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G01N2223/646
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00
Investigating materials by wave or particle radiation
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G01N2223/646
flaws, defects
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Patents Grants
last 30 patents
Information
Patent Grant
Defect inspection apparatus and defect inspection method
Patent number
12,366,538
Issue date
Jul 22, 2025
HITACHI HIGH-TECH CORPORATION
Toshifumi Honda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inline scanning and cutting assembly and method of operation
Patent number
12,350,747
Issue date
Jul 8, 2025
Eagle Machinery & Supply, Inc.
Andrew D. Timmer
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Multiple secondary electron beam alignment method, multiple seconda...
Patent number
12,339,241
Issue date
Jun 24, 2025
NuFlare Technology, Inc.
Koichi Ishii
G01 - MEASURING TESTING
Information
Patent Grant
Method and system utilizing imaging analysis for golf balls
Patent number
12,337,215
Issue date
Jun 24, 2025
Topgolf Callaway Brands Corp.
Megan Ilnicky
A63 - SPORTS GAMES AMUSEMENTS
Information
Patent Grant
Method and system utilizing imaging analysis for golf balls
Patent number
12,311,236
Issue date
May 27, 2025
Topgolf Callaway Brands Corp.
Julie Caterina
A63 - SPORTS GAMES AMUSEMENTS
Information
Patent Grant
X-ray inspection apparatus and X-ray inspection method
Patent number
12,313,572
Issue date
May 27, 2025
Anritsu Corporation
Masaru Ishida
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for defects detection and classification using...
Patent number
12,307,668
Issue date
May 20, 2025
Bruker Nano, Inc.
David Lewis Adler
G01 - MEASURING TESTING
Information
Patent Grant
Customizable axes of rotation for industrial radiography systems
Patent number
12,298,260
Issue date
May 13, 2025
Illinois Tool Works Inc.
Joseph Schlecht
G01 - MEASURING TESTING
Information
Patent Grant
Handheld inspection device and method of inspecting an infrastructu...
Patent number
12,259,342
Issue date
Mar 25, 2025
Inversa Systems LTD.
Peter Marc Cabot
G01 - MEASURING TESTING
Information
Patent Grant
X-ray inspection apparatus
Patent number
12,222,301
Issue date
Feb 11, 2025
ISHIDA CO., LTD.
Ken Iwakawa
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system for quality analysis of a product to be inspected
Patent number
12,222,296
Issue date
Feb 11, 2025
Multiscan Technologies, S.L.
Simon Hendrik E. Van Olmen
G01 - MEASURING TESTING
Information
Patent Grant
System and method for inspecting fused plastic pipes
Patent number
12,203,873
Issue date
Jan 21, 2025
WorldWide Nondestructive Testing, Inc.
Kevin P. Bohne
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Structure information acquisition method and structure information...
Patent number
12,196,690
Issue date
Jan 14, 2025
Rigaku Corporation
Masashi Kageyama
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for inspecting a structure across a cover layer c...
Patent number
12,188,884
Issue date
Jan 7, 2025
Inversa Systems LTD.
Peter Marc Cabot
G01 - MEASURING TESTING
Information
Patent Grant
Evaluation device
Patent number
12,188,885
Issue date
Jan 7, 2025
Kioxia Corporation
Takehiro Nakai
G01 - MEASURING TESTING
Information
Patent Grant
System and method for inspecting defects of structure by using X-ray
Patent number
12,181,426
Issue date
Dec 31, 2024
NEUF Inc.
Myoung Chan Na
G01 - MEASURING TESTING
Information
Patent Grant
Utilize machine learning in selecting high quality averaged SEM ima...
Patent number
12,182,983
Issue date
Dec 31, 2024
ASML Netherlands B.V.
Chen Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
Patent number
12,163,903
Issue date
Dec 10, 2024
The Boeing Company
Morteza Safai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System for estimating the occurrence of defects, and computer-reada...
Patent number
12,111,272
Issue date
Oct 8, 2024
HITACHI HIGH-TECH CORPORATION
Hiroshi Fukuda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection system, determination processing apparatus, and inspecti...
Patent number
12,105,033
Issue date
Oct 1, 2024
JGC CORPORATION
Teruaki Sano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Radio-opaque fillers in multiple layers of golf balls
Patent number
12,090,371
Issue date
Sep 17, 2024
Topgolf Callaway Brands Corp.
