for measuring thermal properties thereof

Industry

CPC
G01R31/2619

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2619for measuring thermal properties thereof

Industries

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device
- Patent number 12,159,928
- Issue date Dec 3, 2024
- Fuji Electric Co., Ltd.
- Shigeki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and system
- Patent number 12,094,960
- Issue date Sep 17, 2024
- Fuji Electric Co., Ltd.
- Shigeki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for measuring intermittent operating life of GaN-...
- Patent number 12,038,469
- Issue date Jul 16, 2024
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Chang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and power conversion device
- Patent number 12,000,883
- Issue date Jun 4, 2024
- Mitsubishi Electric Corporation
- Yukihiko Wada
- G01 - MEASURING TESTING
Information Patent Grant
Multi-time-scale reliability evaluation method of wind power IGBT c...
- Patent number 11,543,446
- Issue date Jan 3, 2023
- WUHAN UNIVERSITY
- Yigang He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Power supply circuit for measuring transient thermal resistances of...
- Patent number 11,532,998
- Issue date Dec 20, 2022
- Sansha Electric Manufacturing Co., Ltd.
- Naoki Nishimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determining the remaining usability of a semiconductor module in no...
- Patent number 11,480,607
- Issue date Oct 25, 2022
- Siemens Aktiengesellschaft
- Gunnar Dietz
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for electrical component life estimation with...
- Patent number 11,476,792
- Issue date Oct 18, 2022
- Rockwell Automation Technologies, Inc.
- Garron K. Morris
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Testing device
- Patent number 11,340,283
- Issue date May 24, 2022
- Tokyo Electron Limited
- Shigeru Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyzing an operation of a power semiconductor device
- Patent number 11,262,248
- Issue date Mar 1, 2022
- MASCHINENFABRIK REINHAUSEN GMBH
- Angus Bryant
- G01 - MEASURING TESTING
Information Patent Grant
Diagnosis system for power conversion device, diagnosis method for...
- Patent number 11,016,138
- Issue date May 25, 2021
- Hitachi, Ltd.
- Yoshinobu Kimura
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method for determining failure of power element and electronic devi...
- Patent number 11,002,782
- Issue date May 11, 2021
- Delta Electronics, Inc.
- Lei-Chung Hsing
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 10,748,822
- Issue date Aug 18, 2020
- Denso Corporation
- Takaaki Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for estimating level of damage or lifetime expect...
- Patent number 10,705,133
- Issue date Jul 7, 2020
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring junction temperature of power module
- Patent number 10,697,836
- Issue date Jun 30, 2020
- Hyundai Motor Company
- Je Hwan Lee
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Drive circuit for insulated-gate semiconductor element
- Patent number 10,578,664
- Issue date Mar 3, 2020
- Fuji Electric Co., Ltd.
- Takahiro Mori
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Desaturation detection circuit and desaturation circuit monitoring...
- Patent number 10,473,710
- Issue date Nov 12, 2019
- Avago Technologies International Sales Pte. Limited
- Patrick Sullivan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Monitoring aging of power semiconductor devices based on case tempe...
- Patent number 10,288,672
- Issue date May 14, 2019
- Nutech Ventures
- Wei Qiao
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining a deterioration of power semiconductor modul...
- Patent number 10,168,381
- Issue date Jan 1, 2019
- Siemens Aktiengesellschaft
- Jimmy-Alexander Butron-Ccoa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor structure and method for operating the same
- Patent number 9,977,072
- Issue date May 22, 2018
- Taiwan Semiconductor Manufacturing Company Ltd.
- Jiaw-Ren Shih
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for determining the temperature calibration chara...
- Patent number 9,927,483
- Issue date Mar 27, 2018
- Siemens Aktiengesellschaft
- Marco Bohlländer
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for electrical component life estimation
- Patent number 9,869,722
- Issue date Jan 16, 2018
- Rockwell Automation Technologies, Inc.
- Garron K. Morris
- G01 - MEASURING TESTING
Information Patent Grant
Thermal resistance measuring method and thermal resistance measurin...
- Patent number 9,601,404
- Issue date Mar 21, 2017
- Fuji Electric Co., Ltd.
- Toshiyuki Miyanagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Insulated-gate bipolar transistor collector-emitter saturation volt...
- Patent number 9,575,113
- Issue date Feb 21, 2017
- Infineon Technologies AG
- Michael Mankel
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for power cycle test
- Patent number 9,453,872
- Issue date Sep 27, 2016
- ESPEC Corp.
- Michiya Kusaka
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for power cycle test
- Patent number 9,435,850
- Issue date Sep 6, 2016
- ESPEC Corp.
- Katsumasa Suyama
- G01 - MEASURING TESTING
Information Patent Grant
System and method for monitoring in real time the operating state o...
- Patent number 9,039,279
- Issue date May 26, 2015
- ABB Research Ltd.
- Vinoth Sundaramoorthy
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating semiconductor device
- Patent number 8,686,750
- Issue date Apr 1, 2014
- Semiconductor Energy Laboratory Co., Ltd.
- Koichiro Kamata
- G01 - MEASURING TESTING
Information Patent Grant
Method and device to measure the temperature of microwave components
- Patent number 6,431,749
- Issue date Aug 13, 2002
- Thomson-CSF
- Clément Tolant
- G01 - MEASURING TESTING
Information Patent Grant
Fail-safe photoelectric detector
- Patent number 5,121,975
- Issue date Jun 16, 1992
- Spacesaver Corporation
- Dean L. Dahnert
- A47 - FURNITURE DOMESTIC ARTICLES OR APPLIANCES COFFEE MILLS SPICE MILLS SUCT...

