issue date Mar 26, 2024
- Face International Corporation
- Clark D Boyd
- G01 - MEASURING TESTING
Information Patent Grant
Spatially offset Raman probe with coaxial excitation and collection...
- Patent number 11,913,834
- Issue date Feb 27, 2024
- Endress+Hauser Optical Analysis, Inc.
- James M. Tedesco
- G01 - MEASURING TESTING
Information Patent Grant
Compact detection module for flow cytometers
- Patent number 11,913,868
- Issue date Feb 27, 2024
- Cytek Biosciences, Inc.
- Ming Yan
- G01 - MEASURING TESTING
Information Patent Grant
Field spectral radiometers including calibration assemblies
- Patent number 11,885,671
- Issue date Jan 30, 2024
- Labsphere, Inc.
- Jeffrey William Holt
- G01 - MEASURING TESTING
Information Patent Grant
Miniaturized spectrometers on transparent substrates
- Patent number 11,877,845
- Issue date Jan 23, 2024
- Brigham Young University
- Robert Davis
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical device comprising wavelength-selective optical filter inclu...
- Patent number 11,879,779
- Issue date Jan 23, 2024
- 3M Innovative Properties Company
- John A. Wheatley
- G02 - OPTICS
Information Patent Grant
Signal collection spectrometer
- Patent number 11,852,529
- Issue date Dec 26, 2023
- Huawei Technologies Co., Ltd.
- Moti Margalit
- G01 - MEASURING TESTING
Information Patent Grant
Optical filter, light detecting device, and light detecting system
- Patent number 11,852,534
- Issue date Dec 26, 2023
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yasuhisa Inada
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Sensor array spectrometer
- Patent number 11,802,795
- Issue date Oct 31, 2023
- 3M Innovative Properties Company
- John A. Wheatley
- G01 - MEASURING TESTING
Information Patent Grant
Technique for determining presence of a species in a sample
- Patent number 11,802,792
- Issue date Oct 31, 2023
- 3M Innovative Properties Company
- John A. Wheatley
- G01 - MEASURING TESTING
Information Patent Grant
Pulsed illumination in a hyperspectral, fluorescence and laser mapp...
- Patent number 11,747,479
- Issue date Sep 5, 2023
- Cilag GmbH International
- Joshua D. Talbert
- G01 - MEASURING TESTING
Information Patent Grant
Gas imaging system
- Patent number 11,733,158
- Issue date Aug 22, 2023
- Rebellion Photonics, Inc.
- Robert Timothy Kester
- G01 - MEASURING TESTING
Information Patent Grant
Pulsed illumination in a fluorescence imaging system
- Patent number 11,686,847
- Issue date Jun 27, 2023
- Cilag GmbH International
- Joshua D. Talbert
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL FILTER AND SPECTROMETER
- Publication number 20250052610
- Publication date Feb 13, 2025
- VIAVI SOLUTIONS INC.
- Paula SMITH
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DETECTION DEVICE, SYSTEM, AND METHOD FOR OMNIDIRECTIONAL PH...
- Publication number 20240426659
- Publication date Dec 26, 2024
- Agency for Science, Technology and Research
- Ee Jin Teo
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTABLE IMAGING SYSTEM, DEVICE AND METHOD
- Publication number 20240426658
- Publication date Dec 26, 2024
- Urugus S.A.
- Nicola Palombo Blascetta
- G01 - MEASURING TESTING
Information Patent Application
IN-SITU INFRA-RED ULTRA-VIOLET PHOTOMETER
- Publication number 20240402014
- Publication date Dec 5, 2024
- Protea Ltd
- Chris Daw
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR QUANTUM ABSORPTION SPECTROSCOPY
- Publication number 20240385043
- Publication date Nov 21, 2024
- KYOTO UNIVERSITY
- Shigeki TAKEUCHI
- G01 - MEASURING TESTING
Information Patent Application
LIGHT DETECTION SYSTEM AND VOLTAGE DETERMINATION METHOD
- Publication number 20240369410
- Publication date Nov 7, 2024
- Hamamatsu Photonics K.K.
- Takashi KASAHARA
- G01 - MEASURING TESTING
Information Patent Application
Fluorescence Imaging Probe and Handheld Imaging Prober
- Publication number 20240272001
- Publication date Aug 15, 2024
- NANJING NUOYUAN MEDICAL DEVICES CO., LTD
- Huiming CAI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR PRODUCING LAMINATES, LAYERS AND COATINGS IN...
- Publication number 20240246320
- Publication date Jul 25, 2024
- FACE INTERNATIONAL CORPORATION
- Clark D. Boyd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WIDE-FIELD SPECTRAL IMAGING SYSTEM
- Publication number 20240230406
- Publication date Jul 11, 2024
- National Central University
- Fan-Ching Chien
- G01 - MEASURING TESTING
