for measuring thermal properties thereof

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CPC
G01R31/2628

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/2628for measuring thermal properties thereof

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Dual mode current and temperature sensing for SiC devices
- Patent number 12,132,104
- Issue date Oct 29, 2024
- Infineon Technologies AG
- Dethard Peters
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test circuit monitoring PBTI and operating method thereof
- Patent number 12,085,602
- Issue date Sep 10, 2024
- SK hynix Inc.
- Min Cheol Kim
- G01 - MEASURING TESTING
Information Patent Grant
Linear discrete Rdson temperature VGS compensation
- Patent number 12,055,565
- Issue date Aug 6, 2024
- ALPHA AND OMEGA SEMICONDUCTOR INTERNATIONAL LP
- Gilbert S. Z. Lee
- G01 - MEASURING TESTING
Information Patent Grant
Power device monitoring system and monitoring method
- Patent number 11,977,103
- Issue date May 7, 2024
- LS ELECTRIC CO., LTD.
- Sunghee Kang
- G01 - MEASURING TESTING
Information Patent Grant
SiC device having a dual mode sense terminal, electronic systems fo...
- Patent number 11,799,026
- Issue date Oct 24, 2023
- Infineon Technologies AG
- Dethard Peters
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Complementary ring oscillators to monitor in-situ stress within int...
- Patent number 11,719,584
- Issue date Aug 8, 2023
- Huawei Technologies Co., Ltd.
- Shiqun Gu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 11,680,979
- Issue date Jun 20, 2023
- Mitsubishi Electric Corporation
- Hiroki Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, manufacture thereof, and a radiation measurem...
- Patent number 11,437,478
- Issue date Sep 6, 2022
- Semiconductor Manufacturing International (Shanghai) Corporation
- Fei Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermal analysis of semiconductor devices
- Patent number 11,313,819
- Issue date Apr 26, 2022
- Technische Hochschule Ingolstadt
- Gordon Elger
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing an operation of a power semiconductor device
- Patent number 11,262,248
- Issue date Mar 1, 2022
- MASCHINENFABRIK REINHAUSEN GMBH
- Angus Bryant
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and testing method using the same
- Patent number 11,249,131
- Issue date Feb 15, 2022
- Taiwan Semiconductor Manufacturing Company Ltd.
- Harry-Hak-Lay Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device for testing characteristics of transistors and...
- Patent number 11,088,138
- Issue date Aug 10, 2021
- The Industry & Academic Cooperation in Chungnam National University (IAC)
- Hideok Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermal gradient correction of a current monitor signal
- Patent number 10,928,439
- Issue date Feb 23, 2021
- Semiconductor Components Industries, LLC
- Zhiwei Liu
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 10,837,996
- Issue date Nov 17, 2020
- SK hynix Inc.
- Na Yeon Cho
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact method to monitor and quantify effective work function...
- Patent number 10,763,179
- Issue date Sep 1, 2020
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Dmitriy Marinskiy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for dynamic Rdson measurement
- Patent number 10,571,511
- Issue date Feb 25, 2020
- Texas Instruments Incorporated
- Alex Paikin
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 10,438,861
- Issue date Oct 8, 2019
- RENESAS ELECTRONICS CORPORATION
- Hideki Aono
- G01 - MEASURING TESTING
Information Patent Grant
Testing and setting performance parameters in a semiconductor devic...
- Patent number 10,365,318
- Issue date Jul 30, 2019
- Darryl G. Walker
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining a deterioration of power semiconductor modul...
- Patent number 10,168,381
- Issue date Jan 1, 2019
- Siemens Aktiengesellschaft
- Jimmy-Alexander Butron-Ccoa
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for dynamic Rdson measurement
- Patent number 10,101,382
- Issue date Oct 16, 2018
- Texas Instruments Incorporated
- Alex Paikin
- G01 - MEASURING TESTING
