for testing diodes

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CPC
G01R31/2632

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2632for testing diodes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Motor vehicle control unit with redundant power supply, and corresp...
- Patent number 12,003,099
- Issue date Jun 4, 2024
- Conti Temic microelectronic GmbH
- Ingo Scheier
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Optical inspection of the varactor diodes in varactor metasurface a...
- Patent number 11,978,958
- Issue date May 7, 2024
- KYMETA CORPORATION
- Hussein Esfahlani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Battery diode fault monitoring
- Patent number 11,953,540
- Issue date Apr 9, 2024
- WISK AERO LLC
- Geoffrey Alan Long
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 11,680,979
- Issue date Jun 20, 2023
- Mitsubishi Electric Corporation
- Hiroki Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Low-power voltage detector for low-voltage CMOS processes
- Patent number 11,650,656
- Issue date May 16, 2023
- Hong Kong Applied Science and Technology Research Institute Company Limited
- Wai Po Wong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Display device and inspecting method thereof
- Patent number 11,645,959
- Issue date May 9, 2023
- Samsung Display Co., Ltd.
- Kwang Sae Lee
- G01 - MEASURING TESTING
Information Patent Grant
Asymmetrical PN junction thermoelectric couple structure and its pa...
- Patent number 11,600,758
- Issue date Mar 7, 2023
- Jiangsu University
- Ruochen Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High accurate contact resistance measurement method using one or mo...
- Patent number 11,555,844
- Issue date Jan 17, 2023
- Infineon Technologies AG
- Ralf Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Predictive chip-maintenance
- Patent number 11,531,056
- Issue date Dec 20, 2022
- Infineon Technologies AG
- Irmgard Escher-Poeppel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit for detecting pin-to-pin leaks of an integrated circuit pac...
- Patent number 11,372,056
- Issue date Jun 28, 2022
- SanDisk Technologies LLC
- Dat Tran
- G01 - MEASURING TESTING
Information Patent Grant
Pin driver and test equipment calibration
- Patent number 11,313,903
- Issue date Apr 26, 2022
- Analog Devices, Inc.
- Amit Kumar Singh
- G01 - MEASURING TESTING
Information Patent Grant
Power transistor junction temperature determination using a desatur...
- Patent number 11,307,239
- Issue date Apr 19, 2022
- NIO USA, Inc.
- Todd J. Kazmirski
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Analyzing an operation of a power semiconductor device
- Patent number 11,262,248
- Issue date Mar 1, 2022
- MASCHINENFABRIK REINHAUSEN GMBH
- Angus Bryant
- G01 - MEASURING TESTING
Information Patent Grant
Display device and inspecting method thereof
- Patent number 11,250,745
- Issue date Feb 15, 2022
- SAMSUNG DISPLAY CO., LTD.
- Kwang Sae Lee
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Transient voltage suppressor bit stimulation
- Patent number 11,209,475
- Issue date Dec 28, 2021
- Hamilton Sundstrand Corporation
- Robert Annan Barnet
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Device for testing a satellite solar array
- Patent number 11,183,970
- Issue date Nov 23, 2021
- AIRBUS DEFENCE AND SPACE SAS
- Dominique Vergnet
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Battery diode fault monitoring
- Patent number 11,016,140
- Issue date May 25, 2021
- WISK AERO LLC
- Geoffrey Alan Long
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test circuit, semiconductor test apparatus, and semic...
- Patent number 10,996,260
- Issue date May 4, 2021
- Fuji Electric Co., Ltd.
- Mitsuru Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Structure and testing device for measuring the bonding strength of...
- Patent number 10,921,364
- Issue date Feb 16, 2021
- WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
- Huipeng Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Passive harmonic filter power quality monitor and communications de...
- Patent number 10,901,026
- Issue date Jan 26, 2021
- TCI, LLC
- William Kranz
