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H01J2237/31745
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H
ELECTRICITY
H01
Electric elements
H01J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J2237/00
Discharge tubes exposing object to beam
Current Industry
H01J2237/31745
for preparing specimen to be viewed in microscopes or analyzed in microanalysers
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Patents Grants
last 30 patents
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Patent Grant
Systems and methods for performing sample lift-out for highly react...
Patent number
11,972,923
Issue date
Apr 30, 2024
FEI Company
Christopher Thompson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of preparing and analyzing thin films
Patent number
11,894,216
Issue date
Feb 6, 2024
Yangtze Memory Technologies Co., Ltd.
Jing Liu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for measuring a sample and microscope implementing the method
Patent number
11,848,172
Issue date
Dec 19, 2023
Carl Zeiss SMT GmbH
Dmitry Klochkov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of material deposition
Patent number
11,798,804
Issue date
Oct 24, 2023
FEI Company
Brian Roberts Routh
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Method, device and system for the treatment of biological cryogenic...
Patent number
11,735,404
Issue date
Aug 22, 2023
FEI Company
Alex De Marco
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for cross-section sample preparation
Patent number
11,726,050
Issue date
Aug 15, 2023
Fibics Incorporated
Michael William Phaneuf
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion milling apparatus and sample holder
Patent number
11,562,886
Issue date
Jan 24, 2023
Jeol Ltd.
Shogo Kataoka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Imaging method and imaging system
Patent number
11,532,454
Issue date
Dec 20, 2022
HITACHI HIGH-TECH CORPORATION
Hiroshi Fukuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Gas phase sample preparation for cryo-electron microscopy
Patent number
11,525,760
Issue date
Dec 13, 2022
Wisconsin Alumni Research Foundation
Joshua Coon
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Three-dimensional (3D) imaging system and method for nanostructure
Patent number
11,488,801
Issue date
Nov 1, 2022
INSTITUTE OF GEOLOGY AND GEOPHYSICS, CHINESE ACADEMY OF SCIENCES
Zhongming Du
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of sample preparation using dual ion beam trenching
Patent number
11,476,120
Issue date
Oct 18, 2022
Intel Corporation
Purushotham Kaushik Muthur Srinath
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Composite charged particle beam apparatus
Patent number
11,462,381
Issue date
Oct 4, 2022
HITACHI HIGH-TECH SCIENCE CORPORATION
Hiroyuki Suzuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for cross-section sample preparation
Patent number
11,366,074
Issue date
Jun 21, 2022
Fibics Incorporated
Michael William Phaneuf
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for preparing a TEM sample
Patent number
11,315,755
Issue date
Apr 26, 2022
Shanghai Huali Integrated Circuit Corporation
Qiang Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dose-based end-pointing for low-kV FIB milling in TEM sample prepar...
Patent number
11,313,042
Issue date
Apr 26, 2022
FEI Company
Thomas G. Miller
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Fiducial design for tilted or glancing mill operations with a charg...
Patent number
11,315,756
Issue date
Apr 26, 2022
FEI Company
Stacey Stone
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and compositions for micro-electron diffraction
Patent number
11,293,883
Issue date
Apr 5, 2022
Howard Hughes Medical Institute
Tamir Gonen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus
Patent number
11,239,046
Issue date
Feb 1, 2022
Hitachi High-Tech Science Corporation
Ayana Muraki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sample holder, ion milling apparatus, sample processing method, sam...
Patent number
11,226,273
Issue date
Jan 18, 2022
HITACHI HIGH-TECH CORPORATION
Atsushi Kamino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Diagonal compound mill
Patent number
11,158,487
Issue date
Oct 26, 2021
FEI Company
Clifford Russell Bugge
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Focused ion beam apparatus
Patent number
11,133,149
Issue date
Sep 28, 2021
Hitachi High-Tech Science Corporation
Toshihiro Mochizuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus, method, and program for processing and observing cross s...
Patent number
11,114,276
Issue date
Sep 7, 2021
Hitachi High-Tech Science Corporation
Xin Man
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Gas phase sample preparation for cryo-electron microscopy
Patent number
11,092,523
Issue date
Aug 17, 2021
Wisconsin Alumni Research Foundation
Joshua Coon
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of preparing thin film sample piece and charged particle bea...
Patent number
11,094,503
Issue date
Aug 17, 2021
Hitachi High-Tech Science Corporation
Masato Suzuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of material deposition
Patent number
11,069,523
Issue date
Jul 20, 2021
FEI Company
Brian Roberts Routh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Face-on, gas-assisted etching for plan-view lamellae preparation
Patent number
11,062,879
Issue date
Jul 13, 2021
FEI Company
Noel Thomas Franco
G01 - MEASURING TESTING
Information
Patent Grant
Depth-controllable ion milling
Patent number
11,049,690
Issue date
Jun 29, 2021
SELA—SOLUTIONS ENABLING NANO ANALYSIS LTD.
Vladimir Zheleznyak
G01 - MEASURING TESTING
Information
Patent Grant
Method of manipulating a sample in an evacuated chamber of a charge...
Patent number
11,017,980
Issue date
May 25, 2021
FEI Company
TomáTomá{hacek over (s)} Vystavel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Tomography-assisted TEM prep with requested intervention automation...
Patent number
11,004,651
Issue date
May 11, 2021
FEI Company
Roger Louis Alvis
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Automatic processing device
Patent number
10,971,330
Issue date
Apr 6, 2021
Hitachi High-Tech Science Corporation
Shota Torikawa
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR CREATING A SMOOTH DIAGONAL SURFACE USING A FOCUSED ION B...
Publication number
20240136150
Publication date
Apr 25, 2024
APPLIED MATERIALS ISRAEL LTD.
