for non-recurrent functions

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CPC
G01R13/0263

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R13/00Arrangements for displaying electric variables or waveforms

Current Industry

G01R13/0263for non-recurrent functions

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Measurement device with arbitrary waveform generator and trigger unit
- Patent number 11,422,159
- Issue date Aug 23, 2022
- Rohde & Schwarz GmbH & Co. KG
- Markus Freidhof
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for synchronizing multiple test and measurement...
- Patent number 11,372,025
- Issue date Jun 28, 2022
- Tektronix, Inc.
- Daniel G. Knierim
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Measurement device and method for measuring at least one signal
- Patent number 10,698,004
- Issue date Jun 30, 2020
- Rohde & Schwarz GmbH & Co. KG
- Friedrich Reich
- G01 - MEASURING TESTING
Information Patent Grant
Occupancy measurement and triggering in frequency domain bitmaps
- Patent number 10,459,008
- Issue date Oct 29, 2019
- Tektronix, Inc.
- Robert E. Tracy
- G01 - MEASURING TESTING
Information Patent Grant
System for improving probability of transient event detection
- Patent number 9,886,419
- Issue date Feb 6, 2018
- Tektronix, Inc.
- Stephen D. Follett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and a device for determining a trigger condition for a rare...
- Patent number 9,759,747
- Issue date Sep 12, 2017
- Rohde & Schwarz GmbH & Co. KG
- Andrew Schaefer
- G01 - MEASURING TESTING
Information Patent Grant
Method and a device for the automatic allocation of a signal to a m...
- Patent number 9,363,698
- Issue date Jun 7, 2016
- Rohde & Schwarz GmbH & Co. KG
- Luke Cirillo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Rare anomaly triggering in a test and measurement instrument
- Patent number 9,134,347
- Issue date Sep 15, 2015
- Tektronix, Inc.
- Tyler B. Niles
- G01 - MEASURING TESTING
Information Patent Grant
Occupancy measurement and triggering in frequency domain bitmaps
- Patent number 8,880,369
- Issue date Nov 4, 2014
- Tektronix, Inc.
- Robert E. Tracy
- G01 - MEASURING TESTING
Information Patent Grant
Signal detection and triggering using a difference bitmap
- Patent number 8,706,435
- Issue date Apr 22, 2014
- Tektronix, Inc.
- Kathryn A. Engholm
- G01 - MEASURING TESTING
Information Patent Grant
Pulse analyzer
- Patent number 8,575,913
- Issue date Nov 5, 2013
- Mitsubishi Electric R&D Centre Europe, B.V.
- Wieslaw Jerzy Szajnowski
- G01 - MEASURING TESTING
Information Patent Grant
Frequency domain bitmap triggering using color, density and correla...
- Patent number 8,489,350
- Issue date Jul 16, 2013
- Tektronix, Inc.
- Kathryn A. Engholm
- G01 - MEASURING TESTING
Information Patent Grant
Digital oscilloscope module with glitch detection
- Patent number 8,433,543
- Issue date Apr 30, 2013
- Service Solutions U.S. LLC
- Marco LeBrun
- G01 - MEASURING TESTING
Information Patent Grant
Holdoff algorithm for no dead time acquisition
- Patent number 8,161,497
- Issue date Apr 17, 2012
- Tektronix, Inc.
- Kenneth P. Dobyns
- G01 - MEASURING TESTING
Information Patent Grant
Waveform anomoly detection and notification systems and methods
- Patent number 8,024,140
- Issue date Sep 20, 2011
- Amherst Systems Associates, Inc.
- Michael Williams
- G01 - MEASURING TESTING
Information Patent Grant
Modulation domain trigger
- Patent number 7,765,086
- Issue date Jul 27, 2010
- Tektronix, Inc.
- Alfred K. Hillman, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Signal analyzer and method for signal analysis
- Patent number 7,759,925
- Issue date Jul 20, 2010
- Tektronix, Inc.
- Akira Nara
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for identifying similar events in long data re...
- Patent number 7,320,014
- Issue date Jan 15, 2008
- Tektronix, Inc.
- Peter J. Letts
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for computing thresholds for identification of...
- Patent number 6,980,212
- Issue date Dec 27, 2005
- Tektronix, Inc.
- Peter J. Letts
- G01 - MEASURING TESTING
Information Patent Grant
Data processing system and method included within an oscilloscope f...
- Patent number 6,845,331
- Issue date Jan 18, 2005
- International Business Machines Corporation
- Scott Leonard Daniels
- G01 - MEASURING TESTING
Information Patent Grant
Recapture of a portion of a displayed waveform without loss of exis...
- Patent number 6,781,584
- Issue date Aug 24, 2004
- Agilent Technologies, Inc.
- Hsiu-Huan Shen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for controlling compressed Z information in a...
- Patent number 6,636,226
- Issue date Oct 21, 2003
- ATI International SRL
