Membership
Tour
Register
Log in
for translational movement of the mass
Follow
Industry
CPC
G01P2015/0814
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01P
MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
Current Industry
G01P2015/0814
for translational movement of the mass
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Low-noise multi-axis accelerometers and related methods
Patent number
12,146,893
Issue date
Nov 19, 2024
Analog Devices, Inc.
Xin Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Resonant microelectromechanical sensor with improved operation
Patent number
12,000,859
Issue date
Jun 4, 2024
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Marc Sansa Perna
G01 - MEASURING TESTING
Information
Patent Grant
Resonantly vibrating accelerometer driven in multiple vibrational m...
Patent number
11,965,907
Issue date
Apr 23, 2024
Emcore Corporation
Sergey Alexandrovich Zotov
G01 - MEASURING TESTING
Information
Patent Grant
Resonantly vibrating accelerometer with cross-coupling signal suppr...
Patent number
11,959,935
Issue date
Apr 16, 2024
Emcore Corporation
Sergey Alexandrovich Zotov
G01 - MEASURING TESTING
Information
Patent Grant
Self-compensating resonantly vibrating accelerometer driven in mult...
Patent number
11,953,514
Issue date
Apr 9, 2024
Emcore Corporation
Sergey Alexandrovich Zotov
G01 - MEASURING TESTING
Information
Patent Grant
Inertial sensor and method of inertial sensing with tuneable mode c...
Patent number
11,913,808
Issue date
Feb 27, 2024
SILICON MICROGRAVITY LIMITED
Xin Zhou
G01 - MEASURING TESTING
Information
Patent Grant
MEMS accelerometric sensor having high accuracy and low sensitivity...
Patent number
11,835,541
Issue date
Dec 5, 2023
STMicroelectronics S.r.l.
Alessandro Tocchio
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Physical quantity sensor, physical quantity sensor device, electron...
Patent number
11,650,220
Issue date
May 16, 2023
Seiko Epson Corporation
Satoru Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
Low-noise multi-axis MEMS accelerometer
Patent number
11,467,181
Issue date
Oct 11, 2022
Murata Manufacturing Co., Ltd.
Matti Liukku
G01 - MEASURING TESTING
Information
Patent Grant
Optomechanical structure with corrugated edge
Patent number
11,408,911
Issue date
Aug 9, 2022
Honeywell International Inc.
Neil Krueger
G01 - MEASURING TESTING
Information
Patent Grant
Vibrator device, electronic apparatus, and vehicle
Patent number
11,340,070
Issue date
May 24, 2022
Seiko Epson Corporation
Ryuta Nishizawa
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor, physical quantity sensor device, complex...
Patent number
11,204,367
Issue date
Dec 21, 2021
Seiko Epson Corporation
Satoru Tanaka
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Piezoresistive detection resonant device in particular with large v...
Patent number
11,125,632
Issue date
Sep 21, 2021
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Patrice Rey
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Anchor structure for securing optomechanical structure
Patent number
11,119,114
Issue date
Sep 14, 2021
Honeywell International Inc.
Neil Krueger
G01 - MEASURING TESTING
Information
Patent Grant
Low-noise multi-axis accelerometers and related methods
Patent number
11,099,207
Issue date
Aug 24, 2021
Analog Devices, Inc.
Xin Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor, physical quantity sensor device, electron...
Patent number
11,085,946
Issue date
Aug 10, 2021
Seiko Epson Corporation
Satoru Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor, physical quantity sensor device, portable...
Patent number
11,035,875
Issue date
Jun 15, 2021
Seiko Epson Corporation
Satoru Tanaka
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Inertial sensor with suspension spring structure surrounding anchor
Patent number
11,029,327
Issue date
Jun 8, 2021
NXP USA, INC.
Andrew C. McNeil
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor, physical quantity sensor device, electron...
Patent number
10,969,403
Issue date
Apr 6, 2021
Seiko Epson Corporation
Satoru Tanaka
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Electronic device having a first electrode formed on a movable susp...
Patent number
10,948,513
Issue date
Mar 16, 2021
Infineon Technologies AG
Thoralf Kautzsch
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Physical quantity sensor, electronic device, and vehicle
Patent number
10,935,567
Issue date
Mar 2, 2021
Seiko Epson Corporation
Shuichi Kawano
G01 - MEASURING TESTING
Information
Patent Grant
Temperature-compensated micro-electromechanical device, and method...
