for displaying non-recurrent functions such as transients

Patents Grantslast 30 patents

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    Flash waveform analyzer method and device

    • Patent number 5,457,637
    • Issue date Oct 10, 1995
    • Texas Instruments Inc.
    • Jerold A. Seitchik
    • G01 - MEASURING TESTING
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    Automatic extraction of pulse-parametrics from multi-valued functions

    • Patent number 5,343,405
    • Issue date Aug 30, 1994
    • Tektronix, Inc.
    • Dennis W. Kucera
    • G01 - MEASURING TESTING
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    Automatic anomalous event detection

    • Patent number 5,123,034
    • Issue date Jun 16, 1992
    • Tektronix, Inc.
    • Jean-Christophe Grujon
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method and device for the automatic recording of signal curves

    • Patent number 4,901,009
    • Issue date Feb 13, 1990
    • Asea Brown Boveri Aktiengesellschaft
    • Wolfgang Schultze
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Data acquisition system

    • Patent number 4,156,809
    • Issue date May 29, 1979
    • The United States of America as represented by the United States Department o...
    • David T. Phillips
    • G01 - MEASURING TESTING
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    3662380

    • Patent number 3,662,380
    • Issue date May 9, 1972
    • G01 - MEASURING TESTING
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    3633101

    • Patent number 3,633,101
    • Issue date Jan 4, 1972
    • G01 - MEASURING TESTING
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    3579121

    • Patent number 3,579,121
    • Issue date May 18, 1971
    • G01 - MEASURING TESTING
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    3549799

    • Patent number 3,549,799
    • Issue date Dec 22, 1970
    • G01 - MEASURING TESTING
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    3309533

    • Patent number 3,309,533
    • Issue date Mar 14, 1967
    • G01 - MEASURING TESTING
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    3153699

    • Patent number 3,153,699
    • Issue date Oct 20, 1964
    • G01 - MEASURING TESTING
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    2928985

    • Patent number 2,928,985
    • Issue date Mar 15, 1960
    • G01 - MEASURING TESTING
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    2477847

    • Patent number 2,477,847
    • Issue date Aug 2, 1949
    • G01 - MEASURING TESTING
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    2477848

    • Patent number 2,477,848
    • Issue date Aug 2, 1949
    • G08 - SIGNALLING
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    2477770

    • Patent number 2,477,770
    • Issue date Aug 2, 1949
    • G01 - MEASURING TESTING
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    2471246

    • Patent number 2,471,246
    • Issue date May 24, 1949
    • G01 - MEASURING TESTING
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    2466924

    • Patent number 2,466,924
    • Issue date Apr 12, 1949
    • G01 - MEASURING TESTING
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    2464393

    • Patent number 2,464,393
    • Issue date Mar 15, 1949
    • G01 - MEASURING TESTING
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    2430154

    • Patent number 2,430,154
    • Issue date Nov 4, 1947
    • G01 - MEASURING TESTING
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    2378383

    • Patent number 2,378,383
    • Issue date Jun 19, 1945
    • G01 - MEASURING TESTING
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    2350069

    • Patent number 2,350,069
    • Issue date May 30, 1944
    • G01 - MEASURING TESTING
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    2244513

    • Patent number 2,244,513
    • Issue date Jun 3, 1941
    • G01 - MEASURING TESTING
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    2241256

    • Patent number 2,241,256
    • Issue date May 6, 1941
    • G01 - MEASURING TESTING
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    2219188

    • Patent number 2,219,188
    • Issue date Oct 22, 1940
    • G01 - MEASURING TESTING
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    2211325

    • Patent number 2,211,325
    • Issue date Aug 13, 1940
    • G01 - MEASURING TESTING
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    2185292

    • Patent number 2,185,292
    • Issue date Jan 2, 1940
    • G01 - MEASURING TESTING
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    2180153

    • Patent number 2,180,153
    • Issue date Nov 14, 1939
    • G01 - MEASURING TESTING
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    2086546

    • Patent number 2,086,546
    • Issue date Jul 13, 1937
    • G01 - MEASURING TESTING
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    1986607

    • Patent number 1,986,607
    • Issue date Jan 1, 1935
    • G01 - MEASURING TESTING
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    1738464

    • Patent number 1,738,464
    • Issue date Dec 3, 1929
    • G01 - MEASURING TESTING