for curve tracing of semiconductor characteristics

Industry

CPC
G01R31/2603

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2603for curve tracing of semiconductor characteristics

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method for measuring current-voltage characteristic
- Patent number 12,038,468
- Issue date Jul 16, 2024
- Rohm Co., Ltd.
- Tatsuya Yanagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Signal analyzer and method of processing data from an input signal
- Patent number 11,798,618
- Issue date Oct 24, 2023
- Rohde & Schwarz GmbH & Co. KG
- Nico Toender
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Switching loss measurement and plot in test and measurement instrument
- Patent number 11,181,581
- Issue date Nov 23, 2021
- Tektronix, Inc.
- Krishna N H Sri
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Computer implemented method for determining intrinsic parameter in...
- Patent number 10,914,703
- Issue date Feb 9, 2021
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Olivier Rozeau
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for measuring current-voltage characteristic
- Patent number 10,908,204
- Issue date Feb 2, 2021
- Rohm Co., Ltd.
- Tatsuya Yanagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for measuring current-voltage characteristic
- Patent number 10,901,024
- Issue date Jan 26, 2021
- Rohm Co., Ltd.
- Tatsuya Yanagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic response analysis prober device
- Patent number 10,782,340
- Issue date Sep 22, 2020
- HITACHI HIGH-TECH CORPORATION
- Masaaki Komori
- G02 - OPTICS
Information Patent Grant
Method and device for determining the temperature calibration chara...
- Patent number 9,927,483
- Issue date Mar 27, 2018
- Siemens Aktiengesellschaft
- Marco Bohlländer
- G01 - MEASURING TESTING
Information Patent Grant
Testing method and testing system for semiconductor element
- Patent number 9,726,713
- Issue date Aug 8, 2017
- Industrial Technology Research Institute
- Tzung-Te Chen
- G01 - MEASURING TESTING
Information Patent Grant
Guide and support member for a device for testing electronic compon...
- Patent number 9,618,534
- Issue date Apr 11, 2017
- Multitest Elektronische Systeme GmbH
- Johann Poetzinger
- G01 - MEASURING TESTING
Information Patent Grant
Testing of module integrated electronics using power reversal
- Patent number 9,423,448
- Issue date Aug 23, 2016
- SunPower Corporation
- Ravindranath Naiknaware
- G01 - MEASURING TESTING
Information Patent Grant
Power device analyzer
- Patent number 9,310,408
- Issue date Apr 12, 2016
- Keysight Technologies, Inc.
- Atsushi Mikata
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining BSIMSOI4 DC model parameters
- Patent number 9,134,361
- Issue date Sep 15, 2015
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Jing Chen
- G01 - MEASURING TESTING
Information Patent Grant
Wireless current-voltage tracer with uninterrupted bypass system an...
- Patent number 8,952,715
- Issue date Feb 10, 2015
- Stratasense LLC
- Kellen Gillispe
- G01 - MEASURING TESTING
Information Patent Grant
Digital programmable load measurement device
- Patent number 8,892,377
- Issue date Nov 18, 2014
- National Central University
- Shyh-Biau Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Photovoltaic array systems, methods, and devices with bidirectional...
- Patent number 8,471,408
- Issue date Jun 25, 2013
- Ideal Power Converters, Inc.
- Paul Bundschuh
- G05 - CONTROLLING REGULATING
Information Patent Grant
Photovoltaic array systems, methods, and devices with bidirectional...
- Patent number 8,461,718
- Issue date Jun 11, 2013
- Ideal Power Converters, Inc.
- Paul Bundschuh
- G05 - CONTROLLING REGULATING
Information Patent Grant
Photovoltaic array systems, methods, and devices and improved diagn...
- Patent number 8,446,043
- Issue date May 21, 2013
- Ideal Power Converters, Inc.
- Paul Bundschuh
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for measuring I-V characteristics of solar cell, and solar cell
- Patent number 8,446,145
- Issue date May 21, 2013
- Sanyo Electric Co., Ltd.
- Shigeharu Taira
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Photovoltaic array systems, methods, and devices with improved diag...
- Patent number 8,446,042
- Issue date May 21, 2013
- Ideal Power Converters, Inc.
- Paul A. Bundschuh