Patent number
10,894,713
Issue date
Jan 19, 2021
STMicroelectronics S.r.l.
Ernesto Lasalandra
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Physical quantity sensor having a spring connected to a movable unit
Patent number
10,883,887
Issue date
Jan 5, 2021
Seiko Epson Corporation
Atsuki Naruse
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometer
Patent number
10,884,020
Issue date
Jan 5, 2021
ATLANTIC INERTIAL SYSTEMS, LIMITED
Alan Malvern
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor, physical quantity sensor device, electron...
Patent number
10,830,789
Issue date
Nov 10, 2020
Seiko Epson Corporation
Shota Kigure
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Physical quantity sensor, physical quantity sensor device, electron...
Patent number
10,823,570
Issue date
Nov 3, 2020
Seiko Epson Corporation
Kei Kanemoto
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometers
Patent number
10,775,404
Issue date
Sep 15, 2020
ATLANTIC INERTIAL SYSTEMS, LIMITED.
Kevin Townsend
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometers
Patent number
10,670,623
Issue date
Jun 2, 2020
Atlantic Inertial Systems Limited
Kiran Mysore Harish
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Physical quantity sensor, electronic device, and mobile body
Patent number
10,656,174
Issue date
May 19, 2020
Seiko Epson Corporation
Shota Kigure
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Micromechanical structure for an acceleration sensor
Patent number
10,656,173
Issue date
May 19, 2020
Robert Bosch GmbH
Johannes Classen
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
TRANSLATIONAL MASS ACCELEROMETER
Publication number
20240410914
Publication date
Dec 12, 2024
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Application
IN-PLANE AND OUT-OF-PLANE ACCELEROMETER
Publication number
20240300805
Publication date
Sep 12, 2024
Murata Manufacturing Co., Ltd.
Ville-Pekka RYTKÖNEN
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MICROMECHANICAL Z-ACCELERATION SENSOR WITH REFERENCE ELECTRODE
Publication number
20240182296
Publication date
Jun 6, 2024
ROBERT BOSCH GmbH
Johannes Classen
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Resonantly vibrating accelerometer with cross-coupling signal suppr...
Publication number
20230314463
Publication date
Oct 5, 2023
Emcore Corporation
Sergey Alexandrovich Zotov
G01 - MEASURING TESTING
Information
Patent Application
Resonantly vibrating accelerometer driven in multiple vibrational m...
Publication number
20230314467
Publication date
Oct 5, 2023
Emcore Corporation
Sergey Alexandrovich Zotov
G01 - MEASURING TESTING
Information
Patent Application
MICROMECHANICAL DEVICE FOR ENHANCED ACCELERATION MEASUREMENT
Publication number
20230266357
Publication date
Aug 24, 2023
STMicroelectronics S.r.l.
Gabriele GATTERE
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MODE LOCALISED ACCELEROMETER
Publication number
20230204621
Publication date
Jun 29, 2023
CAMBRIDGE ENTERPRISE LIMITED
Ashwin SESHIA
G01 - MEASURING TESTING
Information
Patent Application
ACCELEROMETER DEVICE WITH IMPROVED BIAS STABILITY
Publication number
20220308085
Publication date
Sep 29, 2022
NORTHROP GRUMMAN LITEF GMBH
Stefan König
G01 - MEASURING TESTING
Information
Patent Application
Vibrator Device, Electronic Apparatus, And Vehicle
Publication number
20220236058
Publication date
Jul 28, 2022
SEIKO EPSON CORPORATION
Ryuta Nishizawa
G01 - MEASURING TESTING
Information
Patent Application
LOW-NOISE MULTI-AXIS ACCELEROMETERS AND RELATED METHODS
Publication number
20210349123
Publication date
Nov 11, 2021
Analog Devices, Inc.
Xin Zhang
G01 - MEASURING TESTING
Information
Patent Application
VIBRATOR DEVICE, ELECTRONIC APPARATUS, AND VEHICLE
Publication number
20210033398
Publication date
Feb 4, 2021
SEIKO EPSON CORPORATION
Ryuta Nishizawa
G01 - MEASURING TESTING
Information
Patent Application
OPTOMECHANICAL STRUCTURE WITH CORRUGATED EDGE
Publication number
20210018531
Publication date
Jan 21, 2021
HONEYWELL INTERNATIONAL INC.