Information Patent Grant
Test structure, fabrication method, and test method
- Patent number 10,078,108
- Issue date Sep 18, 2018
- Semiconductor Manufacturing International (Beijing) Corporation
- Yong Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit arrangement
- Patent number 10,036,771
- Issue date Jul 31, 2018
- Infineon Technologies AG
- Benno Koeppl
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Semiconductor device and method of inspecting a semiconductor device
- Patent number 10,006,958
- Issue date Jun 26, 2018
- ABLIC INC.
- Kaoru Sakaguchi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Testing and setting performance parameters in a semiconductor devic...
- Patent number 10,006,959
- Issue date Jun 26, 2018
- Darryl G. Walker
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor structure and method for operating the same
- Patent number 9,977,072
- Issue date May 22, 2018
- Taiwan Semiconductor Manufacturing Company Ltd.
- Jiaw-Ren Shih
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for temperature measurement of FinFET devices
- Patent number 9,970,981
- Issue date May 15, 2018
- Semiconductor Manufacturing International (Shanghai) Corporation
- Junhong Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement for transistor output characteristics with and without...
- Patent number 9,952,274
- Issue date Apr 24, 2018
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING
Information Patent Grant
Negative bias thermal instability stress testing of transistors
- Patent number 9,857,409
- Issue date Jan 2, 2018
- Synopsys, Inc.
- Jamil Kawa
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation of thermal instability stress testing
- Patent number 9,817,059
- Issue date Nov 14, 2017
- Synopsys, Inc.
- Jamil Kawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement for transistor output characteristics with and without...
- Patent number 9,678,141
- Issue date Jun 13, 2017
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND CIRCUIT ARRANGEMENTS FOR DETERMINING A BARRIER-LAYER TEM...
- Publication number 20240426675
- Publication date Dec 26, 2024
- ROBERT BOSCH GmbH
- Manuel Riefer
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR INCREASING LIFETIME OF POWER DIE OR POWER MODULE
- Publication number 20240272222
- Publication date Aug 15, 2024
- Mitsubishi Electric Corporation
- Merouane OUHAB
- G01 - MEASURING TESTING
Information Patent Application
LINEAR DISCRETE RDSON TEMPERATURE VGS COMPENSATION
- Publication number 20240175901
- Publication date May 30, 2024
- ALPHA AND OMEGA SEMICONDUCTOR INTERNATIONAL LP
- Gilbert S. Z. Lee
- G01 - MEASURING TESTING
Information Patent Application
Method of Monitoring Reliability of System Including Electrical Com...
- Publication number 20240151765
- Publication date May 9, 2024
- Aptiv Technologies AG
- Markus Heinrich
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING THE TEMPERATURE CHARACTERISTIC OF THE DRAIN-...
- Publication number 20240125842
- Publication date Apr 18, 2024
- ROBERT BOSCH GmbH
- Georg Schill
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT MONITORING PBTI AND OPERATING METHOD THEREOF
- Publication number 20240003961
- Publication date Jan 4, 2024
- SK HYNIX INC.
- Min Cheol KIM
- G01 - MEASURING TESTING
Information Patent Application
Dual Mode Current and Temperature Sensing for SiC Devices
- Publication number 20230420559
- Publication date Dec 28, 2023
- INFINEON TECHNOLOGIES AG
- Dethard Peters
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYZING AN OPERATION OF A POWER SEMICONDUCTOR DEVICE
- Publication number 20230096094
- Publication date Mar 30, 2023
- MASCHINENFABRIK REINHAUSEN GMBH
- Angus Bryant
- G01 - MEASURING TESTING
Information Patent Application
SiC Device Having a Dual Mode Sense Terminal, Electronic Systems fo...
- Publication number 20220271156
- Publication date Aug 25, 2022
- Dethard Peters
- G01 - MEASURING TESTING
Information Patent Application
POWER DEVICE MONITORING SYSTEM AND MONITORING METHOD
- Publication number 20220206046
- Publication date Jun 30, 2022
- Sunghee KANG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20220065918
- Publication date Mar 3, 2022