Yehuda Zur
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR PREPARING A MICROSCOPIC SAMPLE FOR FIB/SEM TOMOGRAPHY
Publication number
20240120175
Publication date
Apr 11, 2024
CARL ZEISS MICROSCOPY GMBH
Lorenz Lechner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM FOR PREPARING A SPECIMEN
Publication number
20240071720
Publication date
Feb 29, 2024
FEI Company
Jamie Dee Gravell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Application Management For Charged Particle Microscope Devices
Publication number
20240071717
Publication date
Feb 29, 2024
FEI Company
Pavel Potocek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR PRE-ALIGNING SAMPLES FOR MORE EFFICIENT PRO...
Publication number
20230377834
Publication date
Nov 23, 2023
FEI Company
Michal HROUZEK
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR CROSS-SECTION SAMPLE PREPARATION
Publication number
20230358696
Publication date
Nov 9, 2023
Fibics Incorporated
Michael William PHANEUF
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES
Publication number
20230343546
Publication date
Oct 26, 2023
CARL ZEISS MICROSCOPY GMBH
Michele Nicoletti
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ENDPOINTING WITH DETERMINATION OF REMAINING DISTANCE
Publication number
20230307209
Publication date
Sep 28, 2023
FEI Company
Zoltán Orémus
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR MICROMACHINING A SAMPLE USING A FOCUSED IO...
Publication number
20230298855
Publication date
Sep 21, 2023
DELMIC IP B.V.
Andries Pieter Johan EFFTING
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SAMPLE PREPARATION METHOD AND APPARATUS
Publication number
20230273136
Publication date
Aug 31, 2023
OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
John Lindsay
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Gas Phase Sample Preparation for Cryo-Electron Microscopy
Publication number
20230266214
Publication date
Aug 24, 2023
Wisconsin Alumni Research Foundation
Joshua COON
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR PERFORMING SAMPLE LIFT-OUT FOR HIGHLY REACT...
Publication number
20230215690
Publication date
Jul 6, 2023
FEI Company
Christopher THOMPSON
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR MEASURING A SAMPLE AND MICROSCOPE IMPLEMENTING THE METHOD
Publication number
20230145897
Publication date
May 11, 2023
Carl Zeiss SMT GMBH
Dmitry Klochkov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
WORKSTATION, PREPARATION STATION AND METHOD FOR MANIPULATING AN ELE...
Publication number
20230073506
Publication date
Mar 9, 2023
Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V.
Sebastian TACKE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ANALYSIS DEVICE, ANALYSIS METHOD, AND STORAGE MEDIUM
Publication number
20230067374
Publication date
Mar 2, 2023
Honda Motor Co., Ltd.
Atsushi Sakurai
G01 - MEASURING TESTING
Information
Patent Application
Specimen Machining Device and Specimen Machining Method
Publication number
20220392739
Publication date
Dec 8, 2022
JEOL Ltd.
Munehiro Kozuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion Milling Device
Publication number
20220367148
Publication date
Nov 17, 2022
Hitachi High-Tech Corporation
Shota AIDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for Producing Lamella, Analysis System and Method for Analyz...
Publication number
20220367144
Publication date
Nov 17, 2022
Hitachi High-Tech Corporation
Atsushi SAWADA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR CROSS-SECTION SAMPLE PREPARATION
Publication number
20220317072
Publication date
Oct 6, 2022
Fibics Incorporated
Michael William PHANEUF
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Gas Phase Sample Preparation for Cryo-Electron Microscopy
Publication number
20220065761
Publication date
Mar 3, 2022
Wisconsin Alumni Research Foundation
Joshua COON
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR PREPARING A TEM SAMPLE
Publication number
20220068600
Publication date
Mar 3, 2022
Shanghai Huali Integrated Circuit Corporation
Qiang CHEN
G01 - MEASURING TESTING
Information
Patent Application
Ion Milling Apparatus and Sample Holder
Publication number
20220051870
Publication date
Feb 17, 2022
JEOL Ltd.
Shogo Kataoka
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF PREPARING AND ANALYZING THIN FILMS
Publication number
20220028655
Publication date
Jan 27, 2022
Yangtze Memory Technologies Co., Ltd.
Jing LIU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COMPOSITE CHARGED PARTICLE BEAM APPARATUS
Publication number
20210151283
Publication date
May 20, 2021
HITACHI HIGH-TECH SCIENCE CORPORATION
Hiroyuki SUZUKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF MATERIAL DEPOSITION
Publication number
20210118678
Publication date
Apr 22, 2021
FEI Company
Brian Roberts Routh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD, DEVICE AND SYSTEM FOR THE TREATMENT OF BIOLOGICAL CRYOGENIC...
Publication number
20210066056
Publication date
Mar 4, 2021
FEI Company
Alex DE MARCO
G01 - MEASURING TESTING
Information
Patent Application
A Device for Extracting and Placing a Lamella
Publication number
20210050180
Publication date
Feb 18, 2021
TESCAN Brno, s.r.o.
Andrey Denisyuk
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DIAGONAL COMPOUND MILL
Publication number
20200312618
Publication date
Oct 1, 2020
FEI Company
Clifford Russell Bugge
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF PREPARING THIN FILM SAMPLE PIECE AND CHARGED PARTICLE BEA...
Publication number
20200266031
Publication date
Aug 20, 2020
HITACHI HIGH-TECH SCIENCE CORPORATION
Masato SUZUKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR CROSS-SECTION SAMPLE PREPARATION
Publication number
20200264115
Publication date
Aug 20, 2020
Fibics Incorporated
Michael William PHANEUF
G01 - MEASURING TESTING