for measuring thickness of coating

Industry

CPC
G01B7/066

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B7/00Measuring arrangements characterised by the use of electric or magnetic means

Current Industry

G01B7/066for measuring thickness of coating

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Monitoring thin film deposition
- Patent number 12,227,846
- Issue date Feb 18, 2025
- Inficon, Inc.
- Mohamed Buhary Rinzan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Crystal oscillation probe structure and evaporation device
- Patent number 10,988,840
- Issue date Apr 27, 2021
- Chengdu BOE Optoelectronics Technology Co., Ltd.
- Yifan Yang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Monitoring thin film deposition
- Patent number 10,704,150
- Issue date Jul 7, 2020
- Inficon, Inc.
- Mohamed Buhary Rinzan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus and method for layer thickness measurement for a vapor de...
- Patent number 10,684,126
- Issue date Jun 16, 2020
- NICE SOLAR ENERGY GMBH
- Matthias Gang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Crystal oscillator and the use thereof in semiconductor fabrication
- Patent number 10,446,421
- Issue date Oct 15, 2019
- GLOBALFOUNDRIES Inc.
- Cyril Cabral
- G05 - CONTROLLING REGULATING
Information Patent Grant
Corrosion environment diagnosis system, corrosion prevention system...
- Patent number 10,436,701
- Issue date Oct 8, 2019
- Hitachi, Ltd.
- Rintarou Minamitani
- G01 - MEASURING TESTING
Information Patent Grant
Pipe outer surface inspection apparatus
- Patent number 10,175,149
- Issue date Jan 8, 2019
- Aegion Coating Services, LLC
- Rick R. Kimpel
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Grant
Method for synthesis of two-dimensional dichalcogenide semiconductors
- Patent number 10,128,109
- Issue date Nov 13, 2018
- Elwha LLC
- Rachel Cannara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Crystal oscillator and the use thereof in semiconductor fabrication
- Patent number 9,971,341
- Issue date May 15, 2018
- GLOBALFOUNDRIES Inc.
- Cyril Cabral
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for manufacturing organic EL display device, and film thickn...
- Patent number 9,905,486
- Issue date Feb 27, 2018
- Japan Display Inc.
- Hiroshi Ooka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pipe outer surface inspection apparatus
- Patent number 9,389,150
- Issue date Jul 12, 2016
- Aegion Coating Services, LLC
- Rick R. Kimpel
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Grant
Method and device for measuring the thickness of any deposit of mat...
- Patent number 8,966,979
- Issue date Mar 3, 2015
- Statoil Petroleum AS
- Lene Amundsen
- G01 - MEASURING TESTING
Information Patent Grant
Internal pipe coating inspection robot
- Patent number 8,633,713
- Issue date Jan 21, 2014
- CRTS, Inc.
- Russell Langley
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining multilayer thin film deposition on a piezoele...
- Patent number 8,438,924
- Issue date May 14, 2013
- Inficon, Inc.
- Abdul Wajid
- G01 - MEASURING TESTING
Information Patent Grant
Film-thickness measuring device using PLL circuit
- Patent number 8,432,151
- Issue date Apr 30, 2013
- Pioneer Corporation
- Hiroaki Sato
- G01 - MEASURING TESTING
Information Patent Grant
Method of quantifying paint and bodywork on automobiles and other p...
- Patent number 7,606,671
- Issue date Oct 20, 2009
- Elcometer, Inc.
- Joseph J. Walker
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring film thickness and film thicknes...
- Patent number 6,820,485
- Issue date Nov 23, 2004
- Tangidyne Corporation
- Scott F. Grimshaw
- G01 - MEASURING TESTING
Information Patent Grant
Reusable mass-sensor in manufacture of organic light-emitting devices
- Patent number 6,682,600
- Issue date Jan 27, 2004
- Michael A. Marcus
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Procedure and device for measuring the thickness of a liquid layer...
- Patent number 6,684,049
- Issue date Jan 27, 2004
- NexPress Solutions LLC
- Wolfgang Eberhard Luxem
- G01 - MEASURING TESTING
Information Patent Grant
Reusable mass-sensor in manufacture of organic light-emitting devices
- Patent number 6,558,735
- Issue date May 6, 2003
- Eastman Kodak Company
- Michael A. Marcus
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
High-temperature balance
- Patent number 6,370,955
- Issue date Apr 16, 2002
- Massachusetts Institute of Technology
- Harry L. Tuller
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Thickness measurement using AFM for next generation lithography
- Patent number 6,339,955
- Issue date Jan 22, 2002
- Advanced Micro Devices, Inc.
- Khoi A. Phan
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multiple remote probe electronic thickness gauge with probe holder
- Patent number 5,831,430
- Issue date Nov 3, 1998
- John Pfanstiehl
- G01 - MEASURING TESTING
Information Patent Grant
Control circuitry for quartz crystal deposition monitor
- Patent number 5,117,192
- Issue date May 26, 1992
- Leybold Inficon Inc.
- Clarence Hurd
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Measuring and controlling deposition on a piezoelectric monitor cry...
- Patent number 5,112,642
- Issue date May 12, 1992
- Leybold Inficon, Inc.
- Abdul Wajid
- G01 - MEASURING TESTING
Information Patent Grant
Multiple crystal head for deposition thickness monitor
- Patent number 5,025,664
- Issue date Jun 25, 1991
- Leybold Inficon, Inc.
- Mark F. Kendrick
- G01 - MEASURING TESTING
Information Patent Grant
System for determining the thickness of varying material coatings
- Patent number 4,817,430
- Issue date Apr 4, 1989
- Leybold Aktiengesellschaft
- Ewald Benes
- G01 - MEASURING TESTING
Information Patent Grant
Thickness monitoring system for intermittently exposing a quartz cr...
- Patent number 4,588,942
- Issue date May 13, 1986
- Anelva Corporation
- Hiroaki Kitahara
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Piezoelectric contamination detector
- Patent number 4,561,286
- Issue date Dec 31, 1985
- Laboratoire Suisse de Recherches Horlogeres
- Jorg Sekler
- G01 - MEASURING TESTING
Information Patent Grant
Sensor for monitoring the deposition of frozen fog and/or ice on su...
- Patent number 4,532,806
- Issue date Aug 6, 1985
- Bosch-Siemens Hausgeraete GmbH
- Hans-George Bruchmuller
- B64 - AIRCRAFT AVIATION COSMONAUTICS

