for measuring break-down voltage therefor

Industry

CPC
G01R31/2623

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2623for measuring break-down voltage therefor

Industries

Patents Grantslast 30 patents

Information Patent Grant
Deterioration checking apparatus and deterioration checking
- Patent number 12,072,368
- Issue date Aug 27, 2024
- Kabushiki Kaisha Toshiba
- Hideaki Majima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card for device under test
- Patent number 12,044,719
- Issue date Jul 23, 2024
- Texas Instruments Incorporated
- Trevor Hubbard
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring a device parameter
- Patent number 11,933,836
- Issue date Mar 19, 2024
- Rohm Co., Ltd.
- Tatsuya Yanagi
- G01 - MEASURING TESTING
Information Patent Grant
Processor frequency improvement based on antenna optimization
- Patent number 11,906,570
- Issue date Feb 20, 2024
- International Business Machines Corporation
- Christopher Gonzalez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Processor frequency improvement based on antenna optimization
- Patent number 11,754,615
- Issue date Sep 12, 2023
- International Business Machines Corporation
- Christopher Gonzalez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for testing semiconductor devices
- Patent number 11,733,287
- Issue date Aug 22, 2023
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Jihua Li
- G01 - MEASURING TESTING
Information Patent Grant
Test method and system for testing connectivity of semiconductor st...
- Patent number 11,698,409
- Issue date Jul 11, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Geyan Liu
- G01 - MEASURING TESTING
Information Patent Grant
High-side gate over-voltage stress testing
- Patent number 11,624,769
- Issue date Apr 11, 2023
- Texas Instruments Incorporated
- Sigfredo E. Gonzalez Diaz
- G01 - MEASURING TESTING
Information Patent Grant
Systems, circuits, and methods to detect gate-open failures in MOS...
- Patent number 11,585,844
- Issue date Feb 21, 2023
- Board of Regents, The University of Texas System
- Bhanu Teja Vankayalapati
- G01 - MEASURING TESTING
Information Patent Grant
RDSON/dRON measurement method and circuit for high voltage HEMTs
- Patent number 11,448,686
- Issue date Sep 20, 2022
- Texas Instruments Incorporated
- Ramana Tadepalli
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for testing semiconductor devices
- Patent number 11,448,685
- Issue date Sep 20, 2022
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Jihua Li
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for calculating kink current of SOI device
- Patent number 11,442,097
- Issue date Sep 13, 2022
- Soochow University
- Mingxiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Body-contacted field effect transistors configured for test and met...
- Patent number 11,367,790
- Issue date Jun 21, 2022
- GLOBALFOUNDRIES U.S. Inc.
- Anupam Dutta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High-side gate over-voltage stress testing
- Patent number 11,353,494
- Issue date Jun 7, 2022
- Texas Instruments Incorporated
- Sigfredo E. Gonzalez Diaz
- G01 - MEASURING TESTING
Information Patent Grant
System and method for surge-testing a gallium nitride transistor de...
- Patent number 11,227,805
- Issue date Jan 18, 2022
- Texas Instruments Incorporated
- Sandeep Raj Bahl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Universal driver systems and methods of operating the same
- Patent number 11,022,654
- Issue date Jun 1, 2021
- University of Tennessee Research Foundation
- Fei Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-contact method to monitor and quantify effective work function...
- Patent number 10,763,179
- Issue date Sep 1, 2020
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Dmitriy Marinskiy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nondestructive inspection method for coatings and ceramic matrix co...
- Patent number 10,648,937
- Issue date May 12, 2020
- General Electric Company
- Russell Craig Baucke
- G01 - MEASURING TESTING
Information Patent Grant
High-side gate over-voltage stress testing
- Patent number 10,613,134
- Issue date Apr 7, 2020
- Texas Instruments Incorporated
- Sigfredo E. Gonzalez Diaz
- G01 - MEASURING TESTING
Information Patent Grant
Spike safe floating current and voltage source
