for measuring frequency response characteristics

Industry

CPC
G01R31/2612

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/2612for measuring frequency response characteristics

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Machine operation monitoring
- Patent number 11,953,539
- Issue date Apr 9, 2024
- Hitech & Development Wireless Sweden AB
- Örjan Fritz
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Secondary monitoring system for a machine under test
- Patent number 11,480,603
- Issue date Oct 25, 2022
- The Boeing Company
- Steven F Griffin
- G01 - MEASURING TESTING
Information Patent Grant
Chip testing system
- Patent number 11,435,396
- Issue date Sep 6, 2022
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Line fault signature analysis
- Patent number 10,794,963
- Issue date Oct 6, 2020
- Texas Instruments Incorporated
- Prasanna U Rajagopal
- G01 - MEASURING TESTING
Information Patent Grant
Line fault signature analysis
- Patent number 10,564,206
- Issue date Feb 18, 2020
- Texas Instruments Incorporated
- Prasanna U Rajagopal
- G01 - MEASURING TESTING
Information Patent Grant
Line fault signature analysis
- Patent number 10,401,412
- Issue date Sep 3, 2019
- Texas Instruments Incorporated
- Prasanna U Rajagopal
- G01 - MEASURING TESTING
Information Patent Grant
SOC management system of energy storage device, and method therefor
- Patent number 10,234,510
- Issue date Mar 19, 2019
- HYOSUNG HEAVY INDUSTRIES CORPORATION
- Geon Ho An
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated split signal hybrid harmonic tuner
- Patent number 10,187,228
- Issue date Jan 22, 2019
- Christos Tsironis
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for determining a deterioration of power semiconductor modul...
- Patent number 10,168,381
- Issue date Jan 1, 2019
- Siemens Aktiengesellschaft
- Jimmy-Alexander Butron-Ccoa
- G01 - MEASURING TESTING
Information Patent Grant
Insulated gate bipolar transistor failure mode detection and protec...
- Patent number 9,726,712
- Issue date Aug 8, 2017
- General Electric Company
- Tao Wu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electric circuit evaluation method and electric circuit
- Patent number 9,470,735
- Issue date Oct 18, 2016
- Rohm Co., Ltd.
- Noriaki Hiraga
- G01 - MEASURING TESTING
Information Patent Grant
SMU RF transistor stability arrangement
- Patent number 9,335,364
- Issue date May 10, 2016
- Keithley Instruments, Inc.
- James A. Niemann
- G01 - MEASURING TESTING
Information Patent Grant
In-line measurement of transistor device cut-off frequency
- Patent number 9,297,853
- Issue date Mar 29, 2016
- GLOBALFOUNDRIES Inc.
- John J. Benoit
- G01 - MEASURING TESTING
Information Patent Grant
Method for characterizing an electrical system by impedance spectro...
- Patent number 8,773,145
- Issue date Jul 8, 2014
- Helion
- Vincent Phlippoteau
- G01 - MEASURING TESTING
Information Patent Grant
3314008
- Patent number 3,314,008
- Issue date Apr 11, 1967
- G01 - MEASURING TESTING
Information Patent Grant
2900582
- Patent number 2,900,582
- Issue date Aug 18, 1959
- G01 - MEASURING TESTING
Information Patent Grant
2794952
- Patent number 2,794,952
- Issue date Jun 4, 1957
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHIP TESTING SYSTEM
- Publication number 20220128621
- Publication date Apr 28, 2022
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
MACHINE OPERATION MONITORING
- Publication number 20220034957
- Publication date Feb 3, 2022
- HITECH & DEVELOPMENT WIRELESS SWEDEN AB
- Örjan FRITZ
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SECONDARY MONITORING SYSTEM FOR A MACHINE UNDER TEST
- Publication number 20210293875
- Publication date Sep 23, 2021
- The Boeing Company
- Steven F. Griffin
- G01 - MEASURING TESTING
Information Patent Application
LINE FAULT SIGNATURE ANALYSIS
- Publication number 20200150192
- Publication date May 14, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Prasanna U. Rajagopal
- G01 - MEASURING TESTING
Information Patent Application
LINE FAULT SIGNATURE ANALYSIS
- Publication number 20190346499
- Publication date Nov 14, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Prasanna U. Rajagopal
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF TESTING SEMICONDUCTOR DEVICES AND SYSTEM FOR TESTING SEMI...
- Publication number 20180188311
- Publication date Jul 5, 2018
- Samsung Electronics Co., Ltd.
- OH SONG KWON
- G01 - MEASURING TESTING
Information Patent Application
LINE FAULT SIGNATURE ANALYSIS
- Publication number 20180172750
- Publication date Jun 21, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Prasanna U. Rajagopal
- G01 - MEASURING TESTING
Information Patent Application
SOC MANAGEMENT SYSTEM OF ENERGY STORAGE DEVICE, AND METHOD THEREFOR
- Publication number 20180003772
- Publication date Jan 4, 2018
- HYOSUNG CORPORATION
- Geon Ho AN
- G01 - MEASURING TESTING
Information Patent Application
Electric Circuit Evaluation Method and Electric Circuit
- Publication number 20140368213
- Publication date Dec 18, 2014
- Noriaki HIRAGA
- G01 - MEASURING TESTING
Information Patent Application
INSULATED GATE BIPOLAR TRANSISTOR FAILURE MODE DETECTION AND PROTEC...
- Publication number 20140368232
- Publication date Dec 18, 2014
- GENERAL ELECTRIC COMPANY
- Tao Wu
- G01 - MEASURING TESTING
Information Patent Application
IN-LINE MEASUREMENT OF TRANSISTOR DEVICE CUT-OFF FREQUENCY
- Publication number 20140368227
- Publication date Dec 18, 2014
- John J. Benoit
- G01 - MEASURING TESTING
Information Patent Application
SMU RF TRANSISTOR STABILITY ARRANGEMENT
- Publication number 20140218064
- Publication date Aug 7, 2014
- KEITHLEY INSTRUMENTS, INC.
- James A. Niemann
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CHARACTERIZING AN ELECTRICAL SYSTEM BY IMPEDANCE SPECTRO...
- Publication number 20120105075
- Publication date May 3, 2012
- HELION
- Vincent Phlippoteau
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Semiconductor test system and associated methods for wafer level ac...
- Publication number 20030006413
- Publication date Jan 9, 2003
- University of Florida
- Ravi Chawla
- G01 - MEASURING TESTING

