for measuring switching properties thereof

Industry

CPC
G01R31/2617

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/2617for measuring switching properties thereof

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Non-invasive front-end for power electronic monitoring
- Patent number 12,158,490
- Issue date Dec 3, 2024
- Aalborg Universitet
- Huai Wang
- G01 - MEASURING TESTING
Information Patent Grant
Non-invasive online monitoring circuit for on-state saturation volt...
- Patent number 12,085,600
- Issue date Sep 10, 2024
- Hunan Lanhai Electrical Engineering Co., Ltd.
- Xing Wei
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems and methods for controlling wind converters
- Patent number 12,074,530
- Issue date Aug 27, 2024
- General Electric Renovables Espana, S.L.
- Lijun He
- F03 - MACHINES OR ENGINES FOR LIQUIDS WIND, SPRING WEIGHT AND MISCELLANEOUS M...
Information Patent Grant
System and method for measuring intermittent operating life of GaN-...
- Patent number 12,038,469
- Issue date Jul 16, 2024
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Chang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method for checking a semiconductor switch for a fault
- Patent number 11,881,848
- Issue date Jan 23, 2024
- Webasto SE
- Philipp Eck
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Device and method for testing semiconductor devices
- Patent number 11,733,287
- Issue date Aug 22, 2023
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Jihua Li
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for identifying a malfunctioning current sensor
- Patent number 11,624,772
- Issue date Apr 11, 2023
- Schneider Electric Industries SAS
- Pierre Blanchard
- G01 - MEASURING TESTING
Information Patent Grant
Detection circuit for open, close and suspension states of high and...
- Patent number 11,585,843
- Issue date Feb 21, 2023
- Chongqing University
- Yongduan Song
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Testing apparatus, testing method, and manufacturing method
- Patent number 11,500,009
- Issue date Nov 15, 2022
- Fuji Electric Co., Ltd.
- Tetsutaro Imagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for testing semiconductor devices
- Patent number 11,448,685
- Issue date Sep 20, 2022
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Jihua Li
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring an operating condition of a transistor-based power conve...
- Patent number 11,287,465
- Issue date Mar 29, 2022
- Rolls-Royce PLC
- Mohamed Sathik Mohamed Halick
- G01 - MEASURING TESTING
Information Patent Grant
Switching loss measurement and plot in test and measurement instrument
- Patent number 11,181,581
- Issue date Nov 23, 2021
- Tektronix, Inc.
- Krishna N H Sri
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Adaptive blanking of over current fault detection circuits in power...
- Patent number 11,150,300
- Issue date Oct 19, 2021
- Analog Devices International Unlimited Company
- Brian K. Jadus
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the output voltage of a transistor
- Patent number 11,099,225
- Issue date Aug 24, 2021
- ALSTOM TRANSPORT TECHNOLOGIES
- Vincent Escrouzailles
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Connection circuit and connection method thereof
- Patent number 11,031,934
- Issue date Jun 8, 2021
- Realtek Semiconductor Corporation
- Ya-Hsuan Sung
- G01 - MEASURING TESTING
Information Patent Grant
Method and a device for determining a switching current of a conver...
- Patent number 10,908,205
- Issue date Feb 2, 2021
- Bombardier Primove GmbH
- Alexander Klingspor
- B60 - VEHICLES IN GENERAL
Information Patent Grant
System and method of monitoring a switching transistor
- Patent number 10,895,601
- Issue date Jan 19, 2021
- Infineon Technologies AG
- Matthias Bogus
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for estimating power system health
- Patent number 10,605,854
- Issue date Mar 31, 2020
- Rollys-Royce PLC
- Mohamed Halick Mohamed Sathik
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Apparatus and method for predicting fault state of inverter
- Patent number 10,495,682
- Issue date Dec 3, 2019
- Hyundai Motor Company
- Deog Hyeon Kim
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
High-resolution power electronics measurements
- Patent number 10,094,863
- Issue date Oct 9, 2018
- Texas Instruments Incorporated
- Sandeep R. Bahl
- G01 - MEASURING TESTING
Information Patent Grant
Precision measurement of voltage drop across a semiconductor switch...
- Patent number 9,772,369
- Issue date Sep 26, 2017
- Siemens Aktiengesellschaft
- Anandarup Das
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test apparatus with power cutoff section having variable maximum an...
- Patent number 8,866,489
- Issue date Oct 21, 2014
- Advantest Corporation
- Shinichi Hashimoto
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for evaluating the effects of stress on an RF...
- Patent number 7,808,266
- Issue date Oct 5, 2010
- Texas Instruments Incorporated
- Andrew Marsall
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing power switches using a logic gate...
- Patent number 7,394,241
- Issue date Jul 1, 2008
- Faraday Technology Corp.
- Yu-Wen Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Switch device
- Patent number 7,327,157
- Issue date Feb 5, 2008
- Fraunhofer-Gesellschaft zur angewandten Forschung e.V.
- Michael Hackner
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus with self-test circuit
- Patent number 7,111,218
- Issue date Sep 19, 2006
- Maytag Corporation
- Keith D. Egger
- G01 - MEASURING TESTING
Information Patent Grant
Transistor circuits
- Patent number 4,010,418
- Issue date Mar 1, 1977
- RCA Corporation
- Leonard Robert Salvatore
- G01 - MEASURING TESTING
Information Patent Grant
3505598
- Patent number 3,505,598
- Issue date Apr 7, 1970
- G01 - MEASURING TESTING
Information Patent Grant
3443227