- Patent number 10,317,456
- Issue date Jun 11, 2019
- Texas Instruments Incorporated
- Ramana Tadepalli
- G01 - MEASURING TESTING
Information Patent Grant
Gate oxide soft breakdown detection circuit
- Patent number 10,247,770
- Issue date Apr 2, 2019
- Advanced Micro Devices, Inc.
- Abhay Deshpande
- G01 - MEASURING TESTING
Information Patent Grant
Quality evaluation method for laminate having protective layer on s...
- Patent number 10,203,367
- Issue date Feb 12, 2019
- Kobe Steel, Ltd.
- Kazushi Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of inspecting a semiconductor device
- Patent number 10,006,958
- Issue date Jun 26, 2018
- ABLIC INC.
- Kaoru Sakaguchi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Devices under test
- Patent number 9,778,313
- Issue date Oct 3, 2017
- Texas Instruments Incorporated
- Min Chen
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneously measuring degradation in multiple FETs
- Patent number 9,702,924
- Issue date Jul 11, 2017
- International Business Machines Corporation
- Karthik Balakrishnan
- G01 - MEASURING TESTING
Information Patent Grant
Methods, apparatus and system for screening process splits for tech...
- Patent number 9,702,926
- Issue date Jul 11, 2017
- GLOBALFOUNDRIES Inc.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Grant
Test method and system for cut-in voltage
- Patent number 9,696,371
- Issue date Jul 4, 2017
- CSMC Technologies Fab2 Co., Ltd.
- Ming Wang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 9,599,655
- Issue date Mar 21, 2017
- Mitsubishi Electric Corporation
- Hiroyuki Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-planar field effect transistor test structure and lateral diele...
- Patent number 9,453,873
- Issue date Sep 27, 2016
- GLOBALFOUNDRIES Inc.
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Grant
On chip bias temperature instability characterization of a semicond...
- Patent number 9,404,960
- Issue date Aug 2, 2016
- GLOBALFOUNDRIES Inc.
- Hanyi Ding
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD FOR DEVICE UNDER TEST
- Publication number 20240369614
- Publication date Nov 7, 2024
- TEXAS INSTRUMENTS INCORPORATED
- TREVOR HUBBARD
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PREDICTING FAILURE OF SEMICONDUCTOR DEVICE, AND SEMICOND...
- Publication number 20240110970
- Publication date Apr 4, 2024
- DENSO CORPORATION
- Masataka DEGUCHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF TESTING A SEMICONDUCTOR DEVICE AS WELL AS A CORRESPONDING...
- Publication number 20230400503
- Publication date Dec 14, 2023
- NEXPERIA B.V.
- Magnus Siegfried RUMMEY
- G01 - MEASURING TESTING
Information Patent Application
PROCESSOR FREQUENCY IMPROVEMENT BASED ON ANTENNA OPTIMIZATION
- Publication number 20230251299
- Publication date Aug 10, 2023
- International Business Machines Corporation
- Christopher Gonzalez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBE CARD FOR DEVICE UNDER TEST
- Publication number 20230251298
- Publication date Aug 10, 2023
- TEXAS INSTRUMENTS INCORPORATED
- TREVOR HUBBARD
- G01 - MEASURING TESTING
Information Patent Application
PROCESSOR FREQUENCY IMPROVEMENT BASED ON ANTENNA OPTIMIZATION
- Publication number 20230086010
- Publication date Mar 23, 2023
- International Business Machines Corporation
- Christopher Gonzalez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS, CIRCUITS, AND METHODS TO DETECT GATE-OPEN FAILURES IN MOS...
- Publication number 20230076735
- Publication date Mar 9, 2023
- Board of Regents, The University of Texas System
- Bhanu Teja Vankayalapati
- G01 - MEASURING TESTING
Information Patent Application
TEST METHOD AND SYSTEM FOR TESTING CONNECTIVITY OF SEMICONDUCTOR ST...
- Publication number 20230029337
- Publication date Jan 26, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Geyan LIU
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20220390502
- Publication date Dec 8, 2022
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- JIHUA LI
- G01 - MEASURING TESTING
Information Patent Application
DETERIORATION CHECKING APPARATUS AND DETERIORATION CHECKING
- Publication number 20220381814
- Publication date Dec 1, 2022
- Kabushiki Kaisha Toshiba
- Hideaki Majima
- G01 - MEASURING TESTING
Information Patent Application
HIGH-SIDE GATE OVER-VOLTAGE STRESS TESTING