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR MEASURING THE STATE OF HEALTH OF SEMICONDUCTO...
- Publication number 20250012848
- Publication date Jan 9, 2025
- UNIVERSITE GUSTAVE EIFFEL
- Zoubir KHATIR
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND CIRCUIT ARRANGEMENTS FOR DETERMINING A BARRIER-LAYER TEM...
- Publication number 20240426675
- Publication date Dec 26, 2024
- ROBERT BOSCH GmbH
- Manuel Riefer
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR INCREASING LIFETIME OF POWER DIE OR POWER MODULE
- Publication number 20240272222
- Publication date Aug 15, 2024
- Mitsubishi Electric Corporation
- Merouane OUHAB
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING AND EVALUATING SHORT-CIRCUIT WITHSTAND CAPABILIT...
- Publication number 20240142546
- Publication date May 2, 2024
- CHONGQING UNIVERSITY
- Hui LI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240142511
- Publication date May 2, 2024
- Fuji Electric Co., Ltd.
- Yuki KUMAZAWA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DIAGNOSIS AND PROGNOSIS OF IGBT MODULES
- Publication number 20240118333
- Publication date Apr 11, 2024
- ABB Schweiz AG
- Aleksi Vulli
- G01 - MEASURING TESTING
Information Patent Application
STATE DETERMINATION DEVICE AND VEHICLE
- Publication number 20230408572
- Publication date Dec 21, 2023
- DENSO CORPORATION
- Junya MURAMATSU
- G01 - MEASURING TESTING
Information Patent Application
JUNCTION TEMPERATURE CALCULATION METHOD AND DEVICE FOR POWER CONVER...
- Publication number 20230143957
- Publication date May 11, 2023
- NIO Technology (Anhui) Co., Ltd.
- Kai WANG
- G01 - MEASURING TESTING
Information Patent Application
ANALYZING AN OPERATION OF A POWER SEMICONDUCTOR DEVICE
- Publication number 20230096094
- Publication date Mar 30, 2023
- MASCHINENFABRIK REINHAUSEN GMBH
- Angus Bryant
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING INTERMITTENT OPERATING LIFE OF GaN-...
- Publication number 20220381815
- Publication date Dec 1, 2022
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Chang CHEN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CHARACTERIZING IGBT MODULE AGING BASED ON MIN...
- Publication number 20220334170
- Publication date Oct 20, 2022
- WUHAN UNIVERSITY
- Yigang HE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND POWER CONVERSION DEVICE
- Publication number 20220206057
- Publication date Jun 30, 2022
- Mitsubishi Electric Corporation
- Yukihiko WADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-TIME-SCALE RELIABILITY EVALUATION METHOD OF WIND POWER IGBT C...
- Publication number 20220074985
- Publication date Mar 10, 2022
- WUHAN UNIVERSITY
- Yigang HE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR ELECTRICAL COMPONENT LIFE ESTIMATION WITH...
- Publication number 20210391820
- Publication date Dec 16, 2021
- Rockwell Automation Technologies, Inc.
- Garron K. Morris
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND SYSTEM
- Publication number 20210384333
- Publication date Dec 9, 2021
- Fuji Electric Co., Ltd.