- Patent number 3,443,227
- Issue date May 6, 1969
- G01 - MEASURING TESTING
Information Patent Grant
3441857
- Patent number 3,441,857
- Issue date Apr 29, 1969
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND OVERCURRENT PROTECTION DEVICE
- Publication number 20240219449
- Publication date Jul 4, 2024
- Fuji Electric Co., Ltd.
- Shigeki SATO
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND TESTING METHOD
- Publication number 20240142510
- Publication date May 2, 2024
- Fuji Electric Co., Ltd.
- Mitsuru YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
SWITCH SHORT-CIRCUITED DIAGNOSIS METHOD
- Publication number 20240069090
- Publication date Feb 29, 2024
- Delta Electronics, Inc.
- Kai-Wei HU
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
NON-INVASIVE FRONT-END FOR POWER ELECTRONIC MONITORING
- Publication number 20230132796
- Publication date May 4, 2023
- AALBORG UNIVERSITET
- Huai Wang
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20220390502
- Publication date Dec 8, 2022
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- JIHUA LI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING INTERMITTENT OPERATING LIFE OF GaN-...
- Publication number 20220381815
- Publication date Dec 1, 2022
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Chang CHEN
- G01 - MEASURING TESTING
Information Patent Application
DETECTION CIRCUIT FOR OPEN, CLOSE AND SUSPENSION STATES OF HIGH AND...
- Publication number 20220291276
- Publication date Sep 15, 2022
- CHONGQING UNIVERSITY
- YONGDUAN SONG
- B60 - VEHICLES IN GENERAL
Information Patent Application
METHOD FOR CHECKING A SEMICONDUCTOR SWITCH FOR A FAULT
- Publication number 20220158633
- Publication date May 19, 2022
- Webasto SE
- Philipp ECK
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHODS AND SYSTEMS FOR IDENTIFYING A MALFUNCTIONING CURRENT SENSOR
- Publication number 20220099728
- Publication date Mar 31, 2022
- Schneider Electric Industries SAS
- Pierre Blanchard
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS, TESTING METHOD, AND MANUFACTURING METHOD
- Publication number 20220065917
- Publication date Mar 3, 2022
- Fuji Electric Co., Ltd.
- Tetsutaro IMAGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20220043048
- Publication date Feb 10, 2022
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- JIHUA LI
- G01 - MEASURING TESTING
Information Patent Application
ADAPTIVE BLANKING OF OVER CURRENT FAULT DETECTION CIRCUITS IN POWER...
- Publication number 20210181254
- Publication date Jun 17, 2021
- Analog Devices International Unlimited Company
- Brian K. Jadus
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CONTROLLING WIND CONVERTERS
- Publication number 20210131400
- Publication date May 6, 2021
- GENERAL ELECTRIC COMPANY
- Lijun He
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
System and Method of Monitoring a Switching Transistor
- Publication number 20200355745
- Publication date Nov 12, 2020
- INFINEON TECHNOLOGIES AG
- Matthias Bogus
- G01 - MEASURING TESTING
Information Patent Application
CONNECTION CIRCUIT AND CONNECTION METHOD THEREOF
- Publication number 20200204176
- Publication date Jun 25, 2020
- REALTEK SEMICONDUCTOR CORPORATION
- Ya-Hsuan SUNG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method and a Device for Determining a Switching Current of a Conver...
- Publication number 20190324076
- Publication date Oct 24, 2019
- Bombardier Primove GmbH
- Alexander Klingspor
- G01 - MEASURING TESTING
Information Patent Application
HIGH-RESOLUTION POWER ELECTRONICS MEASUREMENTS
- Publication number 20190094276
- Publication date Mar 28, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Sandeep R. Bahl
- G01 - MEASURING TESTING
Information Patent Application
Method for Determining the Output Voltage of a Transistor
- Publication number 20180348293
- Publication date Dec 6, 2018
- ALSTOM TRANSPORT TECHNOLOGIES
- Vincent Escrouzailles
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CIRCUIT ARRANGEMENT FOR A SECURE DIGITAL SWITCHED OUTPUT, TEST METH...
- Publication number 20180205375
- Publication date Jul 19, 2018
- Weidmuller Interface GmbH & Co. KG
- Gorm ROSE
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
APPARATUS AND METHOD FOR PREDICTING FAULT STATE OF INVERTER
- Publication number 20180045771
- Publication date Feb 15, 2018
- Hyundai Motor Company
- Deog Hyeon KIM
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ESTIMATING POWER SYSTEM HEALTH
- Publication number 20170350934
- Publication date Dec 7, 2017
- Rolls-Royce plc
- Mohamed Halick Mohamed SATHIK
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT AND METHOD FOR TESTING TRANSISTOR(S)
- Publication number 20160109504
- Publication date Apr 21, 2016
- BOE TECHNOLOGY GROUP CO., LTD.
- Guangliang SHANG
- G01 - MEASURING TESTING
Information Patent Application
WIRING CORE STRUCTURE, SEMICONDUCTOR EVALUATION DEVICE AND SEMICOND...
- Publication number 20160054376
- Publication date Feb 25, 2016
- Mitsubishi Electric Corporation
- Akira OKADA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPRATUS
- Publication number 20120187968
- Publication date Jul 26, 2012
- Advantest Corporation
- Shinichi Hashimoto
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR EVALUATING THE EFFECTS OF STRESS ON AN RF...
- Publication number 20100164533
- Publication date Jul 1, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Andrew Marshall
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TESTING POWER SWITCHES USING A LOGIC GATE...
- Publication number 20070252581
- Publication date Nov 1, 2007
- Yu-Wen Tsai
- G01 - MEASURING TESTING
Information Patent Application
Switch device
- Publication number 20060261838
- Publication date Nov 23, 2006
- Michael Hackner
- G01 - MEASURING TESTING
Information Patent Application
Apparatus with self-test circuit
- Publication number 20060031729
- Publication date Feb 9, 2006
- Maytag Corporation
- Keith D. Egger
- G01 - MEASURING TESTING