- Steven L. Morein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for controlling compressed Z information in a...
- Patent number 6,492,991
- Issue date Dec 10, 2002
- ATI International SRL
- Steven L. Morein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data processing system and method included within an oscilloscope f...
- Patent number 6,421,619
- Issue date Jul 16, 2002
- International Business Machines Corporation
- Scott Leonard Daniels
- G01 - MEASURING TESTING
Information Patent Grant
Reacting to unusual waveforms
- Patent number 6,188,384
- Issue date Feb 13, 2001
- Tektronix, Inc.
- Steven K. Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Detection of unusual waveforms
- Patent number 6,163,758
- Issue date Dec 19, 2000
- Tektronix, Inc.
- Steven K. Sullivan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
A method and a device for determining a trigger condition for a rar...
- Publication number 20150301086
- Publication date Oct 22, 2015
- Rohde& Schwarz GmbH & Co. KG
- Andrew Schaefer
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND A DEVICE FOR THE AUTOMATIC ALLOCATION OF A SIGNAL TO A M...
- Publication number 20140370883
- Publication date Dec 18, 2014
- Luke Cirillo
- G01 - MEASURING TESTING
Information Patent Application
RARE ANOMALY TRIGGERING IN A TEST AND MEASUREMENT INSTRUMENT
- Publication number 20140095098
- Publication date Apr 3, 2014
- Tektronix, Inc.
- Tyler B. Niles
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR IMPROVING PROBABILITY OF TRANSIENT EVENT DETECTION
- Publication number 20140032150
- Publication date Jan 30, 2014
- Tektronix, Inc.
- STEPHEN D. FOLLETT
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL DETECTION AND TRIGGERING USING A DIFFERENCE BITMAP
- Publication number 20110273469
- Publication date Nov 10, 2011
- Tektronix, Inc.
- KATHRYN A. ENGHOLM
- G01 - MEASURING TESTING
Information Patent Application
PULSE ANALYZER
- Publication number 20100295532
- Publication date Nov 25, 2010
- Mitsubishi Electric Corporation
- Wieslaw Jerzy Szajnowski
- G01 - MEASURING TESTING
Information Patent Application
OCCUPANCY MEASUREMENT AND TRIGGERING IN FREQUENCY DOMAIN BITMAPS
- Publication number 20100235124
- Publication date Sep 16, 2010
- Tektronix, Inc.
- ROBERT E. TRACY
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY DOMAIN BITMAP TRIGGERING USING COLOR, DENSITY AND CORRELA...
- Publication number 20100231398
- Publication date Sep 16, 2010
- Tektronix, Inc.
- Kathryn A. Engholm
- G01 - MEASURING TESTING
Information Patent Application
Digital Oscilloscope Module with Glitch Detection
- Publication number 20100052653
- Publication date Mar 4, 2010
- SPX Corporation
- Marco LeBrun
- G01 - MEASURING TESTING
Information Patent Application
HOLDOFF ALGORITHM FOR NO DEAD TIME ACQUISITION
- Publication number 20090249363
- Publication date Oct 1, 2009
- Tektronix, Inc.
- Kenneth P. DOBYNS
- G01 - MEASURING TESTING
Information Patent Application
WAVEFORM ANOMOLY DETECTION AND NOTIFICATION SYSTEMS AND METHODS
- Publication number 20090055111
- Publication date Feb 26, 2009
- Amherst Systems Associates Corporation
- Michael Williams
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL ANALYZER AND METHOD FOR SIGNAL ANALYSIS
- Publication number 20080143316
- Publication date Jun 19, 2008
- TEKTRONIX, JAPAN, LTD.
- AKIRA NARA
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for evaluating data
- Publication number 20080071488
- Publication date Mar 20, 2008
- LeCroy Corporation
- Anthony Cake
- G01 - MEASURING TESTING
Information Patent Application
Modulation domain trigger
- Publication number 20060129355
- Publication date Jun 15, 2006
- Alfred K. Hillman
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for identifying similar events in long data re...
- Publication number 20050131974
- Publication date Jun 16, 2005
- Peter J. Letts
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Recapture of a portion of a displayed waveform without loss of exis...
- Publication number 20040017371
- Publication date Jan 29, 2004
- Hsiu-Huan Shen
- G01 - MEASURING TESTING
Information Patent Application
Data processing system and method included within an oscilloscope f...
- Publication number 20030229460
- Publication date Dec 11, 2003
- International Business Machines Corp.
- Scott Leonard Daniels
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for controlling compressed Z information in a...
- Publication number 20030085893
- Publication date May 8, 2003
- Steven L. Morein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for computing thresholds for identification of...
- Publication number 20020180737
- Publication date Dec 5, 2002
- Peter J. Letts
- G01 - MEASURING TESTING

