for measurement in the infra-red range

Industry

CPC
G01J3/108

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Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J3/00Spectrometry Spectrophotometry Monochromators Measuring colour

Current Industry

G01J3/108for measurement in the infra-red range

Industries

Patents Grantslast 30 patents

Information Patent Grant
Hyperspectral imaging systems
- Patent number 11,959,801
- Issue date Apr 16, 2024
- James F. Coward
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for inspecting a machine
- Patent number 11,923,096
- Issue date Mar 5, 2024
- HITACHI ENERGY LTD
- Gregory Cole
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Tunable mid-infrared laser source and method
- Patent number 11,914,267
- Issue date Feb 27, 2024
- King Abdullah University of Science and Technology
- Mohammad Khaled Shakfa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Short-wave infrared sensor for identifying based on water content
- Patent number 11,896,346
- Issue date Feb 13, 2024
- OMNI MEDSCI, LLC
- Mohammed N. Islam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mirror unit and optical module
- Patent number 11,879,731
- Issue date Jan 23, 2024
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Modeling the emission intensity of an IR emitter by varying the emi...
- Patent number 11,879,784
- Issue date Jan 23, 2024
- Hahn-Schickard-Gesellschaft fur Angewandte Forschung e.V.
- Alfons Dehé
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Textile detection module, textile sorting system and using method t...
- Patent number 11,874,526
- Issue date Jan 16, 2024
- Industrial Technology Research Institute
- Jen-You Chu
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Surface sensing systems and methods for imaging a scanned surface o...
- Patent number 11,808,563
- Issue date Nov 7, 2023
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Self-adaptive electromagnetic energy attenuator
- Patent number 11,781,906
- Issue date Oct 10, 2023
- Elbit Systems Ltd.
- Noam Yona Gross
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Augmented reality spectroscopy
- Patent number 11,754,844
- Issue date Sep 12, 2023
- Magic Leap, Inc.
- Nicole Elizabeth Samec
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Infrared spectrophotometer
- Patent number 11,747,201
- Issue date Sep 5, 2023
- Ewan Waddell
- G01 - MEASURING TESTING
Information Patent Grant
Sensing device, display device using the sensor device, and control...
- Patent number 11,749,216
- Issue date Sep 5, 2023
- Samsung Electronics Co., Ltd.
- Hojune Yoo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multiplexing and encoding for reference switching
- Patent number 11,740,126
- Issue date Aug 29, 2023
- Trent D. Ridder
- G01 - MEASURING TESTING
Information Patent Grant
FTIR data quality optimization
- Patent number 11,732,694
- Issue date Aug 22, 2023
- TPI Composites Inc.
- Richard Mignacca
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Highly-integrated ultrahigh-resolution mid-infrared dual-comb spect...
- Patent number 11,733,096
- Issue date Aug 22, 2023
- XI'AN INSTITUTE OF OPTICS AND PRECISION MECHANICS OF CAS
- Leiran Wang
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for spectral identification and optical sorting...
- Patent number 11,731,171
- Issue date Aug 22, 2023
- 6511660 CANADA INC.
- Julien Neige
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
3-dimensional measuring device
- Patent number 11,733,357
- Issue date Aug 22, 2023
- Topcon Corporation
- Yasushi Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Electrically pumped vertical cavity laser
- Patent number 11,721,953
- Issue date Aug 8, 2023
- Thorlabs, Inc.
- Vijaysekhar Jayaraman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Active remote sensing system using time-of-flight sensor combined w...
- Patent number 11,678,805
- Issue date Jun 20, 2023
- Omni MedSci, Inc.
- Mohammed N. Islam
