for optimized yield

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CPC
G11C29/814

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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/814for optimized yield

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor memory devices and repair methods of the semiconducto...
- Patent number 11,621,050
- Issue date Apr 4, 2023
- SK hynix Inc.
- Jae Il Lim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Runtime cell row replacement in a memory
- Patent number 11,481,294
- Issue date Oct 25, 2022
- Intel Corporation
- Satish Muthiyalu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stacked memory apparatus using error correction code and repairing...
- Patent number 11,315,657
- Issue date Apr 26, 2022
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory devices having spare column remap storages and methods of re...
- Patent number 11,200,962
- Issue date Dec 14, 2021
- SK hynix Inc.
- Hokyoon Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for SOC with optimal RSMA
- Patent number 10,789,398
- Issue date Sep 29, 2020
- Synopsys, Inc.
- Suren Martirosyan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory devices having spare column remap storages
- Patent number 10,726,939
- Issue date Jul 28, 2020
- SK hynix Inc.
- Hokyoon Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Layered semiconductor device, and production method therefor
- Patent number 10,714,151
- Issue date Jul 14, 2020
- ULTRAMEMORY INC.
- Yasutoshi Yamada
- G11 - INFORMATION STORAGE
Information Patent Grant
On-the-fly bit failure detection and bit redundancy remapping techn...
- Patent number 10,529,439
- Issue date Jan 7, 2020
- Spin Memory, Inc.
- Neal Berger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Forcing stuck bits, waterfall bits, shunt bits and low TMR bits to...
- Patent number 10,489,245
- Issue date Nov 26, 2019
- Spin Memory, Inc.
- Neal Berger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
E-fuse circuit
- Patent number 10,366,773
- Issue date Jul 30, 2019
- SK hynix Inc.
- Hyeong Soo Jeong
- G11 - INFORMATION STORAGE
Information Patent Grant
Techniques to achieve area reduction through co-optimizing logic co...
- Patent number 10,268,122
- Issue date Apr 23, 2019
- Intel Corporation
- Silvio E. Bou-Ghazale
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory cell with redundant carbon nanotube
- Patent number 9,842,991
- Issue date Dec 12, 2017
- Honeywell International Inc.
- David K. Nelson
- G11 - INFORMATION STORAGE
Information Patent Grant
Real time correction of bit failure in resistive memory
- Patent number 9,552,244
- Issue date Jan 24, 2017
- QUALCOMM Incorporated
- Taehyun Kim
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Device and method for reducing the number of addresses of faulty me...
- Patent number 6,910,161
- Issue date Jun 21, 2005
- Infineon Technologies AG
- Justus Kuhn
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having improved redundancy scheme
- Patent number 6,870,780
- Issue date Mar 22, 2005
- Samsung Electronics Co., Ltd.
- Duk-ha Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory
- Patent number 6,504,770
- Issue date Jan 7, 2003
- Hitachi, Ltd.
- Goro Kitsukawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory
- Patent number 6,407,952
- Issue date Jun 18, 2002
- Hitachi, Ltd.
- Goro Kitsukawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory
- Patent number 6,191,983
- Issue date Feb 20, 2001
- Hitachi, Ltd.
- Goro Kitsukawa
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
MEMORY DEVICES HAVING SPARE COLUMN REMAP STORAGES AND METHODS OF RE...
- Publication number 20200312423
- Publication date Oct 1, 2020
- SK HYNIX INC.
- Hokyoon LEE
- G11 - INFORMATION STORAGE
Information Patent Application
STACKED MEMORY APPARATUS USING ERROR CORRECTION CODE AND REPAIRING...
- Publication number 20200243159
- Publication date Jul 30, 2020
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LAYERED SEMICONDUCTOR DEVICE, AND PRODUCTION METHOD THEREFOR
- Publication number 20200090708
- Publication date Mar 19, 2020
- UltraMemory Inc.
- Yasutoshi YAMADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY CELL WITH REDUNDANT CARBON NANOTUBE
- Publication number 20140264251
- Publication date Sep 18, 2014
- Honeywell International Inc.
- David K. Nelson
- G11 - INFORMATION STORAGE
Information Patent Application
Enhancing Memory Yield Through Memory Subsystem Repair
- Publication number 20140169113
- Publication date Jun 19, 2014
- Ting Zhou
- G11 - INFORMATION STORAGE
Information Patent Application
Yield calculation method
- Publication number 20070266358
- Publication date Nov 15, 2007
- Yoko Tohyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Redundancy repaired yield calculation method
- Publication number 20050073875
- Publication date Apr 7, 2005
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Yoko Tohyama
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device having improved redundancy scheme
- Publication number 20040047222
- Publication date Mar 11, 2004
- SAMSUNG ELECTRONICS CO., LTD.
- Duk-Ha Park
- G11 - INFORMATION STORAGE
Information Patent Application
Device and method for reducing the number of addresses of faulty me...
- Publication number 20020087926
- Publication date Jul 4, 2002
- Justus Kuhn
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory
- Publication number 20020071324
- Publication date Jun 13, 2002
- Goro Kitsukawa
- H01 - BASIC ELECTRIC ELEMENTS

for optimized yield

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semiconductor memory devices and repair methods of the semiconducto...

Runtime cell row replacement in a memory

Stacked memory apparatus using error correction code and repairing...

Memory devices having spare column remap storages and methods of re...

Method and apparatus for SOC with optimal RSMA

Memory devices having spare column remap storages

Layered semiconductor device, and production method therefor

On-the-fly bit failure detection and bit redundancy remapping techn...

Forcing stuck bits, waterfall bits, shunt bits and low TMR bits to...

E-fuse circuit

Techniques to achieve area reduction through co-optimizing logic co...

Memory cell with redundant carbon nanotube

Real time correction of bit failure in resistive memory

Device and method for reducing the number of addresses of faulty me...

Semiconductor memory device having improved redundancy scheme

Semiconductor memory

Semiconductor memory

Semiconductor memory

Patents Applicationslast 30 patents

MEMORY DEVICES HAVING SPARE COLUMN REMAP STORAGES AND METHODS OF RE...

STACKED MEMORY APPARATUS USING ERROR CORRECTION CODE AND REPAIRING...

LAYERED SEMICONDUCTOR DEVICE, AND PRODUCTION METHOD THEREFOR

MEMORY CELL WITH REDUNDANT CARBON NANOTUBE

Enhancing Memory Yield Through Memory Subsystem Repair

Yield calculation method

Redundancy repaired yield calculation method

Semiconductor memory device having improved redundancy scheme

Device and method for reducing the number of addresses of faulty me...

Semiconductor memory