for measuring roughness or irregularity of surfaces

Industry

CPC
G01B15/08

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B15/00Measuring arrangements characterised by the use of wave or particle radiation

Current Industry

G01B15/08for measuring roughness or irregularity of surfaces

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Methods for growing crystals on QCM sensors
- Patent number 12,195,840
- Issue date Jan 14, 2025
- Saudi Arabian Oil Company
- Ayrat Gizzatov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Inspection apparatus and method
- Patent number 12,072,181
- Issue date Aug 27, 2024
- ASML Netherlands B.V.
- Yan Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Airfoil tip cleaning and assessment systems and methods
- Patent number 12,044,632
- Issue date Jul 23, 2024
- RTX Corporation
- Christopher James Pelliccione
- G08 - SIGNALLING
Information Patent Grant
System and method for detecting tool plugging of an agricultural im...
- Patent number 11,761,757
- Issue date Sep 19, 2023
- CNH Industrial America LLC
- Kevin M. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Pattern shape evaluation device, pattern shape evaluation system, a...
- Patent number 11,713,963
- Issue date Aug 1, 2023
- HITACHI HIGH-TECH CORPORATION
- Atsuko Shintani
- G01 - MEASURING TESTING
Information Patent Grant
Fill-level measuring device
- Patent number 11,340,106
- Issue date May 24, 2022
- ENDRESS+HAUSER SE+CO.KG
- Florian Falger
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for detecting road surface conditions
- Patent number 11,059,489
- Issue date Jul 13, 2021
- Valeo Radar Systems, Inc.
- David Insana
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method, computer program product and system for detecting manufactu...
- Patent number 10,957,567
- Issue date Mar 23, 2021
- Applied Materials Israel Ltd.
- Moshe Amzaleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement method for micro topography and roughness of internal s...
- Patent number 10,942,025
- Issue date Mar 9, 2021
- Dalian University of Technology
- Jiang Guo
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric boundary surface estimation device
- Patent number 10,775,163
- Issue date Sep 15, 2020
- Mitsubishi Electric Corporation
- Takehiro Hoshino
- G01 - MEASURING TESTING
Information Patent Grant
Method for monitoring nanometric structures
- Patent number 10,731,979
- Issue date Aug 4, 2020
- Applied Materials Israel Ltd.
- Shimon Levi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Determining an edge roughness parameter of a periodic structure
- Patent number 10,725,387
- Issue date Jul 28, 2020
- ASML Netherlands B.V.
- Teis Johan Coenen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Sample for measuring particles, method for measuring particles and...
- Patent number 10,697,767
- Issue date Jun 30, 2020
- Hitachi High-Technologies Corporation
- Tomihiro Hashizume
- G01 - MEASURING TESTING
Information Patent Grant
Determining edge roughness parameters
- Patent number 10,634,490
- Issue date Apr 28, 2020
- ASML Netherlands B.V.
- Martin Jacobus Johan Jak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for removing noise from roughness measurements
- Patent number 10,488,188
- Issue date Nov 26, 2019
- Fractilia, LLC
- Chris Mack
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Defect observation method and device and defect detection device
- Patent number 10,401,300
- Issue date Sep 3, 2019
- Hitachi High-Technologies Corporation
- Yuko Otani
- G02 - OPTICS
Information Patent Grant
Articulating CMM probe
- Patent number 10,317,186
- Issue date Jun 11, 2019
- Hexagon Metrology, Inc.
- Paul Ferrari
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry apparatus for samples with a miniscule measurem...
- Patent number 10,151,713
- Issue date Dec 11, 2018
- Industrial Technology Research Institute
- Wen-Li Wu
- G01 - MEASURING TESTING
Information Patent Grant
Nitride crystal, nitride crystal substrate, epilayer-containing nit...
- Patent number 10,078,059
- Issue date Sep 18, 2018
- Sumitomo Electric Industries, Ltd.
- Keiji Ishibashi
- C30 - CRYSTAL GROWTH
Information Patent Grant
