for testing other individual devices

Industry

CPC
G01R31/2637

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2637for testing other individual devices

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Substrate storage container management system, load port, and subst...
- Patent number 11,662,373
- Issue date May 30, 2023
- Sinfonia Technology Co., Ltd.
- Izumi Ito
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing apparatus, analysis method, and computer-readable medium
- Patent number 11,635,458
- Issue date Apr 25, 2023
- Fuji Electric Co., Ltd.
- Norihiro Komiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus
- Patent number 11,543,445
- Issue date Jan 3, 2023
- Tokyo Electron Limited
- Shigeru Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and methodology for detecting defects during MEMS device...
- Patent number 11,377,348
- Issue date Jul 5, 2022
- NXP USA, INC.
- Lianjun Liu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Fabrication variation analysis method of silicon Mach-Zehnder elect...
- Patent number 11,353,495
- Issue date Jun 7, 2022
- Nanjing University
- Wei Jiang
- G02 - OPTICS
Information Patent Grant
Dummy element and method of examining defect of resistive element
- Patent number 11,114,351
- Issue date Sep 7, 2021
- Fuji Electric Co., Ltd.
- Osamu Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Method for rapid testing of functionality of phase-change material...
- Patent number 11,031,689
- Issue date Jun 8, 2021
- Newport Fab, LLC
- David J. Howard
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semi-insulating compound semiconductor substrate and semi-insulatin...
- Patent number 10,971,374
- Issue date Apr 6, 2021
- Sumitomo Electric Industries, Ltd.
- Katsushi Hashio
- G01 - MEASURING TESTING
Information Patent Grant
Structure and methodology for detecting defects during MEMS device...
- Patent number 10,941,037
- Issue date Mar 9, 2021
- NXP USA, INC.
- Lianjun Liu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Thermopile self-test and/or self-calibration
- Patent number 10,914,636
- Issue date Feb 9, 2021
- AMS SENSORS UK LIMITED
- Syed Zeeshan Ali
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical component testing in stacked semiconductor arrangement
- Patent number 10,886,185
- Issue date Jan 5, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Shao-Yu Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for estimating lifetime of the SPD using discharge charac...
- Patent number 10,725,088
- Issue date Jul 28, 2020
- SUNKWANG LIGHTNING PROTECTION TECHNICAL INSTITUTE INC.
- Dong-Jin Kim
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Secured electronic chip
- Patent number 10,685,923
- Issue date Jun 16, 2020
- STMicroelectronics (Rousset) SAS
- Alexandre Sarafianos
- G01 - MEASURING TESTING
Information Patent Grant
Fabrication of a sacrificial interposer test structure
- Patent number 10,643,910
- Issue date May 5, 2020
- International Business Machines Corporation
- Hiroyuki Mori
- G01 - MEASURING TESTING
Information Patent Grant
Method for estimating power system health
- Patent number 10,605,854
- Issue date Mar 31, 2020
- Rollys-Royce PLC
- Mohamed Halick Mohamed Sathik
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Apparatus for determining deterioration of photocoupler
- Patent number 10,365,319
- Issue date Jul 30, 2019
- Denso Wave Incorporated
- Yoko Sumiyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Pipe structure and semiconductor module testing equipment including...
- Patent number 10,330,722
- Issue date Jun 25, 2019
- Samsung Electronics Co., Ltd.
- Min-woo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Array substrates testing circuits, display panels, and flat display...
- Patent number 10,235,913
- Issue date Mar 19, 2019
- WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Mang Zhao
- G02 - OPTICS
Information Patent Grant
Fabrication of sacrificial interposer test structure
- Patent number 10,109,540
- Issue date Oct 23, 2018
- International Business Machines Corporation
- Hiroyuki Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for enhancing guardbands using “in-situ” silic...
- Patent number 10,060,966
- Issue date Aug 28, 2018
