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for spectrometry, i.e. using an analysing crystal
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G01N23/2076
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N23/00
Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00
Current Industry
G01N23/2076
for spectrometry, i.e. using an analysing crystal
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Patents Grants
last 30 patents
Information
Patent Grant
X-ray fluorescence analyzer
Patent number
12,135,299
Issue date
Nov 5, 2024
Shimadzu Corporation
Takuro Izumi
G01 - MEASURING TESTING
Information
Patent Grant
X-ray sequential array wavelength dispersive spectrometer
Patent number
11,885,755
Issue date
Jan 30, 2024
Sigray, Inc.
Wenbing Yun
G01 - MEASURING TESTING
Information
Patent Grant
Single-crystal X-ray structure analysis system
Patent number
11,879,857
Issue date
Jan 23, 2024
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
Single-crystal X-ray structure analysis apparatus and method, and s...
Patent number
11,874,238
Issue date
Jan 16, 2024
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for interpreting high energy interactions
Patent number
11,874,240
Issue date
Jan 16, 2024
Decision Tree, LLC
Brandon Lee Goodchild Drake
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Advanced X-ray emission spectrometers
Patent number
11,874,239
Issue date
Jan 16, 2024
UChicago Argonne, LLC
Chengjun Sun
G01 - MEASURING TESTING
Information
Patent Grant
Integrated, portable sample analysis system and method
Patent number
11,796,486
Issue date
Oct 24, 2023
Spectro Scientific, Inc.
Patrick F. Henning
G01 - MEASURING TESTING
Information
Patent Grant
X-ray spectrometer and methods for use
Patent number
11,796,490
Issue date
Oct 24, 2023
University of Washington
Gerald Todd Seidler
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-ray spectroscopic analysis apparatus and elemental analysis method
Patent number
11,796,491
Issue date
Oct 24, 2023
Shimadzu Corporation
Shinji Miyauchi
G01 - MEASURING TESTING
Information
Patent Grant
Flex plate with removable inserts and cover
Patent number
11,795,567
Issue date
Oct 24, 2023
Brookhaven Science Associates, LLC
Alexei S. Soares
C30 - CRYSTAL GROWTH
Information
Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
Patent number
11,796,492
Issue date
Oct 24, 2023
INEL S.A.S.
Henry Pilliere
G01 - MEASURING TESTING
Information
Patent Grant
X-ray analysis device including a spectrometer to detect characteri...
Patent number
11,740,190
Issue date
Aug 29, 2023
Shimadzu Corporation
Kenji Sato
G01 - MEASURING TESTING
Information
Patent Grant
Fluorescent X-ray analysis apparatus comprising a plurality of X-ra...
Patent number
11,733,185
Issue date
Aug 22, 2023
Rigaku Corporation
Kiyoshi Ogata
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for manufacturing superconductor devices
Patent number
11,719,653
Issue date
Aug 8, 2023
PSIQUANTUM CORP.
Faraz Najafi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Determining the age of a tunnel
Patent number
11,585,801
Issue date
Feb 21, 2023
The Mitre Corporation
Robert Latham
G01 - MEASURING TESTING
Information
Patent Grant
Estimating wear for BHA components using borehole hardness
Patent number
11,579,329
Issue date
Feb 14, 2023
Halliburton Energy Services, Inc.
Ian David Campbell Mitchell
E21 - EARTH DRILLING MINING
Information
Patent Grant
Support system for specified inspection, support method for specifi...
Patent number
11,561,184
Issue date
Jan 24, 2023
HITACHI HIGH-TECH CORPORATION
Nobuyoshi Tada
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for combined reflectometry and photoelectron sp...
Patent number
11,536,674
Issue date
Dec 27, 2022
KLA Corporation
Andrei V. Shchegrov
G01 - MEASURING TESTING
Information
Patent Grant
Intelligent lithology identification system and method based on ima...
Patent number
11,536,639
Issue date
Dec 27, 2022
Shandong University
Shucai Li
G01 - MEASURING TESTING
Information
Patent Grant
Analytical method and apparatus
Patent number
11,536,675
Issue date
Dec 27, 2022
Jeol Ltd.