- G05 - CONTROLLING REGULATING
Information Patent Grant
SCR module dynamic counter tester
- Patent number 8,427,184
- Issue date Apr 23, 2013
- The United States of America as represented by the Secretary of the Navy
- Dexter T Kan
- G01 - MEASURING TESTING
Information Patent Grant
Method for load-line correction of pulsed measurements
- Patent number 8,400,179
- Issue date Mar 19, 2013
- Keithley Instruments, Inc.
- Pete Hulbert
- G01 - MEASURING TESTING
Information Patent Grant
Method for forming optimal characteristic curves of solar cell and...
- Patent number 8,224,598
- Issue date Jul 17, 2012
- Industrial Technology Research Institute
- Teng Chun Wu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Circuits and methods for characterizing random variations in device...
- Patent number 8,214,169
- Issue date Jul 3, 2012
- International Business Machines Corporation
- Azeez Bhavnagarwala
- G11 - INFORMATION STORAGE
Information Patent Grant
Pulsed I-V measurement method and apparatus
- Patent number 7,616,014
- Issue date Nov 10, 2009
- Keithley Instruments, Inc.
- Gregory Sobolewski
- G01 - MEASURING TESTING
Information Patent Grant
Cable compensation for pulsed I-V measurements
- Patent number 7,518,378
- Issue date Apr 14, 2009
- Keithley Instruments, Inc.
- Rajat Mehta
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus for FET characteristics
- Patent number 7,403,031
- Issue date Jul 22, 2008
- Agilent Technologies, Inc.
- Yasushi Okawa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring operating temperatures of an ele...
- Patent number 7,121,721
- Issue date Oct 17, 2006
- Robert Bosch GmbH
- Henning Hauenstein
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring photoelectric conversion device,...
- Patent number 6,946,858
- Issue date Sep 20, 2005
- Canon Kabushiki Kaisha
- Jinsho Matsuyama
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method and apparatus for calculating the electrical characteristics...
- Patent number 6,714,027
- Issue date Mar 30, 2004
- Seiko Epson Corporation
- Basil Lui
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MEASURING CURRENT-VOLTAGE CHARACTERISTIC
- Publication number 20240329111
- Publication date Oct 3, 2024
- Rohm Co., Ltd.
- Tatsuya YANAGI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING APPARATUS AND TESTING METHOD
- Publication number 20240142510
- Publication date May 2, 2024
- Fuji Electric Co., Ltd.
- Mitsuru YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
A WEDGE AMPLITUDE-MODULATION PROBE CARD AND A MAIN BODY THEREOF
- Publication number 20240053384
- Publication date Feb 15, 2024
- MAXONE SEMICONDUCTOR CO., LTD.
- Haichao YU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING OUTPUT CHARGE OF WIDE BANDGAP...
- Publication number 20240044968
- Publication date Feb 8, 2024
- Tektronix, Inc.
- Vivek Shivaram
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING SEMICONDUCTOR MULTILAYER STRUCTURE...
- Publication number 20240038600
- Publication date Feb 1, 2024
- SHANGHAI ASPIRING SEMICONDUCTOR EQUIPMENT CO., LTD.
- Chongji HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MACHINE LEARNING MODEL TRAINING USING DE-NOISED DATA AND MODEL PRED...
- Publication number 20230228803
- Publication date Jul 20, 2023
- Tektronix, Inc.
- Wenzheng Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYZING AN OPERATION OF A POWER SEMICONDUCTOR DEVICE
- Publication number 20230096094
- Publication date Mar 30, 2023
- MASCHINENFABRIK REINHAUSEN GMBH
- Angus Bryant
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING CURRENT-VOLTAGE CHARACTERISTIC
- Publication number 20210132136
- Publication date May 6, 2021
- Rohm Co., Ltd.
- Tatsuya YANAGI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONNECTOR
- Publication number 20210135624
- Publication date May 6, 2021
- Industrial Technology Research Institute
- Ren-Chin Shr
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
TESTING OF MODULE INTEGRATED ELECTRONICS USING POWER REVERSAL
- Publication number 20160359454
- Publication date Dec 8, 2016
- SunPower Corporation
- Ravindranath Naiknaware
- G01 - MEASURING TESTING
Information Patent Application
GUIDE AND SUPPORT MEMBER FOR A DEVICE FOR TESTING ELECTRONIC COMPON...
- Publication number 20150338440
- Publication date Nov 26, 2015
- Multitest elektronische Systeme GmbH
- Johann POETZINGER