- Intel Corporation
- Sankaran M. Menon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for testing semiconductor dies
- Patent number 10,018,667
- Issue date Jul 10, 2018
- Infineon Technologies AG
- Erwin Thalmann
- G01 - MEASURING TESTING
Information Patent Grant
Thermoelectric system and method
- Patent number 9,989,571
- Issue date Jun 5, 2018
- Jaguar Land Rover Limited
- Timothy Loftus
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Current sense ratio compensation
- Patent number 9,804,205
- Issue date Oct 31, 2017
- Power Integrations, Inc.
- Rajko Duvjnak
- G01 - MEASURING TESTING
Information Patent Grant
Partial SOI on power device for breakdown voltage improvement
- Patent number 9,698,024
- Issue date Jul 4, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Long-Shih Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Insulated-gate bipolar transistor collector-emitter saturation volt...
- Patent number 9,575,113
- Issue date Feb 21, 2017
- Infineon Technologies AG
- Michael Mankel
- G01 - MEASURING TESTING
Information Patent Grant
Current application device and manufacturing method of semiconducto...
- Patent number 9,541,577
- Issue date Jan 10, 2017
- Honda Motor Co., Ltd.
- Satoshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of detecting wire open failure thereof
- Patent number 9,354,269
- Issue date May 31, 2016
- Fuji Electric Co., Ltd.
- Shigemi Miyazawa
- G01 - MEASURING TESTING
Information Patent Grant
Memory test sequencer
- Patent number 9,239,355
- Issue date Jan 19, 2016
- Inphi Corporation
- Andrew Burstein
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor apparatus and test method thereof
- Patent number 9,188,626
- Issue date Nov 17, 2015
- SK Hynix Inc.
- Chul Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Test apparatus
- Patent number 9,057,756
- Issue date Jun 16, 2015
- Advantest Corporation
- Seiji Amanuma
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT, METHOD, AND APPARATUS FOR ACQUIRING RESISTANCE VALUE OF RE...
- Publication number 20240426883
- Publication date Dec 26, 2024
- SANECHIPS TECHNOLOGY CO., LTD.
- Niuyi SUN
- G01 - MEASURING TESTING
Information Patent Application
BONDING QUALITY TEST METHOD, BONDING QUALITY TEST CIRCUIT, AND MEMO...
- Publication number 20240255564
- Publication date Aug 1, 2024
- Samsung Electronics Co., Ltd.
- Sangsu Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING DEVICE, TESTING METHOD, AND NON-TRANSITORY STORAGE MEDIUM S...
- Publication number 20240142495
- Publication date May 2, 2024
- Sumitomo Electric Industries, Ltd.
- Kosuke FUJII
- G01 - MEASURING TESTING
Information Patent Application
THERMOELECTRIC MODULE PROTECTION CIRCUIT AND THERMOELECTRIC DEVICE...
- Publication number 20230157173
- Publication date May 18, 2023
- TEGWAY CO.,LTD
- Ockkyun OH
- G01 - MEASURING TESTING
Information Patent Application
ANALYZING APPARATUS, ANALYSIS METHOD, AND COMPUTER-READABLE MEDIUM
- Publication number 20220334171
- Publication date Oct 20, 2022
- Fuji Electric Co., Ltd.
- Norihiro KOMIYAMA
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, AND FIELD DEVICE
- Publication number 20220128617
- Publication date Apr 28, 2022
- YOKOGAWA ELECTRIC CORPORATION
- Sohei Kondo
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE STORAGE CONTAINER MANAGEMENT SYSTEM, LOAD PORT, AND SUBST...
- Publication number 20210215752
- Publication date Jul 15, 2021
- SINFONIA TECHNOLOGY CO., LTD.
- Izumi Ito
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE AND METHODOLOGY FOR DETECTING DEFECTS DURING MEMS DEVICE...
- Publication number 20210155474
- Publication date May 27, 2021
- NXP USA, Inc.
- Lianjun Liu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
INSPECTION DEVICE
- Publication number 20200386805
- Publication date Dec 10, 2020
- TOKYO ELECTRON LIMITED
- Shigeru KASAI
- G01 - MEASURING TESTING
Information Patent Application
Fabrication variation analysis method of silicon Mach-Zehnder elect...
- Publication number 20200371153
- Publication date Nov 26, 2020
- NANJING UNIVERSITY
- Wei Jiang
- G01 - MEASURING TESTING
Information Patent Application
Method for Rapid Testing of Functionality of Phase-Change Material...
- Publication number 20200287281
- Publication date Sep 10, 2020
