for measuring break-down voltage or punch through voltage therefor

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CPC
G01R31/261

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/261for measuring break-down voltage or punch through voltage therefor

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device
- Patent number 12,159,928
- Issue date Dec 3, 2024
- Fuji Electric Co., Ltd.
- Shigeki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-invasive front-end for power electronic monitoring
- Patent number 12,158,490
- Issue date Dec 3, 2024
- Aalborg Universitet
- Huai Wang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and system
- Patent number 12,094,960
- Issue date Sep 17, 2024
- Fuji Electric Co., Ltd.
- Shigeki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-invasive online monitoring circuit for on-state saturation volt...
- Patent number 12,085,600
- Issue date Sep 10, 2024
- Hunan Lanhai Electrical Engineering Co., Ltd.
- Xing Wei
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems and methods for controlling wind converters
- Patent number 12,074,530
- Issue date Aug 27, 2024
- General Electric Renovables Espana, S.L.
- Lijun He
- F03 - MACHINES OR ENGINES FOR LIQUIDS WIND, SPRING WEIGHT AND MISCELLANEOUS M...
Information Patent Grant
System and method for measuring intermittent operating life of GaN-...
- Patent number 12,038,469
- Issue date Jul 16, 2024
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Chang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and power conversion device
- Patent number 12,000,883
- Issue date Jun 4, 2024
- Mitsubishi Electric Corporation
- Yukihiko Wada
- G01 - MEASURING TESTING
Information Patent Grant
Test method
- Patent number 11,982,701
- Issue date May 14, 2024
- Fuji Electric Co., Ltd.
- Shuhei Tatemichi
- G01 - MEASURING TESTING
Information Patent Grant
Machine operation monitoring
- Patent number 11,953,539
- Issue date Apr 9, 2024
- Hitech & Development Wireless Sweden AB
- Örjan Fritz
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method for checking a semiconductor switch for a fault
- Patent number 11,881,848
- Issue date Jan 23, 2024
- Webasto SE
- Philipp Eck
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Noise parameter determination of scalable devices
- Patent number 11,747,384
- Issue date Sep 5, 2023
- The Government of the United States of America, as represented by the Secreta...
- Luciano Boglione
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for testing semiconductor devices
- Patent number 11,733,287
- Issue date Aug 22, 2023
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Jihua Li
- G01 - MEASURING TESTING
Information Patent Grant
Serial IGBT voltage equalization method and system based on auxilia...
- Patent number 11,705,899
- Issue date Jul 18, 2023
- WUHAN UNIVERSITY
- Yigang He
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Methods and systems for identifying a malfunctioning current sensor
- Patent number 11,624,772
- Issue date Apr 11, 2023
- Schneider Electric Industries SAS
- Pierre Blanchard
- G01 - MEASURING TESTING
Information Patent Grant
Detection circuit for open, close and suspension states of high and...
- Patent number 11,585,843
- Issue date Feb 21, 2023
- Chongqing University
- Yongduan Song
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Multi-time-scale reliability evaluation method of wind power IGBT c...
- Patent number 11,543,446
- Issue date Jan 3, 2023
- WUHAN UNIVERSITY
- Yigang He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Power supply circuit for measuring transient thermal resistances of...
- Patent number 11,532,998
- Issue date Dec 20, 2022
- Sansha Electric Manufacturing Co., Ltd.
- Naoki Nishimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing apparatus, testing method, and manufacturing method
- Patent number 11,500,009
- Issue date Nov 15, 2022
- Fuji Electric Co., Ltd.
- Tetsutaro Imagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determining the remaining usability of a semiconductor module in no...
- Patent number 11,480,607