Patents Applicationslast 30 patents

Information Patent Application
MONITORING THIN FILM DEPOSITION
- Publication number 20200325580
- Publication date Oct 15, 2020
- Inficon, Inc.
- Mohamed B. Rinzan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Evaporation Apparatus
- Publication number 20180363129
- Publication date Dec 20, 2018
- BOE TECHNOLOGY GROUP CO., LTD.
- Shupeng Guo
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
CRYSTAL OSCILLATOR AND THE USE THEREOF IN SEMICONDUCTOR FABRICATION
- Publication number 20180231957
- Publication date Aug 16, 2018
- GLOBALFOUNDRIES INC.
- Cyril CABRAL
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR MANUFACTURING ORGANIC EL DISPLAY DEVICE, AND FILM THICKN...
- Publication number 20160284614
- Publication date Sep 29, 2016
- Japan Display Inc.
- Hiroshi OOKA
- G01 - MEASURING TESTING
Information Patent Application
MONITORING THIN FILM DEPOSITION
- Publication number 20160215397
- Publication date Jul 28, 2016
- Inficon Inc.
- Mohamed Buhary Rinzan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
MEASUREMENT APPARATUS AND FILM-COATING DEVICE
- Publication number 20160216099
- Publication date Jul 28, 2016
- BOE TECHNOLOGY GROUP CO., LTD.
- Haidong WU
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PIPE OUTER SURFACE INSPECTION APPARATUS
- Publication number 20140260705
- Publication date Sep 18, 2014
- Commercial Coating Services International, LLC
- Rick R. Kimpel
- G01 - MEASURING TESTING
Information Patent Application
INTERNAL PIPE COATING INSPECTION ROBOT
- Publication number 20120256643
- Publication date Oct 11, 2012
- CRTS, INC.
- Russell Langley
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING MULTILAYER THIN FILM DEPOSITION ON A PIEZOELE...
- Publication number 20120201954
- Publication date Aug 9, 2012
- Inficon, Inc.
- Abdul Wajid
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING THE THICKNESS OF ANY DEPOSIT OF MAT...
- Publication number 20110303012
- Publication date Dec 15, 2011
- STATOIL ASA
- Lene Amundsen
- G01 - MEASURING TESTING
Information Patent Application
FILM-THICKNESS MEASURING DEVICE USING PLL CIRCUIT
- Publication number 20110115467
- Publication date May 19, 2011
- PIONEER CORPORATION
- Hiroaki Sato
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
THICKNESS MEASURING DEVICE, COATING INSTALLATION, METHOD OF MEASURI...
- Publication number 20110079178
- Publication date Apr 7, 2011
- Applied Materials, Inc.
- Sven SCHRAMM
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
DEPOSITION RATE MONITOR DEVICE, EVAPORATOR, COATING INSTALLATION, M...
- Publication number 20100316788
- Publication date Dec 16, 2010
- Applied Materials, Inc.
- Manuel Dieguez-Campo
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method of quantifying paint and bodywork on automobiles and other p...
- Publication number 20090157349
- Publication date Jun 18, 2009
- Joseph J. Walker
- G01 - MEASURING TESTING
Information Patent Application
Electrodeposition characteristic measuring device, evaluation metho...
- Publication number 20050023142
- Publication date Feb 3, 2005
- Kenichi Nobuto
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Electrodeposition characteristic measuring device, evaluation metho...
- Publication number 20050023143
- Publication date Feb 3, 2005
- Kenichi Nobuto
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Method and apparatus for measuring film thickness and film thicknes...
- Publication number 20040206178
- Publication date Oct 21, 2004
- Tangidyne Corporation
- Scott F. Grimshaw
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING FILM THICKNESS AND FILM THICKNES...
- Publication number 20040206182
- Publication date Oct 21, 2004
- Cold Springs R&D, Inc.
- Scott F. Grimshaw
- G01 - MEASURING TESTING
Information Patent Application
Reusable mass-sensor in manufacture of organic light-emitting devices
- Publication number 20030140858
- Publication date Jul 31, 2003
- Michael A. Marcus
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Reusable mass-sensor in manufacture of organic light-emitting devices
- Publication number 20020187253
- Publication date Dec 12, 2002
- Eastman Kodak Company
- Michael A. Marcus
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Procedure and device for measuring the thickness of a liquid layer
- Publication number 20020131797
- Publication date Sep 19, 2002
- Wolfgang Eberhard Luxem
- G01 - MEASURING TESTING