- NEWPORT FAB, LLC DBA JAZZ SEMICONDUCTOR
- David J. Howard
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND METHODOLOGY FOR DETECTING DEFECTS DURING MEMS DEVICE...
- Publication number 20200207618
- Publication date Jul 2, 2020
- NXP USA, Inc.
- Lianjun Liu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
DUMMY ELEMENT AND METHOD OF EXAMINING DEFECT OF RESISTIVE ELEMENT
- Publication number 20200051874
- Publication date Feb 13, 2020
- Fuji Electric Co., Ltd.
- Osamu SASAKI
- G01 - MEASURING TESTING
Information Patent Application
SEMI-INSULATING COMPOUND SEMICONDUCTOR SUBSTRATE AND SEMI-INSULATIN...
- Publication number 20190371620
- Publication date Dec 5, 2019
- Sumitomo Electric Industries, Ltd.
- Katsushi HASHIO
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR ESTIMATING LIFETIME OF THE SPD USING DISCHARGE CHARAC...
- Publication number 20190353694
- Publication date Nov 21, 2019
- SUNKWANG LIGHTNING PROTECTION TECHNICAL INSTITUTE INC.
- Dong-Jin KIM
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
THERMOPILE SELF-TEST AND/OR SELF-CALIBRATION
- Publication number 20190285478
- Publication date Sep 19, 2019
- AMS Sensors UK Limited
- Syed Zeeshan Ali
- G01 - MEASURING TESTING
Information Patent Application
FABRICATION OF A SACRIFICIAL INTERPOSER TEST STRUCTURE
- Publication number 20190006250
- Publication date Jan 3, 2019
- International Business Machines Corporation
- Hiroyuki Mori
- G01 - MEASURING TESTING
Information Patent Application
SECURED ELECTRONIC CHIP
- Publication number 20180261560
- Publication date Sep 13, 2018
- STMicroelectronics (Rousset) SAS
- Alexandre SARAFIANOS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARRAY SUBSTRATES TESTING CIRCUITS, DISPLAY PANELS, AND FLAT DISPLAY...
- Publication number 20180108285
- Publication date Apr 19, 2018
- WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Mang ZHAO
- G02 - OPTICS
Information Patent Application
PIPE STRUCTURE AND SEMICONDUCTOR MODULE TESTING EQUIPMENT INCLUDING...
- Publication number 20180106853
- Publication date Apr 19, 2018
- Samsung Electronics Co., Ltd.
- MIN-WOO KIM
- G01 - MEASURING TESTING
Information Patent Application
FABRICATION OF SACRIFICIAL INTERPOSER TEST STRUCTURE
- Publication number 20170358507
- Publication date Dec 14, 2017
- International Business Machines Corporation
- Hiroyuki Mori
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL COMPONENT TESTING IN STACKED SEMICONDUCTOR ARRANGEMENT
- Publication number 20170069552
- Publication date Mar 9, 2017
- Taiwan Semiconductor Manufacturing Company Limited
- Shao-Yu Li
- G01 - MEASURING TESTING
Information Patent Application
TEST BOARD AND TEST SYSTEM INCLUDING THE SAME
- Publication number 20170023633
- Publication date Jan 26, 2017
- Samsung Electronics Co., Ltd.
- Ki-jae SONG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ENHANCING GUARDBANDS USING "IN-SITU" SILIC...
- Publication number 20160285434
- Publication date Sep 29, 2016
- Intel Corporation
- Sankaran M. Menon
- G01 - MEASURING TESTING
Information Patent Application
Thermoelectric System and Method
- Publication number 20160003882
- Publication date Jan 7, 2016
- Timothy Loftus
- B60 - VEHICLES IN GENERAL
Information Patent Application
METHODS AND APPARATUSES FOR AC/DC CHARACTERIZATION
- Publication number 20150123697
- Publication date May 7, 2015
- QUALCOMM Incorporated
- James LeRoy BLAIR
- G01 - MEASURING TESTING
Information Patent Application
PARTIAL SOI ON POWER DEVICE FOR BREAKDOWN VOLTAGE IMPROVEMENT
- Publication number 20140322871
- Publication date Oct 30, 2014
- Long-Shih Lin
- G01 - MEASURING TESTING
Information Patent Application
CURRENT APPLICATION DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTO...
- Publication number 20140193928
- Publication date Jul 10, 2014
- Honda Motor Co., Ltd.
- Satoshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF DETECTING WIRE OPEN FAILURE THEREOF
- Publication number 20140070839
- Publication date Mar 13, 2014
- Fuji Electric Co., Ltd.
- Shigemi MIYAZAWA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR APPARATUS AND TEST METHOD THEREOF
- Publication number 20140043057
- Publication date Feb 13, 2014
- SK HYNIX INC.
- Chul KIM
- G01 - MEASURING TESTING

