for double-sided contacting or for testing boards with surface-mounted devices (SMD's)

Industry

CPC
G01R1/07335

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/07335for double-sided contacting or for testing boards with surface-mounted devices (SMD's)

Industries

Patents Grantslast 30 patents

Information Patent Grant
Methods and assemblies for tuning electronic modules
- Patent number 11,693,029
- Issue date Jul 4, 2023
- NXP USA, INC.
- Joshua Bennett English
- G01 - MEASURING TESTING
Information Patent Grant
Contact terminal, inspection jig, and inspection apparatus
- Patent number 10,649,004
- Issue date May 12, 2020
- Nidec-Read Corporation
- Norihiro Ota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for checking electronic cards
- Patent number 9,494,638
- Issue date Nov 15, 2016
- Larisys Industries
- Morad Mahdjoub
- G01 - MEASURING TESTING
Information Patent Grant
Circuit board checker and circuit board checking method
- Patent number 7,541,823
- Issue date Jun 2, 2009
- JSR Corporation
- Sugiro Shimoda
- G01 - MEASURING TESTING
Information Patent Grant
Inspection equipment of circuit board and inspection method of circ...
- Patent number 7,489,147
- Issue date Feb 10, 2009
- JSR Corporation
- Kiyoshi Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Circuit board checker and circuit board checking method
- Patent number 7,279,914
- Issue date Oct 9, 2007
- JSR Corporation
- Sugiro Shimoda
- G01 - MEASURING TESTING
Information Patent Grant
Electrical inspection apparatus
- Patent number 7,145,351
- Issue date Dec 5, 2006
- Yamaha Fine Technologies Co., Ltd
- Yasunori Mizoguchi
- G01 - MEASURING TESTING
Information Patent Grant
Universal test fixture
- Patent number 7,071,717
- Issue date Jul 4, 2006
- Agilent Technologies, Inc.
- Charles D. Hoke
- G01 - MEASURING TESTING
Information Patent Grant
Testing device for printed circuit boards
- Patent number 6,677,773
- Issue date Jan 13, 2004
- atg test systems GmbH & Co. KG
- Manfred Prokopp
- G01 - MEASURING TESTING
Information Patent Grant
Wireless test fixture for printed circuit board test systems
- Patent number 6,628,130
- Issue date Sep 30, 2003
- Agilent Technologies, Inc.
- Michael C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing a printed circuit
- Patent number 6,218,851
- Issue date Apr 17, 2001
- New System S.r.l.
- Jozef Vodopivec
- G01 - MEASURING TESTING
Information Patent Grant
Printed circuit board test device with test adapter and method for...
- Patent number 6,191,597
- Issue date Feb 20, 2001
- Mania GmbH & Co.
- Hubert Driller
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for printed circuit board and assembly kit therefor
- Patent number 6,130,547
- Issue date Oct 10, 2000
- Masatoshi Kato
- G01 - MEASURING TESTING
Information Patent Grant
Test fixture for two sided circuit boards
- Patent number 5,898,313
- Issue date Apr 27, 1999
- Mario A. Cugini
- G01 - MEASURING TESTING
Information Patent Grant
Press assembly for electrically testing a printed circuit board hav...
- Patent number 5,889,407
- Issue date Mar 30, 1999
- Circuit Line S.p.A.
- Fernando Nucci
- G01 - MEASURING TESTING
Information Patent Grant
Probing adapter for testing IC packages
- Patent number 5,646,542
- Issue date Jul 8, 1997
- Hewlett-Packard Co.
- Thomas J. Zamborelli
- G01 - MEASURING TESTING
Information Patent Grant
Multi-station machine and press assembly for electrically testing a...
- Patent number 5,614,819
- Issue date Mar 25, 1997
- Circuit Line S.p.A.
- Fernando Nucci
- G01 - MEASURING TESTING
Information Patent Grant
Open frame gantry probing system
- Patent number 5,543,726
- Issue date Aug 6, 1996
- International Business Machines Corporation
- James E. Boyette
- G01 - MEASURING TESTING
Information Patent Grant
Completely wireless dual-access test fixture
- Patent number 5,500,606
- Issue date Mar 19, 1996
- Compaq Computer Corporation
- Frederick J. Holmes
- G01 - MEASURING TESTING
Information Patent Grant
Double-sided automatic test equipment probe clamshell with vacuum-a...
- Patent number 5,436,567
- Issue date Jul 25, 1995
- Automated Test Engineering, Inc.
- Donald J. Wexler
- G01 - MEASURING TESTING
Information Patent Grant
Probe for capacitive open-circuit tests
- Patent number 5,426,372
- Issue date Jun 20, 1995
- GenRad, Inc.
- Paul R. Freve
- G01 - MEASURING TESTING
Information Patent Grant
Dual side access test fixture
- Patent number 5,270,641
- Issue date Dec 14, 1993
- Everett Charles Technologies, Inc.
- David R. Van Loan
- G01 - MEASURING TESTING
Information Patent Grant
Compact, wireless apparatus for electrically testing printed circui...
- Patent number 5,157,325