for measuring thickness of coating

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Monitoring thin film deposition

Crystal oscillation probe structure and evaporation device

Monitoring thin film deposition

Apparatus and method for layer thickness measurement for a vapor de...

Crystal oscillator and the use thereof in semiconductor fabrication

Corrosion environment diagnosis system, corrosion prevention system...

Pipe outer surface inspection apparatus

Method for synthesis of two-dimensional dichalcogenide semiconductors

Crystal oscillator and the use thereof in semiconductor fabrication

Method for manufacturing organic EL display device, and film thickn...

Pipe outer surface inspection apparatus

Method and device for measuring the thickness of any deposit of mat...

Internal pipe coating inspection robot

Method of determining multilayer thin film deposition on a piezoele...

Film-thickness measuring device using PLL circuit

Method of quantifying paint and bodywork on automobiles and other p...

Method and apparatus for measuring film thickness and film thicknes...

Reusable mass-sensor in manufacture of organic light-emitting devices

Procedure and device for measuring the thickness of a liquid layer...

Reusable mass-sensor in manufacture of organic light-emitting devices

High-temperature balance

Thickness measurement using AFM for next generation lithography

Multiple remote probe electronic thickness gauge with probe holder

Control circuitry for quartz crystal deposition monitor

Measuring and controlling deposition on a piezoelectric monitor cry...

Multiple crystal head for deposition thickness monitor

System for determining the thickness of varying material coatings

Thickness monitoring system for intermittently exposing a quartz cr...

Piezoelectric contamination detector

Sensor for monitoring the deposition of frozen fog and/or ice on su...

Patents Applicationslast 30 patents

MONITORING THIN FILM DEPOSITION

Evaporation Apparatus

CRYSTAL OSCILLATOR AND THE USE THEREOF IN SEMICONDUCTOR FABRICATION

METHOD FOR MANUFACTURING ORGANIC EL DISPLAY DEVICE, AND FILM THICKN...

MONITORING THIN FILM DEPOSITION

MEASUREMENT APPARATUS AND FILM-COATING DEVICE

PIPE OUTER SURFACE INSPECTION APPARATUS

INTERNAL PIPE COATING INSPECTION ROBOT

METHOD OF DETERMINING MULTILAYER THIN FILM DEPOSITION ON A PIEZOELE...

METHOD AND DEVICE FOR MEASURING THE THICKNESS OF ANY DEPOSIT OF MAT...

FILM-THICKNESS MEASURING DEVICE USING PLL CIRCUIT

THICKNESS MEASURING DEVICE, COATING INSTALLATION, METHOD OF MEASURI...

DEPOSITION RATE MONITOR DEVICE, EVAPORATOR, COATING INSTALLATION, M...

Method of quantifying paint and bodywork on automobiles and other p...

Electrodeposition characteristic measuring device, evaluation metho...

Electrodeposition characteristic measuring device, evaluation metho...

Method and apparatus for measuring film thickness and film thicknes...

METHOD AND APPARATUS FOR MEASURING FILM THICKNESS AND FILM THICKNES...

Reusable mass-sensor in manufacture of organic light-emitting devices

Reusable mass-sensor in manufacture of organic light-emitting devices

Procedure and device for measuring the thickness of a liquid layer