- Publication number 20220260627
- Publication date Aug 18, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Sigfredo E. Gonzalez Diaz
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING A DEVICE PARAMETER
- Publication number 20220146566
- Publication date May 12, 2022
- Rohm Co., Ltd.
- Tatsuya YANAGI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20220043048
- Publication date Feb 10, 2022
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- JIHUA LI
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Calculating Kink Current of SOI Device
- Publication number 20210405107
- Publication date Dec 30, 2021
- SOOCHOW UNIVERSITY
- Mingxiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RDSON/dRON MEASUREMENT METHOD AND CIRCUIT FOR HIGH VOLTAGE HEMTS
- Publication number 20210080498
- Publication date Mar 18, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Ramana Tadepalli
- G01 - MEASURING TESTING
Information Patent Application
BODY-CONTACTED FIELD EFFECT TRANSISTORS CONFIGURED FOR TEST AND MET...
- Publication number 20210066503
- Publication date Mar 4, 2021
- GLOBALFOUNDRIES INC.
- Anupam Dutta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR APPARATUS
- Publication number 20210025933
- Publication date Jan 28, 2021
- Huaian Imaging Device Manufacturer Corporation
- Tienchi KO
- G01 - MEASURING TESTING
Information Patent Application
HIGH-SIDE GATE OVER-VOLTAGE STRESS TESTING
- Publication number 20200182925
- Publication date Jun 11, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Sigfredo E. Gonzalez Diaz
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR SURGE-TESTING A GALLIUM NITRIDE TRANSISTOR DE...
- Publication number 20200126874
- Publication date Apr 23, 2020
- TEXAS INSTRUMENTS INCORPORATED
- SANDEEP RAJ BAHL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF TESTING SEMICONDUCTOR DEVICES AND SYSTEM FOR TESTING SEMI...
- Publication number 20180188311
- Publication date Jul 5, 2018
- Samsung Electronics Co., Ltd.
- OH SONG KWON
- G01 - MEASURING TESTING
Information Patent Application
HIGH-SIDE GATE OVER-VOLTAGE STRESS TESTING
- Publication number 20180180661
- Publication date Jun 28, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Sigfredo E. Gonzalez Diaz
- G01 - MEASURING TESTING
Information Patent Application
GATE OXIDE SOFT BREAKDOWN DETECTION CIRCUIT
- Publication number 20180172753
- Publication date Jun 21, 2018
- Advanced Micro Devices, Inc.
- Abhay Deshpande
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SPIKE SAFE FLOATING CURRENT AND VOLTAGE SOURCE
- Publication number 20170276724
- Publication date Sep 28, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Ramana Tadepalli
- G01 - MEASURING TESTING
Information Patent Application
QUALITY EVALUATION METHOD FOR LAMINATE HAVING PROTECTIVE LAYER ON S...
- Publication number 20170184660
- Publication date Jun 29, 2017
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Kazushi HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
SIMULTANEOUSLY MEASURING DEGRADATION IN MULTIPLE FETS
- Publication number 20160341785
- Publication date Nov 24, 2016
- International Business Machines Corporation
- Karthik Balakrishnan
- G01 - MEASURING TESTING
Information Patent Application
TRANSISTOR TESTING CIRCUIT AND METHOD THEREOF, SEMICONDUCTOR MEMORY...
- Publication number 20160216313
- Publication date Jul 28, 2016
- POWERCHIP TECHNOLOGY CORPORATION
- Akira OGAWA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE HAVING FINFETS AND METHOD FOR MEASURING RESISTANCE OF THE FI...
- Publication number 20160187414
- Publication date Jun 30, 2016
- UNITED MICROELECTRONICS CORP.
- Hung-Chan Lin
- G01 - MEASURING TESTING
Information Patent Application
CURRENT MEASUREMENT METHOD
- Publication number 20150241510
- Publication date Aug 27, 2015
- Semiconductor Energy Laboratory Co., Ltd.
- Masashi TSUBUKU
- G01 - MEASURING TESTING
Information Patent Application
NON-PLANAR FIELD EFFECT TRANSISTOR TEST STRUCTURE AND LATERAL DIELE...
- Publication number 20150198654
- Publication date Jul 16, 2015
- International Business Machines Corporation
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Application
TESTING OF INTEGRATED CIRCUITS WITH EXTERNAL CLEARANCE REQUIREMENTS
- Publication number 20140375350
- Publication date Dec 25, 2014
- John Paul Tellkamp
- G01 - MEASURING TESTING