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining a junction temperature of a device under tes...
- Patent number 10,890,614
- Issue date Jan 12, 2021
- Star Technologies, Inc.
- Choon Leong Lou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fault detection and isolation in generator modules
- Patent number 10,746,803
- Issue date Aug 18, 2020
- HAMILTON SUNSTRAND CORPORATION
- Huazhen Chai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Battery disconnect for electrical drain test system
- Patent number 10,598,714
- Issue date Mar 24, 2020
- Grosch, LLC
- Briant Grossi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and inspection method for performing dynamic and...
- Patent number 10,578,663
- Issue date Mar 3, 2020
- Sintokogio, Ltd.
- Yoichi Sakamoto
- G01 - MEASURING TESTING
Information Patent Grant
Pulse current application circuit and control method thereof
- Patent number 10,451,665
- Issue date Oct 22, 2019
- Fuji Electric Co., Ltd.
- Naoki Kumagai
- G01 - MEASURING TESTING
Information Patent Grant
Voltage suppressor test circuit and method of testing a voltage sup...
- Patent number 10,401,420
- Issue date Sep 3, 2019
- Hamilton Sundstrand Corporation
- John A. Dickey
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Life estimation circuit and semiconductor device made using the same
- Patent number 10,338,128
- Issue date Jul 2, 2019
- Mitsubishi Electric Corporation
- Shiori Uota
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Transient voltage suppressor having built-in-test capability for so...
- Patent number 10,250,033
- Issue date Apr 2, 2019
- Hamilton Sundstrand Corporation
- John A. Dickey
- G01 - MEASURING TESTING
Information Patent Grant
Array substrates testing circuits, display panels, and flat display...
- Patent number 10,235,913
- Issue date Mar 19, 2019
- WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Mang Zhao
- G02 - OPTICS
Information Patent Grant
Doorbell camera test tool
- Patent number 10,180,452
- Issue date Jan 15, 2019
- Nortek Security & Control LLC
- Ernesto Alonzo Marin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICES WITH INTEGRATED TEST STRUCTURES
- Publication number 20240321651
- Publication date Sep 26, 2024
- Woflspeed, Inc.
- Rahul R. Potera
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY DEVICE AND INSPECTING METHOD THEREOF
- Publication number 20230252923
- Publication date Aug 10, 2023
- SAMSUNG DISPLAY CO., LTD.
- Kwang Sae LEE
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
MONITORING AN IDEAL DIODE
- Publication number 20230228804
- Publication date Jul 20, 2023
- Continental Automotive Technologies GmbH
- Sebastien Bernard
- B60 - VEHICLES IN GENERAL
Information Patent Application
DIODE TEST MODULE FOR MONITORING LEAKAGE CURRENT AND ITS METHOD THE...
- Publication number 20230168298
- Publication date Jun 1, 2023
- Amazing Microelectronic Corp.
- CHIH-TING YEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY DEVICE AND INSPECTING METHOD THEREOF
- Publication number 20220130302
- Publication date Apr 28, 2022
- SAMSUNG DISPLAY CO., LTD.
- Kwang Sae LEE
- G01 - MEASURING TESTING
Information Patent Application
PIN DRIVER AND TEST EQUIPMENT CALIBRATION
- Publication number 20220099738
- Publication date Mar 31, 2022
- Analog Devices, Inc.
- Amit Kumar Singh
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20220065918
- Publication date Mar 3, 2022
- Mitsubishi Electric Corporation
- Hiroki HIDAKA
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT FOR DETECTING PIN-TO-PIN LEAKS OF AN INTEGRATED CIRCUIT PAC...
- Publication number 20210373085
- Publication date Dec 2, 2021
- SANDISK TECHNOLOGIES LLC
- Dat Tran
- G01 - MEASURING TESTING
Information Patent Application
PREDICTIVE CHIP-MAINTENANCE
- Publication number 20210325445
- Publication date Oct 21, 2021
- INFINEON TECHNOLOGIES AG
- Irmgard Escher-Poeppel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYZING AN OPERATION OF A POWER SEMICONDUCTOR DEVICE
- Publication number 20210318176
- Publication date Oct 14, 2021
- MASCHINENFABRIK REINHAUSEN GMBH
- Angus Bryant
- G01 - MEASURING TESTING
Information Patent Application
PASSIVE HARMONIC FILTER POWER QUALITY MONITOR AND COMMUNICATIONS DE...