- Issue date Oct 25, 2022
- Siemens Aktiengesellschaft
- Gunnar Dietz
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Secondary monitoring system for a machine under test
- Patent number 11,480,603
- Issue date Oct 25, 2022
- The Boeing Company
- Steven F Griffin
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for electrical component life estimation with...
- Patent number 11,476,792
- Issue date Oct 18, 2022
- Rockwell Automation Technologies, Inc.
- Garron K. Morris
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Device and method for testing semiconductor devices
- Patent number 11,448,685
- Issue date Sep 20, 2022
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Jihua Li
- G01 - MEASURING TESTING
Information Patent Grant
Chip testing system
- Patent number 11,435,396
- Issue date Sep 6, 2022
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
IGBT module reliability evaluation method and device based on bondi...
- Patent number 11,378,613
- Issue date Jul 5, 2022
- WUHAN UNIVERSITY
- Yigang He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing device
- Patent number 11,340,283
- Issue date May 24, 2022
- Tokyo Electron Limited
- Shigeru Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monitoring an operating condition of a transistor-based power conve...
- Patent number 11,287,465
- Issue date Mar 29, 2022
- Rolls-Royce PLC
- Mohamed Sathik Mohamed Halick
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing an operation of a power semiconductor device
- Patent number 11,262,248
- Issue date Mar 1, 2022
- MASCHINENFABRIK REINHAUSEN GMBH
- Angus Bryant
- G01 - MEASURING TESTING
Information Patent Grant
Switching loss measurement and plot in test and measurement instrument
- Patent number 11,181,581
- Issue date Nov 23, 2021
- Tektronix, Inc.
- Krishna N H Sri
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Adaptive blanking of over current fault detection circuits in power...
- Patent number 11,150,300
- Issue date Oct 19, 2021
- Analog Devices International Unlimited Company
- Brian K. Jadus
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the output voltage of a transistor
- Patent number 11,099,225
- Issue date Aug 24, 2021
- ALSTOM TRANSPORT TECHNOLOGIES
- Vincent Escrouzailles
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR MEASURING THE STATE OF HEALTH OF SEMICONDUCTO...
- Publication number 20250012848
- Publication date Jan 9, 2025
- UNIVERSITE GUSTAVE EIFFEL
- Zoubir KHATIR
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND CIRCUIT ARRANGEMENTS FOR DETERMINING A BARRIER-LAYER TEM...
- Publication number 20240426675
- Publication date Dec 26, 2024
- ROBERT BOSCH GmbH
- Manuel Riefer
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR INCREASING LIFETIME OF POWER DIE OR POWER MODULE
- Publication number 20240272222
- Publication date Aug 15, 2024
- Mitsubishi Electric Corporation
- Merouane OUHAB
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND OVERCURRENT PROTECTION DEVICE
- Publication number 20240219449
- Publication date Jul 4, 2024
- Fuji Electric Co., Ltd.
- Shigeki SATO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING AND EVALUATING SHORT-CIRCUIT WITHSTAND CAPABILIT...
- Publication number 20240142546
- Publication date May 2, 2024
- CHONGQING UNIVERSITY
- Hui LI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240142511
- Publication date May 2, 2024
- Fuji Electric Co., Ltd.
- Yuki KUMAZAWA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TESTING APPARATUS AND TESTING METHOD
- Publication number 20240142510
- Publication date May 2, 2024
- Fuji Electric Co., Ltd.
- Mitsuru YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSIS AND PROGNOSIS OF IGBT MODULES
- Publication number 20240118333
- Publication date Apr 11, 2024
- ABB Schweiz AG
- Aleksi Vulli
- G01 - MEASURING TESTING
Information Patent Application
SWITCH SHORT-CIRCUITED DIAGNOSIS METHOD
- Publication number 20240069090
- Publication date Feb 29, 2024
- Delta Electronics, Inc.
- Kai-Wei HU
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
STATE DETERMINATION DEVICE AND VEHICLE
- Publication number 20230408572