for measuring break-down voltage therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Deterioration checking apparatus and deterioration checking

Probe card for device under test

Method of measuring a device parameter

Processor frequency improvement based on antenna optimization

Processor frequency improvement based on antenna optimization

Device and method for testing semiconductor devices

Test method and system for testing connectivity of semiconductor st...

High-side gate over-voltage stress testing

Systems, circuits, and methods to detect gate-open failures in MOS...

RDSON/dRON measurement method and circuit for high voltage HEMTs

Device and method for testing semiconductor devices

Method and apparatus for calculating kink current of SOI device

Body-contacted field effect transistors configured for test and met...

High-side gate over-voltage stress testing

System and method for surge-testing a gallium nitride transistor de...

Universal driver systems and methods of operating the same

Non-contact method to monitor and quantify effective work function...

Nondestructive inspection method for coatings and ceramic matrix co...

High-side gate over-voltage stress testing

Spike safe floating current and voltage source

Gate oxide soft breakdown detection circuit

Quality evaluation method for laminate having protective layer on s...

Semiconductor device and method of inspecting a semiconductor device

Devices under test

Simultaneously measuring degradation in multiple FETs

Methods, apparatus and system for screening process splits for tech...

Test method and system for cut-in voltage

Semiconductor device

Non-planar field effect transistor test structure and lateral diele...

On chip bias temperature instability characterization of a semicond...

Patents Applicationslast 30 patents

PROBE CARD FOR DEVICE UNDER TEST

METHOD FOR PREDICTING FAILURE OF SEMICONDUCTOR DEVICE, AND SEMICOND...

METHOD OF TESTING A SEMICONDUCTOR DEVICE AS WELL AS A CORRESPONDING...

PROCESSOR FREQUENCY IMPROVEMENT BASED ON ANTENNA OPTIMIZATION

PROBE CARD FOR DEVICE UNDER TEST

PROCESSOR FREQUENCY IMPROVEMENT BASED ON ANTENNA OPTIMIZATION

SYSTEMS, CIRCUITS, AND METHODS TO DETECT GATE-OPEN FAILURES IN MOS...

TEST METHOD AND SYSTEM FOR TESTING CONNECTIVITY OF SEMICONDUCTOR ST...

DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICES

DETERIORATION CHECKING APPARATUS AND DETERIORATION CHECKING

HIGH-SIDE GATE OVER-VOLTAGE STRESS TESTING

METHOD OF MEASURING A DEVICE PARAMETER

DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICES

Method and Apparatus for Calculating Kink Current of SOI Device

RDSON/dRON MEASUREMENT METHOD AND CIRCUIT FOR HIGH VOLTAGE HEMTS

BODY-CONTACTED FIELD EFFECT TRANSISTORS CONFIGURED FOR TEST AND MET...

SEMICONDUCTOR APPARATUS

HIGH-SIDE GATE OVER-VOLTAGE STRESS TESTING

SYSTEM AND METHOD FOR SURGE-TESTING A GALLIUM NITRIDE TRANSISTOR DE...

METHOD OF TESTING SEMICONDUCTOR DEVICES AND SYSTEM FOR TESTING SEMI...

HIGH-SIDE GATE OVER-VOLTAGE STRESS TESTING

GATE OXIDE SOFT BREAKDOWN DETECTION CIRCUIT

SPIKE SAFE FLOATING CURRENT AND VOLTAGE SOURCE

QUALITY EVALUATION METHOD FOR LAMINATE HAVING PROTECTIVE LAYER ON S...

SIMULTANEOUSLY MEASURING DEGRADATION IN MULTIPLE FETS

TRANSISTOR TESTING CIRCUIT AND METHOD THEREOF, SEMICONDUCTOR MEMORY...

DEVICE HAVING FINFETS AND METHOD FOR MEASURING RESISTANCE OF THE FI...

CURRENT MEASUREMENT METHOD

NON-PLANAR FIELD EFFECT TRANSISTOR TEST STRUCTURE AND LATERAL DIELE...

TESTING OF INTEGRATED CIRCUITS WITH EXTERNAL CLEARANCE REQUIREMENTS