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for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)
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G01R13/345
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Parent Industries
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R13/00
Arrangements for displaying electric variables or waveforms
Current Industry
G01R13/345
for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method and device for digital compensation of dynamic distortion in...
Patent number
12,034,573
Issue date
Jul 9, 2024
MARVELL ASIA PTE. LTD.
Dragos Cartina
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Pattern acquisitions in equivalent time sampling systems
Patent number
12,019,098
Issue date
Jun 25, 2024
Tektronix, Inc.
Noah Brummer
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Waveform segmentation device and waveform segmentation method
Patent number
12,000,868
Issue date
Jun 4, 2024
Kabushiki Kaisha Toshiba
Topon Paul
G01 - MEASURING TESTING
Information
Patent Grant
Measurement apparatus and measurement method
Patent number
11,567,106
Issue date
Jan 31, 2023
Rohde & Schwarz GmbH & Co. KG
Gerd Bresser
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Jitter insertion system for waveform generation
Patent number
11,422,584
Issue date
Aug 23, 2022
Tektronix, Inc.
John J. Pickerd
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and device for digital compensation of dynamic distortion in...
Patent number
11,005,690
Issue date
May 11, 2021
INPHI CORPORATION
Dragos Cartina
G01 - MEASURING TESTING
Information
Patent Grant
Variable resolution oscilloscope
Patent number
10,725,070
Issue date
Jul 28, 2020
Teledyne LeCroy, Inc.
Peter J. Pupalaikis
G01 - MEASURING TESTING
Information
Patent Grant
Analog transitional storage
Patent number
10,670,632
Issue date
Jun 2, 2020
Tektronix, Inc.
David A. Holaday
G01 - MEASURING TESTING
Information
Patent Grant
Measuring device and a method for improved imaging of the spectral...
Patent number
10,571,491
Issue date
Feb 25, 2020
Rohde & Schwarz GmbH & Co. KG
Nico Tonder
G01 - MEASURING TESTING
Information
Patent Grant
Variable resolution oscilloscope
Patent number
10,534,019
Issue date
Jan 14, 2020
Teledyne LeCroy, Inc.
Peter J. Pupalaikis
G01 - MEASURING TESTING
Information
Patent Grant
Measuring device and method with automated trigger function
Patent number
10,495,670
Issue date
Dec 3, 2019
Rohde & Schwarz GmbH & Co. KG
Johann Huber
G01 - MEASURING TESTING
Information
Patent Grant
Real-time spectrum analyzer having frequency content based trigger...
Patent number
10,024,895
Issue date
Jul 17, 2018
Keysight Technologies, Inc.
Joeri Melis
G01 - MEASURING TESTING
Information
Patent Grant
Conversion rate control for analog to digital conversion
Patent number
9,841,446
Issue date
Dec 12, 2017
NXP USA, INC.
Lukas Vaculik
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Logical triggering in the frequency domain
Patent number
9,784,776
Issue date
Oct 10, 2017
Tektronix, Inc.
John A. Dement
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Equivalent-time sampling techninque for non-coherently modulated si...
Patent number
9,772,353
Issue date
Sep 26, 2017
Tektronix, Inc.
Michael A. Nelson
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Precise estimation of arrival time of switching events close in tim...
Patent number
9,632,136
Issue date
Apr 25, 2017
International Business Machines Corporation
Franco Stellari
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for gathering signal states for debugging a circuit
Patent number
8,983,790
Issue date
Mar 17, 2015
Xilinx, Inc.
Ushasri Merugu
G01 - MEASURING TESTING
Information
Patent Grant
Measuring device for a preview display of several time-variable ele...
Patent number
8,195,413
Issue date
Jun 5, 2012
Rohde & Schwarz GmbH & Co. KG
Markus Freidhof
G01 - MEASURING TESTING
Information
Patent Grant
R/T display compression preserving intensity information
Patent number
8,055,077
Issue date
Nov 8, 2011
Tektronix, Inc.
Jeff W. Mucha
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for digital triggering of signals on the basis of...
