for preparing specimen to be viewed in microscopes or analyzed in microanalysers

Industry

CPC
H01J2237/31745

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/31745for preparing specimen to be viewed in microscopes or analyzed in microanalysers

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Ion milling device
- Patent number 12,224,155
- Issue date Feb 11, 2025
- HITACHI HIGH-TECH CORPORATION
- Shota Aida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing lamella, analysis system and method for analyz...
- Patent number 12,176,180
- Issue date Dec 24, 2024
- HITACHI HIGH-TECH CORPORATION
- Atsushi Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas phase sample preparation for cryo-electron microscopy
- Patent number 12,130,217
- Issue date Oct 29, 2024
- Wisconsin Alumni Research Foundation
- Joshua Coon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for pre-aligning samples for more efficient pro...
- Patent number 12,106,931
- Issue date Oct 1, 2024
- FEI Company
- Michal Hrouzek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for cross-section sample preparation
- Patent number 12,007,344
- Issue date Jun 11, 2024
- Fibics Incorporated
- Michael William Phaneuf
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device, analysis method, and storage medium
- Patent number 11,977,009
- Issue date May 7, 2024
- Honda Motor Co., Ltd.
- Atsushi Sakurai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for performing sample lift-out for highly react...
- Patent number 11,972,923
- Issue date Apr 30, 2024
- FEI Company
- Christopher Thompson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of preparing and analyzing thin films
- Patent number 11,894,216
- Issue date Feb 6, 2024
- Yangtze Memory Technologies Co., Ltd.
- Jing Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring a sample and microscope implementing the method
- Patent number 11,848,172
- Issue date Dec 19, 2023
- Carl Zeiss SMT GmbH
- Dmitry Klochkov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of material deposition
- Patent number 11,798,804
- Issue date Oct 24, 2023
- FEI Company
- Brian Roberts Routh
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method, device and system for the treatment of biological cryogenic...
- Patent number 11,735,404
- Issue date Aug 22, 2023
- FEI Company
- Alex De Marco
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for cross-section sample preparation
- Patent number 11,726,050
- Issue date Aug 15, 2023
- Fibics Incorporated
- Michael William Phaneuf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion milling apparatus and sample holder
- Patent number 11,562,886
- Issue date Jan 24, 2023
- Jeol Ltd.
- Shogo Kataoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging method and imaging system
- Patent number 11,532,454
- Issue date Dec 20, 2022
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas phase sample preparation for cryo-electron microscopy
- Patent number 11,525,760
- Issue date Dec 13, 2022
- Wisconsin Alumni Research Foundation
- Joshua Coon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-dimensional (3D) imaging system and method for nanostructure
- Patent number 11,488,801
- Issue date Nov 1, 2022
- INSTITUTE OF GEOLOGY AND GEOPHYSICS, CHINESE ACADEMY OF SCIENCES
- Zhongming Du
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of sample preparation using dual ion beam trenching
- Patent number 11,476,120
- Issue date Oct 18, 2022
- Intel Corporation
- Purushotham Kaushik Muthur Srinath
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite charged particle beam apparatus
- Patent number 11,462,381
- Issue date Oct 4, 2022
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Hiroyuki Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for cross-section sample preparation
- Patent number 11,366,074
- Issue date Jun 21, 2022
- Fibics Incorporated
- Michael William Phaneuf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for preparing a TEM sample
- Patent number 11,315,755
- Issue date Apr 26, 2022
- Shanghai Huali Integrated Circuit Corporation
- Qiang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dose-based end-pointing for low-kV FIB milling in TEM sample prepar...
- Patent number 11,313,042
- Issue date Apr 26, 2022
- FEI Company
- Thomas G. Miller
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Fiducial design for tilted or glancing mill operations with a charg...
- Patent number 11,315,756
- Issue date Apr 26, 2022
- FEI Company
- Stacey Stone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and compositions for micro-electron diffraction
- Patent number 11,293,883
- Issue date Apr 5, 2022
- Howard Hughes Medical Institute
- Tamir Gonen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,239,046
- Issue date Feb 1, 2022
- Hitachi High-Tech Science Corporation
- Ayana Muraki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder, ion milling apparatus, sample processing method, sam...
- Patent number 11,226,273
- Issue date Jan 18, 2022
- HITACHI HIGH-TECH CORPORATION
- Atsushi Kamino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diagonal compound mill
- Patent number 11,158,487
- Issue date Oct 26, 2021
- FEI Company
- Clifford Russell Bugge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam apparatus
- Patent number 11,133,149
- Issue date Sep 28, 2021
- Hitachi High-Tech Science Corporation
- Toshihiro Mochizuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus, method, and program for processing and observing cross s...
- Patent number 11,114,276
- Issue date Sep 7, 2021
- Hitachi High-Tech Science Corporation
- Xin Man
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Gas phase sample preparation for cryo-electron microscopy
- Patent number 11,092,523
- Issue date Aug 17, 2021
- Wisconsin Alumni Research Foundation
- Joshua Coon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of preparing thin film sample piece and charged particle bea...
- Patent number 11,094,503
- Issue date Aug 17, 2021
- Hitachi High-Tech Science Corporation