- Publication number 20210141012
- Publication date May 13, 2021
- TCI, LLC
- William Kranz
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
POWER TRANSISTOR JUNCTION TEMPERATURE DETERMINATION USING A DESATUR...
- Publication number 20210063467
- Publication date Mar 4, 2021
- NIO USA, INC
- Todd J. Kazmirski
- B60 - VEHICLES IN GENERAL
Information Patent Application
TRANSIENT VOLTAGE SUPPRESSOR BIT STIMULATION
- Publication number 20210041493
- Publication date Feb 11, 2021
- HAMILTON SUNDSTRAND CORPORATION
- Robert Annan Barnet
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING A JUNCTION TEMPERATURE OF A DEVICE UNDER TES...
- Publication number 20200326366
- Publication date Oct 15, 2020
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAULT DETECTION AND ISOLATION IN GENERATOR MODULES
- Publication number 20200182934
- Publication date Jun 11, 2020
- HAMILTON SUNDSTRAND CORPORATION
- Huazhen Chai
- G01 - MEASURING TESTING
Information Patent Application
PASSIVE HARMONIC FILTER POWER QUALITY MONITOR AND COMMUNICATIONS DE...
- Publication number 20200088783
- Publication date Mar 19, 2020
- TCI, LLC
- William Kranz
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
HIGH ACCURATE CONTACT RESISTANCE MEASUREMENT METHOD USING ONE OR MO...
- Publication number 20200003824
- Publication date Jan 2, 2020
- INFINEON TECHNOLOGIES AG
- RALF ARNOLD
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE SUPPRESSOR TEST CIRCUIT AND METHOD OF TESTING A VOLTAGE SUP...
- Publication number 20190178930
- Publication date Jun 13, 2019
- HAMILTON SUNDSTRAND CORPORATION
- John A. Dickey
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
PULSE CURRENT APPLICATION CIRCUIT AND CONTROL METHOD THEREOF
- Publication number 20180340972
- Publication date Nov 29, 2018
- Fuji Electric Co., Ltd.
- Naoki KUMAGAI
- G01 - MEASURING TESTING
Information Patent Application
Battery Disconnect For Electrical Drain Test System
- Publication number 20180328970
- Publication date Nov 15, 2018
- Grosch, LLC
- Briant Grossi
- G01 - MEASURING TESTING
Information Patent Application
DOORBELL CAMERA TEST TOOL
- Publication number 20180172755
- Publication date Jun 21, 2018
- NORTEK SECURITY & CONTROL LLC
- Ernesto Alonzo Marin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ROTATING DIODE FAULT DETECTION
- Publication number 20180172754
- Publication date Jun 21, 2018
- GE AVIATION SYSTEMS LLC
- David Andrew Woodburn
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20180113165
- Publication date Apr 26, 2018
- SINTOKOGIO, LTD.
- Yoichi SAKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
ARRAY SUBSTRATES TESTING CIRCUITS, DISPLAY PANELS, AND FLAT DISPLAY...
- Publication number 20180108285
- Publication date Apr 19, 2018
- WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Mang ZHAO
- G02 - OPTICS
Information Patent Application
Life Estimation Circuit and Semiconductor Device Made Using the Same
- Publication number 20170074921
- Publication date Mar 16, 2017
- Mitsubishi Electric Corporation
- Shiori UOTA
- G01 - MEASURING TESTING
Information Patent Application
METHOD TO IMPROVE ANALOG FAULT COVERAGE USING TEST DIODES
- Publication number 20170077003
- Publication date Mar 16, 2017
- Semiconductor Components Industries, LLC
- Ronny VANHOOREN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DETERMINING AN OPERATIONAL CONDITION OF A C...
- Publication number 20160282405
- Publication date Sep 29, 2016
- LENOVO ENTERPRISE SOLUTIONS (SINGAPORE) PTE. LTD.
- Jeffrey R. Hamilton
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR IDENTIFYING A POLARITY OF A FREEWHEELING DIOD...
- Publication number 20160167610
- Publication date Jun 16, 2016
- ROBERT BOSCH GmbH
- Steffen Walker
- B60 - VEHICLES IN GENERAL
Information Patent Application
SEMICONDUCTOR DEVICE WITH UPSET EVENT DETECTION AND METHOD OF MAKING
- Publication number 20160109506
- Publication date Apr 21, 2016
- MARK D. HALL
- G01 - MEASURING TESTING
Information Patent Application
FAULT DIAGNOSIS METHOD FOR FREEWHEELING DIODES OF DUAL-SWITCH POWER...
- Publication number 20160091556
- Publication date Mar 31, 2016
- Hao Chen
- G01 - MEASURING TESTING

