flaws, defects

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CPC
G01N2223/646

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/646flaws, defects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Handheld inspection device and method of inspecting an infrastructu...
- Patent number 12,259,342
- Issue date Mar 25, 2025
- Inversa Systems LTD.
- Peter Marc Cabot
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus
- Patent number 12,222,301
- Issue date Feb 11, 2025
- ISHIDA CO., LTD.
- Ken Iwakawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system for quality analysis of a product to be inspected
- Patent number 12,222,296
- Issue date Feb 11, 2025
- Multiscan Technologies, S.L.
- Simon Hendrik E. Van Olmen
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting fused plastic pipes
- Patent number 12,203,873
- Issue date Jan 21, 2025
- WorldWide Nondestructive Testing, Inc.
- Kevin P. Bohne
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Structure information acquisition method and structure information...
- Patent number 12,196,690
- Issue date Jan 14, 2025
- Rigaku Corporation
- Masashi Kageyama
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for inspecting a structure across a cover layer c...
- Patent number 12,188,884
- Issue date Jan 7, 2025
- Inversa Systems LTD.
- Peter Marc Cabot
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation device
- Patent number 12,188,885
- Issue date Jan 7, 2025
- Kioxia Corporation
- Takehiro Nakai
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting defects of structure by using X-ray
- Patent number 12,181,426
- Issue date Dec 31, 2024
- NEUF Inc.
- Myoung Chan Na
- G01 - MEASURING TESTING
Information Patent Grant
Utilize machine learning in selecting high quality averaged SEM ima...
- Patent number 12,182,983
- Issue date Dec 31, 2024
- ASML Netherlands B.V.
- Chen Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for estimating the occurrence of defects, and computer-reada...
- Patent number 12,111,272
- Issue date Oct 8, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system, determination processing apparatus, and inspecti...
- Patent number 12,105,033
- Issue date Oct 1, 2024
- JGC CORPORATION
- Teruaki Sano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radio-opaque fillers in multiple layers of golf balls
- Patent number 12,090,371
- Issue date Sep 17, 2024
- Topgolf Callaway Brands Corp.
- Julie Caterina
- G01 - MEASURING TESTING
Information Patent Grant
Estimating heights of defects in a wafer by scaling a 3D model usin...
- Patent number 12,057,336
- Issue date Aug 6, 2024
- Samsung Electronics Co., Ltd.
- Shashank Shrikant Agashe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method and associated apparatus
- Patent number 12,038,394
- Issue date Jul 16, 2024
- E M & I (Maritime) Limited
- Daniel Constantinis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 12,023,555
- Issue date Jul 2, 2024
- Topgolf Callaway Brands Corp.
- Julie Caterina
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Correction method, correction apparatus, radiography system, and co...
- Patent number 12,025,574
- Issue date Jul 2, 2024
- FUJIFILM Corporation
- Kengo Nomura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-scale inspection and intelligent diagnosis system and method...
- Patent number 12,013,485
- Issue date Jun 18, 2024
- Shandong University
- Shucai Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device
- Patent number 12,013,351
- Issue date Jun 18, 2024
- ISHIDA CO., LTD.
- Ryota Hatano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample holder, system and method
- Patent number 12,007,339
- Issue date Jun 11, 2024
- Carl Zeiss SMT Inc.
- Thomas Anthony Case
- G01 - MEASURING TESTING
Information Patent Grant
Method to use artificial intelligence to enhance visual inspection...
- Patent number 11,988,630
- Issue date May 21, 2024
- Robert Bosch GmbH
- Craig Magera
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Live flaw detection system for multi-bundled conductor splicing sle...
- Patent number 11,959,866
- Issue date Apr 16, 2024
- STATE GRID HUNAN ELECTRIC COMPANY LIMITED
- Dehua Zou
- G05 - CONTROLLING REGULATING
Information Patent Grant
Geometry based three dimensional reconstruction of a semiconductor...
- Patent number 11,953,316
- Issue date Apr 9, 2024
- Applied Materials Israel Ltd.
- Rafael Bistritzer
- G01 - MEASURING TESTING
Information Patent Grant
Item inspection by dynamic selection of projection angle
- Patent number 11,953,451
- Issue date Apr 9, 2024
- Universiteit Antwerpen
- Jan De Beenhouwer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for crack detection
- Patent number 11,946,883
- Issue date Apr 2, 2024
- United States as represented by the Administrator of NASA
- Ajay M Koshti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for in-situ X-ray diffraction-based real-time mon...
- Patent number 11,933,747
- Issue date Mar 19, 2024
- University of Maryland, College Park
- Peter Zavalij
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Line for inspecting empty glass containers
- Patent number 11,927,542
- Issue date Mar 12, 2024
- TIAMA
- Olivier Colle
- G01 - MEASURING TESTING
Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 11,911,667
- Issue date Feb 27, 2024
- Topgolf Callaway Brands Corp.
- Megan Ilnicky
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for determining 3-dimensional atomic level structure and...
- Patent number 11,907,812
- Issue date Feb 20, 2024
- Korea Advanced Institute of Science and Technology
- Yongsoo Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 11,904,214
- Issue date Feb 20, 2024
- Topgolf Callaway Brands Corp.
- Julie Caterina
- A63 - SPORTS GAMES AMUSEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Stack Cell for Easy Confirmation of Separator Folding, Separator In...
- Publication number 20250105378
- Publication date Mar 27, 2025
- LG ENERGY SOLUTION, LTD.
