for high pressure testing

Industry

CPC
G01N23/20041

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/20041for high pressure testing

Industries

Patents Grantslast 30 patents

Information Patent Grant
Structure for battery analysis and X-ray diffraction device
- Patent number 12,080,858
- Issue date Sep 3, 2024
- Rigaku Corporation
- Koichiro Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diamond anvil cell having an integrated sensor
- Patent number 12,013,354
- Issue date Jun 18, 2024
- The Regent of the University of California
- Norman Ying Yao
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Structure for pressurization analysis, X-ray diffraction apparatus...
- Patent number 11,913,891
- Issue date Feb 27, 2024
- Rigaku Corporation
- Koichiro Ito
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Modular specimen holders for high pressure freezing and X-ray cryst...
- Patent number 10,809,211
- Issue date Oct 20, 2020
- Leica Mikrosysteme GmbH
- Rainer Wogritsch
- G01 - MEASURING TESTING
Information Patent Grant
Sample handling apparatus for pressurized fluids and X-ray analyzer...
- Patent number 10,705,033
- Issue date Jul 7, 2020
- X-Ray Optical Systems, Inc.
- Joseph J Spinazola
- G01 - MEASURING TESTING
Information Patent Grant
Anvils and ultra-high pressure apparatuses using the same
- Patent number 9,194,824
- Issue date Nov 24, 2015
- U.S. Synthetic Corporation
- Jiang Qian
- G01 - MEASURING TESTING
Information Patent Grant
Photo-sensor fiber-optic stress analysis system
- Patent number 6,058,160
- Issue date May 2, 2000
- Hypernex, Inc.
- David S. Kurtz
- G01 - MEASURING TESTING
Information Patent Grant
Photo-sensor fiber-optic stress analysis system
- Patent number 5,828,724
- Issue date Oct 27, 1998
- Advanced Technology Materials, Inc.
- David S. Kurtz
- G01 - MEASURING TESTING
Information Patent Grant
Diamond anvil cell assembly
- Patent number 5,693,345
- Issue date Dec 2, 1997
- The Research Foundation of State University of New York
- Ruijin Chen
- G01 - MEASURING TESTING
Information Patent Grant
Diamond-anvil high-pressure cell with improved X-ray collimation sy...
- Patent number 4,602,377
- Issue date Jul 22, 1986
- The United States of America as represented by the United States Department o...
- David Schiferl
- G01 - MEASURING TESTING
Information Patent Grant
3548190
- Patent number 3,548,190
- Issue date Dec 15, 1970
- G01 - MEASURING TESTING
Information Patent Grant
3261057
- Patent number 3,261,057
- Issue date Jul 19, 1966
- B30 - PRESSES
Information Patent Grant
3259941
- Patent number 3,259,941
- Issue date Jul 12, 1966
- B30 - PRESSES

Patents Applicationslast 30 patents

Information Patent Application
HIGH-THROUGHPUT HIGH-PRESSURE SMALL-ANGLE NEUTRON SCATTERING SAMPLE...
- Publication number 20240272096
- Publication date Aug 15, 2024
- STF Technologies LLC
- Norman J. Wagner
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE FOR BATTERY ANALYSIS AND X-RAY DIFFRACTION DEVICE
- Publication number 20220278381
- Publication date Sep 1, 2022
- Rigaku Corporation
- Koichiro Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE FOR PRESSURIZATION ANALYSIS, X-RAY DIFFRACTION APPARATUS...
- Publication number 20220099603
- Publication date Mar 31, 2022
- Rigaku Corporation
- Koichiro Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIAMOND ANVIL CELL HAVING AN INTEGRATED SENSOR
- Publication number 20220011249
- Publication date Jan 13, 2022
- The Regents of the University of California
- Norman Ying Yao
- G01 - MEASURING TESTING
Information Patent Application
MODULAR SPECIMEN HOLDERS FOR HIGH PRESSURE FREEZING AND X-RAY CRYST...
- Publication number 20190195814
- Publication date Jun 27, 2019
- Leica Mikrosysteme GmbH
- Rainer WOGRITSCH
- G01 - MEASURING TESTING

for high pressure testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Structure for battery analysis and X-ray diffraction device

Diamond anvil cell having an integrated sensor

Structure for pressurization analysis, X-ray diffraction apparatus...

Modular specimen holders for high pressure freezing and X-ray cryst...

Sample handling apparatus for pressurized fluids and X-ray analyzer...

Anvils and ultra-high pressure apparatuses using the same

Photo-sensor fiber-optic stress analysis system

Photo-sensor fiber-optic stress analysis system

Diamond anvil cell assembly

Diamond-anvil high-pressure cell with improved X-ray collimation sy...

3548190

3261057

3259941

Patents Applicationslast 30 patents

HIGH-THROUGHPUT HIGH-PRESSURE SMALL-ANGLE NEUTRON SCATTERING SAMPLE...

STRUCTURE FOR BATTERY ANALYSIS AND X-RAY DIFFRACTION DEVICE

STRUCTURE FOR PRESSURIZATION ANALYSIS, X-RAY DIFFRACTION APPARATUS...

DIAMOND ANVIL CELL HAVING AN INTEGRATED SENSOR

MODULAR SPECIMEN HOLDERS FOR HIGH PRESSURE FREEZING AND X-RAY CRYST...