for testing other individual devices

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Substrate storage container management system, load port, and subst...

Analyzing apparatus, analysis method, and computer-readable medium

Inspection apparatus

Structure and methodology for detecting defects during MEMS device...

Fabrication variation analysis method of silicon Mach-Zehnder elect...

Dummy element and method of examining defect of resistive element

Method for rapid testing of functionality of phase-change material...

Semi-insulating compound semiconductor substrate and semi-insulatin...

Structure and methodology for detecting defects during MEMS device...

Thermopile self-test and/or self-calibration

Electrical component testing in stacked semiconductor arrangement

Apparatus for estimating lifetime of the SPD using discharge charac...

Secured electronic chip

Fabrication of a sacrificial interposer test structure

Method for estimating power system health

Apparatus for determining deterioration of photocoupler

Pipe structure and semiconductor module testing equipment including...

Array substrates testing circuits, display panels, and flat display...

Fabrication of sacrificial interposer test structure

Method and apparatus for enhancing guardbands using “in-situ” silic...

Method for testing semiconductor dies

Thermoelectric system and method

Current sense ratio compensation

Partial SOI on power device for breakdown voltage improvement

Insulated-gate bipolar transistor collector-emitter saturation volt...

Current application device and manufacturing method of semiconducto...

Semiconductor device and method of detecting wire open failure thereof

Memory test sequencer

Semiconductor apparatus and test method thereof

Test apparatus

Patents Applicationslast 30 patents

CIRCUIT, METHOD, AND APPARATUS FOR ACQUIRING RESISTANCE VALUE OF RE...

BONDING QUALITY TEST METHOD, BONDING QUALITY TEST CIRCUIT, AND MEMO...

TESTING DEVICE, TESTING METHOD, AND NON-TRANSITORY STORAGE MEDIUM S...

THERMOELECTRIC MODULE PROTECTION CIRCUIT AND THERMOELECTRIC DEVICE...

ANALYZING APPARATUS, ANALYSIS METHOD, AND COMPUTER-READABLE MEDIUM

DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, AND FIELD DEVICE

SUBSTRATE STORAGE CONTAINER MANAGEMENT SYSTEM, LOAD PORT, AND SUBST...

STRUCTURE AND METHODOLOGY FOR DETECTING DEFECTS DURING MEMS DEVICE...

INSPECTION DEVICE

Fabrication variation analysis method of silicon Mach-Zehnder elect...

Method for Rapid Testing of Functionality of Phase-Change Material...

STRUCTURE AND METHODOLOGY FOR DETECTING DEFECTS DURING MEMS DEVICE...

DUMMY ELEMENT AND METHOD OF EXAMINING DEFECT OF RESISTIVE ELEMENT

SEMI-INSULATING COMPOUND SEMICONDUCTOR SUBSTRATE AND SEMI-INSULATIN...

APPARATUS FOR ESTIMATING LIFETIME OF THE SPD USING DISCHARGE CHARAC...

THERMOPILE SELF-TEST AND/OR SELF-CALIBRATION

FABRICATION OF A SACRIFICIAL INTERPOSER TEST STRUCTURE

SECURED ELECTRONIC CHIP

ARRAY SUBSTRATES TESTING CIRCUITS, DISPLAY PANELS, AND FLAT DISPLAY...

PIPE STRUCTURE AND SEMICONDUCTOR MODULE TESTING EQUIPMENT INCLUDING...

FABRICATION OF SACRIFICIAL INTERPOSER TEST STRUCTURE

ELECTRICAL COMPONENT TESTING IN STACKED SEMICONDUCTOR ARRANGEMENT

TEST BOARD AND TEST SYSTEM INCLUDING THE SAME

METHOD AND APPARATUS FOR ENHANCING GUARDBANDS USING "IN-SITU" SILIC...

Thermoelectric System and Method

METHODS AND APPARATUSES FOR AC/DC CHARACTERIZATION

PARTIAL SOI ON POWER DEVICE FOR BREAKDOWN VOLTAGE IMPROVEMENT

CURRENT APPLICATION DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTO...

SEMICONDUCTOR DEVICE AND METHOD OF DETECTING WIRE OPEN FAILURE THEREOF

SEMICONDUCTOR APPARATUS AND TEST METHOD THEREOF