- Publication date Dec 21, 2023
- DENSO CORPORATION
- Junya MURAMATSU
- G01 - MEASURING TESTING
Information Patent Application
JUNCTION TEMPERATURE CALCULATION METHOD AND DEVICE FOR POWER CONVER...
- Publication number 20230143957
- Publication date May 11, 2023
- NIO Technology (Anhui) Co., Ltd.
- Kai WANG
- G01 - MEASURING TESTING
Information Patent Application
NON-INVASIVE FRONT-END FOR POWER ELECTRONIC MONITORING
- Publication number 20230132796
- Publication date May 4, 2023
- AALBORG UNIVERSITET
- Huai Wang
- G01 - MEASURING TESTING
Information Patent Application
TEST METHOD
- Publication number 20230113109
- Publication date Apr 13, 2023
- Fuji Electric Co., Ltd.
- Shuhei TATEMICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYZING AN OPERATION OF A POWER SEMICONDUCTOR DEVICE
- Publication number 20230096094
- Publication date Mar 30, 2023
- MASCHINENFABRIK REINHAUSEN GMBH
- Angus Bryant
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20220390502
- Publication date Dec 8, 2022
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- JIHUA LI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING INTERMITTENT OPERATING LIFE OF GaN-...
- Publication number 20220381815
- Publication date Dec 1, 2022
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Chang CHEN
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC CIRCUIT SIMULATION BASED ON RANDOM TELEGRAPH SIGNAL NOISE
- Publication number 20220357390
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Chien-Ming HUNG
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND SYSTEM FOR CHARACTERIZING IGBT MODULE AGING BASED ON MIN...
- Publication number 20220334170
- Publication date Oct 20, 2022
- WUHAN UNIVERSITY
- Yigang HE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION CIRCUIT FOR OPEN, CLOSE AND SUSPENSION STATES OF HIGH AND...
- Publication number 20220291276
- Publication date Sep 15, 2022
- CHONGQING UNIVERSITY
- YONGDUAN SONG
- B60 - VEHICLES IN GENERAL
Information Patent Application
SEMICONDUCTOR DEVICE AND POWER CONVERSION DEVICE
- Publication number 20220206057
- Publication date Jun 30, 2022
- Mitsubishi Electric Corporation
- Yukihiko WADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CHECKING A SEMICONDUCTOR SWITCH FOR A FAULT
- Publication number 20220158633
- Publication date May 19, 2022
- Webasto SE
- Philipp ECK
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CHIP TESTING SYSTEM
- Publication number 20220128621
- Publication date Apr 28, 2022
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR IDENTIFYING A MALFUNCTIONING CURRENT SENSOR
- Publication number 20220099728
- Publication date Mar 31, 2022
- Schneider Electric Industries SAS
- Pierre Blanchard
- G01 - MEASURING TESTING
Information Patent Application
MULTI-TIME-SCALE RELIABILITY EVALUATION METHOD OF WIND POWER IGBT C...
- Publication number 20220074985
- Publication date Mar 10, 2022
- WUHAN UNIVERSITY
- Yigang HE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING APPARATUS, TESTING METHOD, AND MANUFACTURING METHOD
- Publication number 20220065917
- Publication date Mar 3, 2022
- Fuji Electric Co., Ltd.
- Tetsutaro IMAGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20220043048
- Publication date Feb 10, 2022
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- JIHUA LI
- G01 - MEASURING TESTING
Information Patent Application
MACHINE OPERATION MONITORING
- Publication number 20220034957
- Publication date Feb 3, 2022
- HITECH & DEVELOPMENT WIRELESS SWEDEN AB
- Örjan FRITZ
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
METHOD AND APPARATUS FOR ELECTRICAL COMPONENT LIFE ESTIMATION WITH...
- Publication number 20210391820
- Publication date Dec 16, 2021
- Rockwell Automation Technologies, Inc.
- Garron K. Morris
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND SYSTEM
- Publication number 20210384333
- Publication date Dec 9, 2021
- Fuji Electric Co., Ltd.
- Shigeki SATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20210384331
- Publication date Dec 9, 2021
- Fuji Electric Co., Ltd.
- Shigeki SATO
- H01 - BASIC ELECTRIC ELEMENTS

