“High Resolution Structure Imaging of Octahedral Void Defects in As-Grown Czochralski Silicon”, Jpn. J. Appl. Phys., vol. 36 (1997) pp. L1217-L1220, Part 2. No. 9A/B, Sep. 15, 1997. |
“Light Point Defects on Hydrogen Annealed Silicon Wafer”, Jpn. J. Appl. Phys., vol. 36 (1997), pp. L1127-L1129, Part 2, No. 9A/B, Sep. 15, 1997. |
“A New Method for Transmission Electron Microscope Observation of Grown-in Defects in As-Grown Czochralski Silicon (111) Crystals”, Jpn. J. Appl. Phys., vol. 36 (1997), pp. 6200-6203, Part 1, No. 10, Oct. 1997. |
“Atomic Force Microscope Observation of the Change in Shape and Subsequent Disappearance of ‘Crystal-Oriented Particles’ after Hydrogen-Atmosphere Thermal Annealing”, Jpn. J. Appl. Phys., vol. 37 (1998), pp. 1-4, Part 1, No. 1, Jan. 1998. |