for spectrometry, i.e. using an analysing crystal

Industry

CPC
G01N23/2076

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/2076for spectrometry, i.e. using an analysing crystal

Industries

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Patents Grantslast 30 patents

Information Patent Grant
X-ray detector system with at least two stacked flat Bragg diffractors
- Patent number 12,209,977
- Issue date Jan 28, 2025
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method for measuring distribution of pores in electrode for seconda...
- Patent number 12,196,651
- Issue date Jan 14, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Hoon Han
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,135,299
- Issue date Nov 5, 2024
- Shimadzu Corporation
- Takuro Izumi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray sequential array wavelength dispersive spectrometer
- Patent number 11,885,755
- Issue date Jan 30, 2024
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Single-crystal X-ray structure analysis system
- Patent number 11,879,857
- Issue date Jan 23, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Single-crystal X-ray structure analysis apparatus and method, and s...
- Patent number 11,874,238
- Issue date Jan 16, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for interpreting high energy interactions
- Patent number 11,874,240
- Issue date Jan 16, 2024
- Decision Tree, LLC
- Brandon Lee Goodchild Drake
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Advanced X-ray emission spectrometers
- Patent number 11,874,239
- Issue date Jan 16, 2024
- UChicago Argonne, LLC
- Chengjun Sun
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer and methods for use
- Patent number 11,796,490
- Issue date Oct 24, 2023
- University of Washington
- Gerald Todd Seidler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray spectroscopic analysis apparatus and elemental analysis method
- Patent number 11,796,491
- Issue date Oct 24, 2023
- Shimadzu Corporation
- Shinji Miyauchi
- G01 - MEASURING TESTING
Information Patent Grant
Integrated, portable sample analysis system and method
- Patent number 11,796,486
- Issue date Oct 24, 2023
- Spectro Scientific, Inc.
- Patrick F. Henning
- G01 - MEASURING TESTING
Information Patent Grant
Flex plate with removable inserts and cover
- Patent number 11,795,567
- Issue date Oct 24, 2023
- Brookhaven Science Associates, LLC
- Alexei S. Soares
- C30 - CRYSTAL GROWTH
Information Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
- Patent number 11,796,492
- Issue date Oct 24, 2023
- INEL S.A.S.
- Henry Pilliere
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis device including a spectrometer to detect characteri...
- Patent number 11,740,190
- Issue date Aug 29, 2023
- Shimadzu Corporation
- Kenji Sato
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analysis apparatus comprising a plurality of X-ra...
- Patent number 11,733,185
- Issue date Aug 22, 2023
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for manufacturing superconductor devices
- Patent number 11,719,653
- Issue date Aug 8, 2023
- PSIQUANTUM CORP.
- Faraz Najafi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determining the age of a tunnel
- Patent number 11,585,801
- Issue date Feb 21, 2023
- The Mitre Corporation
- Robert Latham
- G01 - MEASURING TESTING
Information Patent Grant
Estimating wear for BHA components using borehole hardness
- Patent number 11,579,329
- Issue date Feb 14, 2023
- Halliburton Energy Services, Inc.
- Ian David Campbell Mitchell
- E21 - EARTH DRILLING MINING
Information Patent Grant
Support system for specified inspection, support method for specifi...
- Patent number 11,561,184
- Issue date Jan 24, 2023
- HITACHI HIGH-TECH CORPORATION
- Nobuyoshi Tada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for combined reflectometry and photoelectron sp...
- Patent number 11,536,674
- Issue date Dec 27, 2022
- KLA Corporation
- Andrei V. Shchegrov
- G01 - MEASURING TESTING
Information Patent Grant
Intelligent lithology identification system and method based on ima...
- Patent number 11,536,639
- Issue date Dec 27, 2022
- Shandong University
- Shucai Li
- G01 - MEASURING TESTING
Information Patent Grant
Analytical method and apparatus
- Patent number 11,536,675
- Issue date Dec 27, 2022
- Jeol Ltd.
- Takanori Murano
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 11,513,086
- Issue date Nov 29, 2022
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer
- Patent number 11,467,103
- Issue date Oct 11, 2022
- APPLIED SCIENCE LABORATORY CO., LTD.
- Hiroyoshi Soejima
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray analyzer
- Patent number 11,467,106
- Issue date Oct 11, 2022
- Jeol Ltd.
- Kazunori Tsukamoto
- G01 - MEASURING TESTING
Information Patent Grant
Reaction control and mass spectrometry workstation for coupling an...
- Patent number 11,435,301
- Issue date Sep 6, 2022
- ShanghaiTech University
- Yong Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray analysis device and peak search method
- Patent number 11,435,303
- Issue date Sep 6, 2022
- Shimadzu Corporation
- Hiroshi Sakamae
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for analyzing chemical state of battery material
- Patent number 11,378,530
- Issue date Jul 5, 2022
- Shimadzu Corporation
- Kenji Sato
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device and spectrum generation method
- Patent number 11,353,414
- Issue date Jun 7, 2022
- Jeol Ltd.
- Takanori Murano
- G01 - MEASURING TESTING
Information Patent Grant
Divergent beam two dimensional diffraction
- Patent number 11,275,039
- Issue date Mar 15, 2022
- Jonathan Giencke
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY ANALYZER
- Publication number 20240361261