Patent number
8,046,182
Issue date
Oct 25, 2011
Rohde & Schwarz GmbH & Co. KG
Markus Freidhof
G01 - MEASURING TESTING
Information
Patent Grant
Report generating method and apparatus
Patent number
7,663,624
Issue date
Feb 16, 2010
LeCroy Corporation
Anthony Cake
G01 - MEASURING TESTING
Information
Patent Grant
Detection of time-frequency codes using a spectrogram
Patent number
7,620,509
Issue date
Nov 17, 2009
Tektronix, Inc.
Richard A. Cameron
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Mixed signal display for a measurement instrument
Patent number
7,529,641
Issue date
May 5, 2009
Tektronix, Inc.
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
Frame signal waveform observation apparatus and method
Patent number
7,508,844
Issue date
Mar 24, 2009
Anritsu Corporation
Mitsuo Amagai
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus to measure and display data dependent eye diag...
Patent number
7,467,336
Issue date
Dec 16, 2008
SyntheSys Research, Inc.
Thomas E. Waschura
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and apparatus for analyzing serial data streams
Patent number
7,437,624
Issue date
Oct 14, 2008
LeCroy Corporation
Martin Miller
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Pattern trigger in a coherent timebase
Patent number
7,285,946
Issue date
Oct 23, 2007
LeCroy Corporation
Stephen C. Ems
G01 - MEASURING TESTING
Information
Patent Grant
Graphical application development system for test, measurement and...
Patent number
7,275,235
Issue date
Sep 25, 2007
Alfred A. Molinari
G01 - MEASURING TESTING
Information
Patent Grant
Three dimensional correlated data display
Patent number
7,236,900
Issue date
Jun 26, 2007
Tektronix, Inc.
Michael S. Hagen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Waveform measuring instrument using interpolated data
Patent number
7,219,025
Issue date
May 15, 2007
Yokogawa Electric Corporation
Takuya Saitou
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF ANALYZING A SIGNAL AND SIGNAL ANALYSIS DEVICE
Publication number
20220043031
Publication date
Feb 10, 2022
ROHDE & SCHWARZ GMBH & CO. KG
Markus Freidhof
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR DIGITAL COMPENSATION OF DYNAMIC DISTORTION IN...
Publication number
20210297294
Publication date
Sep 23, 2021
INPHI CORPORATION
Dragos CARTINA
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR DERIVING INFORMATION FROM SAMPLED DATA ON A...
Publication number
20210148952
Publication date
May 20, 2021
SCHNEIDER ELECTRIC USA, INC.
Erin C. McPhalen
G01 - MEASURING TESTING
Information
Patent Application
DISPLAY DATA GENERATION DEVICE, DISPLAY DATA GENERATION METHOD, AND...
Publication number
20200393497
Publication date
Dec 17, 2020
Mitsubishi Electric Corporation
Osamu NASU
G01 - MEASURING TESTING
Information
Patent Application
PATTERN ACQUISITIONS IN EQUIVALENT TIME SAMPLING SYSTEMS
Publication number
20200386791
Publication date
Dec 10, 2020
Tektronix, Inc.
Noah Brummer
G01 - MEASURING TESTING
Information
Patent Application
WAVEFORM SEGMENTATION DEVICE AND WAVEFORM SEGMENTATION METHOD
Publication number
20200379016
Publication date
Dec 3, 2020
KABUSHIKI KAISHA TOSHIBA
Topon PAUL
G01 - MEASURING TESTING
Information
Patent Application
Variable Resolution Oscilloscope
Publication number
20200088766
Publication date
Mar 19, 2020
Teledyne LeCroy, Inc.
Peter J. Pupalaikis
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
Publication number
20200041545
Publication date
Feb 6, 2020
Rohde& Schwarz GmbH & Co. KG
Gerd Bresser
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
VARIABLE RESOLUTION OSCILLOSCOPE
Publication number
20180059143
Publication date
Mar 1, 2018
Teledyne LeCroy, Inc.
Peter J. Pupalaikis
G01 - MEASURING TESTING
Information
Patent Application
CONVERSION RATE CONTROL FOR ANALOG TO DIGITAL CONVERSION
Publication number
20170356937
Publication date
Dec 14, 2017
FREESCALE SEMICONDUCTOR, INC.