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INSPECTING DEFECTS OF SOLAR CELLS AND SYSTEM THEREOF
- Publication number 20150039270
- Publication date Feb 5, 2015
- Industrial Technology Research Institute
- Yean-San Long
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DETERMINING THE TEMPERATURE CALIBRATION CHARA...
- Publication number 20150032404
- Publication date Jan 29, 2015
- SIEMENS AKTIENGESELLSCHAFT
- Marco Bohlländer
- G01 - MEASURING TESTING
Information Patent Application
WIRELESS CURRENT-VOLTAGE TRACER WITH UNINTERRUPTED BYPASS SYSTEM AN...
- Publication number 20140132301
- Publication date May 15, 2014
- Stratasense LLC
- Kellen Gillispie
- G01 - MEASURING TESTING
Information Patent Application
TESTING METHOD AND TESTING SYSTEM FOR SEMICONDUCTOR ELEMENT
- Publication number 20140107961
- Publication date Apr 17, 2014
- Industrial Technology Research Institute
- Tzung-Te Chen
- G01 - MEASURING TESTING
Information Patent Application
Power Device Analyzer
- Publication number 20130320959
- Publication date Dec 5, 2013
- AGILENT TECHNOLOGIES, INC.
- Atsushi Mikata
- G01 - MEASURING TESTING
Information Patent Application
Photovoltaic Array Systems, Methods, and Devices with Bidirectional...
- Publication number 20130314096
- Publication date Nov 28, 2013
- Ideal Power Converters, Inc.
- Paul Bundschuh
- G01 - MEASURING TESTING
Information Patent Application
Photovoltaic Array Systems, Methods, and Devices with Improved Diag...
- Publication number 20130307336
- Publication date Nov 21, 2013
- Ideal Power Converters, Inc.
- Paul Bundschuh
- G01 - MEASURING TESTING
Information Patent Application
PHOTOVOLTAIC ARRAY SYSTEMS, METHODS, AND DEVICES WITH BIDIRECTIONAL...
- Publication number 20130114303
- Publication date May 9, 2013
- Ideal Power Converters, Inc.
- Paul Bundschuh
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL PROGRAMMABLE LOAD MEASUREMENT DEVICE
- Publication number 20130054155
- Publication date Feb 28, 2013
- NATIONAL CENTRAL UNIVERSITY
- Shyh-Biau JIANG
- G01 - MEASURING TESTING
Information Patent Application
Method for Determining BSIMSOI4 DC Model Parameters
- Publication number 20130054210
- Publication date Feb 28, 2013
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- Jing Chen
- G01 - MEASURING TESTING
Information Patent Application
Photovoltaic Array Systems, Methods, and Devices with Improved Diag...
- Publication number 20130038129
- Publication date Feb 14, 2013
- IDEAL POWER CONVERTERS, INC.
- Paul Bundschuh
- G01 - MEASURING TESTING
Information Patent Application
Photovoltaic Array Systems, Methods, and Devices with Bidirectional...
- Publication number 20120274138
- Publication date Nov 1, 2012
- IDEAL POWER CONVERTERS, INC.
- Paul Bundschuh
- G05 - CONTROLLING REGULATING
Information Patent Application
SCR Module Dynamic Counter Tester
- Publication number 20120242361
- Publication date Sep 27, 2012
- United States of America as Represented by the Secretary of the Navy
- Dexter T. Kan
- G01 - MEASURING TESTING
Information Patent Application
Circuits and Methods for Characterizing Random Variations in Device...
- Publication number 20120179412
- Publication date Jul 12, 2012
- International Business Machines Corporation
- Azeez Bhavnagarwala
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING I-V CHARACTERISTICS OF SOLAR CELL, AND SOLAR CELL
- Publication number 20100201349
- Publication date Aug 12, 2010
- Sanyo Electric Co., Ltd.
- Shigeharu TAIRA
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
METHOD FOR FORMING OPTIMAL CHARACTERISTIC CURVES OF SOLAR CELL AND...
- Publication number 20090234601
- Publication date Sep 17, 2009
- Industrial Technology Research Institute
- TENG CHUN WU
- G01 - MEASURING TESTING
Information Patent Application
Cable compensation for pulsed I-V measurements
- Publication number 20080191709
- Publication date Aug 14, 2008
- Rajat Mehta
- G01 - MEASURING TESTING
Information Patent Application
Measurement apparatus for FET characteristics
- Publication number 20070279081
- Publication date Dec 6, 2007
- Yasushi Okawa
- G01 - MEASURING TESTING
Information Patent Application
Circuits and methods for characterizing random variations in device...
- Publication number 20050043908
- Publication date Feb 24, 2005
- International Business Machines Corporation
- Azeez Bhavnagarwala
- G01 - MEASURING TESTING

