The invention relates to a compact holographic spectrometer without any optical diffraction elements. The invention performs the basic spectrometer function using only one spatial light modulator (SLM).
The conventional spectrometer designs include an optical material known as a prism or diffraction grating, which serves to separate light into its spectrum. These two optical materials separate the incident light at different angles according to the wavelength, allowing different colors or frequencies to be observed on the display or detector in the output environment. Spectrometers containing prisms are more preferred and used more widely than spectrometers containing diffraction gratings due to their advantages such as being more efficient in light transmittance. A mechanical rotational motion is needed to measure the light spectrum in such conventional spectrometers. It is ensured that the whole spectrum dispersed at different angles is measured by rotating the diffraction optical element or the detector. However, since this mechanical movement will create vibration in the system, it affects resolution, reliability, stability and effective use of incident light. There is also a spectrometer system in which mechanical motion is eliminated by using a spatial light modulator (SLM) in addition to the diffraction element.
By activating certain small parts of a SLM placed after a diffractive optical element and keeping the other parts closed, only the light falling on the active area is ensured to fall on the detector by passing through or reflecting from the SLM in the state of the art. Different spectral lines of the light, which is separated into the spectrum after the diffraction element, are selected as the active region on the SLM is changed, and the remaining parts of the spectrum are absorbed by the inactivated regions of the SLM or reflected to a region outside the detector. Thus, it is possible to scan the entire spectrum by changing the active region of the SLM. One of the biggest disadvantages of this system is that the SLM surface must be large enough in order to observe the entire spectrum. Otherwise, the resolution or the use of all incident light must be waived. In addition, it causes loss in the amount of light and does not work at low light intensities because only a certain part of the SLM surface is used and only the light in this active region is directed to the detector.
The present invention relates to a compact holographic SLM spectrometer in order to eliminate the above-mentioned disadvantages and to bring new advantages to the related technical field.
The object of the invention is to develop a spectrometer with a holographic method. The small number of optical elements to be used in the spectrometer system will reduce the cost and the production time, as well as presenting a less space-consuming, more compact, more portable design.
The invention does not require any diffraction optical elements (prism, diffraction grating, etc.) in its design unlike the current spectrometers. The invention presents a holographic-based spectrometer that occupies less space and increases signal-to-noise ratio and resolution using the entire SLM surface.
The figures used to better explain the compact holographic SLM spectrometer developed by this invention are as follows.
The parts and components in the compact holographic SLM spectrometer developed by this invention are individually numbered and are given below.
The innovation subject to the invention is explained with examples that do not have any limiting effect only for a better understanding of the subject in this detailed description.
The said invention can be used in sectors and applications such as medical sector (diagnosis, analysis, etc.), food sector (purity and validation measurements of foods), research and development laboratories, paint sector (determination of true colors), photography (determination of true color tone), screen technologies (LCD, etc. for screens to give the true color tone), communication (color selection in communication channel), security (hazardous material detection, etc.).
Spectrometers are devices or systems used to separate light sources into their spectrums. Information about how much light intensity the light source has at which wavelength (or at which frequency) can be analyzed in this way. Such analysis, which expresses the wavelength dependency of light intensity, is called spectrometer analysis.
The light source may be used before or after the material when the spectrometer system is used for material characterization. When it is used before the material, the developed invention acts as a frequency selector and measures the response of the material to the selected color by illuminating the material in the desired color. When the spectrometer is used after the material, the material is illuminated with all colors and the passing colors are analyzed one by one through the spectrometer, and again, the response of the material to the color of the light is determined.
Conventional spectrometers use diffraction optical elements, called prisms or diffraction gratings, to decompose the incident light into its spectrum. Both types of equipment allow the light falling on them to exit at different angles for different wavelengths. Intensity analysis depending on the wavelength of the light is performed with the help of a detector to be placed on the system output. However, it is necessary to rotate the diffraction element or the detector, that is, to create a mechanical motion in the system, to observe the entire spectrum since the light emitted from the diffraction elements in conventional spectrometers will be diffracted at different angles at different wavelengths. However, mechanical movements create great disadvantages in conventional spectrometer systems as they disrupt the stability, stagnation and sensitivity of the system and reduce the efficiency and service life of the system for similar reasons.
For all these reasons, instead of conventional spectrometers, new spectrometer systems are developed that aim to overcome the problems by incorporating more up-to-date and technological innovations. The present invention is a spatial light modulator (SLM) based spectrometer that completely eliminates the diffraction optical element in the spectrometer system.
