Fluid environment

Industry

CPC
G01Q30/12

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Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q30/00Auxiliary means serving to assist or improve the scanning probe techniques or apparatus

Current Industry

G01Q30/12Fluid environment

Industries

Patents Grantslast 30 patents

Information Patent Grant
Force microscope with helium atmosphere
- Patent number 10,942,199
- Issue date Mar 9, 2021
- MOLECULAR VISTA, INC.
- Thomas R. Albrecht
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for generating three-dimensional image of poly...
- Patent number 10,740,948
- Issue date Aug 11, 2020
- Hanbat National University Industry-Academic Cooperation Foundation
- Sang Mo Shin
- G01 - MEASURING TESTING
Information Patent Grant
Modular atomic force microscope with environmental controls
- Patent number 10,416,190
- Issue date Sep 17, 2019
- Oxford Instruments Asylum Research Inc
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 9,689,893
- Issue date Jun 27, 2017
- Hitachi High-Tech Science Corporation
- Kazunori Ando
- G01 - MEASURING TESTING
Information Patent Grant
Method of studying a sample in an ETEM
- Patent number 9,658,246
- Issue date May 23, 2017
- FEI Company
- Stan Johan Pieter Konings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Modular atomic force microscope with environmental controls
- Patent number 9,581,616
- Issue date Feb 28, 2017
- Oxford Instruments Asylum Research, Inc.
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope drying system and atomic force microscope
- Patent number 9,442,132
- Issue date Sep 13, 2016
- National Tsing Hua University
- Fan-Gang Tseng
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sealed AFM cell
- Patent number 9,110,093
- Issue date Aug 18, 2015
- National University Corporation Kanazawa University
- Takeshi Fukuma
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fluid delivery for scanning probe microscopy
- Patent number 9,075,082
- Issue date Jul 7, 2015
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Inert gas delivery system for electrical inspection apparatus
- Patent number 9,052,338
- Issue date Jun 9, 2015
- International Business Machines Corporation
- Terence Lawrence Kane
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for nanomechanical measurement using an atomic...
- Patent number 8,973,161
- Issue date Mar 3, 2015
- Rutgers, The State University of New Jersey
- Qingze Zou
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning tunneling microscope assembly, reactor, and system
- Patent number 8,893,309
- Issue date Nov 18, 2014
- The Regents of the University of California
- Feng Tao
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for measuring the force interaction that is caused by a sample
- Patent number 8,832,860
- Issue date Sep 9, 2014
- Forschungszentrum Juelich GmbH
- Ruslan Temirov
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Inert gas delivery system for electrical inspection apparatus
- Patent number 8,701,511
- Issue date Apr 22, 2014
- International Business Machines Corporation
- Richard Walter Oldrey
- G01 - MEASURING TESTING
Information Patent Grant
Method for examining a sample
- Patent number 8,347,410
- Issue date Jan 1, 2013
- Forschungszentrum Juelich GmbH
- Ruslan Temirov
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever evaluation system, cantilever evaluation method, and can...
- Patent number 8,332,187
- Issue date Dec 11, 2012
- Mizuho Information & Research Institute, Inc.
- Naoki Watanabe
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscopy probe
- Patent number 8,091,143
- Issue date Jan 3, 2012
- Centre National de la Recherche Scientifique
- Marc Faucher
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fluid delivery for scanning probe microscopy
- Patent number 7,930,766
- Issue date Apr 19, 2011
- General Nanotechnology L.L.C.
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fluid delivery for scanning probe microscopy
- Patent number 7,503,206
- Issue date Mar 17, 2009
- General Nanotechnology L.L.C.
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and measuring method by means of the same
- Patent number 7,251,987
- Issue date Aug 7, 2007
- SII NanoTechnology Inc.
- Masafumi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Fluid delivery for scanning probe microscopy
- Patent number 6,998,689
- Issue date Feb 14, 2006
- General Nanotechnology L.L.C.
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring electrical capacitance
- Patent number 6,828,804
- Issue date Dec 7, 2004
- Sharp Kabushiki Kaisha
- Yuji Yashiro
- G01 - MEASURING TESTING
Information Patent Grant
Squid microscope
- Patent number 6,583,619
- Issue date Jun 24, 2003