- Issue date Oct 20, 1992
- Compaq Computer Corporation
- Patrick K. Murphy
- G01 - MEASURING TESTING
Information Patent Grant
Top-accessible system, and related methods, for simultaneously test...
- Patent number 5,087,878
- Issue date Feb 11, 1992
- Compaq Computer Corporation
- Walter J. Belmore
- G01 - MEASURING TESTING
Information Patent Grant
Testing device for both-sided two-stage contacting of equipped prin...
- Patent number 5,068,600
- Issue date Nov 26, 1991
- Siemens Aktiengesellschaft
- Wolfgang Hilz
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing circuit boards
- Patent number 4,912,400
- Issue date Mar 27, 1990
- Design and Manufacturing Specialties, Inc.
- James E. Plante
- G01 - MEASURING TESTING
Information Patent Grant
Testing device for both-sided contacting of component-equipped prin...
- Patent number 4,841,241
- Issue date Jun 20, 1989
- Siemens Aktiengesellschaft
- Wolfgang Hilz
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for printed circuit boards
- Patent number 4,820,975
- Issue date Apr 11, 1989
- International Computers Limited
- Brian Diggle
- G01 - MEASURING TESTING
Information Patent Grant
Circuit board interfacing apparatus
- Patent number 4,812,754
- Issue date Mar 14, 1989
- Theodore A. Tracy
- G01 - MEASURING TESTING
Information Patent Grant
Electrical interface arrangement
- Patent number 4,780,086
- Issue date Oct 25, 1988
- Marconi Instruments Limited
- Frank H. Jenner
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE HOLDER AND PROBE UNIT
- Publication number 20240019460
- Publication date Jan 18, 2024
- NHK Spring Co., Ltd.
- Osamu Ito
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND ASSEMBLIES FOR TUNING ELECTRONIC MODULES
- Publication number 20230014716
- Publication date Jan 19, 2023
- NXP USA, Inc.
- Joshua Bennett English
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS FOR TEST CARDS
- Publication number 20230008782
- Publication date Jan 12, 2023
- Feinmetall GmbH
- Carsten Molitor
- G01 - MEASURING TESTING
Information Patent Application
TEST FIXTURE AND TESTING MACHINE HAVING THE SAME
- Publication number 20200379011
- Publication date Dec 3, 2020
- TRIPLE WIN TECHNOLOGY(SHENZHEN) CO.LTD.
- YANG-GANG LIU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND ROUND PROBE THEREOF
- Publication number 20190086443
- Publication date Mar 21, 2019
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEI-JHIH SU
- G01 - MEASURING TESTING
Information Patent Application
CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION APPARATUS
- Publication number 20190011479
- Publication date Jan 10, 2019
- NIDEC-READ CORPORATION
- Norihiro OTA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR CHECKING ELECTRONIC CARDS
- Publication number 20140333338
- Publication date Nov 13, 2014
- Morad Mahdjoub
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR INSPECTING CIRCUIT BOARD AND METHOD OF INSPECTING CIR...
- Publication number 20090153146
- Publication date Jun 18, 2009
- JSR Corporation
- Kiyoshi Kimura
- G01 - MEASURING TESTING
Information Patent Application
Inspection Equipment of Circuit Board and Inspection Method of Circ...
- Publication number 20080054921
- Publication date Mar 6, 2008
- Kiyoshi Kimura
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARD CHECKER AND CIRCUIT BOARD CHECKING METHOD
- Publication number 20080012593
- Publication date Jan 17, 2008
- JSR Corporation
- Sugiro SHIMODA
- G01 - MEASURING TESTING
Information Patent Application
UNIVERSAL TEST FIXTURE
- Publication number 20060097738
- Publication date May 11, 2006
- Charles D. Hoke
- G01 - MEASURING TESTING
Information Patent Application
Substrate testing apparatus with full contact configuration
- Publication number 20060091384
- Publication date May 4, 2006
- Advanced Semiconductor Engineering, Inc.
- Chung-Hsiung Ho
- G01 - MEASURING TESTING
Information Patent Application
Circuit board checker and circuit board checking method
- Publication number 20060043991
- Publication date Mar 2, 2006
- JSR Corporation
- Sugiro Shimoda
- G01 - MEASURING TESTING
Information Patent Application
Electrical inspection apparatus
- Publication number 20040207423
- Publication date Oct 21, 2004
- Yasunori Mizoguchi
- G01 - MEASURING TESTING
Information Patent Application
Testing device for printed circuit boards
- Publication number 20030020506
- Publication date Jan 30, 2003
- atg test systems GmbH & Co. KG
- Manfred Prokopp
- G01 - MEASURING TESTING
Information Patent Application
Wireless test fixture for printed circuit board test systems
- Publication number 20030016039
- Publication date Jan 23, 2003
- Michael C. Williams
- G01 - MEASURING TESTING

