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G01R13/325
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R13/00
Arrangements for displaying electric variables or waveforms
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G01R13/325
for displaying non-recurrent functions such as transients
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Patents Grants
last 30 patents
Information
Patent Grant
Flash waveform analyzer method and device
Patent number
5,457,637
Issue date
Oct 10, 1995
Texas Instruments Inc.
Jerold A. Seitchik
G01 - MEASURING TESTING
Information
Patent Grant
Automatic extraction of pulse-parametrics from multi-valued functions
Patent number
5,343,405
Issue date
Aug 30, 1994
Tektronix, Inc.
Dennis W. Kucera
G01 - MEASURING TESTING
Information
Patent Grant
Automatic anomalous event detection
Patent number
5,123,034
Issue date
Jun 16, 1992
Tektronix, Inc.
Jean-Christophe Grujon
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for the automatic recording of signal curves
Patent number
4,901,009
Issue date
Feb 13, 1990
Asea Brown Boveri Aktiengesellschaft
Wolfgang Schultze
G01 - MEASURING TESTING
Information
Patent Grant
Data acquisition system
Patent number
4,156,809
Issue date
May 29, 1979
The United States of America as represented by the United States Department o...
David T. Phillips
G01 - MEASURING TESTING
Information
Patent Grant
3662380
Patent number
3,662,380
Issue date
May 9, 1972
G01 - MEASURING TESTING
Information
Patent Grant
3633101
Patent number
3,633,101
Issue date
Jan 4, 1972
G01 - MEASURING TESTING
Information
Patent Grant
3579121
Patent number
3,579,121
Issue date
May 18, 1971
G01 - MEASURING TESTING
Information
Patent Grant
3549799
Patent number
3,549,799
Issue date
Dec 22, 1970
G01 - MEASURING TESTING
Information
Patent Grant
3309533
Patent number
3,309,533
Issue date
Mar 14, 1967
G01 - MEASURING TESTING
Information
Patent Grant
3153699
Patent number
3,153,699
Issue date
Oct 20, 1964
G01 - MEASURING TESTING
Information
Patent Grant
2928985
Patent number
2,928,985
Issue date
Mar 15, 1960
G01 - MEASURING TESTING
Information
Patent Grant
2477847
Patent number
2,477,847
Issue date
Aug 2, 1949
G01 - MEASURING TESTING
Information
Patent Grant
2477848
Patent number
2,477,848
Issue date
Aug 2, 1949
G08 - SIGNALLING
Information
Patent Grant
2477770
Patent number
2,477,770
Issue date
Aug 2, 1949
G01 - MEASURING TESTING
Information
Patent Grant
2471246
Patent number
2,471,246
Issue date
May 24, 1949
G01 - MEASURING TESTING
Information
Patent Grant
2466924
Patent number
2,466,924
Issue date
Apr 12, 1949
G01 - MEASURING TESTING
Information
Patent Grant
2464393
Patent number
2,464,393
Issue date
Mar 15, 1949
G01 - MEASURING TESTING
Information
Patent Grant
2430154
Patent number
2,430,154
Issue date
Nov 4, 1947
G01 - MEASURING TESTING
Information
Patent Grant
2378383
Patent number
2,378,383
Issue date
Jun 19, 1945
G01 - MEASURING TESTING
Information
Patent Grant
2350069
Patent number
2,350,069
Issue date
May 30, 1944
G01 - MEASURING TESTING
Information
Patent Grant
2244513
Patent number
2,244,513
Issue date
Jun 3, 1941
G01 - MEASURING TESTING
Information
Patent Grant
2241256
Patent number
2,241,256
Issue date
May 6, 1941
G01 - MEASURING TESTING
Information
Patent Grant
2219188
Patent number
2,219,188
Issue date
Oct 22, 1940
G01 - MEASURING TESTING
Information
Patent Grant
2211325
Patent number
2,211,325
Issue date
Aug 13, 1940
G01 - MEASURING TESTING
Information
Patent Grant
2185292
Patent number
2,185,292
Issue date
Jan 2, 1940
G01 - MEASURING TESTING
Information
Patent Grant
2180153
Patent number
2,180,153
Issue date
Nov 14, 1939
G01 - MEASURING TESTING
Information
Patent Grant
2086546
Patent number
2,086,546
Issue date
Jul 13, 1937
G01 - MEASURING TESTING
Information
Patent Grant
1986607
Patent number
1,986,607
Issue date
Jan 1, 1935
G01 - MEASURING TESTING
Information
Patent Grant
1738464
Patent number
1,738,464
Issue date
Dec 3, 1929
G01 - MEASURING TESTING
Patents Applications
last 30 patents