Lukas Vaculik
G01 - MEASURING TESTING
Information
Patent Application
Real-time Oscilloscope For Generating a Fast Real-time Eye Diagram
Publication number
20150066409
Publication date
Mar 5, 2015
Keysight Technologies, Inc.
Christopher P. Duff
G01 - MEASURING TESTING
Information
Patent Application
EQUIVALENT-TIME SAMPLING TECHNINQUE FOR NON-COHERENTLY MODULATED SI...
Publication number
20140358464
Publication date
Dec 4, 2014
Tektronix, Inc.
Michael A. Nelson
G01 - MEASURING TESTING
Information
Patent Application
LOGICAL TRIGGERING IN THE FREQUENCY DOMAIN
Publication number
20140012526
Publication date
Jan 9, 2014
Tektronix, Inc.
John A. Dement
G01 - MEASURING TESTING
Information
Patent Application
LOGICAL TRIGGERING IN THE FREQUENCY DOMAIN
Publication number
20110274150
Publication date
Nov 10, 2011
Tektronix, Inc.
JOHN A. DEMENT
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
MEASURING DEVICE FOR A PREVIEW DISPLAY OF SEVERAL TIME-VARIABLE ELE...
Publication number
20090265126
Publication date
Oct 22, 2009
ROHDE &SCHWARZ GMBH & CO. KG
Markus Freidhof
G01 - MEASURING TESTING
Information
Patent Application
Method and System for Digital Triggering of Signals on the Basis of...
Publication number
20080270054
Publication date
Oct 30, 2008
ROHDE &SCHWARZ GMBH & CO. KG
Markus Freidhof
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for processing a signal under test using a tri...
Publication number
20070273389
Publication date
Nov 29, 2007
Kan Tan
G01 - MEASURING TESTING
Information
Patent Application
Calibration method and apparatus using a trigger signal synchronous...
Publication number
20070276622
Publication date
Nov 29, 2007
John J. Pickerd
G01 - MEASURING TESTING
Information
Patent Application
Mixed signal display for a measurement instrument
Publication number
20070250278
Publication date
Oct 25, 2007
Steven K. Sullivan
G01 - MEASURING TESTING
Information
Patent Application
Digital oscilloscope and method for displaying signal
Publication number
20070229055
Publication date
Oct 4, 2007
Kabushiki Kaisha Toshiba
Yoshihiro Nishida
G01 - MEASURING TESTING
Information
Patent Application
R/T display compression preserving intensity information
Publication number
20070133887
Publication date
Jun 14, 2007
Jeff W. Mucha
G01 - MEASURING TESTING
Information
Patent Application
Detection of time-frequency codes using a spectrogram
Publication number
20070098045
Publication date
May 3, 2007
Richard A. Cameron
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Apparatus and method for processing a signal under test for measuri...
Publication number
20070041511
Publication date
Feb 22, 2007
Kan Tan
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Quadrature phase-shifting timebase system
Publication number
20060241915
Publication date
Oct 26, 2006
Mark Joseph Woodward
G01 - MEASURING TESTING
Information
Patent Application
WAVEFORM DISPLAY DEVICE CAPABLE OF CONNECTING TO NETWORK
Publication number
20060224340
Publication date
Oct 5, 2006
Genichi Imamura
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for processing acquired signals for measuring...
Publication number
20060182231
Publication date
Aug 17, 2006
Kan Tan
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Pattern trigger in a coherent timebase
Publication number
20060176151
Publication date
Aug 10, 2006
LeCroy Corporation
Stephen C. Ems
G01 - MEASURING TESTING
Information
Patent Application
Report generating method and apparatus
Publication number
20060001666
Publication date
Jan 5, 2006
LeCroy Corporation
Anthony Cake
G01 - MEASURING TESTING
Information
Patent Application
Trigger signal generation system frame signal waveform observation...
Publication number
20050271087
Publication date
Dec 8, 2005
Anritus Corporation
Mitsuo Amagai
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus to measure and display data dependent eye diag...
Publication number
20050246601
Publication date
Nov 3, 2005
Thomas E. Waschura
H04 - ELECTRIC COMMUNICATION TECHNIQUE