for measuring break-down voltage or punch through voltage therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semiconductor device

Non-invasive front-end for power electronic monitoring

Semiconductor device and system

Non-invasive online monitoring circuit for on-state saturation volt...

Systems and methods for controlling wind converters

System and method for measuring intermittent operating life of GaN-...

Semiconductor device and power conversion device

Test method

Machine operation monitoring

Method for checking a semiconductor switch for a fault

Noise parameter determination of scalable devices

Device and method for testing semiconductor devices

Serial IGBT voltage equalization method and system based on auxilia...

Methods and systems for identifying a malfunctioning current sensor

Detection circuit for open, close and suspension states of high and...

Multi-time-scale reliability evaluation method of wind power IGBT c...

Power supply circuit for measuring transient thermal resistances of...

Testing apparatus, testing method, and manufacturing method

Determining the remaining usability of a semiconductor module in no...

Secondary monitoring system for a machine under test

Method and apparatus for electrical component life estimation with...

Device and method for testing semiconductor devices

Chip testing system

IGBT module reliability evaluation method and device based on bondi...

Testing device

Monitoring an operating condition of a transistor-based power conve...

Analyzing an operation of a power semiconductor device

Switching loss measurement and plot in test and measurement instrument

Adaptive blanking of over current fault detection circuits in power...

Method for determining the output voltage of a transistor

Patents Applicationslast 30 patents

METHOD AND DEVICE FOR MEASURING THE STATE OF HEALTH OF SEMICONDUCTO...

METHOD AND CIRCUIT ARRANGEMENTS FOR DETERMINING A BARRIER-LAYER TEM...

METHOD AND DEVICE FOR INCREASING LIFETIME OF POWER DIE OR POWER MODULE

SEMICONDUCTOR DEVICE AND OVERCURRENT PROTECTION DEVICE

METHOD FOR TESTING AND EVALUATING SHORT-CIRCUIT WITHSTAND CAPABILIT...

SEMICONDUCTOR DEVICE

TESTING APPARATUS AND TESTING METHOD

DIAGNOSIS AND PROGNOSIS OF IGBT MODULES

SWITCH SHORT-CIRCUITED DIAGNOSIS METHOD

STATE DETERMINATION DEVICE AND VEHICLE

JUNCTION TEMPERATURE CALCULATION METHOD AND DEVICE FOR POWER CONVER...

NON-INVASIVE FRONT-END FOR POWER ELECTRONIC MONITORING

TEST METHOD

ANALYZING AN OPERATION OF A POWER SEMICONDUCTOR DEVICE

DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICES

SYSTEM AND METHOD FOR MEASURING INTERMITTENT OPERATING LIFE OF GaN-...

ELECTRONIC CIRCUIT SIMULATION BASED ON RANDOM TELEGRAPH SIGNAL NOISE

METHOD AND SYSTEM FOR CHARACTERIZING IGBT MODULE AGING BASED ON MIN...

DETECTION CIRCUIT FOR OPEN, CLOSE AND SUSPENSION STATES OF HIGH AND...

SEMICONDUCTOR DEVICE AND POWER CONVERSION DEVICE

METHOD FOR CHECKING A SEMICONDUCTOR SWITCH FOR A FAULT

CHIP TESTING SYSTEM

METHODS AND SYSTEMS FOR IDENTIFYING A MALFUNCTIONING CURRENT SENSOR

MULTI-TIME-SCALE RELIABILITY EVALUATION METHOD OF WIND POWER IGBT C...

TESTING APPARATUS, TESTING METHOD, AND MANUFACTURING METHOD

DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICES

MACHINE OPERATION MONITORING

METHOD AND APPARATUS FOR ELECTRICAL COMPONENT LIFE ESTIMATION WITH...

SEMICONDUCTOR DEVICE AND SYSTEM

SEMICONDUCTOR DEVICE