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Outlier detection for spectroscopic classification
- Patent number 11,656,174
- Issue date May 23, 2023
- Viavi Solutions Inc.
- Chang Meng Hsiung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reduced false positive identification for spectroscopic classification
- Patent number 11,656,175
- Issue date May 23, 2023
- Viavi Solutions Inc.
- Changmeng Hsiung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical module
- Patent number 11,635,290
- Issue date Apr 25, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical device
- Patent number 11,629,947
- Issue date Apr 18, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Mirror unit and optical module
- Patent number 11,629,946
- Issue date Apr 18, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Filter incidence narrow-band infrared spectrometer
- Patent number 11,624,704
- Issue date Apr 11, 2023
- Utah State University
- Charles Swenson
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometry system with decreased light path
- Patent number 11,624,651
- Issue date Apr 11, 2023
- VERIFOOD, LTD.
- Damian Goldring
- G01 - MEASURING TESTING
Information Patent Grant
Mirror unit and optical module
- Patent number 11,624,605
- Issue date Apr 11, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Identification apparatus
- Patent number 11,619,579
- Issue date Apr 4, 2023
- Canon Kabushiki Kaisha
- Makoto Kawaguchi
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Emitter structure and production method
- Patent number 11,617,232
- Issue date Mar 28, 2023
- Infineon Technologies AG
- David Tumpold
- G01 - MEASURING TESTING
Information Patent Grant
Remote sensing and measurement system using time-of-flight detectors
- Patent number 11,596,311
- Issue date Mar 7, 2023
- Omni MedSci, Inc.
- Mohammed N. Islam
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CAMERA BASED SYSTEM WITH PROCESSING USING ARTIFICIAL INTELLIGENCE F...
- Publication number 20240130621
- Publication date Apr 25, 2024
- Omni MedSci, Inc.
- Mohammed N. Islam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MIRROR UNIT AND OPTICAL MODULE
- Publication number 20240110779
- Publication date Apr 4, 2024
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
THERMAL RADIATION SOURCE AND METHOD FOR MEASURING THE EXACT TEMPERA...
- Publication number 20240077358
- Publication date Mar 7, 2024
- INFRASOLID GMBH
- Marco SCHOSSIG
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRY SYSTEM WITH DECREASED LIGHT PATH
- Publication number 20240060820
- Publication date Feb 22, 2024
- VERIFOOD, LTD.
- Damian GOLDRING
- G01 - MEASURING TESTING
Information Patent Application
Spectrometer with Self-Referenced Calibration
- Publication number 20240053198
- Publication date Feb 15, 2024
- Wisconsin Alumni Research Foundation
- Scott Sanders
- G01 - MEASURING TESTING
Information Patent Application
WAVELENGTH-TUNABLE SOURCE OF PULSED LASER RADIATION FOR VIS-NIR SPE...
- Publication number 20240027873
- Publication date Jan 25, 2024
- Romaldas ANTANAVICIUS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Surface Sensing Systems and Methods for Imaging a Scanned Surface o...
- Publication number 20240019243
- Publication date Jan 18, 2024
- The Boeing Company
- Jeffrey H. Hunt
- G01 - MEASURING TESTING
Information Patent Application
PHOTOTHERMAL INFRARED SPECTROSCOPY UTILIZING SPATIAL LIGHT MANIPULA...
- Publication number 20240011830
- Publication date Jan 11, 2024
- Photothermal Spectroscopy Corp.
- Derek Decker
- G01 - MEASURING TESTING
Information Patent Application
IDENTIFYING OBJECTS USING NEAR-INFRARED SENSORS, CAMERAS OR TIME-OF...
- Publication number 20240000317
- Publication date Jan 4, 2024
- Omni MedSci, Inc.
- Mohammed N. Islam
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OPTICAL DETECTOR AND METHOD FOR DETERMINING AT LEAST ONE PROPERTY O...
- Publication number 20230393061
- Publication date Dec 7, 2023
- trinamiX GmbH
- Henning ZIMMERMANN
