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G01N2201/1218
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2201/00
Features of devices classified in G01N21/00
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G01N2201/1218
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Patents Grants
last 30 patents
Information
Patent Grant
Ringer solution detection device and detection device
Patent number
12,105,041
Issue date
Oct 1, 2024
UIF (University Industry Foundation), Yonsei University
Cheol Min Park
G01 - MEASURING TESTING
Information
Patent Grant
Concentration measurement device
Patent number
11,796,458
Issue date
Oct 24, 2023
Fujikin Incorporated
Masaaki Nagase
G01 - MEASURING TESTING
Information
Patent Grant
Concentration measurement device
Patent number
11,686,671
Issue date
Jun 27, 2023
Fujikin Incorporated
Masaaki Nagase
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Plasma-based detector and methods using the same for measuring and...
Patent number
11,474,043
Issue date
Oct 18, 2022
Mécanique Analytique Inc.
Yves Gamache
G01 - MEASURING TESTING
Information
Patent Grant
Portable moisture analyzer for natural gas
Patent number
10,705,016
Issue date
Jul 7, 2020
GE Infrastructure Sensing, LLC
John Sanroma
G01 - MEASURING TESTING
Information
Patent Grant
Arrangement for measuring gas concentrations
Patent number
10,634,606
Issue date
Apr 28, 2020
Bluepoint-Medical GmbH & Co. KG
Bernd Lindner
G02 - OPTICS
Information
Patent Grant
Device for correcting light absorption spectrum, method of manufact...
Patent number
10,362,996
Issue date
Jul 30, 2019
Samsung Electronics Co., Ltd.
Sangkyu Kim
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Portable moisture analyzer for natural gas
Patent number
10,324,030
Issue date
Jun 18, 2019
GE Infrastructure Sensing, LLC
John Sanroma
G01 - MEASURING TESTING
Information
Patent Grant
Gas concentration sensor with improved accuracy
Patent number
10,288,559
Issue date
May 14, 2019
Honeywell International Inc.
Raghavendra Muniraju
G01 - MEASURING TESTING
Information
Patent Grant
System and method for measuring concentration of a trace gas in a g...
Patent number
10,024,787
Issue date
Jul 17, 2018
General Electric Company
Rachit Sharma
G01 - MEASURING TESTING
Information
Patent Grant
Diamond ATR artefact correction
Patent number
10,018,561
Issue date
Jul 10, 2018
PerkinElmer Singapore PTE. LTD.
Robert Alan Hoult
G01 - MEASURING TESTING
Information
Patent Grant
Collisional broadening compensation using real or near-real time va...
Patent number
9,618,391
Issue date
Apr 11, 2017
SpectraSensors, Inc.
Alfred Feitisch
G01 - MEASURING TESTING
Information
Patent Grant
Method for the laser spectroscopy of gases
Patent number
9,046,481
Issue date
Jun 2, 2015
Sick AG
Julian Edler
G01 - MEASURING TESTING
Information
Patent Grant
System and method for dynamically measuring oxygen levels
Patent number
8,942,944
Issue date
Jan 27, 2015
Laguna Research, Inc.
David E. Forsyth
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspecting method and apparatus
Patent number
8,134,701
Issue date
Mar 13, 2012
Hitachi High-Technologies Corporation
Shuichi Chikamatsu
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspecting apparatus
Patent number
7,733,475
Issue date
Jun 8, 2010
Hitachi High-Technologies Corporation
Shuichi Chikamatsu
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspecting apparatus
Patent number
7,535,561
Issue date
May 19, 2009
Hitachi High-Technologies Corporation
Shuichi Chikamatsu
G01 - MEASURING TESTING
Information
Patent Grant
Pressure-invariant trace gas detection
Patent number
7,508,521
Issue date
Mar 24, 2009
SpectraSensors, Inc.
Xiang Liu
G01 - MEASURING TESTING
Information
Patent Grant
Detecting minority gaseous species by light-emission spectroscopy
Patent number
7,403,283
Issue date
Jul 22, 2008
Alcatel
Gloria Sogan
G01 - MEASURING TESTING
Information
Patent Grant
Compensated infrared absorption sensor for carbon dioxide and other...
Patent number
6,969,857
Issue date
Nov 29, 2005
Southwest Research Institute
Thomas E. Owen
G01 - MEASURING TESTING
Information
Patent Grant
Optical system and methods that compensate for changes in atmospher...
Patent number
6,842,286
Issue date
Jan 11, 2005
Agilent Technologies, Inc.
John Phillip Ertel
G01 - MEASURING TESTING
Information
Patent Grant
Device for measuring gas concentration
Patent number
6,710,347
Issue date
Mar 23, 2004
Sensors, Inc.
