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G01R13/342
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G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R13/00
Arrangements for displaying electric variables or waveforms
Current Industry
G01R13/342
for displaying periodic H.F. signals
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Patents Grants
last 30 patents
Information
Patent Grant
Measuring instrument with multiple signal terminals shared in multi...
Patent number
6,816,708
Issue date
Nov 9, 2004
Anritsu Corporation
Jun Kinase
G01 - MEASURING TESTING
Information
Patent Grant
System and method for establishing a subsampling rate for repetitiv...
Patent number
6,768,430
Issue date
Jul 27, 2004
Agilent Technologies, Inc.
Michael J. Weinstein
G01 - MEASURING TESTING
Information
Patent Grant
Charge sampling circuit
Patent number
6,225,837
Issue date
May 1, 2001
LeCroy S.A.
Jean-François Goumaz
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for digital sampling of electrical waveforms
Patent number
5,978,742
Issue date
Nov 2, 1999
Tektronix, Inc.
John J. Pickerd
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for improving time variant image details on a...
Patent number
5,929,842
Issue date
Jul 27, 1999
Fluke Corporation
Maarten Vertregt
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Scanning method for jittered signals
Patent number
5,506,635
Issue date
Apr 9, 1996
Siemens Aktiengesellschaft
Thomas Vorwerk
G01 - MEASURING TESTING
Information
Patent Grant
Pulse generation, parameter determination, and modification system
Patent number
5,012,808
Issue date
May 7, 1991
Zion Educational Foundation
Ron Stubbers
G01 - MEASURING TESTING
Information
Patent Grant
Analog recording and integration of electric signals
Patent number
4,926,057
Issue date
May 15, 1990
Daniele Fournier
G01 - MEASURING TESTING
Information
Patent Grant
Time domain reflectometer
Patent number
4,866,302
Issue date
Sep 12, 1989
Hypres, Incorporated
Stephen R. Whiteley
G01 - MEASURING TESTING
Information
Patent Grant
Time domain reflectometer
Patent number
4,789,794
Issue date
Dec 6, 1988
Hypres Incorporated
Stephen R. Whiteley
G01 - MEASURING TESTING
Information
Patent Grant
Voltage, current and frequency measuring of non-standard waveforms
Patent number
4,779,044
Issue date
Oct 18, 1988
Zion Educational Foundation
Malcolm Skolnick
G01 - MEASURING TESTING
Information
Patent Grant
Particle trigger and delay generation system
Patent number
4,777,362
Issue date
Oct 11, 1988
Hypres, Inc.
Sadeg M. Faris
G01 - MEASURING TESTING
Information
Patent Grant
Ultra high resolution Josephson sampling technique
Patent number
4,631,423
Issue date
Dec 23, 1986
International Business Machines Corporation
Sadeg M. Faris
G01 - MEASURING TESTING
Information
Patent Grant
Soliton sampler
Patent number
4,533,840
Issue date
Aug 6, 1985
International Business Machines Corporation
Tushar R. Gheewala
G01 - MEASURING TESTING
Information
Patent Grant
Ultra high resolution Josephson sampling technique
Patent number
4,401,900
Issue date
Aug 30, 1983
International Business Machines Corporation
Sadeg M. Faris
G01 - MEASURING TESTING
Information
Patent Grant
Analog waveform digitizer
Patent number
4,297,680
Issue date
Oct 27, 1981
John Fluke Mfg. Co., Inc.
Henriecus Koeman
G01 - MEASURING TESTING
Information
Patent Grant
Device for detecting the deflection signal of the electron beam gen...
Patent number
4,166,956
Issue date
Sep 4, 1979
Thomson-CSF
Jean Fraleux
G01 - MEASURING TESTING
Information
Patent Grant
3921028
Patent number
3,921,028
Issue date
Nov 18, 1975
G01 - MEASURING TESTING
Information
Patent Grant
3900759
Patent number
3,900,759
Issue date
Aug 19, 1975
G01 - MEASURING TESTING
Information
Patent Grant
3843926
Patent number
3,843,926
Issue date
Oct 22, 1974
G01 - MEASURING TESTING
Information
Patent Grant
3764905
Patent number
3,764,905
Issue date
Oct 9, 1973
G01 - MEASURING TESTING
Information
Patent Grant
3747002
Patent number
3,747,002
Issue date
Jul 17, 1973
G01 - MEASURING TESTING
Information
Patent Grant
3742290
Patent number
3,742,290
Issue date
Jun 26, 1973
G01 - MEASURING TESTING
Information
Patent Grant
3704416
Patent number
3,704,416
Issue date
Nov 28, 1972
G01 - MEASURING TESTING
Information
Patent Grant
3700917
Patent number
3,700,917
Issue date
Oct 24, 1972
G01 - MEASURING TESTING
Information
Patent Grant
3665324
Patent number
3,665,324
Issue date
May 23, 1972
G11 - INFORMATION STORAGE
Information
Patent Grant
3629731
Patent number
3,629,731
Issue date
Dec 21, 1971
G01 - MEASURING TESTING
Information
Patent Grant
3621325
Patent number
3,621,325
Issue date
Nov 16, 1971
G01 - MEASURING TESTING
Information
Patent Grant
3611003
Patent number
3,611,003
Issue date
Oct 5, 1971
G01 - MEASURING TESTING
Information
Patent Grant
3584309
Patent number
3,584,309
Issue date
Jun 8, 1971
G01 - MEASURING TESTING
Patents Applications
last 30 patents