for measuring switching properties thereof

Industry

CPC
G01R31/2633

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2633for measuring switching properties thereof

Industries

Patents Grantslast 30 patents

Information Patent Grant
System and method for identifying non-switching semiconductor switches
- Patent number 12,203,988
- Issue date Jan 21, 2025
- Leoni-Bordnetz Systeme GmbH
- Wolfgang Koch
- G01 - MEASURING TESTING
Information Patent Grant
Phase distortion measurement
- Patent number 12,158,491
- Issue date Dec 3, 2024
- Keysight Technologies, Inc.
- Jan Verspecht
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for testing semiconductor devices
- Patent number 11,733,287
- Issue date Aug 22, 2023
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Jihua Li
- G01 - MEASURING TESTING
Information Patent Grant
Fault recognition
- Patent number 11,719,757
- Issue date Aug 8, 2023
- NEW H3C TECHNOLOGIES CO., LTD.
- Ping Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for testing semiconductor devices
- Patent number 11,448,685
- Issue date Sep 20, 2022
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Jihua Li
- G01 - MEASURING TESTING
Information Patent Grant
Unclamped inductor switching test at wafer probe
- Patent number 11,041,901
- Issue date Jun 22, 2021
- Texas Instruments Incorporated
- Pavan Pakala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Intrinsically safe Zener diode barrier with indication
- Patent number 10,845,395
- Issue date Nov 24, 2020
- Honeywell International Inc.
- Michael Williams
- G01 - MEASURING TESTING
Information Patent Grant
Switching amplifier and method for estimating remaining lifetime of...
- Patent number 10,481,207
- Issue date Nov 19, 2019
- General Electric Company
- Juan Antonio Sabate
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor element test apparatus and semiconductor element test...
- Patent number 10,365,317
- Issue date Jul 30, 2019
- Denso Corporation
- Masanori Miyata
- G01 - MEASURING TESTING
Information Patent Grant
Light device deriving condition of storage circuit
- Patent number 10,123,389
- Issue date Nov 6, 2018
- Philips Lighting Holding B.V.
- Hongxin Chen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Techniques for assessing condition of leds and power supply
- Patent number 9,998,026
- Issue date Jun 12, 2018
- OSRAM SYLVANIA Inc.
- Bernhard Siessegger
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Semiconductor switch and method for determining a current through a...
- Patent number 9,903,905
- Issue date Feb 27, 2018
- Robert Bosch GmbH
- Stefan Butzmann
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Circuit and method for inspecting semiconductor device
- Patent number 9,863,999
- Issue date Jan 9, 2018
- Denso Corporation
- Masanori Miyata
- G01 - MEASURING TESTING
Information Patent Grant
Auxiliary power supply for lighting driver circuitry
- Patent number 9,859,812
- Issue date Jan 2, 2018
- OSRAM SYLVANIA Inc.
- Bernhard Siessegger
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
System for measuring soft starter current and method of making same
- Patent number 9,664,730
- Issue date May 30, 2017
- Eaton Corporation
- Kaijam M. Woodley
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Auxiliary power supply for AC powered electronics
- Patent number 9,564,828
- Issue date Feb 7, 2017
- OSRAM SYLVANIA Inc.
- Bernhard Siessegger
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
System and method for converging current with target current in dev...
- Patent number 9,547,035
- Issue date Jan 17, 2017
- Keysight Technologies, Inc.
- Katsuhito Iwasaki
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Optoelectronic component device
- Patent number 9,450,505
- Issue date Sep 20, 2016
- Osram GmbH
- Bernhard Siessegger
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Lighting driver having multiple dimming interfaces
- Patent number 9,374,015
- Issue date Jun 21, 2016
- Bernhard Siessegger
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Lighting systems with uniform LED brightness
- Patent number 9,246,403
- Issue date Jan 26, 2016
- OSRAM SYLVANIA Inc.
- Bernhard Siessegger
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System for measuring soft starter current and method of making same
- Patent number 8,896,334
- Issue date Nov 25, 2014
- Eaton Corporation
- Kaijam M. Woodley
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Testing of semiconductor devices
- Patent number 5,623,215
- Issue date Apr 22, 1997
- Texas Instruments Incorporated
- Michael J. Maytum
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR CHECKING THE SWITCH-OFF CAPABILITY OF A MOSFET
- Publication number 20250052805
- Publication date Feb 13, 2025
- Continental Automotive Technologies GmbH
- Erwin Kessler
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
METHOD FOR INSPECTING ELECTRONIC COMPONENTS AND ELECTRONIC DEVICE
- Publication number 20240103063
- Publication date Mar 28, 2024
- Innolux Corporation
- Zhi-Fu Huang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR IDENTIFYING NON-SWITCHING SEMICONDUCTOR SWITCHES
- Publication number 20230060718
- Publication date Mar 2, 2023
- LEONI BORDNETZ-SYSTEME GMBH
- Wolfgang KOCH
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20220390502
- Publication date Dec 8, 2022
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- JIHUA LI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20220043048
- Publication date Feb 10, 2022
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- JIHUA LI
- G01 - MEASURING TESTING
Information Patent Application
FAULT RECOGNITION
- Publication number 20210356530
- Publication date Nov 18, 2021
- New H3C Technologies Co., Ltd.
- Ping YANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
UNCLAMPED INDUCTOR SWITCHING TEST AT WAFER PROBE
- Publication number 20200292610
- Publication date Sep 17, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Pavan Pakala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM FOR CHARACTERIZING A POWER DIODE
- Publication number 20190271736
- Publication date Sep 5, 2019
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- William VANDENDAELE
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR ELEMENT TEST APPARATUS AND SEMICONDUCTOR ELEMENT TEST...
- Publication number 20180172752
- Publication date Jun 21, 2018
- Masanori MIYATA
- G01 - MEASURING TESTING
Information Patent Application
LIGHT DEVICE DERIVING CONDITION OF STORAGE CIRCUIT
- Publication number 20180035511
- Publication date Feb 1, 2018
- PHILIPS LIGHTING HOLDING B.V.
- HONGXIN CHEN
- G01 - MEASURING TESTING
Information Patent Application
SWITCHING AMPLIFIER AND METHOD FOR ESTIMATING REMAINING LIFETIME OF...
- Publication number 20170276730
- Publication date Sep 28, 2017
- GENERAL ELECTRIC COMPANY
- Juan Antonio Sabate
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT AND METHOD FOR INSPECTING SEMICONDUCTOR DEVICE
- Publication number 20170131344
- Publication date May 11, 2017
- Denso Corporation
- Masanori MIYATA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR SWITCH AND METHOD FOR DETERMINING A CURRENT THROUGH A...
- Publication number 20170010318
- Publication date Jan 12, 2017
- ROBERT BOSCH GmbH
- Stefan Butzmann
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR MEASURING SOFT STARTER CURRENT AND METHOD OF MAKING SAME
- Publication number 20150077154
- Publication date Mar 19, 2015
- EATON CORPORATION
- Kaijam M. Woodley
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUES FOR ASSESSING CONDITION OF LEDS AND POWER SUPPLY
- Publication number 20140368204
- Publication date Dec 18, 2014
- Osram Sylvania Inc.
- Bernhard Siessegger
- G01 - MEASURING TESTING
Information Patent Application
LIGHTING SYSTEMS WITH UNIFORM LED BRIGHTNESS
- Publication number 20140361696
- Publication date Dec 11, 2014
- Osram Sylvania Inc.
- Bernhard Siessegger
- G01 - MEASURING TESTING
Information Patent Application
AUXILIARY POWER SUPPLY FOR LIGHTING DRIVER CIRCUITRY
- Publication number 20140361623
- Publication date Dec 11, 2014
- Osram Sylvania Inc.
- Bernhard Siessegger
- G01 - MEASURING TESTING
Information Patent Application
SECONDARY SIDE PHASE-CUT DIMMING ANGLE DETECTION
- Publication number 20140361701
- Publication date Dec 11, 2014
- Bernhard Siessegger
- G01 - MEASURING TESTING
Information Patent Application
LIGHTING DRIVER HAVING MULTIPLE DIMMING INTERFACES
- Publication number 20140354178
- Publication date Dec 4, 2014
- Bernhard Siessegger
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR MEASURING SOFT STARTER CURRENT AND METHOD OF MAKING SAME
- Publication number 20140002117
- Publication date Jan 2, 2014
- Kaijam M. Woodley
- G01 - MEASURING TESTING