Julie Caterina
G01 - MEASURING TESTING
Information
Patent Grant
Estimating heights of defects in a wafer by scaling a 3D model usin...
Patent number
12,057,336
Issue date
Aug 6, 2024
Samsung Electronics Co., Ltd.
Shashank Shrikant Agashe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection method and associated apparatus
Patent number
12,038,394
Issue date
Jul 16, 2024
E M & I (Maritime) Limited
Daniel Constantinis
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system utilizing imaging analysis for golf balls
Patent number
12,023,555
Issue date
Jul 2, 2024
Topgolf Callaway Brands Corp.
Julie Caterina
A63 - SPORTS GAMES AMUSEMENTS
Information
Patent Grant
Correction method, correction apparatus, radiography system, and co...
Patent number
12,025,574
Issue date
Jul 2, 2024
FUJIFILM Corporation
Kengo Nomura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Multi-scale inspection and intelligent diagnosis system and method...
Patent number
12,013,485
Issue date
Jun 18, 2024
Shandong University
Shucai Li
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection device
Patent number
12,013,351
Issue date
Jun 18, 2024
ISHIDA CO., LTD.
Ryota Hatano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Sample holder, system and method
Patent number
12,007,339
Issue date
Jun 11, 2024
Carl Zeiss SMT Inc.
Thomas Anthony Case
G01 - MEASURING TESTING
Information
Patent Grant
Method to use artificial intelligence to enhance visual inspection...
Patent number
11,988,630
Issue date
May 21, 2024
Robert Bosch GmbH
Craig Magera
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Live flaw detection system for multi-bundled conductor splicing sle...
Patent number
11,959,866
Issue date
Apr 16, 2024
STATE GRID HUNAN ELECTRIC COMPANY LIMITED
Dehua Zou
G05 - CONTROLLING REGULATING
Patents Applications
last 30 patents
Information
Patent Application
RADIO/MICROWAVE FREQUENCY SENSOR FOR ANALYZING AGRICULTURAL EQUIPMENT
Publication number
20250208069
Publication date
Jun 26, 2025
Know Labs, Inc.
Dominic KLYVE
A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information
Patent Application
Analysis System, Analysis Method, and Analysis Program
Publication number
20250208076
Publication date
Jun 26, 2025
Hitachi High-Tech Corporation
Keiichi TANAKA
G01 - MEASURING TESTING
Information
Patent Application
Quality control method for a cable specimen
Publication number
20250172505
Publication date
May 29, 2025
NEXANS
Espen DOEDENS
G01 - MEASURING TESTING
Information
Patent Application
Methods And Systems For Spectral Measurements Based On Perturbed Sp...
Publication number
20250164411
Publication date
May 22, 2025
KLA Corporation
William McGahan
G01 - MEASURING TESTING
Information
Patent Application
RAIL DIAGNOSTIC INSPECTION APPARATUS
Publication number
20250155383
Publication date
May 15, 2025
TESMEC S.P.A.
Silvestro Di Gioia
G01 - MEASURING TESTING
Information
Patent Application
Stack Cell for Easy Confirmation of Separator Folding, Separator In...
Publication number
20250105378
Publication date
Mar 27, 2025
LG ENERGY SOLUTION, LTD.
Joon Sup KANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...
Publication number
20250078244
Publication date
Mar 6, 2025
ASML NETHERLANDS B.V.
Chen ZHANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...
Publication number
20250067689
Publication date
Feb 27, 2025
The Boeing Company
Morteza Safai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR STRUCTURE AND METHOD...
Publication number
20250028253
Publication date
Jan 23, 2025
Taiwan Semiconductor Manufacturing company Ltd.
YEN-FONG CHAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OBSERVATION DEVICE, AND CROSS-SECTIONAL IMAGE ACQUISITION METHOD
Publication number
20250027890
Publication date
Jan 23, 2025
Riken
Kunihiro FUJITA
G01 - MEASURING TESTING
Information
Patent Application
APPARATUSES, SYSTEMS, AND METHODS FOR THREE-DIMENSIONAL, IN-SITU IN...
Publication number
20250020600
Publication date
Jan 16, 2025
GENERAL ELECTRIC COMPANY
Mohamed Rahmane
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MONITORING INFLUENCE OF DEFECTS IN FEW-LAYER TWO-DIMENSI...