All-in-one-type continuous reactor for preparing positive electrode...
- Patent number 10,010,851
- Issue date Jul 3, 2018
- LAMINAR CO., LTD.
- Jong Pal Hong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Articulating CMM probe
- Patent number 9,759,540
- Issue date Sep 12, 2017
- Hexagon Metrology, Inc.
- Paul Ferrari
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection system
- Patent number 9,704,235
- Issue date Jul 11, 2017
- Hitachi High-Technologies Corporation
- Akiyuki Sugiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Undulation detection device and method
- Patent number 9,291,452
- Issue date Mar 22, 2016
- Fujitsu Limited
- Kouichirou Kasama
- G01 - MEASURING TESTING
Information Patent Grant
Projection detecting apparatus and projection detecting method
- Patent number 8,878,717
- Issue date Nov 4, 2014
- Nireco Corporation
- Masahiro Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
System and method of surface wave imaging to detect ice on a surfac...
- Patent number 7,719,694
- Issue date May 18, 2010
- HRL Laboratories, LLC
- Daniel J. Gregoire
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Evaluation method of fine pattern feature, its equipment, and metho...
- Patent number 7,684,937
- Issue date Mar 23, 2010
- Hitachi, Ltd.
- Atsuko Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining the irregularities of a hole
- Patent number 7,398,178
- Issue date Jul 8, 2008
- Samsung Electronics Co., Ltd.
- Hyo-Cheon Kang
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation method of fine pattern feature, its equipment, and metho...
- Patent number 7,366,620
- Issue date Apr 29, 2008
- Hitachi High-Technologies Corporation
- Atsuko Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring three-dimensional surface roughness of a structure
- Patent number 7,348,556
- Issue date Mar 25, 2008
- FEI Company
- Prasanna Chitturi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring a minute pitch
- Patent number 7,200,095
- Issue date Apr 3, 2007
- Pioneer Corporation
- Yoshiaki Kojima
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Electromagnetic Response Simulation for Arbitrary Road Surface Prof...
- Publication number 20240411011
- Publication date Dec 12, 2024
- Aptiv Technologies Limited
- Fang Chen
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND METHOD
- Publication number 20240369356
- Publication date Nov 7, 2024
- ASML NETHERLANDS B.V.
- Yan WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A SYSTEM AND METHOD FOR SENSING TOPOLOGY OF A PLANET
- Publication number 20240337482
- Publication date Oct 10, 2024
- Suyash Singh
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING THE THICKNESS OF A MATERIAL IN MA...
- Publication number 20240093983
- Publication date Mar 21, 2024
- PaneraTech, Inc.
- Yakup Bayram
- G01 - MEASURING TESTING
Information Patent Application
AIRFOIL TIP CLEANING AND ASSESSMENT SYSTEMS AND METHODS
- Publication number 20230366835
- Publication date Nov 16, 2023
- Raytheon Technologies Corporation
- Ron I. PRIHAR
- G08 - SIGNALLING
Information Patent Application
AXIAL DEVIATION ESTIMATING DEVICE
- Publication number 20220229168
- Publication date Jul 21, 2022
- DENSO CORPORATION
- Katsuhiko KONDO
- G01 - MEASURING TESTING
Information Patent Application
Pattern Measurement System, Pattern Measurement Method, and Program
- Publication number 20220230281
- Publication date Jul 21, 2022
- HITACHI HIGH-TECH CORPORATION
- Toshimasa Kameda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...
- Publication number 20220120561
- Publication date Apr 21, 2022
- Industrial Technology Research Institute
- Chun-Ting LIU
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND METHOD
- Publication number 20220107176
- Publication date Apr 7, 2022
- ASML NETHERLANDS B.V.
- Yan WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR GROWING CRYSTALS ON QCM SENSORS
- Publication number 20220042164
- Publication date Feb 10, 2022
- Saudi Arabian Oil Company
- Ayrat Gizzatov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PATTERN SHAPE EVALUATION DEVICE, PATTERN SHAPE EVALUATION SYSTEM, A...
- Publication number 20220034653
- Publication date Feb 3, 2022