Information Patent Application
System and method for illumination source identification
- Publication number 20240219232
- Publication date Jul 4, 2024
- Jacov Tutavac
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR PRODUCING OBJECTS INCORPORATING SELECTIVE E...
- Publication number 20240217213
- Publication date Jul 4, 2024
- FACE INTERNATIONAL CORPORATION
- Clark D. Boyd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
A SPECTRAL SENSING SYSTEM
- Publication number 20240183712
- Publication date Jun 6, 2024
- Technische Universiteit Eindhoven
- Andrea FIORE
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT SPECTROMETER
- Publication number 20240142303
- Publication date May 2, 2024
- Agency for Science, Technology and Research
- Anmin KONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPACT HOLOGRAPHIC SLM SPECTROMETER
- Publication number 20240077356
- Publication date Mar 7, 2024
- ORTA DOGU TEKNIK UNIVERSITESI
- Emre YUCE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FILTER, LIGHT DETECTING DEVICE, AND LIGHT DETECTING SYSTEM
- Publication number 20240077359
- Publication date Mar 7, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- YASUHISA INADA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DETECTION AND IDENTIFICATION OF BODY FLUID TRACES WITH STAND-OFF RA...
- Publication number 20240053200
- Publication date Feb 15, 2024
- The Research Foundation for the State University of New York
- Igor Lednev
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC UNIT AND SPECTROSCOPIC MODULE
- Publication number 20240035888
- Publication date Feb 1, 2024
- Hamamatsu Photonics K.K.
- Kei TABATA
- G01 - MEASURING TESTING
Information Patent Application
VERY HIGH RESOLUTION SPECTROMETER FOR MONITORING OF SEMICONDUCTOR P...
- Publication number 20240019302
- Publication date Jan 18, 2024
- Verity Instruments, Inc.
- Andrew Weeks Kueny
- G01 - MEASURING TESTING
Information Patent Application
PULSED ILLUMINATION IN A HYPERSPECTRAL, FLUORESCENCE AND LASER MAPP...
- Publication number 20230417917
- Publication date Dec 28, 2023
- Cilag GMBH International
- Joshua D. Talbert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL DETECTOR AND METHOD FOR DETERMINING AT LEAST ONE PROPERTY O...
- Publication number 20230393061
- Publication date Dec 7, 2023
- trinamiX GmbH
- Henning ZIMMERMANN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSING MODULE
- Publication number 20230375525
- Publication date Nov 23, 2023
- ROCKLEY PHOTONICS LIMITED
- Sean Merritt
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
CONCEALMENT COMPONENT FOR AN OPTICAL SENSOR DEVICE
- Publication number 20230314213
- Publication date Oct 5, 2023
- VIAVI Solutions Inc.
- William D. HOUCK
- G02 - OPTICS
Information Patent Application
SPECTRAL SENSOR SYSTEM WITH SPATIALLY MODIFIED CENTER WAVELENGTHS
- Publication number 20230280210
- Publication date Sep 7, 2023
- SPECTRICITY
- Jonathan Borremans
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER-LESS SAMPLE ANALYSIS SYSTEM AND METHOD USING HIGH WAVE...
- Publication number 20230266170
- Publication date Aug 24, 2023
- CytoVeris Inc.
- Alan Kersey
- G01 - MEASURING TESTING
Information Patent Application
MULTICHANNEL COLOR SENSOR
- Publication number 20230184589
- Publication date Jun 15, 2023
- ams Sensors Germany GmbH
- Gunter SIESS
- G01 - MEASURING TESTING
Information Patent Application
DETECTING DEVICE AND MEASURING DEVICE
- Publication number 20230133711
- Publication date May 4, 2023
- SEIKO EPSON CORPORATION
- Takefumi FUKAGAWA
- G01 - MEASURING TESTING
Information Patent Application
SPATIALLY OFFSET RAMAN PROBE WITH COAXIAL EXCITATION AND COLLECTION...
- Publication number 20230048375
- Publication date Feb 16, 2023
- KAISER OPTICAL SYSTEMS INC.
- James M. Tedesco
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ILLUMINATION AND SYSTEM FOR DETERMINING SPECTRAL DISTRIB...
- Publication number 20230003662
- Publication date Jan 5, 2023
- NALUX CO., LTD.
- Michitomo ISHII
- G01 - MEASURING TESTING
Information Patent Application
Device and Method for Color Indentification
- Publication number 20220412804
- Publication date Dec 29, 2022
- Northeastern University
- Swastik KAR
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP TEMPERATURE-INSENSITIVE READ-OUT
- Publication number 20220390280
- Publication date Dec 8, 2022
- Universiteit Gent
- Fabio PAVANELLO
- G01 - MEASURING TESTING