- Shigeki SATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20210384331
- Publication date Dec 9, 2021
- Fuji Electric Co., Ltd.
- Shigeki SATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYZING AN OPERATION OF A POWER SEMICONDUCTOR DEVICE
- Publication number 20210318176
- Publication date Oct 14, 2021
- MASCHINENFABRIK REINHAUSEN GMBH
- Angus Bryant
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE
- Publication number 20200408828
- Publication date Dec 31, 2020
- TOKYO ELECTRON LIMITED
- Shigeru KASAI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING FAILURE OF POWER ELEMENT AND ELECTRONIC DEVI...
- Publication number 20200033394
- Publication date Jan 30, 2020
- Delta Electronics, Inc.
- Lei-Chung HSING
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20190333827
- Publication date Oct 31, 2019
- DENSO CORPORATION
- Takaaki AOKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR ESTIMATING LEVEL OF DAMAGE OR LIFETIME EXPECT...
- Publication number 20190285689
- Publication date Sep 19, 2019
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- G01 - MEASURING TESTING
Information Patent Application
THERMAL MODEL BASED HEALTH ASSESSMENT OF IGBT
- Publication number 20190250205
- Publication date Aug 15, 2019
- GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Azeem Sarwar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Diagnosis System for Power Conversion Device, Diagnosis Method for...
- Publication number 20190146026
- Publication date May 16, 2019
- Hitachi, Ltd
- Yoshinobu KIMURA
- B60 - VEHICLES IN GENERAL
Information Patent Application
DOOR APPARATUS FOR CHAMBER
- Publication number 20190112865
- Publication date Apr 18, 2019
- In Jae CHANG
- E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
Information Patent Application
DRIVE CIRCUIT FOR INSULATED-GATE SEMICONDUCTOR ELEMENT
- Publication number 20180335469
- Publication date Nov 22, 2018
- Fuji Electric Co., Ltd.
- Takahiro MORI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ON-LINE HEALTH MANAGEMENT DEVICE AND METHOD FOR INSULATED GATE BIPO...
- Publication number 20180284181
- Publication date Oct 4, 2018
- CRRC ZHUZHOU INSTITUTE CO., LTD.
- Wenye LIU
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR ELEMENT DRIVING DEVICE
- Publication number 20180269677
- Publication date Sep 20, 2018
- Fuji Electric Co., Ltd.
- Takuo YAMAMURA
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SYSTEM AND METHOD FOR MEASURING JUNCTION TEMPERATURE OF POWER MODULE
- Publication number 20180172522
- Publication date Jun 21, 2018
- Hyundai Motor Company
- Je Hwan Lee
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MONITORING AGING OF POWER SEMICONDUCTOR DEVICES BASED ON CASE TEMPE...
- Publication number 20180017613
- Publication date Jan 18, 2018
- NUTECH VENTURES
- Wei Qiao
- G01 - MEASURING TESTING
Information Patent Application
Method For Determining A Deterioration Of Power Semiconductor Modul...
- Publication number 20180017612
- Publication date Jan 18, 2018
- Siemens Aktiengesellschaft
- Jimmy-Alexander BURTON-CCOCA
- G01 - MEASURING TESTING