- Publication date Oct 31, 2024
- Shimadzu Corporation
- Keijiro SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS
- Publication number 20240280515
- Publication date Aug 22, 2024
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
SEMICONDUCTOR METROLOGY SYSTEM AND METHOD
- Publication number 20240193473
- Publication date Jun 13, 2024
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Yun-Chung Teng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems And Methods For Interpreting High Energy Interactions
- Publication number 20240125717
- Publication date Apr 18, 2024
- DECISION TREE, LLC
- Brandon Lee Goodchild Drake
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
XRS INSPECTION AND SORTING OF PLASTIC CONTAINING OBJECTS PROGRESSIN...
- Publication number 20240035989
- Publication date Feb 1, 2024
- Security Matters Ltd.
- Haggai ALON
- G01 - MEASURING TESTING
Information Patent Application
DIFFRACTIVE ANALYZER OF PATIENT TISSUE
- Publication number 20230341340
- Publication date Oct 26, 2023
- Arion Diagnostics, Inc.
- Alexander P. Lazarev
- G01 - MEASURING TESTING
Information Patent Application
MULTI-PHYSICAL FIELD MEASUREMENT DEVICE FOR METAL SOLIDIFICATION PR...
- Publication number 20230314349
- Publication date Oct 5, 2023
- SHANGHAI JIAOTONG UNIVERSITY
- Jiao ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Advanced X-Ray Emission Spectrometers
- Publication number 20230288352
- Publication date Sep 14, 2023
- UChicago Argonne, LLC
- Chengjun Sun
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER
- Publication number 20220349844
- Publication date Nov 3, 2022
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CLASSIFICATION OF SAMPLES
- Publication number 20220317069
- Publication date Oct 6, 2022
- Security Matters Ltd.
- Yair GROF
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20220260506
- Publication date Aug 18, 2022
- Rigaku Corporation
- Yoshiyuki KATAOKA
- G01 - MEASURING TESTING
Information Patent Application
DIFFRACTOMETER FOR CHARGED-PARTICLE CRYSTALLOGRAPHY
- Publication number 20220238299
- Publication date Jul 28, 2022
- ELDICO SCIENTIFIC AG
- Gunther STEINFELD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS SYSTEM
- Publication number 20220128494
- Publication date Apr 28, 2022
- Rigaku Corporation
- Takashi SATO
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND METHOD, AND S...
- Publication number 20220128495
- Publication date Apr 28, 2022
- Rigaku Corporation
- Takashi SATO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR IDENTIFYING NUCLEAR THREATS
- Publication number 20220074876
- Publication date Mar 10, 2022
- CAEN TECHNOLOGIES, INC.
- Massimo Morichi
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SPECTROMETER AND METHODS FOR USE
- Publication number 20220003694
- Publication date Jan 6, 2022
- University of Washington
- Gerald Todd SEIDLER
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20220003691
- Publication date Jan 6, 2022
- APPLIED SCIENCE LABORATORY CO., LTD
- Hiroyoshi SOEJIMA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS DEVICE AND X-RAY ANALYSIS METHOD
- Publication number 20210372953
- Publication date Dec 2, 2021
- Shimadzu Corporation
- Kenji SATO
- G01 - MEASURING TESTING
Information Patent Application
STOCHASTIC BAG GENERATOR
- Publication number 20210350045
- Publication date Nov 11, 2021
- Arizona Board of Regents on behalf of The University of Arizona
- Amit Ashok
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR INTERPRETING HIGH ENERGY INTERACTIONS
- Publication number 20210341400
- Publication date Nov 4, 2021
- DECISION TREE, LLC
- Brandon Lee Goodchild Drake
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Flex Plate with Removable Inserts and Cover
- Publication number 20210207284
- Publication date Jul 8, 2021
- Brookhaven Science Associates, LLC
- Alexei S. Soares
- C07 - ORGANIC CHEMISTRY
Information Patent Application
AUTOMATIC MULTIPLE SAMPLE PREPARATION SYSTEM OF FUSED BEADS FOR XRF...
- Publication number 20210088458
- Publication date Mar 25, 2021
- JOSE MARIA LAS NAVAS GARCIA
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Semiconductor Metrology Based On Wavelength...
- Publication number 20210063329
- Publication date Mar 4, 2021
- KLA Corporation
- Alexander Kuznetsov
- G01 - MEASURING TESTING
Information Patent Application
Systems And Methods For Combined Reflectometry And Photoelectron Sp...
- Publication number 20210055237
- Publication date Feb 25, 2021
- KLA Corporation
- Andrei V. Shchegrov
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR ANALYZING CHEMICAL STATE OF BATTERY MATERIAL
- Publication number 20200386696
- Publication date Dec 10, 2020
- Shimadzu Corporation
- Kenji SATO
- G01 - MEASURING TESTING
Information Patent Application
Flex Plate with Removable Inserts and Cover
- Publication number 20200340136
- Publication date Oct 29, 2020
- Brookhaven Science Associates, LLC
- Alexei S. Soares
- C30 - CRYSTAL GROWTH
Information Patent Application
DETERMINING THE AGE OF A TUNNEL
- Publication number 20200340969
- Publication date Oct 29, 2020
- The MITRE Corporation
- Robert LATHAM
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SPECTROMETER
- Publication number 20200225172
- Publication date Jul 16, 2020
- Shimadzu Corporation
- Kenji SATO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SPECTROMETER AND CHEMICAL STATE ANALYSIS METHOD USING THE SAME
- Publication number 20200225173
- Publication date Jul 16, 2020
- SHIMADZU CORPORATION
- Kenji SATO
- G01 - MEASURING TESTING
Information Patent Application
DEVICES AND SYSTEMS FOR IMPROVED COLLECTION EFFICIENCY AND RESOLUTI...
- Publication number 20200200691
- Publication date Jun 25, 2020
- EDAX, Incorporated
- Patrick Paul Camus
- G02 - OPTICS

