-
-
-
Charge sampling circuit
-
Patent number 6,225,837
-
Issue date May 1, 2001
-
LeCroy S.A.
-
Jean-François Goumaz
-
G01 - MEASURING TESTING
-
-
-
-
-
-
Time domain reflectometer
-
Patent number 4,866,302
-
Issue date Sep 12, 1989
-
Hypres, Incorporated
-
Stephen R. Whiteley
-
G01 - MEASURING TESTING
-
Time domain reflectometer
-
Patent number 4,789,794
-
Issue date Dec 6, 1988
-
Hypres Incorporated
-
Stephen R. Whiteley
-
G01 - MEASURING TESTING
-
-
-
-
Soliton sampler
-
Patent number 4,533,840
-
Issue date Aug 6, 1985
-
International Business Machines Corporation
-
Tushar R. Gheewala
-
G01 - MEASURING TESTING
-
-
Analog waveform digitizer
-
Patent number 4,297,680
-
Issue date Oct 27, 1981
-
John Fluke Mfg. Co., Inc.
-
Henriecus Koeman
-
G01 - MEASURING TESTING
-
-
3921028
-
Patent number 3,921,028
-
Issue date Nov 18, 1975
-
G01 - MEASURING TESTING
-
3900759
-
Patent number 3,900,759
-
Issue date Aug 19, 1975
-
G01 - MEASURING TESTING
-
3843926
-
Patent number 3,843,926
-
Issue date Oct 22, 1974
-
G01 - MEASURING TESTING
-
3764905
-
Patent number 3,764,905
-
Issue date Oct 9, 1973
-
G01 - MEASURING TESTING
-
3747002
-
Patent number 3,747,002
-
Issue date Jul 17, 1973
-
G01 - MEASURING TESTING
-
3742290
-
Patent number 3,742,290
-
Issue date Jun 26, 1973
-
G01 - MEASURING TESTING
-
3704416
-
Patent number 3,704,416
-
Issue date Nov 28, 1972
-
G01 - MEASURING TESTING
-
3700917
-
Patent number 3,700,917
-
Issue date Oct 24, 1972
-
G01 - MEASURING TESTING
-
3665324
-
Patent number 3,665,324
-
Issue date May 23, 1972
-
G11 - INFORMATION STORAGE
-
3629731
-
Patent number 3,629,731
-
Issue date Dec 21, 1971
-
G01 - MEASURING TESTING
-
3621325
-
Patent number 3,621,325
-
Issue date Nov 16, 1971
-
G01 - MEASURING TESTING
-
3611003
-
Patent number 3,611,003
-
Issue date Oct 5, 1971
-
G01 - MEASURING TESTING
-
3584309
-
Patent number 3,584,309
-
Issue date Jun 8, 1971
-
G01 - MEASURING TESTING