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G01J5/0245
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
G01J5/00
Radiation pyrometry
Current Industry
G01J5/0245
for performing thermal shunt
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Patents Grants
last 30 patents
Information
Patent Grant
Method for determining a temperature without contact, and infrared...
Patent number
11,215,509
Issue date
Jan 4, 2022
Robert Bosch GmbH
Michael Frank
G01 - MEASURING TESTING
Information
Patent Grant
Low cost and high performance bolometer circuitry and methods
Patent number
11,015,979
Issue date
May 25, 2021
FLIR Systems, Inc.
Naseem Y. Aziz
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining a temperature without contact, and infrared...
Patent number
10,816,404
Issue date
Oct 27, 2020
Robert Bosch GmbH
Michael Frank
G01 - MEASURING TESTING
Information
Patent Grant
Devices and methods for infrared reference pixels
Patent number
10,677,656
Issue date
Jun 9, 2020
FLIR Systems, Inc.
Eric A. Kurth
G01 - MEASURING TESTING
Information
Patent Grant
Thermal protection mechanisms for uncooled microbolometers
Patent number
10,520,364
Issue date
Dec 31, 2019
Raytheon Company
Paolo Masini
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Thermal protection mechanisms for uncooled microbolometers
Patent number
10,175,113
Issue date
Jan 8, 2019
Raytheon Company
Paolo Masini
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Thermally shorted bolometer
Patent number
9,199,838
Issue date
Dec 1, 2015
Robert Bosch GmbH
Gary O'Brien
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Infrared ray detector and method of detecting infrared rays by usin...
Patent number
9,140,611
Issue date
Sep 22, 2015
Samsung Electronics Co., Ltd.
Hae-seok Park
G01 - MEASURING TESTING
Information
Patent Grant
Bolometer having absorber with pillar structure for thermal shorting
Patent number
9,130,081
Issue date
Sep 8, 2015
Robert Bosch GmbH
Gary Yama
G01 - MEASURING TESTING
Information
Patent Grant
Device to detect thermal radiation with high resolution method to m...
Patent number
8,969,811
Issue date
Mar 3, 2015
Pyreos Ltd.
Carsten Giebeler
G01 - MEASURING TESTING
Information
Patent Grant
Electronic device
Patent number
8,047,710
Issue date
Nov 1, 2011
Panasonic Corporation
Kimiya Ikushima
G01 - MEASURING TESTING
Information
Patent Grant
Electronic device and method for fabricating the same
Patent number
7,550,726
Issue date
Jun 23, 2009
Panasonic Corporation
Kimiya Ikushima
G01 - MEASURING TESTING
Information
Patent Grant
Solid-state imaging device and driving method thereof
Patent number
7,535,003
Issue date
May 19, 2009
Kabushiki Kaisha Toshiba
Hiroto Honda
G01 - MEASURING TESTING
Information
Patent Grant
Thermoelectric bridge IR detector
Patent number
7,485,860
Issue date
Feb 3, 2009
BAE Systems Information and Electronic Systems Integration Inc.
Michael DeFlumere
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for providing thermal conductance in thermally...
Patent number
7,351,973
Issue date
Apr 1, 2008
Delphi Technologies, Inc.
John R. Troxell
G01 - MEASURING TESTING
Information
Patent Grant
Microbolometer and its manufacturing method
Patent number
7,241,998
Issue date
Jul 10, 2007
Commissariat a l'Energie Atomique
Michel Vilain
G01 - MEASURING TESTING
Information
Patent Grant
Thermal infrared detector and infrared image sensor using the same
Patent number
7,026,617
Issue date
Apr 11, 2006
Kabushiki Kaisha Toshiba
Naoya Mashio
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Infrared detector and drive method therefor
Patent number
5,656,816
Issue date
Aug 12, 1997
NEC Corporation
Akio Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
Thermal imaging system with integrated thermal chopper
Patent number
5,486,698
Issue date
Jan 23, 1996
Texas Instruments Incorporated
Charles M. Hanson
G01 - MEASURING TESTING
Information
Patent Grant
Radiometric standard infrared detector
Patent number
5,084,621
Issue date
Jan 28, 1992
Cincinnati Electronics Corporation
A. G. Geiser
G01 - MEASURING TESTING
Information
Patent Grant
Thermal mask for cryogenic detectors in a thermal imaging device
Patent number
4,929,834
Issue date
May 29, 1990
The United States of America as represented by the Secretary of the Army
Wilbur Liebson
G01 - MEASURING TESTING
Information
Patent Grant
Material identification using infrared thermometry
Patent number
4,644,163
Issue date
Feb 17, 1987
International Business Machines Corporation
Raymond K. Selander
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
LOW COST AND HIGH PERFORMANCE BOLOMETER CIRCUITRY AND METHODS
Publication number
20190368941
Publication date
Dec 5, 2019
FLIR SYSTEMS, INC.
Naseem Y. Aziz
G01 - MEASURING TESTING
Information
Patent Application
THERMAL PROTECTION MECHANISMS FOR UNCOOLED MICROBOLOMETERS
Publication number
20190107442
Publication date
Apr 11, 2019
Raytheon Company
Paolo Masini
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DEVICES AND METHODS FOR INFRARED REFERENCE PIXELS
Publication number
20170191868
Publication date
Jul 6, 2017
FLIR SYSTEMS, INC.
Eric A. Kurth
G01 - MEASURING TESTING
Information
Patent Application
Thermally Shorted Bolometer
Publication number
20150115160
Publication date
Apr 30, 2015
ROBERT BOSCH GmbH
Gary O'Brien
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
BOLOMETER HAVING ABSORBER WITH PILLAR STRUCTURE FOR THERMAL SHORTING
Publication number
20140175285
Publication date
Jun 26, 2014
ROBERT BOSCH GmbH
Gary Yama
G01 - MEASURING TESTING
Information
Patent Application
INFRARED RAY DETECTOR AND METHOD OF DETECTING INFRARED RAYS BY USIN...
Publication number
20130161515
Publication date
Jun 27, 2013
Samsung Electronics Co., Ltd.
Hae-seok PARK
G01 - MEASURING TESTING
Information
Patent Application
Device to detect thermal radiation with high resolution method to...
Publication number
20110049369
Publication date
Mar 3, 2011
Carsten Giebeler
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE
Publication number
20090262778
Publication date
Oct 22, 2009
Matsushita Electric Industrial Co., Ltd.
Kimiya Ikushima
G01 - MEASURING TESTING
Information
Patent Application
SOLID-STATE IMAGING DEVICE AND DRIVING METHOD THEREOF
Publication number
20080237468
Publication date
Oct 2, 2008
Kabushiki Kaisha Toshiba
Hiroto HONDA
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE AND METHOD FOR FABRICATING THE SAME
Publication number
20080179525
Publication date
Jul 31, 2008
Kimiya IKUSHIMA
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for providing thermal conductance in thermally...
Publication number
20060180758
Publication date
Aug 17, 2006
John R. Troxell
G01 - MEASURING TESTING
Information
Patent Application
Microbolometer and method for making same
Publication number
20040232337
Publication date
Nov 25, 2004
Michel Vilain
G01 - MEASURING TESTING
Information
Patent Application
Thermoelectric bridge IR detector
Publication number
20040188615
Publication date
Sep 30, 2004
Michael DeFlumere
G01 - MEASURING TESTING
Information
Patent Application
Thermal infrared detector and infrared image sensor using the same
Publication number
20040129882
Publication date
Jul 8, 2004
Kabushiki Kaisha Toshiba
Naoya Mashio
H04 - ELECTRIC COMMUNICATION TECHNIQUE