for measuring frequency response characteristics

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Machine operation monitoring

Secondary monitoring system for a machine under test

Chip testing system

Line fault signature analysis

Line fault signature analysis

Line fault signature analysis

SOC management system of energy storage device, and method therefor

Integrated split signal hybrid harmonic tuner

Method for determining a deterioration of power semiconductor modul...

Insulated gate bipolar transistor failure mode detection and protec...

Electric circuit evaluation method and electric circuit

SMU RF transistor stability arrangement

In-line measurement of transistor device cut-off frequency

Method for characterizing an electrical system by impedance spectro...

3314008

2900582

2794952

Patents Applicationslast 30 patents

CHIP TESTING SYSTEM

MACHINE OPERATION MONITORING

SECONDARY MONITORING SYSTEM FOR A MACHINE UNDER TEST

LINE FAULT SIGNATURE ANALYSIS

LINE FAULT SIGNATURE ANALYSIS

METHOD OF TESTING SEMICONDUCTOR DEVICES AND SYSTEM FOR TESTING SEMI...

LINE FAULT SIGNATURE ANALYSIS

SOC MANAGEMENT SYSTEM OF ENERGY STORAGE DEVICE, AND METHOD THEREFOR

Electric Circuit Evaluation Method and Electric Circuit

INSULATED GATE BIPOLAR TRANSISTOR FAILURE MODE DETECTION AND PROTEC...

IN-LINE MEASUREMENT OF TRANSISTOR DEVICE CUT-OFF FREQUENCY

SMU RF TRANSISTOR STABILITY ARRANGEMENT

METHOD FOR CHARACTERIZING AN ELECTRICAL SYSTEM BY IMPEDANCE SPECTRO...

Semiconductor test system and associated methods for wafer level ac...