- Masato Suzuki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
FOCUS STACKING APPLICATIONS FOR SAMPLE PREPARATION
- Publication number 20250005714
- Publication date Jan 2, 2025
- FEI Company
- Matej Dolník
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD TO INVESTIGATE A SEMICONDUCTOR SAMPLE LAYER BY LAYER AND INV...
- Publication number 20240404786
- Publication date Dec 5, 2024
- Carl Zeiss SMT GMBH
- Ivo IHRKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES VIA BACKSIDE TH...
- Publication number 20240347312
- Publication date Oct 17, 2024
- CARL ZEISS MICROSCOPY GMBH
- Heiko Stegmann
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Integrated Circuit with FIB-Ready Structures
- Publication number 20240321548
- Publication date Sep 26, 2024
- Nuvoton Technology Corporation
- Yuval Kirschner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR PERFORMING SAMPLE LIFT-OUT FOR HIGHLY REACT...
- Publication number 20240266142
- Publication date Aug 8, 2024
- FEI Company
- Christopher THOMPSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CREATING A SMOOTH DIAGONAL SURFACE USING A FOCUSED ION B...
- Publication number 20240234085
- Publication date Jul 11, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CREATING A SMOOTH DIAGONAL SURFACE USING A FOCUSED ION B...
- Publication number 20240136150
- Publication date Apr 25, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PREPARING A MICROSCOPIC SAMPLE FOR FIB/SEM TOMOGRAPHY
- Publication number 20240120175
- Publication date Apr 11, 2024
- CARL ZEISS MICROSCOPY GMBH
- Lorenz Lechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR PREPARING A SPECIMEN
- Publication number 20240071720
- Publication date Feb 29, 2024
- FEI Company
- Jamie Dee Gravell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Application Management For Charged Particle Microscope Devices
- Publication number 20240071717
- Publication date Feb 29, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR PRE-ALIGNING SAMPLES FOR MORE EFFICIENT PRO...
- Publication number 20230377834
- Publication date Nov 23, 2023
- FEI Company
- Michal HROUZEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CROSS-SECTION SAMPLE PREPARATION
- Publication number 20230358696
- Publication date Nov 9, 2023
- Fibics Incorporated
- Michael William PHANEUF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES
- Publication number 20230343546
- Publication date Oct 26, 2023
- CARL ZEISS MICROSCOPY GMBH
- Michele Nicoletti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENDPOINTING WITH DETERMINATION OF REMAINING DISTANCE
- Publication number 20230307209
- Publication date Sep 28, 2023
- FEI Company
- Zoltán Orémus
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR MICROMACHINING A SAMPLE USING A FOCUSED IO...
- Publication number 20230298855
- Publication date Sep 21, 2023
- DELMIC IP B.V.
- Andries Pieter Johan EFFTING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE PREPARATION METHOD AND APPARATUS
- Publication number 20230273136
- Publication date Aug 31, 2023
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- John Lindsay
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gas Phase Sample Preparation for Cryo-Electron Microscopy
- Publication number 20230266214
- Publication date Aug 24, 2023
- Wisconsin Alumni Research Foundation
- Joshua COON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR PERFORMING SAMPLE LIFT-OUT FOR HIGHLY REACT...
- Publication number 20230215690
- Publication date Jul 6, 2023
- FEI Company
- Christopher THOMPSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MEASURING A SAMPLE AND MICROSCOPE IMPLEMENTING THE METHOD
- Publication number 20230145897
- Publication date May 11, 2023
- Carl Zeiss SMT GMBH
- Dmitry Klochkov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WORKSTATION, PREPARATION STATION AND METHOD FOR MANIPULATING AN ELE...
- Publication number 20230073506
- Publication date Mar 9, 2023
- Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V.
- Sebastian TACKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSIS DEVICE, ANALYSIS METHOD, AND STORAGE MEDIUM
- Publication number 20230067374
- Publication date Mar 2, 2023
- Honda Motor Co., Ltd.
- Atsushi Sakurai
- G01 - MEASURING TESTING
Information Patent Application
Specimen Machining Device and Specimen Machining Method
- Publication number 20220392739
- Publication date Dec 8, 2022
- JEOL Ltd.
- Munehiro Kozuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Milling Device
- Publication number 20220367148
- Publication date Nov 17, 2022
- Hitachi High-Tech Corporation
- Shota AIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Producing Lamella, Analysis System and Method for Analyz...
- Publication number 20220367144
- Publication date Nov 17, 2022
- Hitachi High-Tech Corporation
- Atsushi SAWADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CROSS-SECTION SAMPLE PREPARATION
- Publication number 20220317072
- Publication date Oct 6, 2022
- Fibics Incorporated
- Michael William PHANEUF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gas Phase Sample Preparation for Cryo-Electron Microscopy
- Publication number 20220065761
- Publication date Mar 3, 2022
- Wisconsin Alumni Research Foundation
- Joshua COON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PREPARING A TEM SAMPLE
- Publication number 20220068600
- Publication date Mar 3, 2022
- Shanghai Huali Integrated Circuit Corporation
- Qiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
Ion Milling Apparatus and Sample Holder
- Publication number 20220051870
- Publication date Feb 17, 2022
- JEOL Ltd.
- Shogo Kataoka
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PREPARING AND ANALYZING THIN FILMS
- Publication number 20220028655
- Publication date Jan 27, 2022
- Yangtze Memory Technologies Co., Ltd.
- Jing LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOSITE CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210151283
- Publication date May 20, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Hiroyuki SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS

for preparing specimen to be viewed in microscopes or analyzed in microanalysers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Ion milling device

Method for producing lamella, analysis system and method for analyz...

Gas phase sample preparation for cryo-electron microscopy

Systems and methods for pre-aligning samples for more efficient pro...

Method for cross-section sample preparation

Analysis device, analysis method, and storage medium

Systems and methods for performing sample lift-out for highly react...

Method of preparing and analyzing thin films

Method for measuring a sample and microscope implementing the method

Method of material deposition

Method, device and system for the treatment of biological cryogenic...

Method for cross-section sample preparation

Ion milling apparatus and sample holder

Imaging method and imaging system

Gas phase sample preparation for cryo-electron microscopy

Three-dimensional (3D) imaging system and method for nanostructure

Method of sample preparation using dual ion beam trenching

Composite charged particle beam apparatus

Method for cross-section sample preparation

Method for preparing a TEM sample

Dose-based end-pointing for low-kV FIB milling in TEM sample prepar...

Fiducial design for tilted or glancing mill operations with a charg...

Methods and compositions for micro-electron diffraction

Charged particle beam apparatus

Sample holder, ion milling apparatus, sample processing method, sam...

Diagonal compound mill

Focused ion beam apparatus

Apparatus, method, and program for processing and observing cross s...

Gas phase sample preparation for cryo-electron microscopy

Method of preparing thin film sample piece and charged particle bea...

Patents Applicationslast 30 patents

FOCUS STACKING APPLICATIONS FOR SAMPLE PREPARATION

METHOD TO INVESTIGATE A SEMICONDUCTOR SAMPLE LAYER BY LAYER AND INV...

DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES VIA BACKSIDE TH...

Integrated Circuit with FIB-Ready Structures

SYSTEMS AND METHODS FOR PERFORMING SAMPLE LIFT-OUT FOR HIGHLY REACT...

METHOD FOR CREATING A SMOOTH DIAGONAL SURFACE USING A FOCUSED ION B...

METHOD FOR CREATING A SMOOTH DIAGONAL SURFACE USING A FOCUSED ION B...

METHOD FOR PREPARING A MICROSCOPIC SAMPLE FOR FIB/SEM TOMOGRAPHY

METHOD AND SYSTEM FOR PREPARING A SPECIMEN

Application Management For Charged Particle Microscope Devices

SYSTEMS AND METHODS FOR PRE-ALIGNING SAMPLES FOR MORE EFFICIENT PRO...

METHOD FOR CROSS-SECTION SAMPLE PREPARATION

DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES

ENDPOINTING WITH DETERMINATION OF REMAINING DISTANCE

METHOD AND APPARATUS FOR MICROMACHINING A SAMPLE USING A FOCUSED IO...

SAMPLE PREPARATION METHOD AND APPARATUS

Gas Phase Sample Preparation for Cryo-Electron Microscopy

SYSTEMS AND METHODS FOR PERFORMING SAMPLE LIFT-OUT FOR HIGHLY REACT...

METHOD FOR MEASURING A SAMPLE AND MICROSCOPE IMPLEMENTING THE METHOD

WORKSTATION, PREPARATION STATION AND METHOD FOR MANIPULATING AN ELE...

ANALYSIS DEVICE, ANALYSIS METHOD, AND STORAGE MEDIUM

Specimen Machining Device and Specimen Machining Method

Ion Milling Device

Method for Producing Lamella, Analysis System and Method for Analyz...

METHOD FOR CROSS-SECTION SAMPLE PREPARATION

Gas Phase Sample Preparation for Cryo-Electron Microscopy

METHOD FOR PREPARING A TEM SAMPLE

Ion Milling Apparatus and Sample Holder

METHOD OF PREPARING AND ANALYZING THIN FILMS

COMPOSITE CHARGED PARTICLE BEAM APPARATUS