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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

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H01J37/3056for microworking

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for pre-aligning samples for more efficient pro...
- Patent number 12,106,931
- Issue date Oct 1, 2024
- FEI Company
- Michal Hrouzek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Modulation of rolling k vectors of angled gratings
- Patent number 12,106,935
- Issue date Oct 1, 2024
- Applied Materials, Inc.
- Joseph C. Olson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Perimeter trench formation and delineation etch delayering
- Patent number 12,040,196
- Issue date Jul 16, 2024
- FEI Company
- James Clarke
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for cross-sectioning a sample with a preset thick...
- Patent number RE50001
- Issue date Jun 4, 2024
- FIBICS INCORPORATED
- Michael William Phaneuf
Information Patent Grant
Temperature-tuned ultrafast X-ray shutter using optics-on-a-chip
- Patent number 11,996,210
- Issue date May 28, 2024
- UChicago Argonne, LLC
- Jin Wang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Analysis device, analysis method, and storage medium
- Patent number 11,977,009
- Issue date May 7, 2024
- Honda Motor Co., Ltd.
- Atsushi Sakurai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for performing sample lift-out for highly react...
- Patent number 11,972,923
- Issue date Apr 30, 2024
- FEI Company
- Christopher Thompson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam irradiation apparatus and program therefor
- Patent number 11,955,311
- Issue date Apr 9, 2024
- NISSIN ION EQUIPMENT CO., LTD.
- Shinya Takemura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Microscopy imaging method for 3D tomography with predictive drift t...
- Patent number 11,923,168
- Issue date Mar 5, 2024
- FIBICS INCORPORATED
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for manufacturing semiconductor structure
- Patent number 11,908,700
- Issue date Feb 20, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Nai-Han Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of preparing and analyzing thin films
- Patent number 11,894,216
- Issue date Feb 6, 2024
- Yangtze Memory Technologies Co., Ltd.
- Jing Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Textured surfaces for breast implants
- Patent number 11,890,179
- Issue date Feb 6, 2024
- Establishment Labs S.A.
- Ardeshir Bayat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduced charging by low negative voltage in FIB systems
- Patent number 11,887,810
- Issue date Jan 30, 2024
- Applied Materials Israel Ltd.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Processing an object using a material processing device
- Patent number 11,862,428
- Issue date Jan 2, 2024
- Carl Zeiss Microscopy GmbH
- Fabian Perez-Willard
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etch improvement
- Patent number 11,852,853
- Issue date Dec 26, 2023
- Applied Materials, Inc.
- Rutger Meyer Timmerman Thijssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of material deposition
- Patent number 11,798,804
- Issue date Oct 24, 2023
- FEI Company
- Brian Roberts Routh
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Integral sweep in ion beam system
- Patent number 11,784,025
- Issue date Oct 10, 2023
- Plasma-Therm NES LLC
- Sarpangala Hariharakeshava Hegde
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion milling device and milling processing method using same
- Patent number 11,742,178
- Issue date Aug 29, 2023
- HITACHI HIGH-TECH CORPORATION
- Hitoshi Kamoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3D metrology from 3D datacube created from stack of registered imag...
- Patent number 11,728,126
- Issue date Aug 15, 2023
- Applied Materials Israel Ltd.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FIB delayering endpoint detection by monitoring sputtered materials...
- Patent number 11,694,934
- Issue date Jul 4, 2023
- Applied Materials Israel Ltd.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Modulation of rolling k vectors of angled gratings
- Patent number 11,670,482
- Issue date Jun 6, 2023
- Applied Materials, Inc.
- Joseph C. Olson
- G02 - OPTICS
Information Patent Grant
Method for reducing line-end space in integrated circuit patterning
- Patent number 11,635,695
- Issue date Apr 25, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jing-Huei Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabricating non-uniform diffraction gratings
- Patent number 11,609,365
- Issue date Mar 21, 2023
- Magic Leap, Inc.
- Mauro Melli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method of preparing integrated circuits for backside pro...
- Patent number 11,605,525
- Issue date Mar 14, 2023
- FEI Company
- James Vickers
- G01 - MEASURING TESTING
Information Patent Grant
Substrate processing system, switching timing creation support devi...
- Patent number 11,587,763
- Issue date Feb 21, 2023
- Tokyo Electron Limited
- Takeshi Akimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gratings with variable depths formed using planarization for wavegu...
- Patent number 11,579,364
- Issue date Feb 14, 2023
- Meta Platforms Technologies, LLC
- Matthew E. Colburn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging method and imaging system
- Patent number 11,532,454
- Issue date Dec 20, 2022
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor structure
- Patent number 11,482,422
- Issue date Oct 25, 2022
- Nai-Han Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for iteratively cross-sectioning a sample to corr...
- Patent number 11,462,383
- Issue date Oct 4, 2022
- Fibics Incorporated
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Modulation of rolling K vectors of angled gratings
- Patent number 11,456,152
- Issue date Sep 27, 2022
- Applied Materials, Inc.
- Joseph C. Olson