SLMs are modulators in which the total area on them or regionally separated parts can be permanently or dynamically programmed with the help of a computer. An SLM may be a magneto-optical modulator, or a set of liquid crystal displays (LCD) in which the directions of the liquid crystals are changed with the help of the applied external voltage, or a set of micro mirrors (DMD) that can be rotated in two different directions with the help of micro-electro-mechanical systems. SLMs are devices that reflect or pass the light falling on them by modulating the wavefront. The developed SLM-based spectrometers allow spectrum observation by falling the light, which has been separated into its spectrum in space after a dispersive medium, on the detector in a certain order. Spectrometers developed with this approach require a dispersive environment similar to conventional spectrometers.
The holographic method is used in this invention. The holographic method used eliminates the need to use diffraction optical elements. The invention performs the basic spectrometer function using only one SLM. The image is recorded with the help of a detector placed (depending on SLM's working principle) in the reflection or transition direction of the used SLM by falling light onto it. The SLM is programmed separately for each wavelength and the optimized phase pattern of that wavelength (the SLM pattern that will form the focus in the detector for that wavelength) is determined and saved. The resulting spectrometer has a high resolution since the sharpness of the focus on the detector can be precisely adjusted by the SLM (in proportion to the number of pixels to be used) in such a system. A data set is obtained regarding which SLM pattern is written for each different wavelength when the process is completed. Then, when this SLM is added to the spectrometer system without any diffraction optical element and any pattern in the existing data set is chosen and written on the SLM, the intensity of the wavelength associated with that pattern can be measured on the detector. Different patterns are written on the SLM to observe different wavelengths on the detector, and thus, a basic spectrometer is built by obtaining the intensity variation depending on the wavelength. Which wavelength of the light is passed or reflected when an SLM pattern is written on the SLM used in the system can be pre-programmed or it can be dynamically changed during the experiments depending on the spectrometer design. In addition, the system provides the opportunity to measure at low light intensities since a much greater part of the light will pass through the system and fall on the detector unlike existing systems.
Similarly, a certain amount of radiation incident on the first modulation zone (20a) of the spatial light modulator (20) is modulated differently and sent as a radiation reflected from the open micromirror (145). The radiation reflected from the open micromirror (145) is sent to the optical mirror (24e) with the help of the focusing optical element (24a). The radiation reflected from the optical mirror (24e) passes through the focusing optical element (24a) again and is falled onto the second modulation zone (20b) of the spatial light modulator (20). The radiation reflected from the second modulation zone (20b) reaches the detector (28) with the help of the focusing optical element (24a).
Here, a phase difference can be created between the two parts of the radiation reaching the detector (28) by changing the positions of the left or right optical mirror (24e) and the collimator (16) with the help of digital and analog control devices. The same phase difference can be created by selecting the focusing optical element (24a) and/or the optical mirror (24e) to have a piezoelectric structure or a piezoelectric system may be added to these elements.
There may be no need for a collimator (16) in compact designs and the incident radiation (10) may be falled directly onto the first modulation zone (20a) of the spatial light modulator (20). The focusing optical element (24a) may not be required in cases where the light intensity is sufficient. The collimator (16), focusing optical element (24a) and optical mirror (24e) may be any reflective or transparent surface made of optical spherical mirror, reflector system, crystal, metallic, semiconductor, insulating or ceramic material. The detector (28) may be a camera, photodiode, photomultiplier tube, bolometer, piezoelectric detector, avalanche detector.
The spatial light modulator (20) can be positioned flat or angled to the system in the above description.
The light source has a visible region wavelength in one embodiment of the invention.
The light source has an infrared or larger wavelength in one embodiment of the invention.
The light source has an ultraviolet or smaller wavelength in one embodiment of the invention.
The analysis and detection optics (24) may include multiple elements of the same or different type in alternative embodiments of the invention.
The analysis and detection optics (24) is a focusing optical element (24a) in one embodiment of the invention, and this focusing optical element (24a) may be a plano convex lens, biconvex lens or convex meniscus.
The analysis and detection optics (24) is a filter (24c) in one embodiment of the invention.
The detector (28) may be a camera or photodiode or photomultiplier tube or bolometer or a piezoelectric or avalanche detector in alternative embodiments of the invention.
The control device (30) includes at least one optical element in one embodiment of the invention.
The analog control device (30) is optical sensor or optical amplifier or optical diffuser or sensor electronics or power control electronics or control electronics or data converter electronics or data processing electronics in alternative embodiments of the invention.
Number | Date | Country | Kind |
---|---|---|---|
2020/22701 | Dec 2020 | TR | national |
This application is the national phase entry of International Application No. PCT/TR2021/051613, filed on Dec. 30, 2021, which is based upon and claims priority to Turkish Patent Application No. 2020/22701, filed on Dec. 31, 2020, the entire contents of which are incorporated herein by reference.
Filing Document | Filing Date | Country | Kind |
---|---|---|---|
PCT/TR2021/051613 | 12/30/2021 | WO |