for testing diodes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Motor vehicle control unit with redundant power supply, and corresp...

Optical inspection of the varactor diodes in varactor metasurface a...

Battery diode fault monitoring

Semiconductor device

Low-power voltage detector for low-voltage CMOS processes

Display device and inspecting method thereof

Asymmetrical PN junction thermoelectric couple structure and its pa...

High accurate contact resistance measurement method using one or mo...

Predictive chip-maintenance

Circuit for detecting pin-to-pin leaks of an integrated circuit pac...

Pin driver and test equipment calibration

Power transistor junction temperature determination using a desatur...

Analyzing an operation of a power semiconductor device

Display device and inspecting method thereof

Transient voltage suppressor bit stimulation

Device for testing a satellite solar array

Battery diode fault monitoring

Semiconductor test circuit, semiconductor test apparatus, and semic...

Structure and testing device for measuring the bonding strength of...

Passive harmonic filter power quality monitor and communications de...

Method for determining a junction temperature of a device under tes...

Fault detection and isolation in generator modules

Battery disconnect for electrical drain test system

Inspection device and inspection method for performing dynamic and...

Pulse current application circuit and control method thereof

Voltage suppressor test circuit and method of testing a voltage sup...

Life estimation circuit and semiconductor device made using the same

Transient voltage suppressor having built-in-test capability for so...

Array substrates testing circuits, display panels, and flat display...

Doorbell camera test tool

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICES WITH INTEGRATED TEST STRUCTURES

DISPLAY DEVICE AND INSPECTING METHOD THEREOF

MONITORING AN IDEAL DIODE

DIODE TEST MODULE FOR MONITORING LEAKAGE CURRENT AND ITS METHOD THE...

DISPLAY DEVICE AND INSPECTING METHOD THEREOF

PIN DRIVER AND TEST EQUIPMENT CALIBRATION

SEMICONDUCTOR DEVICE

CIRCUIT FOR DETECTING PIN-TO-PIN LEAKS OF AN INTEGRATED CIRCUIT PAC...

PREDICTIVE CHIP-MAINTENANCE

ANALYZING AN OPERATION OF A POWER SEMICONDUCTOR DEVICE

PASSIVE HARMONIC FILTER POWER QUALITY MONITOR AND COMMUNICATIONS DE...

POWER TRANSISTOR JUNCTION TEMPERATURE DETERMINATION USING A DESATUR...

TRANSIENT VOLTAGE SUPPRESSOR BIT STIMULATION

METHOD FOR DETERMINING A JUNCTION TEMPERATURE OF A DEVICE UNDER TES...

FAULT DETECTION AND ISOLATION IN GENERATOR MODULES

PASSIVE HARMONIC FILTER POWER QUALITY MONITOR AND COMMUNICATIONS DE...

HIGH ACCURATE CONTACT RESISTANCE MEASUREMENT METHOD USING ONE OR MO...

VOLTAGE SUPPRESSOR TEST CIRCUIT AND METHOD OF TESTING A VOLTAGE SUP...

PULSE CURRENT APPLICATION CIRCUIT AND CONTROL METHOD THEREOF

Battery Disconnect For Electrical Drain Test System

DOORBELL CAMERA TEST TOOL

ROTATING DIODE FAULT DETECTION

INSPECTION DEVICE AND INSPECTION METHOD

ARRAY SUBSTRATES TESTING CIRCUITS, DISPLAY PANELS, AND FLAT DISPLAY...

Life Estimation Circuit and Semiconductor Device Made Using the Same

METHOD TO IMPROVE ANALOG FAULT COVERAGE USING TEST DIODES

SYSTEMS AND METHODS FOR DETERMINING AN OPERATIONAL CONDITION OF A C...

METHOD AND DEVICE FOR IDENTIFYING A POLARITY OF A FREEWHEELING DIOD...

SEMICONDUCTOR DEVICE WITH UPSET EVENT DETECTION AND METHOD OF MAKING

FAULT DIAGNOSIS METHOD FOR FREEWHEELING DIODES OF DUAL-SWITCH POWER...