for measuring switching properties thereof

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Non-invasive front-end for power electronic monitoring

Non-invasive online monitoring circuit for on-state saturation volt...

Systems and methods for controlling wind converters

System and method for measuring intermittent operating life of GaN-...

Method for checking a semiconductor switch for a fault

Device and method for testing semiconductor devices

Methods and systems for identifying a malfunctioning current sensor

Detection circuit for open, close and suspension states of high and...

Testing apparatus, testing method, and manufacturing method

Device and method for testing semiconductor devices

Monitoring an operating condition of a transistor-based power conve...

Switching loss measurement and plot in test and measurement instrument

Adaptive blanking of over current fault detection circuits in power...

Method for determining the output voltage of a transistor

Connection circuit and connection method thereof

Method and a device for determining a switching current of a conver...

System and method of monitoring a switching transistor

Method for estimating power system health

Apparatus and method for predicting fault state of inverter

High-resolution power electronics measurements

Precision measurement of voltage drop across a semiconductor switch...

Test apparatus with power cutoff section having variable maximum an...

Method and apparatus for evaluating the effects of stress on an RF...

Method and apparatus for testing power switches using a logic gate...

Switch device

Apparatus with self-test circuit

Transistor circuits

3505598

3443227

3441857

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND OVERCURRENT PROTECTION DEVICE

TESTING APPARATUS AND TESTING METHOD

SWITCH SHORT-CIRCUITED DIAGNOSIS METHOD

NON-INVASIVE FRONT-END FOR POWER ELECTRONIC MONITORING

DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICES

SYSTEM AND METHOD FOR MEASURING INTERMITTENT OPERATING LIFE OF GaN-...

DETECTION CIRCUIT FOR OPEN, CLOSE AND SUSPENSION STATES OF HIGH AND...

METHOD FOR CHECKING A SEMICONDUCTOR SWITCH FOR A FAULT

METHODS AND SYSTEMS FOR IDENTIFYING A MALFUNCTIONING CURRENT SENSOR

TESTING APPARATUS, TESTING METHOD, AND MANUFACTURING METHOD

DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICES

ADAPTIVE BLANKING OF OVER CURRENT FAULT DETECTION CIRCUITS IN POWER...

SYSTEMS AND METHODS FOR CONTROLLING WIND CONVERTERS

System and Method of Monitoring a Switching Transistor

CONNECTION CIRCUIT AND CONNECTION METHOD THEREOF

Method and a Device for Determining a Switching Current of a Conver...

HIGH-RESOLUTION POWER ELECTRONICS MEASUREMENTS

Method for Determining the Output Voltage of a Transistor

CIRCUIT ARRANGEMENT FOR A SECURE DIGITAL SWITCHED OUTPUT, TEST METH...

APPARATUS AND METHOD FOR PREDICTING FAULT STATE OF INVERTER

METHOD FOR ESTIMATING POWER SYSTEM HEALTH

CIRCUIT AND METHOD FOR TESTING TRANSISTOR(S)

WIRING CORE STRUCTURE, SEMICONDUCTOR EVALUATION DEVICE AND SEMICOND...

TEST APPRATUS

METHOD AND APPARATUS FOR EVALUATING THE EFFECTS OF STRESS ON AN RF...

METHOD AND APPARATUS FOR TESTING POWER SWITCHES USING A LOGIC GATE...

Switch device

Apparatus with self-test circuit