for contour producing

Industry

CPC
G01B9/023

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/023for contour producing

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Hybrid 3D inspection system
- Patent number 11,313,794
- Issue date Apr 26, 2022
- Orbotech Ltd.
- Ram Oron
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing system
- Patent number 11,014,212
- Issue date May 25, 2021
- Broetje-Automation GmbH
- Wilfried Ficken
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Three-dimensional shape measuring device, method for acquiring holo...
- Patent number 9,494,411
- Issue date Nov 15, 2016
- 3DRAGONS, LLC
- Hideyoshi Horimai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Interferometric system with spatial carrier frequency capable of im...
- Patent number 8,526,003
- Issue date Sep 3, 2013
- Vysoke Uceni Technicke Brne
- Radim Chmelík
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer with multiple modes of operation for determining cha...
- Patent number 7,952,724
- Issue date May 31, 2011
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting the deformation of objects
- Patent number 7,860,297
- Issue date Dec 28, 2010
- Steinbichler Optotechnik GmbH
- Robert Wilhelm
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer with multiple modes of operation for determining cha...
- Patent number 7,616,323
- Issue date Nov 10, 2009
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer for determining characteristics of an object surface
- Patent number 7,446,882
- Issue date Nov 4, 2008
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer for determining characteristics of an object surface...
- Patent number 7,428,057
- Issue date Sep 23, 2008
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Light interference measurement method using computer-generated holo...
- Patent number 7,145,659
- Issue date Dec 5, 2006
- Fujinon Corporation
- Kenji Yasuda
- G01 - MEASURING TESTING
Information Patent Grant
Method for three-dimensionally, optically measuring measuring objects
- Patent number 6,724,483
- Issue date Apr 20, 2004
- Robert Bosch GmbH
- Jochen Straehle
- G01 - MEASURING TESTING
Information Patent Grant
Process and device for determining three-dimensional structure in t...
- Patent number 5,910,660
- Issue date Jun 8, 1999
- Heinz Paul Weber
- Walter Hodel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE
- Publication number 20230204345
- Publication date Jun 29, 2023
- CKD CORPORATION
- Hiroyuki Ishigaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Three-Dimensional Shape Measuring Device, Method for Acquiring Holo...
- Publication number 20150300803
- Publication date Oct 22, 2015
- 3DRAGONS, LLC
- Hideyoshi HORIMAI
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC SYSTEM WITH SPATIAL CARRIER FREQUENCY CAPABLE OF IM...
- Publication number 20110255093
- Publication date Oct 20, 2011
- Vysoke uceni technicke v Brne
- Radim Chmelik
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER WITH MULTIPLE MODES OF OPERATION FOR DETERMINING CHA...
- Publication number 20100134786
- Publication date Jun 3, 2010
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for detecting the deformation of objects
- Publication number 20070121121
- Publication date May 31, 2007
- Robert Wilhelm
- G01 - MEASURING TESTING
Information Patent Application
Interferometer for determining characteristics of an object surface...
- Publication number 20060158657
- Publication date Jul 20, 2006
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
Interferometer with multiple modes of operation for determining cha...
- Publication number 20060158658
- Publication date Jul 20, 2006
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
Interferometer for determining characteristics of an object surface
- Publication number 20060158659
- Publication date Jul 20, 2006
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
Light interference measurement method using computer-generated holo...
- Publication number 20050117167
- Publication date Jun 2, 2005
- Fujinon Corporation
- Kenji Yasuda
- G01 - MEASURING TESTING
Information Patent Application
Method for three-dimensionally, optically measuring measuring objects
- Publication number 20020149778
- Publication date Oct 17, 2002
- Jochen Straehle
- G01 - MEASURING TESTING

for contour producing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Hybrid 3D inspection system

Manufacturing system

Three-dimensional shape measuring device, method for acquiring holo...

Interferometric system with spatial carrier frequency capable of im...

Interferometer with multiple modes of operation for determining cha...

Method and apparatus for detecting the deformation of objects

Interferometer with multiple modes of operation for determining cha...

Interferometer for determining characteristics of an object surface

Interferometer for determining characteristics of an object surface...

Light interference measurement method using computer-generated holo...

Method for three-dimensionally, optically measuring measuring objects

Process and device for determining three-dimensional structure in t...

Patents Applicationslast 30 patents

THREE-DIMENSIONAL MEASUREMENT DEVICE

Three-Dimensional Shape Measuring Device, Method for Acquiring Holo...

INTERFEROMETRIC SYSTEM WITH SPATIAL CARRIER FREQUENCY CAPABLE OF IM...

INTERFEROMETER WITH MULTIPLE MODES OF OPERATION FOR DETERMINING CHA...

Method and apparatus for detecting the deformation of objects

Interferometer for determining characteristics of an object surface...

Interferometer with multiple modes of operation for determining cha...

Interferometer for determining characteristics of an object surface

Light interference measurement method using computer-generated holo...

Method for three-dimensionally, optically measuring measuring objects