Filters in general

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Focus plane equalizer apparatus with prismatic focus corrector

Concealment component for an optical sensor device

Multi-order diffractive Fresnel lens (MOD-DFL) and systems that inc...

Optical filter and spectrometer

In-situ infra-red and ultra-violet photometer

Device and method for color indentification

Spectral reconstruction with multi-channel color sensors

FTIR spectrometer with optical filter for low level gas detection s...

Extraordinary IR-absorption in SiO2 thin films with a foreign or at...

Trace microanalysis microscope systems and methods

Systems, devices, and methods for time-resolved fluorescent spectro...

On-chip temperature-insensitive read-out

Spectrometer and computer program

Imaging device provided with light source that emits pulsed light a...

Systems and methods for producing laminates, layers and coatings in...

Spectrometer apparatus and a corresponding method for operating a s...

Multi-spectral method for detection of anomalies during powder bed...

Systems and methods for producing objects incorporating selective e...

Spatially offset Raman probe with coaxial excitation and collection...

Compact detection module for flow cytometers

Field spectral radiometers including calibration assemblies

Miniaturized spectrometers on transparent substrates

Optical device comprising wavelength-selective optical filter inclu...

Signal collection spectrometer

Optical filter, light detecting device, and light detecting system

Sensor array spectrometer

Technique for determining presence of a species in a sample

Pulsed illumination in a hyperspectral, fluorescence and laser mapp...

Gas imaging system

Pulsed illumination in a fluorescence imaging system

Patents Applicationslast 30 patents

OPTICAL FILTER AND SPECTROMETER

OPTICAL DETECTION DEVICE, SYSTEM, AND METHOD FOR OMNIDIRECTIONAL PH...

ADJUSTABLE IMAGING SYSTEM, DEVICE AND METHOD

IN-SITU INFRA-RED ULTRA-VIOLET PHOTOMETER

SYSTEM AND METHOD FOR QUANTUM ABSORPTION SPECTROSCOPY

LIGHT DETECTION SYSTEM AND VOLTAGE DETERMINATION METHOD

Fluorescence Imaging Probe and Handheld Imaging Prober

SYSTEMS AND METHODS FOR PRODUCING LAMINATES, LAYERS AND COATINGS IN...

WIDE-FIELD SPECTRAL IMAGING SYSTEM

System and method for illumination source identification

SYSTEMS AND METHODS FOR PRODUCING OBJECTS INCORPORATING SELECTIVE E...

A SPECTRAL SENSING SYSTEM

INTEGRATED CIRCUIT SPECTROMETER

COMPACT HOLOGRAPHIC SLM SPECTROMETER

OPTICAL FILTER, LIGHT DETECTING DEVICE, AND LIGHT DETECTING SYSTEM

DETECTION AND IDENTIFICATION OF BODY FLUID TRACES WITH STAND-OFF RA...

SPECTROSCOPIC UNIT AND SPECTROSCOPIC MODULE

VERY HIGH RESOLUTION SPECTROMETER FOR MONITORING OF SEMICONDUCTOR P...

PULSED ILLUMINATION IN A HYPERSPECTRAL, FLUORESCENCE AND LASER MAPP...

OPTICAL DETECTOR AND METHOD FOR DETERMINING AT LEAST ONE PROPERTY O...

OPTICAL SENSING MODULE

CONCEALMENT COMPONENT FOR AN OPTICAL SENSOR DEVICE

SPECTRAL SENSOR SYSTEM WITH SPATIALLY MODIFIED CENTER WAVELENGTHS

SPECTROMETER-LESS SAMPLE ANALYSIS SYSTEM AND METHOD USING HIGH WAVE...

MULTICHANNEL COLOR SENSOR

DETECTING DEVICE AND MEASURING DEVICE

SPATIALLY OFFSET RAMAN PROBE WITH COAXIAL EXCITATION AND COLLECTION...

METHOD FOR ILLUMINATION AND SYSTEM FOR DETERMINING SPECTRAL DISTRIB...

Device and Method for Color Indentification

ON-CHIP TEMPERATURE-INSENSITIVE READ-OUT