for double-sided contacting or for testing boards with surface-mounted devices (SMD's)

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Methods and assemblies for tuning electronic modules

Contact terminal, inspection jig, and inspection apparatus

Device for checking electronic cards

Circuit board checker and circuit board checking method

Inspection equipment of circuit board and inspection method of circ...

Circuit board checker and circuit board checking method

Electrical inspection apparatus

Universal test fixture

Testing device for printed circuit boards

Wireless test fixture for printed circuit board test systems

Method and apparatus for testing a printed circuit

Printed circuit board test device with test adapter and method for...

Test apparatus for printed circuit board and assembly kit therefor

Test fixture for two sided circuit boards

Press assembly for electrically testing a printed circuit board hav...

Probing adapter for testing IC packages

Multi-station machine and press assembly for electrically testing a...

Open frame gantry probing system

Completely wireless dual-access test fixture

Double-sided automatic test equipment probe clamshell with vacuum-a...

Probe for capacitive open-circuit tests

Dual side access test fixture

Compact, wireless apparatus for electrically testing printed circui...

Top-accessible system, and related methods, for simultaneously test...

Testing device for both-sided two-stage contacting of equipped prin...

Apparatus for testing circuit boards

Testing device for both-sided contacting of component-equipped prin...

Test apparatus for printed circuit boards

Circuit board interfacing apparatus

Electrical interface arrangement

Patents Applicationslast 30 patents

PROBE HOLDER AND PROBE UNIT

METHODS AND ASSEMBLIES FOR TUNING ELECTRONIC MODULES

TEST APPARATUS FOR TEST CARDS

TEST FIXTURE AND TESTING MACHINE HAVING THE SAME

PROBE CARD DEVICE AND ROUND PROBE THEREOF

CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION APPARATUS

DEVICE FOR CHECKING ELECTRONIC CARDS

APPARATUS FOR INSPECTING CIRCUIT BOARD AND METHOD OF INSPECTING CIR...

Inspection Equipment of Circuit Board and Inspection Method of Circ...

CIRCUIT BOARD CHECKER AND CIRCUIT BOARD CHECKING METHOD

UNIVERSAL TEST FIXTURE

Substrate testing apparatus with full contact configuration

Circuit board checker and circuit board checking method

Electrical inspection apparatus

Testing device for printed circuit boards

Wireless test fixture for printed circuit board test systems