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE ILLUMINATION AND TIME-OF-FLIGHT CAMERA SYSTEM TO EVALUATE FA...
- Publication number 20230277065
- Publication date Sep 7, 2023
- Omni MedSci, Inc.
- Mohammed N. Islam
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OUTLIER DETECTION FOR SPECTROSCOPIC CLASSIFICATION
- Publication number 20230273121
- Publication date Aug 31, 2023
- VIAVI SOLUTIONS INC.
- Chang Meng HSIUNG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REDUCED FALSE POSITIVE IDENTIFICATION FOR SPECTROSCOPIC CLASSIFICATION
- Publication number 20230273122
- Publication date Aug 31, 2023
- VIAVI SOLUTIONS INC.
- Changmeng HSIUNG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PULSE SPECTROSCOPY DEVICE
- Publication number 20230266166
- Publication date Aug 24, 2023
- USHIO DENKI KABUSHIKI KAISHA
- Toshikazu NAGASHIMA
- G01 - MEASURING TESTING
Information Patent Application
HYPERSPECTRAL IMAGING SYSTEMS
- Publication number 20230243698
- Publication date Aug 3, 2023
- James F. Coward
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Compact Apparatus for High-Speed Chemical Spectral Signature Measur...
- Publication number 20230228675
- Publication date Jul 20, 2023
- Epir, Inc.
- Wei Gao
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE
- Publication number 20230221106
- Publication date Jul 13, 2023
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
RAMAN MICROSCOPE
- Publication number 20230194339
- Publication date Jun 22, 2023
- Shimadzu Corporation
- Naoya FUJIWARA
- G01 - MEASURING TESTING
Information Patent Application
RAMAN MICROSCOPE
- Publication number 20230194345
- Publication date Jun 22, 2023
- Shimadzu Corporation
- Naoya FUJIWARA
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER, PORTABLE DEVICE AND METHOD FOR DETECTING ELECTROMAGNE...
- Publication number 20230175890
- Publication date Jun 8, 2023
- ams-Osram AG
- Deborah MORECROFT
- G01 - MEASURING TESTING
Information Patent Application
SHORT-WAVE INFRARED SENSOR FOR IDENTIFYING BASED ON WATER CONTENT
- Publication number 20230172455
- Publication date Jun 8, 2023
- Omni MedSci, Inc.
- Mohammed N. Islam
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
TWO-DIMENSIONAL TERAHERTZ RADIATION DETECTOR
- Publication number 20230143274
- Publication date May 11, 2023
- OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES
- Arthur SALMON
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATING ONE OR MORE OPTICAL SENSORS OF A LASER MACHI...
- Publication number 20230133662
- Publication date May 4, 2023
- Precitec GmbH & Co. KG
- Rüdiger Moser
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SELF-ADAPTIVE ELECTROMAGNETIC ENERGY ATTENUATOR
- Publication number 20230139136
- Publication date May 4, 2023
- Elbit Systems Ltd.
- Noam Yona GROSS
- G01 - MEASURING TESTING
Information Patent Application
INFRARED RADIATOR ELEMENT AND METHODS
- Publication number 20230131181
- Publication date Apr 27, 2023
- 4K-MEMS SÀRL
- Matthias IMBODEN
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PHOTOTHERMAL INFRARED SPECTROSCOPY UTILIZING SPATIAL LIGHT MANIPULA...
- Publication number 20230131208
- Publication date Apr 27, 2023
- Photothermal Spectroscopy Corp.
- Derek Decker
- G01 - MEASURING TESTING
Information Patent Application
MODULE PACKAGE WITH HIGH ILLUMINATION EFFICIENCY
- Publication number 20230120755
- Publication date Apr 20, 2023
- PIXART IMAGING INC.
- CHEE-PIN T'NG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR CHARACTERIZING SPECTRAL REFLECTANCE OF REAL...
- Publication number 20230104000
- Publication date Apr 6, 2023
- ARGO AI, LLC
- Michael V. Morelli
- G01 - MEASURING TESTING
Information Patent Application
GAS SENSING
- Publication number 20230096813
- Publication date Mar 30, 2023
- Koninklijke Philips N.V.
- ZHI-XING JIANG
- G01 - MEASURING TESTING
Information Patent Application
LASER OUTPUT LIMITING DEVICE
- Publication number 20230086020
- Publication date Mar 23, 2023
- Gecko Analysentechnik GmbH
- Matthias EBLE
- G02 - OPTICS