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD TO INVESTIGATE A SEMICONDUCTOR SAMPLE LAYER BY LAYER AND INV...
- Publication number 20240404786
- Publication date Dec 5, 2024
- Carl Zeiss SMT GMBH
- Ivo IHRKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Reducing Line-End Space in Integrated Circuit Patterning
- Publication number 20240385526
- Publication date Nov 21, 2024
- Taiwan Semiconductor Manufacturing Co., LTD
- Jing-Huei Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUSED ION BEAM DEVICE
- Publication number 20240355574
- Publication date Oct 24, 2024
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Koji NAGAHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Circuit with FIB-Ready Structures
- Publication number 20240321548
- Publication date Sep 26, 2024
- Nuvoton Technology Corporation
- Yuval Kirschner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR PERFORMING SAMPLE LIFT-OUT FOR HIGHLY REACT...
- Publication number 20240266142
- Publication date Aug 8, 2024
- FEI Company
- Christopher THOMPSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FILLING EMPTY STRUCTURES BY DEPOSITION UNDER SEM - BALANCING PARAME...
- Publication number 20240249909
- Publication date Jul 25, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-LINE DEPTH MEASUREMENTS BY AFM
- Publication number 20240212976
- Publication date Jun 27, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPY IMAGING METHOD AND SYSTEM
- Publication number 20240177966
- Publication date May 30, 2024
- Fibics Incorporated
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MICROMACHINING A BIOLOGICAL SAMPLE FOR CREATING A LAMELL...
- Publication number 20240177967
- Publication date May 30, 2024
- FEI Company
- Matej Dolník
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEXTURED SURFACES FOR BREAST IMPLANTS
- Publication number 20240130846
- Publication date Apr 25, 2024
- Establishment Labs S.A.
- Ardeshir BAYAT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PREPARING A MICROSCOPIC SAMPLE FOR FIB/SEM TOMOGRAPHY
- Publication number 20240120175
- Publication date Apr 11, 2024
- CARL ZEISS MICROSCOPY GMBH
- Lorenz Lechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Milling Device
- Publication number 20240120174
- Publication date Apr 11, 2024
- Hitachi High-Tech Corporation
- Shota AIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALTERING OPERATIONAL CHARACTERISTICS OF A SEMICONDUCTOR DEVICE USIN...
- Publication number 20240105419
- Publication date Mar 28, 2024
- Intel Corporation
- Shida TAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR IMAGING AND PROCESSING A SAMPLE USING A FOCUSED PARTICLE...
- Publication number 20240062989
- Publication date Feb 22, 2024
- Carl Zeiss SMT GMBH
- Daniel Schwarz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20240055220
- Publication date Feb 15, 2024
- Hitachi High-Tech Corporation
- Yuka II
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PROCESSING A SAMPLE, PARTICLE BEAM SYSTEM, AND COMPUTER P...
- Publication number 20240029996
- Publication date Jan 25, 2024
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMBINED LASER AND BROAD ION BEAM (BIB) SYSTEMS FOR MORE EFFICIENT...
- Publication number 20230420216
- Publication date Dec 28, 2023
- FEI Company
- Krishna Kanth NEELISETTY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MAKING CELL REGIONS OF INTEGRATED CIRCUITS
- Publication number 20230409798
- Publication date Dec 21, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jia-Hong GAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BROAD ION BEAM (BIB) SYSTEMS FOR MORE EFFICIENT PROCESSING OF MULTI...
- Publication number 20230375445
- Publication date Nov 23, 2023
- FEI Company
- Michal HROUZEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR PRE-ALIGNING SAMPLES FOR MORE EFFICIENT PRO...
- Publication number 20230377834
- Publication date Nov 23, 2023
- FEI Company
- Michal HROUZEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL-WALL MULTI-STRUCTURE QUARTZ CYLINDER DEVICE
- Publication number 20230352267
- Publication date Nov 2, 2023
- JIANGSU LEUVEN INSTRUMENTS CO. LTD
- Haiyang LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCED CHARGING BY LOW NEGATIVE VOLTAGE IN FIB SYSTEMS
- Publication number 20230343545
- Publication date Oct 26, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
END POINT DETERMINATION BY MEANS OF CONTRAST GAS
- Publication number 20230341766
- Publication date Oct 26, 2023
- Carl Zeiss SMT GMBH
- Daniel Rhinow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE-TUNED ULTRAFAST X-RAY SHUTTER USING OPTICS-ON-A-CHIP
- Publication number 20230343479
- Publication date Oct 26, 2023
- UChicago Argonne, LLC
- Jin Wang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
3D METROLOGY FROM 3D DATACUBE CREATED FROM STACK OF REGISTERED IMAG...
- Publication number 20230335370
- Publication date Oct 19, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESSING APPARATUS AND METHOD OF MANUFACTURE
- Publication number 20230326705
- Publication date Oct 12, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Chansyun David YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for analyzing three-dimensional features
- Publication number 20230317410
- Publication date Oct 5, 2023
- FEI Company
- Bingxing Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENDPOINTING WITH DETERMINATION OF REMAINING DISTANCE
- Publication number 20230307209
- Publication date Sep 28, 2023
- FEI Company
- Zoltán Orémus
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR MICROMACHINING A SAMPLE USING A FOCUSED IO...
- Publication number 20230298855
- Publication date Sep 21, 2023
- DELMIC IP B.V.
- Andries Pieter Johan EFFTING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Reducing Line-End Space in Integrated Circuit Patterning
- Publication number 20230259036
- Publication date Aug 17, 2023
- Taiwan Semiconductor Manufacturing Co., LTD
- Jing-Huei Huang
- H01 - BASIC ELECTRIC ELEMENTS