- Forschungszentrum Julich GmbH
- Egon Zimmermann
- G01 - MEASURING TESTING
Information Patent Grant
Method for applying or removing material
- Patent number 6,528,807
- Issue date Mar 4, 2003
- Hans Wilfried Peter Koops
- G11 - INFORMATION STORAGE
Information Patent Grant
Environment controllable scanning probe microscope
- Patent number 5,200,616
- Issue date Apr 6, 1993
- Shimadzu Corporation
- Ryohei Kokawa
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
FORCE MICROSCOPE WITH HELIUM ATMOSPHERE
- Publication number 20200379005
- Publication date Dec 3, 2020
- MOLECULAR VISTA, INC.
- Thomas R. ALBRECHT
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPE DRYING SYSTEM AND ATOMIC FORCE MICROSCOPE
- Publication number 20160003867
- Publication date Jan 7, 2016
- National Tsing-Hua University
- FAN-GANG TSENG
- B82 - NANO-TECHNOLOGY
Information Patent Application
APPARATUS AND METHOD FOR ATOMIC FORCE MICROSCOPY
- Publication number 20150226766
- Publication date Aug 13, 2015
- Bruker Nano, Inc.
- Kristof Paredis
- G01 - MEASURING TESTING
Information Patent Application
SEALED AFM CELL
- Publication number 20140289910
- Publication date Sep 25, 2014
- Takeshi Fukuma
- B82 - NANO-TECHNOLOGY
Information Patent Application
Fluid Delivery for Scanning Probe Microscopy
- Publication number 20140082776
- Publication date Mar 20, 2014
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Application
INERT GAS DELIVERY SYSTEM FOR ELECTRICAL INSPECTION APPARATUS
- Publication number 20140069165
- Publication date Mar 13, 2014
- Terence Lawrence Kane
- G02 - OPTICS
Information Patent Application
Method and Apparatus for Nanomechanical Measurement Using an Atomic...
- Publication number 20130347147
- Publication date Dec 26, 2013
- Qingze Zou
- B82 - NANO-TECHNOLOGY
Information Patent Application
Systems And Methods For Performing Microscopy At Hyperbaric Pressures
- Publication number 20130145506
- Publication date Jun 6, 2013
- Jay B. Dean
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD OF STUDYING A SAMPLE IN AN ETEM
- Publication number 20130040400
- Publication date Feb 14, 2013
- FEI Company
- Stan Johan Pieter Konings
- B82 - NANO-TECHNOLOGY
Information Patent Application
INERT GAS DELIVERY SYSTEM FOR ELECTRICAL INSPECTION APPARATUS
- Publication number 20120240657
- Publication date Sep 27, 2012
- International Business Machines Corporation
- Richard Walter Oldrey
- G02 - OPTICS
Information Patent Application
Scanning Tunneling Microscope Assembly, Reactor, and System
- Publication number 20120244038
- Publication date Sep 27, 2012
- The Regents of the University of California
- Feng Tao
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING THE FORCE INTERACTION THAT IS CAUSED BY A SAMPLE
- Publication number 20120151638
- Publication date Jun 14, 2012
- Ruslan Temirov
- G01 - MEASURING TESTING
Information Patent Application
FLUID DELIVERY FOR SCANNING PROBE MICROSCOPY
- Publication number 20120066800
- Publication date Mar 15, 2012
- General Nanotechnology LLC
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EXAMINING A SAMPLE
- Publication number 20100263097
- Publication date Oct 14, 2010
- Ruslan Temirov
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY PROBE
- Publication number 20100205698
- Publication date Aug 12, 2010
- Centre National de la Recherche Scientifique
- Marc Faucher
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER EVALUATION SYSTEM, CANTILEVER EVALUATION METHOD, AND CAN...
- Publication number 20100204968
- Publication date Aug 12, 2010
- MIZUHO INFORMATION & RESEARCH INSTITUTE, INC.
- Naoki Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Fluid Delivery for Scanning Probe Microscopy
- Publication number 20100132076
- Publication date May 27, 2010
- General Nanotechnology LLC
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Application
Fluid delivery for scanning probe microscopy
- Publication number 20060150721
- Publication date Jul 13, 2006
- General Nanotechnology LLC
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope and measuring method by means of the same
- Publication number 20050210966
- Publication date Sep 29, 2005
- Masafumi Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Fluid delivery for scanning probe microscopy
- Publication number 20040118192
- Publication date Jun 24, 2004
- General Nanotechnology LLC
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Application
Method of measuring electrical capacitance
- Publication number 20040108864
- Publication date Jun 10, 2004
- Yuji Yashiro
- G01 - MEASURING TESTING
Information Patent Application
Squid Microscope
- Publication number 20020057085
- Publication date May 16, 2002
- FORSCHUNGSZENTRUM JULICH GmbH
- Egon Zimmermann
- B82 - NANO-TECHNOLOGY