for measurement in the infra-red range

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Hyperspectral imaging systems

Systems and methods for inspecting a machine

Tunable mid-infrared laser source and method

Short-wave infrared sensor for identifying based on water content

Mirror unit and optical module

Modeling the emission intensity of an IR emitter by varying the emi...

Textile detection module, textile sorting system and using method t...

Surface sensing systems and methods for imaging a scanned surface o...

Self-adaptive electromagnetic energy attenuator

Augmented reality spectroscopy

Infrared spectrophotometer

Sensing device, display device using the sensor device, and control...

Multiplexing and encoding for reference switching

FTIR data quality optimization

Highly-integrated ultrahigh-resolution mid-infrared dual-comb spect...

Systems and methods for spectral identification and optical sorting...

3-dimensional measuring device

Electrically pumped vertical cavity laser

Active remote sensing system using time-of-flight sensor combined w...

Outlier detection for spectroscopic classification

Reduced false positive identification for spectroscopic classification

Optical module

Optical device

Mirror unit and optical module

Filter incidence narrow-band infrared spectrometer

Spectrometry system with decreased light path

Mirror unit and optical module

Identification apparatus

Emitter structure and production method

Remote sensing and measurement system using time-of-flight detectors

Patents Applicationslast 30 patents

CAMERA BASED SYSTEM WITH PROCESSING USING ARTIFICIAL INTELLIGENCE F...

MIRROR UNIT AND OPTICAL MODULE

THERMAL RADIATION SOURCE AND METHOD FOR MEASURING THE EXACT TEMPERA...

SPECTROMETRY SYSTEM WITH DECREASED LIGHT PATH

Spectrometer with Self-Referenced Calibration

WAVELENGTH-TUNABLE SOURCE OF PULSED LASER RADIATION FOR VIS-NIR SPE...

Surface Sensing Systems and Methods for Imaging a Scanned Surface o...

PHOTOTHERMAL INFRARED SPECTROSCOPY UTILIZING SPATIAL LIGHT MANIPULA...

IDENTIFYING OBJECTS USING NEAR-INFRARED SENSORS, CAMERAS OR TIME-OF...

OPTICAL DETECTOR AND METHOD FOR DETERMINING AT LEAST ONE PROPERTY O...

ACTIVE ILLUMINATION AND TIME-OF-FLIGHT CAMERA SYSTEM TO EVALUATE FA...

OUTLIER DETECTION FOR SPECTROSCOPIC CLASSIFICATION

REDUCED FALSE POSITIVE IDENTIFICATION FOR SPECTROSCOPIC CLASSIFICATION

PULSE SPECTROSCOPY DEVICE

HYPERSPECTRAL IMAGING SYSTEMS

Compact Apparatus for High-Speed Chemical Spectral Signature Measur...

OPTICAL DEVICE

RAMAN MICROSCOPE

RAMAN MICROSCOPE

SPECTROMETER, PORTABLE DEVICE AND METHOD FOR DETECTING ELECTROMAGNE...

SHORT-WAVE INFRARED SENSOR FOR IDENTIFYING BASED ON WATER CONTENT

TWO-DIMENSIONAL TERAHERTZ RADIATION DETECTOR

METHOD FOR CALIBRATING ONE OR MORE OPTICAL SENSORS OF A LASER MACHI...

SELF-ADAPTIVE ELECTROMAGNETIC ENERGY ATTENUATOR

INFRARED RADIATOR ELEMENT AND METHODS

PHOTOTHERMAL INFRARED SPECTROSCOPY UTILIZING SPATIAL LIGHT MANIPULA...

MODULE PACKAGE WITH HIGH ILLUMINATION EFFICIENCY

SYSTEMS AND METHODS FOR CHARACTERIZING SPECTRAL REFLECTANCE OF REAL...

GAS SENSING

LASER OUTPUT LIMITING DEVICE