- Hitachi High-Tech Corporation
- Atsuko Shintani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR DETECTING TOOL PLUGGING OF AN AGRICULTURAL IM...
- Publication number 20210123728
- Publication date Apr 29, 2021
- CNH Industrial America LLC
- Kevin M. Smith
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
FILL-LEVEL MEASURING DEVICE
- Publication number 20200355537
- Publication date Nov 12, 2020
- Endress+Hauser SE+Co. KG
- Florian Falger
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD FOR MICRO TOPOGRAPHY AND ROUGHNESS OF INTERNAL S...
- Publication number 20200249015
- Publication date Aug 6, 2020
- DALIAN UNIVERSITY OF TECHNOLOGY
- Jiang GUO
- G01 - MEASURING TESTING
Information Patent Application
DIELECTRIC BOUNDARY SURFACE ESTIMATION DEVICE
- Publication number 20200232791
- Publication date Jul 23, 2020
- Mitsubishi Electric Corporation
- Takehiro HOSHINO
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR DETECTING ROAD SURFACE CONDITIONS
- Publication number 20200130697
- Publication date Apr 30, 2020
- Valeo Radar Systems, Inc.
- David Insana
- B60 - VEHICLES IN GENERAL
Information Patent Application
METHOD, COMPUTER PROGRAM PRODUCT AND SYSTEM FOR DETECTING MANUFACTU...
- Publication number 20200118855
- Publication date Apr 16, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Moshe Amzaleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING A STRUCTURE-INDEPENDENT CONTRIBUTION OF A LI...
- Publication number 20190258176
- Publication date Aug 22, 2019
- Carl Zeiss SMT GMBH
- Markus Koch
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR MONITORING NANOMETRIC STRUCTURES
- Publication number 20190219390
- Publication date Jul 18, 2019
- APPLIED MATERIALS ISRAEL, LTD.
- Shimon LEVI
- B82 - NANO-TECHNOLOGY
Information Patent Application
NONMETALLIC JOINTS AND METHODS FOR FORMATION AND INSPECTION THEREOF
- Publication number 20190186658
- Publication date Jun 20, 2019
- Chevron U.S.A. Inc.
- Robert Ernest Rettew
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
SAMPLE FOR MEASURING PARTICLES, METHOD FOR MEASURING PARTICLES AND...
- Publication number 20190178640
- Publication date Jun 13, 2019
- Hitachi High-Technologies Corporation
- Tomihiro HASHIZUME
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR REMOVING NOISE FROM ROUGHNESS MEASUREMENTS
- Publication number 20190113338
- Publication date Apr 18, 2019
- FRACTILIA, LLC
- Chris MACK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Determining Edge Roughness Parameters
- Publication number 20180364036
- Publication date Dec 20, 2018
- ASML NETHERLANDS B.V.
- Martin Jacobus Johan JAK
- G01 - MEASURING TESTING
Information Patent Application
ARTICULATING CMM PROBE
- Publication number 20180073850
- Publication date Mar 15, 2018
- Hexagon Metrology, Inc.
- Paul Ferrari
- G01 - MEASURING TESTING
Information Patent Application
NITRIDE CRYSTAL, NITRIDE CRYSTAL SUBSTRATE, EPILAYER-CONTAINING NIT...
- Publication number 20170115239
- Publication date Apr 27, 2017
- Sumitomo Electric Industries, Ltd.
- Keiji ISHIBASHI
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR CHARACTERIZATION OF A SURFACE TOPOGRAPHY
- Publication number 20140350887
- Publication date Nov 27, 2014
- COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENE. ALT.
- Carlos BEITIA CACERES
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OF LINE-EDGE-ROUGHNESS AND LINE-WIDTH-ROUGHNESS ON PRE-...
- Publication number 20140264016
- Publication date Sep 18, 2014
- Macronix International Co., Ltd.
- YU-CHUNG CHEN
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INSPECTION SYSTEM
- Publication number 20140219545
- Publication date Aug 7, 2014
- Hitachi High-Technologies Corporation
- Akiyuki Sugiyama
- G01 - MEASURING TESTING
Information Patent Application
All-In-One-Type Continuous Reactor For Preparing Positive Electrode...
- Publication number 20140147338
- Publication date May 29, 2014
- LAMINAR CO.,LTD
- Jong Pal Hong
- G01 - MEASURING TESTING
Information Patent Application
System and method for identification of conductor surface roughness...
- Publication number 20140032190
- Publication date Jan 30, 2014
- Yuriy SHLEPNEV
- G01 - MEASURING TESTING