Fluid environment

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Force microscope with helium atmosphere

Apparatus and method for generating three-dimensional image of poly...

Modular atomic force microscope with environmental controls

Scanning probe microscope

Method of studying a sample in an ETEM

Modular atomic force microscope with environmental controls

Atomic force microscope drying system and atomic force microscope

Sealed AFM cell

Fluid delivery for scanning probe microscopy

Inert gas delivery system for electrical inspection apparatus

Method and apparatus for nanomechanical measurement using an atomic...

Scanning tunneling microscope assembly, reactor, and system

Method for measuring the force interaction that is caused by a sample

Inert gas delivery system for electrical inspection apparatus

Method for examining a sample

Cantilever evaluation system, cantilever evaluation method, and can...

Atomic force microscopy probe

Fluid delivery for scanning probe microscopy

Fluid delivery for scanning probe microscopy

Scanning probe microscope and measuring method by means of the same

Fluid delivery for scanning probe microscopy

Method of measuring electrical capacitance

Squid microscope

Method for applying or removing material

Environment controllable scanning probe microscope

Patents Applicationslast 30 patents

FORCE MICROSCOPE WITH HELIUM ATMOSPHERE

ATOMIC FORCE MICROSCOPE DRYING SYSTEM AND ATOMIC FORCE MICROSCOPE

APPARATUS AND METHOD FOR ATOMIC FORCE MICROSCOPY

SEALED AFM CELL

Fluid Delivery for Scanning Probe Microscopy

INERT GAS DELIVERY SYSTEM FOR ELECTRICAL INSPECTION APPARATUS

Method and Apparatus for Nanomechanical Measurement Using an Atomic...

Systems And Methods For Performing Microscopy At Hyperbaric Pressures

METHOD OF STUDYING A SAMPLE IN AN ETEM

INERT GAS DELIVERY SYSTEM FOR ELECTRICAL INSPECTION APPARATUS

Scanning Tunneling Microscope Assembly, Reactor, and System

METHOD FOR MEASURING THE FORCE INTERACTION THAT IS CAUSED BY A SAMPLE

FLUID DELIVERY FOR SCANNING PROBE MICROSCOPY

METHOD FOR EXAMINING A SAMPLE

ATOMIC FORCE MICROSCOPY PROBE

CANTILEVER EVALUATION SYSTEM, CANTILEVER EVALUATION METHOD, AND CAN...

Fluid Delivery for Scanning Probe Microscopy

Fluid delivery for scanning probe microscopy

Scanning probe microscope and measuring method by means of the same

Fluid delivery for scanning probe microscopy

Method of measuring electrical capacitance

Squid Microscope