Neil Krueger
G01 - MEASURING TESTING
Information
Patent Application
ANCHOR STRUCTURE FOR SECURING OPTOMECHANICAL STRUCTURE
Publication number
20210018530
Publication date
Jan 21, 2021
HONEYWELL INTERNATIONAL INC.
Neil Krueger
G01 - MEASURING TESTING
Information
Patent Application
ACCELEROMETERS
Publication number
20200041537
Publication date
Feb 6, 2020
Atlantic Inertial Systems Limited
Kevin Townsend
G01 - MEASURING TESTING
Information
Patent Application
FABRICATION PROCESS FOR A SYMMETRICAL MEMS ACCELEROMETER
Publication number
20190382264
Publication date
Dec 19, 2019
Chinese Academy of Sciences Institute of Geology and Geophysics
Lianzhong YU
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
PHYSICAL QUANTITY SENSOR, PHYSICAL QUANTITY SENSOR DEVICE, ELECTRON...
Publication number
20190353678
Publication date
Nov 21, 2019
SEIKO EPSON CORPORATION
Satoru TANAKA
B60 - VEHICLES IN GENERAL
Information
Patent Application
PHYSICAL QUANTITY SENSOR
Publication number
20190301866
Publication date
Oct 3, 2019
DENSO CORPORATION
Takeru KANAZAWA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DUAL CAPACITIVE LINEARIZATION CIRCUIT
Publication number
20190170786
Publication date
Jun 6, 2019
InvenSense, Inc.
Matthew Julian THOMPSON
G01 - MEASURING TESTING
Information
Patent Application
Physical Quantity Sensor, Electronic Device, And Mobile Body
Publication number
20190154727
Publication date
May 23, 2019
SEIKO EPSON CORPORATION
Shota KIGURE
G01 - MEASURING TESTING
Information
Patent Application
MICROMECHANICAL INERTIAL SENSOR
Publication number
20190146003
Publication date
May 16, 2019
ROBERT BOSCH GmbH
Jochen Reinmuth
G01 - MEASURING TESTING
Information
Patent Application
MEMS-BASED THREE-AXIS ACCELERATION SENSOR
Publication number
20190033341
Publication date
Jan 31, 2019
SHIN SUNG C&T CO., LTD.
Ci Moo SONG
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MICROMECHANICAL STRUCTURE FOR AN ACCELERATION SENSOR
Publication number
20180328959
Publication date
Nov 15, 2018
ROBERT BOSCH GmbH
Johannes Classen
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ACCELEROMETERS
Publication number
20180217179
Publication date
Aug 2, 2018
Atlantic Inertial Systems Limited
Kiran Mysore Harish
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MEMS INERTIAL SENSOR AND FORMING METHOD THEREFOR
Publication number
20180210006
Publication date
Jul 26, 2018
MEMSEN ELECTRONICS INC
Lianjun Liu
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
OUT-OF-PLANE-ACCELEROMETER
Publication number
20180164339
Publication date
Jun 14, 2018
Safran Colibrys SA
Pascal Zwahlen
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
TEMPERATURE-COMPENSATED MICRO-ELECTROMECHANICAL DEVICE, AND METHOD...
Publication number
20180118561
Publication date
May 3, 2018
STMicroelectronics S.r.l.
Ernesto LASALANDRA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ELECTRONIC DEVICE, ELECTRONIC DEVICE APPARATUS, ELECTRONIC APPARATU...
Publication number
20180095105
Publication date
Apr 5, 2018
SEIKO EPSON CORPORATION
Shuichi KAWANO
G01 - MEASURING TESTING
Information
Patent Application
FUNCTIONAL ELEMENT, ELECTRONIC APPARATUS AND MOBILE ENTITY
Publication number
20180050899
Publication date
Feb 22, 2018
SEIKO EPSON CORPORATION
Satoru TANAKA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ACCELERATION SENSOR HAVING SPRING FORCE COMPENSATION
Publication number
20180024160
Publication date
Jan 25, 2018
NORTHROP GRUMMAN LITEF GMBH
STEFAN KOENIG
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
FABRICATION PROCESS FOR A SYMMETRICAL MEMS ACCELEROMETER
Publication number
20170336437
Publication date
Nov 23, 2017
Chinese Academy of Sciences Institute of Geology and Geophysics
Lianzhong YU
B81 - MICRO-STRUCTURAL TECHNOLOGY