for spectrometry, i.e. using an analysing crystal

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

X-ray detector system with at least two stacked flat Bragg diffractors

Method for measuring distribution of pores in electrode for seconda...

X-ray fluorescence analyzer

X-ray sequential array wavelength dispersive spectrometer

Single-crystal X-ray structure analysis system

Single-crystal X-ray structure analysis apparatus and method, and s...

Systems and methods for interpreting high energy interactions

Advanced X-ray emission spectrometers

X-ray spectrometer and methods for use

X-ray spectroscopic analysis apparatus and elemental analysis method

Integrated, portable sample analysis system and method

Flex plate with removable inserts and cover

Apparatuses and methods for combined simultaneous analyses of mater...

X-ray analysis device including a spectrometer to detect characteri...

Fluorescent X-ray analysis apparatus comprising a plurality of X-ra...

Methods and systems for manufacturing superconductor devices

Determining the age of a tunnel

Estimating wear for BHA components using borehole hardness

Support system for specified inspection, support method for specifi...

Systems and methods for combined reflectometry and photoelectron sp...

Intelligent lithology identification system and method based on ima...

Analytical method and apparatus

X-ray fluorescence spectrometer

X-ray analyzer

X-ray analyzer

Reaction control and mass spectrometry workstation for coupling an...

X-ray analysis device and peak search method

Apparatus and method for analyzing chemical state of battery material

Analysis device and spectrum generation method

Divergent beam two dimensional diffraction

Patents Applicationslast 30 patents

X-RAY ANALYZER

X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS

SEMICONDUCTOR METROLOGY SYSTEM AND METHOD

Systems And Methods For Interpreting High Energy Interactions

XRS INSPECTION AND SORTING OF PLASTIC CONTAINING OBJECTS PROGRESSIN...

DIFFRACTIVE ANALYZER OF PATIENT TISSUE

MULTI-PHYSICAL FIELD MEASUREMENT DEVICE FOR METAL SOLIDIFICATION PR...

Advanced X-Ray Emission Spectrometers

SPECTROMETER

METHOD AND SYSTEM FOR CLASSIFICATION OF SAMPLES

X-RAY FLUORESCENCE SPECTROMETER

DIFFRACTOMETER FOR CHARGED-PARTICLE CRYSTALLOGRAPHY

SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS SYSTEM

SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND METHOD, AND S...

SYSTEM AND METHOD FOR IDENTIFYING NUCLEAR THREATS

X-RAY SPECTROMETER AND METHODS FOR USE

X-RAY ANALYZER

X-RAY ANALYSIS DEVICE AND X-RAY ANALYSIS METHOD

STOCHASTIC BAG GENERATOR

SYSTEMS AND METHODS FOR INTERPRETING HIGH ENERGY INTERACTIONS

Flex Plate with Removable Inserts and Cover

AUTOMATIC MULTIPLE SAMPLE PREPARATION SYSTEM OF FUSED BEADS FOR XRF...

Methods And Systems For Semiconductor Metrology Based On Wavelength...

Systems And Methods For Combined Reflectometry And Photoelectron Sp...

APPARATUS AND METHOD FOR ANALYZING CHEMICAL STATE OF BATTERY MATERIAL

Flex Plate with Removable Inserts and Cover

DETERMINING THE AGE OF A TUNNEL

X-RAY SPECTROMETER

X-RAY SPECTROMETER AND CHEMICAL STATE ANALYSIS METHOD USING THE SAME

DEVICES AND SYSTEMS FOR IMPROVED COLLECTION EFFICIENCY AND RESOLUTI...