for curve tracing of semiconductor characteristics

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for measuring current-voltage characteristic

Signal analyzer and method of processing data from an input signal

Switching loss measurement and plot in test and measurement instrument

Computer implemented method for determining intrinsic parameter in...

Method for measuring current-voltage characteristic

Method for measuring current-voltage characteristic

Dynamic response analysis prober device

Method and device for determining the temperature calibration chara...

Testing method and testing system for semiconductor element

Guide and support member for a device for testing electronic compon...

Testing of module integrated electronics using power reversal

Power device analyzer

Method for determining BSIMSOI4 DC model parameters

Wireless current-voltage tracer with uninterrupted bypass system an...

Digital programmable load measurement device

Photovoltaic array systems, methods, and devices with bidirectional...

Photovoltaic array systems, methods, and devices with bidirectional...

Photovoltaic array systems, methods, and devices and improved diagn...

Method for measuring I-V characteristics of solar cell, and solar cell

Photovoltaic array systems, methods, and devices with improved diag...

SCR module dynamic counter tester

Method for load-line correction of pulsed measurements

Method for forming optimal characteristic curves of solar cell and...

Circuits and methods for characterizing random variations in device...

Pulsed I-V measurement method and apparatus

Cable compensation for pulsed I-V measurements

Measurement apparatus for FET characteristics

Apparatus and method for measuring operating temperatures of an ele...

Method and apparatus for measuring photoelectric conversion device,...

Method and apparatus for calculating the electrical characteristics...

Patents Applicationslast 30 patents

METHOD FOR MEASURING CURRENT-VOLTAGE CHARACTERISTIC

TESTING APPARATUS AND TESTING METHOD

A WEDGE AMPLITUDE-MODULATION PROBE CARD AND A MAIN BODY THEREOF

METHOD AND APPARATUS FOR DETERMINING OUTPUT CHARGE OF WIDE BANDGAP...

METHOD AND DEVICE FOR MEASURING SEMICONDUCTOR MULTILAYER STRUCTURE...

MACHINE LEARNING MODEL TRAINING USING DE-NOISED DATA AND MODEL PRED...

ANALYZING AN OPERATION OF A POWER SEMICONDUCTOR DEVICE

METHOD FOR MEASURING CURRENT-VOLTAGE CHARACTERISTIC

CONNECTOR

TESTING OF MODULE INTEGRATED ELECTRONICS USING POWER REVERSAL

GUIDE AND SUPPORT MEMBER FOR A DEVICE FOR TESTING ELECTRONIC COMPON...

METHOD FOR INSPECTING DEFECTS OF SOLAR CELLS AND SYSTEM THEREOF

METHOD AND DEVICE FOR DETERMINING THE TEMPERATURE CALIBRATION CHARA...

WIRELESS CURRENT-VOLTAGE TRACER WITH UNINTERRUPTED BYPASS SYSTEM AN...

TESTING METHOD AND TESTING SYSTEM FOR SEMICONDUCTOR ELEMENT

Power Device Analyzer

Photovoltaic Array Systems, Methods, and Devices with Bidirectional...

Photovoltaic Array Systems, Methods, and Devices with Improved Diag...

PHOTOVOLTAIC ARRAY SYSTEMS, METHODS, AND DEVICES WITH BIDIRECTIONAL...

DIGITAL PROGRAMMABLE LOAD MEASUREMENT DEVICE

Method for Determining BSIMSOI4 DC Model Parameters

Photovoltaic Array Systems, Methods, and Devices with Improved Diag...

Photovoltaic Array Systems, Methods, and Devices with Bidirectional...

SCR Module Dynamic Counter Tester

Circuits and Methods for Characterizing Random Variations in Device...

METHOD FOR MEASURING I-V CHARACTERISTICS OF SOLAR CELL, AND SOLAR CELL

METHOD FOR FORMING OPTIMAL CHARACTERISTIC CURVES OF SOLAR CELL AND...

Cable compensation for pulsed I-V measurements

Measurement apparatus for FET characteristics

Circuits and methods for characterizing random variations in device...