- Joon Sup KANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...
- Publication number 20250078244
- Publication date Mar 6, 2025
- ASML NETHERLANDS B.V.
- Chen ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...
- Publication number 20250067689
- Publication date Feb 27, 2025
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBSERVATION DEVICE, AND CROSS-SECTIONAL IMAGE ACQUISITION METHOD
- Publication number 20250027890
- Publication date Jan 23, 2025
- Riken
- Kunihiro FUJITA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR STRUCTURE AND METHOD...
- Publication number 20250028253
- Publication date Jan 23, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- YEN-FONG CHAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUSES, SYSTEMS, AND METHODS FOR THREE-DIMENSIONAL, IN-SITU IN...
- Publication number 20250020600
- Publication date Jan 16, 2025
- GENERAL ELECTRIC COMPANY
- Mohamed Rahmane
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MONITORING INFLUENCE OF DEFECTS IN FEW-LAYER TWO-DIMENSI...
- Publication number 20250003893
- Publication date Jan 2, 2025
- Tsinghua University
- Dameng Liu
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF THE SPATIAL DISTRIBUTION OF RADIATION DAMAGE IN HE...
- Publication number 20240410840
- Publication date Dec 12, 2024
- NewSouth Innovations Pty Limited
- Patrick BURR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN
- Publication number 20240410841
- Publication date Dec 12, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Vadim KUCHIK
- G01 - MEASURING TESTING
Information Patent Application
VARIABLE DETECTOR AND IMAGE-CAPTURING APPARATUS COMPRISING THE SAME
- Publication number 20240385126
- Publication date Nov 21, 2024
- VIEWORKS CO., LTD.
- Jungmin CHOI
- G01 - MEASURING TESTING
Information Patent Application
ROENTGEN INTEGRATED METROLOGY FOR HYBRID BONDING PROCESS CONTROL IN...
- Publication number 20240387448
- Publication date Nov 21, 2024
- TOKYO ELECTRON LIMITED
- Francisco MACHUCA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...
- Publication number 20240353355
- Publication date Oct 24, 2024
- CiTEX Holding GmbH
- Arno NEUMEISTER
- G01 - MEASURING TESTING
Information Patent Application
TERMINAL AND ELECTRODE DEFECT DETECTION METHOD
- Publication number 20240354932
- Publication date Oct 24, 2024
- LG ELECTRONICS INC.
- Duho LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Process and device for the spatially resolved localization of defec...
- Publication number 20240328973
- Publication date Oct 3, 2024
- Sri Ranjini ARUMUGAM
- B82 - NANO-TECHNOLOGY
Information Patent Application
SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...
- Publication number 20240319123
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Achim WOESSNER
- G01 - MEASURING TESTING
Information Patent Application
DATA ANALYSIS DEVICE, DATA ANALYIS METHOD, PROGRAM, AND RECORDING M...
- Publication number 20240302305
- Publication date Sep 12, 2024
- Sumitomo Electric Industries, Ltd.
- Yutaka HOSHINA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING AND MEASURING INSTALLED ONE-SIDED...
- Publication number 20240295508
- Publication date Sep 5, 2024
- The Boeing Company
- Nicholas C. Reasoner
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SCANNING OF AN OBJECT IN A SCANNING APPARATUS
- Publication number 20240295509
- Publication date Sep 5, 2024
- Rolls-Royce plc
- Akhil MULLOTH
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD
- Publication number 20240288389
- Publication date Aug 29, 2024
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- B08 - CLEANING
Information Patent Application
HIGH RESOLUTION, LOW ENERGY ELECTRON MICROSCOPE FOR PROVIDING TOPOG...
- Publication number 20240272099
- Publication date Aug 15, 2024
- Carl Zeiss SMT GMBH
- Daniel Schwarz
- G01 - MEASURING TESTING
Information Patent Application
DETECTING DEFECTS IN ARRAY REGIONS ON SPECIMENS
- Publication number 20240255448
- Publication date Aug 1, 2024
- KLA Corporation
- Siqing Nie
- G01 - MEASURING TESTING
Information Patent Application
PATTERNING DEVICE DEFECT DETECTION SYSTEMS AND METHODS
- Publication number 20240210336
- Publication date Jun 27, 2024
- ASML NETHERLANDS B.V.
- Marie-Claire VAN LARE
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Determining the Location of Artefacts and/or...
- Publication number 20240133822
- Publication date Apr 25, 2024
- The Australian National University
- Roland Fleddermann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection System and Non-Transitory Computer-Readable Medium
- Publication number 20240127417
- Publication date Apr 18, 2024
- HITACHI HIGH-TECH CORPORATION
- Takehiro HIRAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTING DEFECTS OF STRUCTURE BY USING X-RAY
- Publication number 20240102949
- Publication date Mar 28, 2024
- NEUF Inc.
- Myoung Chan NA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY RADIOGRAPHS BASED FAULT DETECTION AND PREDICTION FOR BATTERY...
- Publication number 20240097215
- Publication date Mar 21, 2024
- GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Diana M. WEGNER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY IMAGING SYSTEM AND LEARNED MODEL PRODUCTION METHOD
- Publication number 20240068962
- Publication date Feb 29, 2024
- Shimadzu Corporation
- Hiroaki TSUSHIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR NON-DESTRUCTIVE INSPECTION OF SEMICONDUCTOR...
- Publication number 20230417687
- Publication date Dec 28, 2023
- SANDISK TECHNOLOGIES LLC
- Shogo TOMITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-DESTRUCTIVE ASSESSMENT OF CORN ROOTWORM DAMAGE
- Publication number 20230408426
- Publication date Dec 21, 2023
- PIONEER HI-BRED INTERNATIONAL, INC.
- DENNY JOSEPH BRUCK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD
- Publication number 20230366838
- Publication date Nov 16, 2023
- Anritsu Corporation
- Masaru ISHIDA
- G01 - MEASURING TESTING