- Mitsubishi Electric Corporation
- Hiroki HIDAKA
- G01 - MEASURING TESTING
Information Patent Application
ANALYZING AN OPERATION OF A POWER SEMICONDUCTOR DEVICE
- Publication number 20210318176
- Publication date Oct 14, 2021
- MASCHINENFABRIK REINHAUSEN GMBH
- Angus Bryant
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TESTING METHOD USING THE SAME
- Publication number 20210311105
- Publication date Oct 7, 2021
- Taiwan Semiconductor Manufacturing company Ltd.
- HARRY-HAK-LAY CHUANG
- G01 - MEASURING TESTING
Information Patent Application
Complementary Ring Oscillators to Monitor In-Situ Stress Within Int...
- Publication number 20210310880
- Publication date Oct 7, 2021
- Huawei Technologies Co., Ltd
- Shigun Gu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR CHIP AND CIRCUIT AND METHOD FOR ELECTRICALLY TESTING...
- Publication number 20210156902
- Publication date May 27, 2021
- Changxin Memory Technologies, Inc.
- Weibao KE
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, MANUFACTURE THEREOF, AND A RADIATION MEASUREM...
- Publication number 20200185503
- Publication date Jun 11, 2020
- Semiconductor Manufacturing International (Shanghai) Corporation
- Fei ZHOU
- G01 - MEASURING TESTING
Information Patent Application
THERMAL GRADIENT CORRECTION OF A CURRENT MONITOR SIGNAL
- Publication number 20200110128
- Publication date Apr 9, 2020
- Semiconductor Components Industries, LLC
- Zhiwei LIU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
THERMAL ANALYSIS OF SEMICONDUCTOR DEVICES
- Publication number 20200018711
- Publication date Jan 16, 2020
- Technische Hochschule Ingolstadt
- Gordon ELGER
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE FOR TESTING CHARACTERISTICS OF TRANSISTORS AND...
- Publication number 20190172829
- Publication date Jun 6, 2019
- The Industry & Academic Cooperation in Chungnam National University (IAC)
- Hideok Lee
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20190041451
- Publication date Feb 7, 2019
- SK HYNIX INC.
- Na Yeon CHO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DYNAMIC Rdson MEASUREMENT
- Publication number 20190011493
- Publication date Jan 10, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Alex PAIKIN
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND ELECTRONIC CONTROL UNIT
- Publication number 20180375506
- Publication date Dec 27, 2018
- RENESAS ELECTRONICS CORPORATION
- Hidetoshi TANEMURA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
APPARATUS AND METHOD FOR PERFORMING AVALANCHE MODE DELTA VSD TESTING
- Publication number 20180321304
- Publication date Nov 8, 2018
- INTEGRATED TECHNOLOGY CORPORATION
- Steven T. Clauter
- G01 - MEASURING TESTING
Information Patent Application
TESTING AND SETTING PERFORMANCE PARAMETERS IN A SEMICONDUCTOR DEVIC...
- Publication number 20180306854
- Publication date Oct 25, 2018
- Darryl G. Walker
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEMS AND METHODS FOR DYNAMIC Rdson MEASUREMENT
- Publication number 20180188313
- Publication date Jul 5, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Alex PAIKIN
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20180156859
- Publication date Jun 7, 2018
- RENESAS ELECTRONICS CORPORATION
- Kan Takeuchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR STRUCTURE AND METHOD FOR OPERATING THE SAME
- Publication number 20170153287
- Publication date Jun 1, 2017
- Taiwan Semiconductor Manufacturing company Ltd.
- JIAW-REN SHIH
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURE, FABRICATION METHOD, AND TEST METHOD
- Publication number 20170082678
- Publication date Mar 23, 2017
- Semiconductor Manufacturing International (Beijing) Corporation
- YONG LI
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method to Monitor Thermal Runaway in a Semiconductor...
- Publication number 20170003339
- Publication date Jan 5, 2017
- BROADCOM CORPORATION
- Sam Ziqun ZHAO
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT FOR TRANSISTOR OUTPUT CHARACTERISTICS WITH AND WITHOUT...
- Publication number 20160266195
- Publication date Sep 15, 2016
- International Business Machines Corporation
- Keith A. Jenkins
- G01 - MEASURING TESTING