for measuring switching properties thereof

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for identifying non-switching semiconductor switches

Phase distortion measurement

Device and method for testing semiconductor devices

Fault recognition

Device and method for testing semiconductor devices

Unclamped inductor switching test at wafer probe

Intrinsically safe Zener diode barrier with indication

Switching amplifier and method for estimating remaining lifetime of...

Semiconductor element test apparatus and semiconductor element test...

Light device deriving condition of storage circuit

Techniques for assessing condition of leds and power supply

Semiconductor switch and method for determining a current through a...

Circuit and method for inspecting semiconductor device

Auxiliary power supply for lighting driver circuitry

System for measuring soft starter current and method of making same

Auxiliary power supply for AC powered electronics

System and method for converging current with target current in dev...

Optoelectronic component device

Lighting driver having multiple dimming interfaces

Lighting systems with uniform LED brightness

System for measuring soft starter current and method of making same

Testing of semiconductor devices

Patents Applicationslast 30 patents

METHOD FOR CHECKING THE SWITCH-OFF CAPABILITY OF A MOSFET

METHOD FOR INSPECTING ELECTRONIC COMPONENTS AND ELECTRONIC DEVICE

SYSTEM AND METHOD FOR IDENTIFYING NON-SWITCHING SEMICONDUCTOR SWITCHES

DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICES

DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICES

FAULT RECOGNITION

UNCLAMPED INDUCTOR SWITCHING TEST AT WAFER PROBE

SYSTEM FOR CHARACTERIZING A POWER DIODE

SEMICONDUCTOR ELEMENT TEST APPARATUS AND SEMICONDUCTOR ELEMENT TEST...

LIGHT DEVICE DERIVING CONDITION OF STORAGE CIRCUIT

SWITCHING AMPLIFIER AND METHOD FOR ESTIMATING REMAINING LIFETIME OF...

CIRCUIT AND METHOD FOR INSPECTING SEMICONDUCTOR DEVICE

SEMICONDUCTOR SWITCH AND METHOD FOR DETERMINING A CURRENT THROUGH A...

SYSTEM FOR MEASURING SOFT STARTER CURRENT AND METHOD OF MAKING SAME

TECHNIQUES FOR ASSESSING CONDITION OF LEDS AND POWER SUPPLY

LIGHTING SYSTEMS WITH UNIFORM LED BRIGHTNESS

AUXILIARY POWER SUPPLY FOR LIGHTING DRIVER CIRCUITRY

SECONDARY SIDE PHASE-CUT DIMMING ANGLE DETECTION

LIGHTING DRIVER HAVING MULTIPLE DIMMING INTERFACES

SYSTEM FOR MEASURING SOFT STARTER CURRENT AND METHOD OF MAKING SAME