Takanori Murano
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence spectrometer
Patent number
11,513,086
Issue date
Nov 29, 2022
Rigaku Corporation
Yoshiyuki Kataoka
G01 - MEASURING TESTING
Information
Patent Grant
X-ray analyzer
Patent number
11,467,103
Issue date
Oct 11, 2022
APPLIED SCIENCE LABORATORY CO., LTD.
Hiroyoshi Soejima
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-ray analyzer
Patent number
11,467,106
Issue date
Oct 11, 2022
Jeol Ltd.
Kazunori Tsukamoto
G01 - MEASURING TESTING
Information
Patent Grant
Reaction control and mass spectrometry workstation for coupling an...
Patent number
11,435,301
Issue date
Sep 6, 2022
ShanghaiTech University
Yong Yang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
X-ray analysis device and peak search method
Patent number
11,435,303
Issue date
Sep 6, 2022
Shimadzu Corporation
Hiroshi Sakamae
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for analyzing chemical state of battery material
Patent number
11,378,530
Issue date
Jul 5, 2022
Shimadzu Corporation
Kenji Sato
G01 - MEASURING TESTING
Information
Patent Grant
Analysis device and spectrum generation method
Patent number
11,353,414
Issue date
Jun 7, 2022
Jeol Ltd.
Takanori Murano
G01 - MEASURING TESTING
Information
Patent Grant
Divergent beam two dimensional diffraction
Patent number
11,275,039
Issue date
Mar 15, 2022
Jonathan Giencke
G01 - MEASURING TESTING
Information
Patent Grant
Graphene-based electro-microfluidic devices and methods for protein...
Patent number
11,175,244
Issue date
Nov 16, 2021
University of Massachusetts
Sarah L. Perry
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
X-ray fluorescence spectrometer
Patent number
11,156,569
Issue date
Oct 26, 2021
Rigaku Corporation
Yasujiro Yamada
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
X-RAY ANALYZER
Publication number
20240361261
Publication date
Oct 31, 2024
Shimadzu Corporation
Keijiro SUZUKI
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS
Publication number
20240280515
Publication date
Aug 22, 2024
Sigray, Inc.
Wenbing Yun
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
SEMICONDUCTOR METROLOGY SYSTEM AND METHOD
Publication number
20240193473
Publication date
Jun 13, 2024
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
Yun-Chung Teng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Systems And Methods For Interpreting High Energy Interactions
Publication number
20240125717
Publication date
Apr 18, 2024
DECISION TREE, LLC
Brandon Lee Goodchild Drake
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
XRS INSPECTION AND SORTING OF PLASTIC CONTAINING OBJECTS PROGRESSIN...
Publication number
20240035989
Publication date
Feb 1, 2024
Security Matters Ltd.
Haggai ALON
G01 - MEASURING TESTING
Information
Patent Application
DIFFRACTIVE ANALYZER OF PATIENT TISSUE
Publication number
20230341340
Publication date
Oct 26, 2023
Arion Diagnostics, Inc.
Alexander P. Lazarev
G01 - MEASURING TESTING
Information
Patent Application
MULTI-PHYSICAL FIELD MEASUREMENT DEVICE FOR METAL SOLIDIFICATION PR...
Publication number
20230314349
Publication date
Oct 5, 2023
SHANGHAI JIAOTONG UNIVERSITY
Jiao ZHANG
G01 - MEASURING TESTING
Information
Patent Application
Advanced X-Ray Emission Spectrometers
Publication number
20230288352
Publication date
Sep 14, 2023
UChicago Argonne, LLC
Chengjun Sun
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETER
Publication number
20220349844
Publication date
Nov 3, 2022
EasyXAFS, LLC
William Holden
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR CLASSIFICATION OF SAMPLES
Publication number
20220317069
Publication date
Oct 6, 2022
Security Matters Ltd.
Yair GROF
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE SPECTROMETER
Publication number
20220260506
Publication date
Aug 18, 2022
Rigaku Corporation
Yoshiyuki KATAOKA
G01 - MEASURING TESTING
Information
Patent Application
DIFFRACTOMETER FOR CHARGED-PARTICLE CRYSTALLOGRAPHY
Publication number
20220238299
Publication date
Jul 28, 2022
ELDICO SCIENTIFIC AG
Gunther STEINFELD
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS SYSTEM
Publication number
20220128494
Publication date
Apr 28, 2022
Rigaku Corporation
Takashi SATO
G01 - MEASURING TESTING
Information
Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND METHOD, AND S...