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Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for pre-aligning samples for more efficient pro...

Modulation of rolling k vectors of angled gratings

Perimeter trench formation and delineation etch delayering

Method and system for cross-sectioning a sample with a preset thick...

Temperature-tuned ultrafast X-ray shutter using optics-on-a-chip

Analysis device, analysis method, and storage medium

Systems and methods for performing sample lift-out for highly react...

Ion beam irradiation apparatus and program therefor

Microscopy imaging method for 3D tomography with predictive drift t...

Method for manufacturing semiconductor structure

Method of preparing and analyzing thin films

Textured surfaces for breast implants

Reduced charging by low negative voltage in FIB systems

Processing an object using a material processing device

Etch improvement

Method of material deposition

Integral sweep in ion beam system

Ion milling device and milling processing method using same

3D metrology from 3D datacube created from stack of registered imag...

FIB delayering endpoint detection by monitoring sputtered materials...

Modulation of rolling k vectors of angled gratings

Method for reducing line-end space in integrated circuit patterning

Fabricating non-uniform diffraction gratings

System and method of preparing integrated circuits for backside pro...

Substrate processing system, switching timing creation support devi...

Gratings with variable depths formed using planarization for wavegu...

Imaging method and imaging system

Method for manufacturing semiconductor structure

Method and system for iteratively cross-sectioning a sample to corr...

Modulation of rolling K vectors of angled gratings

Patents Applicationslast 30 patents

METHOD TO INVESTIGATE A SEMICONDUCTOR SAMPLE LAYER BY LAYER AND INV...

Method for Reducing Line-End Space in Integrated Circuit Patterning

FOCUSED ION BEAM DEVICE

Integrated Circuit with FIB-Ready Structures

SYSTEMS AND METHODS FOR PERFORMING SAMPLE LIFT-OUT FOR HIGHLY REACT...

FILLING EMPTY STRUCTURES BY DEPOSITION UNDER SEM - BALANCING PARAME...

IN-LINE DEPTH MEASUREMENTS BY AFM

MICROSCOPY IMAGING METHOD AND SYSTEM

METHOD FOR MICROMACHINING A BIOLOGICAL SAMPLE FOR CREATING A LAMELL...

TEXTURED SURFACES FOR BREAST IMPLANTS

METHOD FOR PREPARING A MICROSCOPIC SAMPLE FOR FIB/SEM TOMOGRAPHY

Ion Milling Device

ALTERING OPERATIONAL CHARACTERISTICS OF A SEMICONDUCTOR DEVICE USIN...

DEVICE FOR IMAGING AND PROCESSING A SAMPLE USING A FOCUSED PARTICLE...

Charged Particle Beam Device

METHOD OF PROCESSING A SAMPLE, PARTICLE BEAM SYSTEM, AND COMPUTER P...

COMBINED LASER AND BROAD ION BEAM (BIB) SYSTEMS FOR MORE EFFICIENT...

METHOD OF MAKING CELL REGIONS OF INTEGRATED CIRCUITS

BROAD ION BEAM (BIB) SYSTEMS FOR MORE EFFICIENT PROCESSING OF MULTI...

SYSTEMS AND METHODS FOR PRE-ALIGNING SAMPLES FOR MORE EFFICIENT PRO...

DUAL-WALL MULTI-STRUCTURE QUARTZ CYLINDER DEVICE

REDUCED CHARGING BY LOW NEGATIVE VOLTAGE IN FIB SYSTEMS

END POINT DETERMINATION BY MEANS OF CONTRAST GAS

TEMPERATURE-TUNED ULTRAFAST X-RAY SHUTTER USING OPTICS-ON-A-CHIP

3D METROLOGY FROM 3D DATACUBE CREATED FROM STACK OF REGISTERED IMAG...

PROCESSING APPARATUS AND METHOD OF MANUFACTURE

Method and system for analyzing three-dimensional features

ENDPOINTING WITH DETERMINATION OF REMAINING DISTANCE

METHOD AND APPARATUS FOR MICROMACHINING A SAMPLE USING A FOCUSED IO...

Method for Reducing Line-End Space in Integrated Circuit Patterning