for measuring thermal properties thereof

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semiconductor device

Semiconductor device and system

System and method for measuring intermittent operating life of GaN-...

Semiconductor device and power conversion device

Multi-time-scale reliability evaluation method of wind power IGBT c...

Power supply circuit for measuring transient thermal resistances of...

Determining the remaining usability of a semiconductor module in no...

Method and apparatus for electrical component life estimation with...

Testing device

Analyzing an operation of a power semiconductor device

Diagnosis system for power conversion device, diagnosis method for...

Method for determining failure of power element and electronic devi...

Method for manufacturing semiconductor device

Method and device for estimating level of damage or lifetime expect...

System and method for measuring junction temperature of power module

Drive circuit for insulated-gate semiconductor element

Desaturation detection circuit and desaturation circuit monitoring...

Monitoring aging of power semiconductor devices based on case tempe...

Method for determining a deterioration of power semiconductor modul...

Semiconductor structure and method for operating the same

Method and device for determining the temperature calibration chara...

Method and apparatus for electrical component life estimation

Thermal resistance measuring method and thermal resistance measurin...

Insulated-gate bipolar transistor collector-emitter saturation volt...

Apparatus and method for power cycle test

Apparatus and method for power cycle test

System and method for monitoring in real time the operating state o...

Method for evaluating semiconductor device

Method and device to measure the temperature of microwave components

Fail-safe photoelectric detector

Patents Applicationslast 30 patents

METHOD AND DEVICE FOR MEASURING THE STATE OF HEALTH OF SEMICONDUCTO...

METHOD AND CIRCUIT ARRANGEMENTS FOR DETERMINING A BARRIER-LAYER TEM...

METHOD AND DEVICE FOR INCREASING LIFETIME OF POWER DIE OR POWER MODULE

METHOD FOR TESTING AND EVALUATING SHORT-CIRCUIT WITHSTAND CAPABILIT...

SEMICONDUCTOR DEVICE

DIAGNOSIS AND PROGNOSIS OF IGBT MODULES

STATE DETERMINATION DEVICE AND VEHICLE

JUNCTION TEMPERATURE CALCULATION METHOD AND DEVICE FOR POWER CONVER...

ANALYZING AN OPERATION OF A POWER SEMICONDUCTOR DEVICE

SYSTEM AND METHOD FOR MEASURING INTERMITTENT OPERATING LIFE OF GaN-...

METHOD AND SYSTEM FOR CHARACTERIZING IGBT MODULE AGING BASED ON MIN...

SEMICONDUCTOR DEVICE AND POWER CONVERSION DEVICE

MULTI-TIME-SCALE RELIABILITY EVALUATION METHOD OF WIND POWER IGBT C...

METHOD AND APPARATUS FOR ELECTRICAL COMPONENT LIFE ESTIMATION WITH...

SEMICONDUCTOR DEVICE AND SYSTEM

SEMICONDUCTOR DEVICE

ANALYZING AN OPERATION OF A POWER SEMICONDUCTOR DEVICE

TESTING DEVICE

METHOD FOR DETERMINING FAILURE OF POWER ELEMENT AND ELECTRONIC DEVI...

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

METHOD AND DEVICE FOR ESTIMATING LEVEL OF DAMAGE OR LIFETIME EXPECT...

THERMAL MODEL BASED HEALTH ASSESSMENT OF IGBT

Diagnosis System for Power Conversion Device, Diagnosis Method for...

DOOR APPARATUS FOR CHAMBER

DRIVE CIRCUIT FOR INSULATED-GATE SEMICONDUCTOR ELEMENT

ON-LINE HEALTH MANAGEMENT DEVICE AND METHOD FOR INSULATED GATE BIPO...

SEMICONDUCTOR ELEMENT DRIVING DEVICE

SYSTEM AND METHOD FOR MEASURING JUNCTION TEMPERATURE OF POWER MODULE

MONITORING AGING OF POWER SEMICONDUCTOR DEVICES BASED ON CASE TEMPE...

Method For Determining A Deterioration Of Power Semiconductor Modul...