Publication number
20220128495
Publication date
Apr 28, 2022
Rigaku Corporation
Takashi SATO
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR IDENTIFYING NUCLEAR THREATS
Publication number
20220074876
Publication date
Mar 10, 2022
CAEN TECHNOLOGIES, INC.
Massimo Morichi
G01 - MEASURING TESTING
Information
Patent Application
X-RAY SPECTROMETER AND METHODS FOR USE
Publication number
20220003694
Publication date
Jan 6, 2022
University of Washington
Gerald Todd SEIDLER
G01 - MEASURING TESTING
Information
Patent Application
X-RAY ANALYZER
Publication number
20220003691
Publication date
Jan 6, 2022
APPLIED SCIENCE LABORATORY CO., LTD
Hiroyoshi SOEJIMA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY ANALYSIS DEVICE AND X-RAY ANALYSIS METHOD
Publication number
20210372953
Publication date
Dec 2, 2021
Shimadzu Corporation
Kenji SATO
G01 - MEASURING TESTING
Information
Patent Application
STOCHASTIC BAG GENERATOR
Publication number
20210350045
Publication date
Nov 11, 2021
Arizona Board of Regents on behalf of The University of Arizona
Amit Ashok
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR INTERPRETING HIGH ENERGY INTERACTIONS
Publication number
20210341400
Publication date
Nov 4, 2021
DECISION TREE, LLC
Brandon Lee Goodchild Drake
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Flex Plate with Removable Inserts and Cover
Publication number
20210207284
Publication date
Jul 8, 2021
Brookhaven Science Associates, LLC
Alexei S. Soares
C07 - ORGANIC CHEMISTRY
Information
Patent Application
AUTOMATIC MULTIPLE SAMPLE PREPARATION SYSTEM OF FUSED BEADS FOR XRF...
Publication number
20210088458
Publication date
Mar 25, 2021
JOSE MARIA LAS NAVAS GARCIA
G01 - MEASURING TESTING
Information
Patent Application
Methods And Systems For Semiconductor Metrology Based On Wavelength...
Publication number
20210063329
Publication date
Mar 4, 2021
KLA Corporation
Alexander Kuznetsov
G01 - MEASURING TESTING
Information
Patent Application
Systems And Methods For Combined Reflectometry And Photoelectron Sp...
Publication number
20210055237
Publication date
Feb 25, 2021
KLA Corporation
Andrei V. Shchegrov
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR ANALYZING CHEMICAL STATE OF BATTERY MATERIAL
Publication number
20200386696
Publication date
Dec 10, 2020
Shimadzu Corporation
Kenji SATO
G01 - MEASURING TESTING
Information
Patent Application
Flex Plate with Removable Inserts and Cover
Publication number
20200340136
Publication date
Oct 29, 2020
Brookhaven Science Associates, LLC
Alexei S. Soares
C30 - CRYSTAL GROWTH
Information
Patent Application
DETERMINING THE AGE OF A TUNNEL
Publication number
20200340969
Publication date
Oct 29, 2020
The MITRE Corporation
Robert LATHAM
G01 - MEASURING TESTING
Information
Patent Application
X-RAY SPECTROMETER
Publication number
20200225172
Publication date
Jul 16, 2020
Shimadzu Corporation
Kenji SATO
G01 - MEASURING TESTING
Information
Patent Application
X-RAY SPECTROMETER AND CHEMICAL STATE ANALYSIS METHOD USING THE SAME
Publication number
20200225173
Publication date
Jul 16, 2020
SHIMADZU CORPORATION
Kenji SATO
G01 - MEASURING TESTING
Information
Patent Application
DEVICES AND SYSTEMS FOR IMPROVED COLLECTION EFFICIENCY AND RESOLUTI...
Publication number
20200200691
Publication date
Jun 25, 2020
EDAX, Incorporated
Patrick Paul Camus
G02 - OPTICS