for measuring thermal properties thereof

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Dual mode current and temperature sensing for SiC devices

Test circuit monitoring PBTI and operating method thereof

Linear discrete Rdson temperature VGS compensation

Power device monitoring system and monitoring method

SiC device having a dual mode sense terminal, electronic systems fo...

Complementary ring oscillators to monitor in-situ stress within int...

Semiconductor device

Semiconductor device, manufacture thereof, and a radiation measurem...

Thermal analysis of semiconductor devices

Analyzing an operation of a power semiconductor device

Test apparatus and testing method using the same

Semiconductor device for testing characteristics of transistors and...

Thermal gradient correction of a current monitor signal

Semiconductor device

Non-contact method to monitor and quantify effective work function...

Systems and methods for dynamic Rdson measurement

Semiconductor device and method for manufacturing the same

Testing and setting performance parameters in a semiconductor devic...

Method for determining a deterioration of power semiconductor modul...

Systems and methods for dynamic Rdson measurement

Test structure, fabrication method, and test method

Circuit arrangement

Semiconductor device and method of inspecting a semiconductor device

Testing and setting performance parameters in a semiconductor devic...

Semiconductor structure and method for operating the same

Method and device for temperature measurement of FinFET devices

Measurement for transistor output characteristics with and without...

Negative bias thermal instability stress testing of transistors

Evaluation of thermal instability stress testing

Measurement for transistor output characteristics with and without...

Patents Applicationslast 30 patents

METHOD AND CIRCUIT ARRANGEMENTS FOR DETERMINING A BARRIER-LAYER TEM...

METHOD AND DEVICE FOR INCREASING LIFETIME OF POWER DIE OR POWER MODULE

LINEAR DISCRETE RDSON TEMPERATURE VGS COMPENSATION

Method of Monitoring Reliability of System Including Electrical Com...

METHOD FOR DETERMINING THE TEMPERATURE CHARACTERISTIC OF THE DRAIN-...

TEST CIRCUIT MONITORING PBTI AND OPERATING METHOD THEREOF

Dual Mode Current and Temperature Sensing for SiC Devices

ANALYZING AN OPERATION OF A POWER SEMICONDUCTOR DEVICE

SiC Device Having a Dual Mode Sense Terminal, Electronic Systems fo...

POWER DEVICE MONITORING SYSTEM AND MONITORING METHOD

SEMICONDUCTOR DEVICE

ANALYZING AN OPERATION OF A POWER SEMICONDUCTOR DEVICE

TEST APPARATUS AND TESTING METHOD USING THE SAME

Complementary Ring Oscillators to Monitor In-Situ Stress Within Int...

SEMICONDUCTOR CHIP AND CIRCUIT AND METHOD FOR ELECTRICALLY TESTING...

SEMICONDUCTOR DEVICE, MANUFACTURE THEREOF, AND A RADIATION MEASUREM...

THERMAL GRADIENT CORRECTION OF A CURRENT MONITOR SIGNAL

THERMAL ANALYSIS OF SEMICONDUCTOR DEVICES

SEMICONDUCTOR DEVICE FOR TESTING CHARACTERISTICS OF TRANSISTORS AND...

SEMICONDUCTOR DEVICE

SYSTEMS AND METHODS FOR DYNAMIC Rdson MEASUREMENT

SEMICONDUCTOR DEVICE AND ELECTRONIC CONTROL UNIT

APPARATUS AND METHOD FOR PERFORMING AVALANCHE MODE DELTA VSD TESTING

TESTING AND SETTING PERFORMANCE PARAMETERS IN A SEMICONDUCTOR DEVIC...

SYSTEMS AND METHODS FOR DYNAMIC Rdson MEASUREMENT

SEMICONDUCTOR DEVICE

SEMICONDUCTOR STRUCTURE AND METHOD FOR OPERATING THE SAME

TEST STRUCTURE, FABRICATION METHOD, AND TEST METHOD

Apparatus and Method to Monitor Thermal Runaway in a Semiconductor...

MEASUREMENT FOR TRANSISTOR OUTPUT CHARACTERISTICS WITH AND WITHOUT...