for non-recurrent functions

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Measurement device with arbitrary waveform generator and trigger unit

Systems and methods for synchronizing multiple test and measurement...

Measurement device and method for measuring at least one signal

Occupancy measurement and triggering in frequency domain bitmaps

System for improving probability of transient event detection

Method and a device for determining a trigger condition for a rare...

Method and a device for the automatic allocation of a signal to a m...

Rare anomaly triggering in a test and measurement instrument

Occupancy measurement and triggering in frequency domain bitmaps

Signal detection and triggering using a difference bitmap

Pulse analyzer

Frequency domain bitmap triggering using color, density and correla...

Digital oscilloscope module with glitch detection

Holdoff algorithm for no dead time acquisition

Waveform anomoly detection and notification systems and methods

Modulation domain trigger

Signal analyzer and method for signal analysis

Method and apparatus for identifying similar events in long data re...

Method and apparatus for computing thresholds for identification of...

Data processing system and method included within an oscilloscope f...

Recapture of a portion of a displayed waveform without loss of exis...

Method and apparatus for controlling compressed Z information in a...

Method and apparatus for controlling compressed Z information in a...

Data processing system and method included within an oscilloscope f...

Reacting to unusual waveforms

Detection of unusual waveforms

Patents Applicationslast 30 patents

A method and a device for determining a trigger condition for a rar...

METHOD AND A DEVICE FOR THE AUTOMATIC ALLOCATION OF A SIGNAL TO A M...

RARE ANOMALY TRIGGERING IN A TEST AND MEASUREMENT INSTRUMENT

SYSTEM FOR IMPROVING PROBABILITY OF TRANSIENT EVENT DETECTION

SIGNAL DETECTION AND TRIGGERING USING A DIFFERENCE BITMAP

PULSE ANALYZER

OCCUPANCY MEASUREMENT AND TRIGGERING IN FREQUENCY DOMAIN BITMAPS

FREQUENCY DOMAIN BITMAP TRIGGERING USING COLOR, DENSITY AND CORRELA...

Digital Oscilloscope Module with Glitch Detection

HOLDOFF ALGORITHM FOR NO DEAD TIME ACQUISITION

WAVEFORM ANOMOLY DETECTION AND NOTIFICATION SYSTEMS AND METHODS

SIGNAL ANALYZER AND METHOD FOR SIGNAL ANALYSIS

Method and apparatus for evaluating data

Modulation domain trigger

Method and apparatus for identifying similar events in long data re...

Recapture of a portion of a displayed waveform without loss of exis...

Data processing system and method included within an oscilloscope f...

Method and apparatus for controlling compressed Z information in a...

Method and apparatus for computing thresholds for identification of...