flaws, defects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Handheld inspection device and method of inspecting an infrastructu...

X-ray inspection apparatus

Inspection system for quality analysis of a product to be inspected

System and method for inspecting fused plastic pipes

Structure information acquisition method and structure information...

Method and system for inspecting a structure across a cover layer c...

Evaluation device

System and method for inspecting defects of structure by using X-ray

Utilize machine learning in selecting high quality averaged SEM ima...

System, method, and apparatus for x-ray backscatter inspection of p...

System for estimating the occurrence of defects, and computer-reada...

Inspection system, determination processing apparatus, and inspecti...

Radio-opaque fillers in multiple layers of golf balls

Estimating heights of defects in a wafer by scaling a 3D model usin...

Inspection method and associated apparatus

Method and system utilizing imaging analysis for golf balls

Correction method, correction apparatus, radiography system, and co...

Multi-scale inspection and intelligent diagnosis system and method...

Inspection device

Sample holder, system and method

Method to use artificial intelligence to enhance visual inspection...

Live flaw detection system for multi-bundled conductor splicing sle...

Geometry based three dimensional reconstruction of a semiconductor...

Item inspection by dynamic selection of projection angle

System and method for crack detection

System and method for in-situ X-ray diffraction-based real-time mon...

Line for inspecting empty glass containers

Method and system utilizing imaging analysis for golf balls

Apparatus for determining 3-dimensional atomic level structure and...

Method and system utilizing imaging analysis for golf balls

Patents Applicationslast 30 patents

Stack Cell for Easy Confirmation of Separator Folding, Separator In...

UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...

SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...

OBSERVATION DEVICE, AND CROSS-SECTIONAL IMAGE ACQUISITION METHOD

METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR STRUCTURE AND METHOD...

APPARATUSES, SYSTEMS, AND METHODS FOR THREE-DIMENSIONAL, IN-SITU IN...

METHOD FOR MONITORING INFLUENCE OF DEFECTS IN FEW-LAYER TWO-DIMENSI...

DETERMINATION OF THE SPATIAL DISTRIBUTION OF RADIATION DAMAGE IN HE...

DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN

VARIABLE DETECTOR AND IMAGE-CAPTURING APPARATUS COMPRISING THE SAME

ROENTGEN INTEGRATED METROLOGY FOR HYBRID BONDING PROCESS CONTROL IN...

X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...

TERMINAL AND ELECTRODE DEFECT DETECTION METHOD

Process and device for the spatially resolved localization of defec...

SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...

DATA ANALYSIS DEVICE, DATA ANALYIS METHOD, PROGRAM, AND RECORDING M...

METHOD AND SYSTEM FOR INSPECTING AND MEASURING INSTALLED ONE-SIDED...

METHOD FOR SCANNING OF AN OBJECT IN A SCANNING APPARATUS

CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD

HIGH RESOLUTION, LOW ENERGY ELECTRON MICROSCOPE FOR PROVIDING TOPOG...

DETECTING DEFECTS IN ARRAY REGIONS ON SPECIMENS

PATTERNING DEVICE DEFECT DETECTION SYSTEMS AND METHODS

Method and System for Determining the Location of Artefacts and/or...

Inspection System and Non-Transitory Computer-Readable Medium

SYSTEM AND METHOD FOR INSPECTING DEFECTS OF STRUCTURE BY USING X-RAY

X-RAY RADIOGRAPHS BASED FAULT DETECTION AND PREDICTION FOR BATTERY...

X-RAY IMAGING SYSTEM AND LEARNED MODEL PRODUCTION METHOD

SYSTEMS AND METHODS FOR NON-DESTRUCTIVE INSPECTION OF SEMICONDUCTOR...

NON-DESTRUCTIVE ASSESSMENT OF CORN ROOTWORM DAMAGE

X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD