for measuring noise

Industry

CPC
G01R31/2646

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2646for measuring noise

Industries

Patents Grantslast 30 patents

Information Patent Grant
Noise monitoring apparatus, noise monitoring system and a noise mon...
- Patent number 12,085,603
- Issue date Sep 10, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chin Yin
- G01 - MEASURING TESTING
Information Patent Grant
Slave BMS inspection system and method
- Patent number 12,040,458
- Issue date Jul 16, 2024
- LG ENERGY SOLUTION, LTD.
- Yean Sik Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast convergence method for cross-correlation based modulation qual...
- Patent number 11,796,621
- Issue date Oct 24, 2023
- National Instruments Corporation
- Sartaj Chaudhary
- G01 - MEASURING TESTING
Information Patent Grant
Slave BMS inspection system and method
- Patent number 11,688,887
- Issue date Jun 27, 2023
- LG Energy Solution, Ltd.
- Yean Sik Choi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for semiconductor device random telegraph sequenc...
- Patent number 11,674,995
- Issue date Jun 13, 2023
- Cirrus Logic, Inc.
- Aleksey S. Khenkin
- G01 - MEASURING TESTING
Information Patent Grant
Method for differential/common-mode noise figure measurements
- Patent number 11,112,447
- Issue date Sep 7, 2021
- Anritsu Company
- Jon S. Martens
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Synchronized noise measurement system
- Patent number 10,782,337
- Issue date Sep 22, 2020
- Jinan ProPlus Electronics Co., Ltd.
- Zhihong Liu
- G01 - MEASURING TESTING
Information Patent Grant
Computing device executing program performing method of analyzing p...
- Patent number 10,444,276
- Issue date Oct 15, 2019
- Samsung Electronics Co., Ltd.
- Young Hoe Cheon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computing device executing program performing method of analyzing p...
- Patent number 9,958,495
- Issue date May 1, 2018
- Samsung Electronics Co., Ltd.
- Young Hoe Cheon
- G11 - INFORMATION STORAGE
Information Patent Grant
Device testing and monitoring method thereof
- Patent number 9,804,220
- Issue date Oct 31, 2017
- Taiwan Semiconductor Manufacturing Company Ltd.
- Jaw-Juinn Horng
- G01 - MEASURING TESTING
Information Patent Grant
Noise measurement system
- Patent number 9,500,697
- Issue date Nov 22, 2016
- ProPlus Design Solutions, Inc.
- Zhihong Liu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses and methods for measuring flicker noise
- Patent number 9,459,301
- Issue date Oct 4, 2016
- ProPlus Design Solutions, Inc.
- Zhihong Liu
- G01 - MEASURING TESTING
Information Patent Grant
Universal jitter meter and phase noise measurement
- Patent number 9,354,266
- Issue date May 31, 2016
- GLOBALFOUNDRIES Inc.
- Mihai A. Sanduleanu
- G01 - MEASURING TESTING
Information Patent Grant
Using a shared local oscillator to make low-noise vector measurements
- Patent number 9,188,617
- Issue date Nov 17, 2015
- National Instruments Corporation
- Daniel S. Wertz
- G01 - MEASURING TESTING
Information Patent Grant
Method for asynchronous impulse response measurement between separa...
- Patent number 9,170,290
- Issue date Oct 27, 2015
- Audyssey Laboratories, Inc.
- Jeffrey Clark
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining power supply noise in an integrat...
- Patent number 8,704,532
- Issue date Apr 22, 2014
- Avago Technologies General IP (Singapore) Pte. Ltd.
- Brian J. Misek
- G01 - MEASURING TESTING
Information Patent Grant
Crosstalk verification device
- Patent number 5,446,674
- Issue date Aug 29, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Minoru Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for measuring noise characteristics
- Patent number 4,891,577
- Issue date Jan 2, 1990
- Matsushita Electric Industrial Co., Ltd.
- Osamu Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
3723874
- Patent number 3,723,874
- Issue date Mar 27, 1973
- G01 - MEASURING TESTING
Information Patent Grant
3659198
- Patent number 3,659,198
- Issue date Apr 25, 1972
- G01 - MEASURING TESTING
Information Patent Grant
3621394
- Patent number 3,621,394
- Issue date Nov 16, 1971
- G01 - MEASURING TESTING
Information Patent Grant
3619780
- Patent number 3,619,780
- Issue date Nov 9, 1971
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Slave BMS Inspection System and Method
- Publication number 20240332648
- Publication date Oct 3, 2024
- LG ENERGY SOLUTION, LTD.
- Yean Sik Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NOISE MONITORING APPARATUS, NOISE MONITORING SYSTEM AND A NOISE MON...
- Publication number 20240044969
- Publication date Feb 8, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chin Yin
- G01 - MEASURING TESTING
Information Patent Application
DEVICES AND METHODS FOR NOISE TESTING OF A SUBSTRATE INCLUDING THRO...
- Publication number 20230417818
- Publication date Dec 28, 2023
- Shanghai United Imaging Microelectronics Technology Co., Ltd.
- Changzhi SHI
- G01 - MEASURING TESTING
Information Patent Application
Slave BMS Inspection System and Method
- Publication number 20230275276
- Publication date Aug 31, 2023
- LG ENERGY SOLUTION, LTD.
- Yean Sik Choi
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR SEMICONDUCTOR DEVICE RANDOM TELEGRAPH SEQUENC...
- Publication number 20220221505
- Publication date Jul 14, 2022
- Cirrus Logic International Semiconductor Ltd.
- Aleksey S. Khenkin
- G01 - MEASURING TESTING
Information Patent Application
Fast Convergence Method for Cross-Correlation Based Modulation Qual...
- Publication number 20220065972
- Publication date Mar 3, 2022
- National Instruments Corporation
- Sartaj Chaudhary
- G01 - MEASURING TESTING
Information Patent Application
Slave BMS Inspection System and Method
- Publication number 20210265670
- Publication date Aug 26, 2021
- LG CHEM, LTD.
- Yean Sik CHOI
- G01 - MEASURING TESTING
Information Patent Application
COMPUTING DEVICE EXECUTING PROGRAM PERFORMING METHOD OF ANALYZING P...
- Publication number 20180224497
- Publication date Aug 9, 2018
- Samsung Electronics Co., Ltd.
- YOUNG HOE CHEON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Synchronized Noise Measurement System
- Publication number 20180180662
- Publication date Jun 28, 2018
- ProPlus Design Solutions, Inc.
- Zhihong Liu
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM, DEVICE OF A DATA COLLECTING CHIP AND CONTROL METHOD...
- Publication number 20170248650
- Publication date Aug 31, 2017
- SHENZHEN HUIDING TECHNOLOGY CO., LTD.
- Weihe QIN
- G01 - MEASURING TESTING
Information Patent Application
COMPUTING DEVICE EXECUTING PROGRAM PERFORMING METHOD OF ANALYZING P...
- Publication number 20160161546
- Publication date Jun 9, 2016
- Samsung Electronics Co., Ltd.
- YOUNG HOE CHEON
- G01 - MEASURING TESTING
Information Patent Application
DEVICE TESTING AND MONITORING METHOD THEREOF
- Publication number 20160146881
- Publication date May 26, 2016
- Taiwan Semiconductor Manufacturing company Ltd.
- JAW-JUINN HORNG
- G01 - MEASURING TESTING
Information Patent Application
Apparatuses and Methods for Measuring Flicker Noise
- Publication number 20150212131
- Publication date Jul 30, 2015
- PROPLUS ELECTRONICS CO., LTD.
- Zhihong LIU
- G01 - MEASURING TESTING
Information Patent Application
Noise Measurement System
- Publication number 20150212145
- Publication date Jul 30, 2015
- PROPLUS ELECTRONICS CO., LTD.
- Zhihong LIU
- G01 - MEASURING TESTING
Information Patent Application
Using a Shared Local Oscillator to Make Low-noise Vector Measurements
- Publication number 20140306720
- Publication date Oct 16, 2014
- National Instruments Corporation
- Daniel S. Wertz
- G01 - MEASURING TESTING
Information Patent Application
UNIVERSAL JITTER METER AND PHASE NOISE MEASUREMENT
- Publication number 20130332096
- Publication date Dec 12, 2013
- International Business Machines Corporation
- Mihai A. Sanduleanu
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING POWER SUPPLY NOISE IN AN INTEGRAT...
- Publication number 20120146665
- Publication date Jun 14, 2012
- Avago Technologies Enerprise IP (Singapore) Pte. Ltd.
- Brian J. Misek
- G01 - MEASURING TESTING

for measuring noise

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Noise monitoring apparatus, noise monitoring system and a noise mon...

Slave BMS inspection system and method

Fast convergence method for cross-correlation based modulation qual...

Slave BMS inspection system and method

System and method for semiconductor device random telegraph sequenc...

Method for differential/common-mode noise figure measurements

Synchronized noise measurement system

Computing device executing program performing method of analyzing p...

Computing device executing program performing method of analyzing p...

Device testing and monitoring method thereof

Noise measurement system

Apparatuses and methods for measuring flicker noise

Universal jitter meter and phase noise measurement

Using a shared local oscillator to make low-noise vector measurements

Method for asynchronous impulse response measurement between separa...

System and method for determining power supply noise in an integrat...

Crosstalk verification device

Apparatus for measuring noise characteristics

3723874

3659198

3621394

3619780

Patents Applicationslast 30 patents

Slave BMS Inspection System and Method

NOISE MONITORING APPARATUS, NOISE MONITORING SYSTEM AND A NOISE MON...

DEVICES AND METHODS FOR NOISE TESTING OF A SUBSTRATE INCLUDING THRO...

Slave BMS Inspection System and Method

SYSTEM AND METHOD FOR SEMICONDUCTOR DEVICE RANDOM TELEGRAPH SEQUENC...

Fast Convergence Method for Cross-Correlation Based Modulation Qual...

Slave BMS Inspection System and Method

COMPUTING DEVICE EXECUTING PROGRAM PERFORMING METHOD OF ANALYZING P...

Synchronized Noise Measurement System

TESTING SYSTEM, DEVICE OF A DATA COLLECTING CHIP AND CONTROL METHOD...

COMPUTING DEVICE EXECUTING PROGRAM PERFORMING METHOD OF ANALYZING P...

DEVICE TESTING AND MONITORING METHOD THEREOF

Apparatuses and Methods for Measuring Flicker Noise

Noise Measurement System

Using a Shared Local Oscillator to Make Low-noise Vector Measurements

UNIVERSAL JITTER METER AND PHASE NOISE MEASUREMENT

SYSTEM AND METHOD FOR DETERMINING POWER SUPPLY NOISE IN AN INTEGRAT...