for measuring roughness or irregularity of surfaces

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Methods for growing crystals on QCM sensors

Inspection apparatus and method

Airfoil tip cleaning and assessment systems and methods

System and method for detecting tool plugging of an agricultural im...

Pattern shape evaluation device, pattern shape evaluation system, a...

Fill-level measuring device

Methods and systems for detecting road surface conditions

Method, computer program product and system for detecting manufactu...

Measurement method for micro topography and roughness of internal s...

Dielectric boundary surface estimation device

Method for monitoring nanometric structures

Determining an edge roughness parameter of a periodic structure

Sample for measuring particles, method for measuring particles and...

Determining edge roughness parameters

System and method for removing noise from roughness measurements

Defect observation method and device and defect detection device

Articulating CMM probe

X-ray reflectometry apparatus for samples with a miniscule measurem...

Nitride crystal, nitride crystal substrate, epilayer-containing nit...

All-in-one-type continuous reactor for preparing positive electrode...

Articulating CMM probe

Semiconductor inspection system

Undulation detection device and method

Projection detecting apparatus and projection detecting method

System and method of surface wave imaging to detect ice on a surfac...

Evaluation method of fine pattern feature, its equipment, and metho...

Method of determining the irregularities of a hole

Evaluation method of fine pattern feature, its equipment, and metho...

Method of measuring three-dimensional surface roughness of a structure

Method and apparatus for measuring a minute pitch

Patents Applicationslast 30 patents

Electromagnetic Response Simulation for Arbitrary Road Surface Prof...

INSPECTION APPARATUS AND METHOD

A SYSTEM AND METHOD FOR SENSING TOPOLOGY OF A PLANET

SYSTEM AND METHOD FOR DETERMINING THE THICKNESS OF A MATERIAL IN MA...

AIRFOIL TIP CLEANING AND ASSESSMENT SYSTEMS AND METHODS

AXIAL DEVIATION ESTIMATING DEVICE

Pattern Measurement System, Pattern Measurement Method, and Program

X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...

INSPECTION APPARATUS AND METHOD

METHODS FOR GROWING CRYSTALS ON QCM SENSORS

PATTERN SHAPE EVALUATION DEVICE, PATTERN SHAPE EVALUATION SYSTEM, A...

SYSTEM AND METHOD FOR DETECTING TOOL PLUGGING OF AN AGRICULTURAL IM...

FILL-LEVEL MEASURING DEVICE

MEASUREMENT METHOD FOR MICRO TOPOGRAPHY AND ROUGHNESS OF INTERNAL S...

DIELECTRIC BOUNDARY SURFACE ESTIMATION DEVICE

METHODS AND SYSTEMS FOR DETECTING ROAD SURFACE CONDITIONS

METHOD, COMPUTER PROGRAM PRODUCT AND SYSTEM FOR DETECTING MANUFACTU...

METHOD FOR DETERMINING A STRUCTURE-INDEPENDENT CONTRIBUTION OF A LI...

METHOD FOR MONITORING NANOMETRIC STRUCTURES

NONMETALLIC JOINTS AND METHODS FOR FORMATION AND INSPECTION THEREOF

SAMPLE FOR MEASURING PARTICLES, METHOD FOR MEASURING PARTICLES AND...

SYSTEM AND METHOD FOR REMOVING NOISE FROM ROUGHNESS MEASUREMENTS

Determining Edge Roughness Parameters

ARTICULATING CMM PROBE

NITRIDE CRYSTAL, NITRIDE CRYSTAL SUBSTRATE, EPILAYER-CONTAINING NIT...

METHOD FOR CHARACTERIZATION OF A SURFACE TOPOGRAPHY

MEASUREMENT OF LINE-EDGE-ROUGHNESS AND LINE-WIDTH-ROUGHNESS ON PRE-...

SEMICONDUCTOR INSPECTION SYSTEM

All-In-One-Type Continuous Reactor For Preparing Positive Electrode...

System and method for identification of conductor surface roughness...