Publication number
20250003893
Publication date
Jan 2, 2025
Tsinghua University
Dameng Liu
G01 - MEASURING TESTING
Information
Patent Application
DETERMINATION OF THE SPATIAL DISTRIBUTION OF RADIATION DAMAGE IN HE...
Publication number
20240410840
Publication date
Dec 12, 2024
NewSouth Innovations Pty Limited
Patrick BURR
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN
Publication number
20240410841
Publication date
Dec 12, 2024
APPLIED MATERIALS ISRAEL LTD.
Vadim KUCHIK
G01 - MEASURING TESTING
Information
Patent Application
VARIABLE DETECTOR AND IMAGE-CAPTURING APPARATUS COMPRISING THE SAME
Publication number
20240385126
Publication date
Nov 21, 2024
VIEWORKS CO., LTD.
Jungmin CHOI
G01 - MEASURING TESTING
Information
Patent Application
ROENTGEN INTEGRATED METROLOGY FOR HYBRID BONDING PROCESS CONTROL IN...
Publication number
20240387448
Publication date
Nov 21, 2024
TOKYO ELECTRON LIMITED
Francisco MACHUCA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...
Publication number
20240353355
Publication date
Oct 24, 2024
CiTEX Holding GmbH
Arno NEUMEISTER
G01 - MEASURING TESTING
Information
Patent Application
TERMINAL AND ELECTRODE DEFECT DETECTION METHOD
Publication number
20240354932
Publication date
Oct 24, 2024
LG ELECTRONICS INC.
Duho LEE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Process and device for the spatially resolved localization of defec...
Publication number
20240328973
Publication date
Oct 3, 2024
Sri Ranjini ARUMUGAM
B82 - NANO-TECHNOLOGY
Information
Patent Application
SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...
Publication number
20240319123
Publication date
Sep 26, 2024
ASML NETHERLANDS B.V.
Achim WOESSNER
G01 - MEASURING TESTING
Information
Patent Application
DATA ANALYSIS DEVICE, DATA ANALYIS METHOD, PROGRAM, AND RECORDING M...
Publication number
20240302305
Publication date
Sep 12, 2024
Sumitomo Electric Industries, Ltd.
Yutaka HOSHINA
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR INSPECTING AND MEASURING INSTALLED ONE-SIDED...
Publication number
20240295508
Publication date
Sep 5, 2024
The Boeing Company
Nicholas C. Reasoner
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR SCANNING OF AN OBJECT IN A SCANNING APPARATUS
Publication number
20240295509
Publication date
Sep 5, 2024
Rolls-Royce plc
Akhil MULLOTH
G01 - MEASURING TESTING
Information
Patent Application
CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD
Publication number
20240288389
Publication date
Aug 29, 2024
ASML NETHERLANDS B.V.
Marco Jan-Jaco WIELAND
B08 - CLEANING
Information
Patent Application
HIGH RESOLUTION, LOW ENERGY ELECTRON MICROSCOPE FOR PROVIDING TOPOG...
Publication number
20240272099
Publication date
Aug 15, 2024
Carl Zeiss SMT GMBH
Daniel Schwarz
G01 - MEASURING TESTING
Information
Patent Application
DETECTING DEFECTS IN ARRAY REGIONS ON SPECIMENS
Publication number
20240255448
Publication date
Aug 1, 2024
KLA Corporation
Siqing Nie
G01 - MEASURING TESTING
Information
Patent Application
PATTERNING DEVICE DEFECT DETECTION SYSTEMS AND METHODS
Publication number
20240210336
Publication date
Jun 27, 2024
ASML NETHERLANDS B.V.
Marie-Claire VAN LARE
G01 - MEASURING TESTING
Information
Patent Application
Method and System for Determining the Location of Artefacts and/or...
Publication number
20240133822
Publication date
Apr 25, 2024
The Australian National University
Roland Fleddermann
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Inspection System and Non-Transitory Computer-Readable Medium
Publication number
20240127417
Publication date
Apr 18, 2024
HITACHI HIGH-TECH CORPORATION
Takehiro HIRAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR INSPECTING DEFECTS OF STRUCTURE BY USING X-RAY
Publication number
20240102949
Publication date
Mar 28, 2024
NEUF Inc.
Myoung Chan NA
G01 - MEASURING TESTING