Gideon Eden
G01 - MEASURING TESTING
Information
Patent Grant
Constant pressure gas cell
Patent number
5,245,405
Issue date
Sep 14, 1993
BOC Health Care, Inc.
John R. Mitchell
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for emission testing
Patent number
4,881,183
Issue date
Nov 14, 1989
Sun Electric Corporation
David E. Groe
G01 - MEASURING TESTING
Information
Patent Grant
Gas analyzers
Patent number
4,859,859
Issue date
Aug 22, 1989
Cascadia Technology Corporation
Daniel W. Knodle
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Patents Applications
last 30 patents
Information
Patent Application
SIGNAL-TO-NOISE RATIO FOR PHOTOACOUSTIC GAS SENSORS
Publication number
20240060875
Publication date
Feb 22, 2024
InvenSense, Inc.
Jeremy Parker
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
RINGER SOLUTION DETECTION DEVICE AND DETECTION DEVICE
Publication number
20230128762
Publication date
Apr 27, 2023
UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY
Cheol Min PARK
G01 - MEASURING TESTING
Information
Patent Application
CONCENTRATION MEASUREMENT DEVICE
Publication number
20220074851
Publication date
Mar 10, 2022
Fujikin Incorporated
Masaaki NAGASE
G01 - MEASURING TESTING
Information
Patent Application
CONCENTRATION MEASUREMENT DEVICE
Publication number
20210396657
Publication date
Dec 23, 2021
Fujikin Incorporated
Masaaki NAGASE
G01 - MEASURING TESTING
Information
Patent Application
PLASMA-BASED DETECTOR AND METHODS USING THE SAME FOR MEASURING AND...
Publication number
20210156805
Publication date
May 27, 2021
MECANIQUE ANALYTIQUE INC.
Yves Gamache
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR CORRECTING LIGHT ABSORPTION SPECTRUM, METHOD OF MANUFACT...
Publication number
20160089088
Publication date
Mar 31, 2016
Samsung Electronics Co., Ltd.
Sangkyu KIM
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR THE LASER SPECTROSCOPY OF GASES
Publication number
20140340684
Publication date
Nov 20, 2014
SICK AG
Julian EDLER
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR THE LASER SPECTROSCOPY OF GASES
Publication number
20140067282
Publication date
Mar 6, 2014
SICK AG
Thomas BEYER
G01 - MEASURING TESTING
Information
Patent Application
COLLISIONAL BROADENING COMPENSATION USING REAL OR NEAR-REAL TIME VA...
Publication number
20130250301
Publication date
Sep 26, 2013
Alfred Feitisch
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR DYNAMICALLY MEASURING OXYGEN LEVELS
Publication number
20130066564
Publication date
Mar 14, 2013
David E. Forsyth
G01 - MEASURING TESTING
Information
Patent Application
SENSOR UNIT AND MEASUREMENT METHOD
Publication number
20120291515
Publication date
Nov 22, 2012
PreSens-Precision Sensing GmbH
Achim Stangelmayer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
NON-DISPERSIVE INFRARED SENSOR MEASUREMENT SYSTEM AND METHOD
Publication number
20120078532
Publication date
Mar 29, 2012
David Edward Forsyth
G01 - MEASURING TESTING
Information
Patent Application
Photoacoustic Gas Detector with Integrated Signal Processing
Publication number
20120055232
Publication date
Mar 8, 2012
Honeywell International Inc.
Walter R. Thorson
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTING APPARATUS
Publication number
20100214561
Publication date
Aug 26, 2010
Hitachi High-Technologies Corporation
Shuichi Chikamatsu
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTING APPARATUS
Publication number
20090207405
Publication date
Aug 20, 2009
Hitachi High-Technologies Corporation
Shuichi Chikamatsu
G01 - MEASURING TESTING
Information
Patent Application
Pressure-invariant trace gas detection
Publication number
20080225296
Publication date
Sep 18, 2008
SpectraSensors, Inc.
Xiang Liu
G01 - MEASURING TESTING
Information
Patent Application
Defect inspecting apparatus
Publication number
20070216896
Publication date
Sep 20, 2007
Hitachi High-Technologies Corporation
Shuichi Chikamatsu
G01 - MEASURING TESTING
Information
Patent Application
Detecting minority gaseous species by light-emission spectroscopy
Publication number
20050190364
Publication date
Sep 1, 2005
ALCATEL
Gloria Sogan
G01 - MEASURING TESTING
Information
Patent Application
Compensated infrared absorption sensor for carbon dioxide and other...
Publication number
20040206906
Publication date
Oct 21, 2004
Southwest Research Institute
Thomas E. Owen
G01 - MEASURING TESTING
Information
Patent Application
Optical system and methods that compensate for changes in atmospher...
Publication number
20040042079
Publication date
Mar 4, 2004
John Phillip Ertel
G02 - OPTICS