Membership
Tour
Register
Log in
for translational movement of the mass
Follow
Industry
CPC
G01P2015/0814
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01P
MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
Current Industry
G01P2015/0814
for translational movement of the mass
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Resonantly vibrating accelerometer driven in multiple vibrational m...
Patent number
11,965,907
Issue date
Apr 23, 2024
Emcore Corporation
Sergey Alexandrovich Zotov
G01 - MEASURING TESTING
Information
Patent Grant
Resonantly vibrating accelerometer with cross-coupling signal suppr...
Patent number
11,959,935
Issue date
Apr 16, 2024
Emcore Corporation
Sergey Alexandrovich Zotov
G01 - MEASURING TESTING
Information
Patent Grant
Self-compensating resonantly vibrating accelerometer driven in mult...
Patent number
11,953,514
Issue date
Apr 9, 2024
Emcore Corporation
Sergey Alexandrovich Zotov
G01 - MEASURING TESTING
Information
Patent Grant
Inertial sensor and method of inertial sensing with tuneable mode c...
Patent number
11,913,808
Issue date
Feb 27, 2024
SILICON MICROGRAVITY LIMITED
Xin Zhou
G01 - MEASURING TESTING
Information
Patent Grant
MEMS accelerometric sensor having high accuracy and low sensitivity...
Patent number
11,835,541
Issue date
Dec 5, 2023
STMicroelectronics S.r.l.
Alessandro Tocchio
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Physical quantity sensor, physical quantity sensor device, electron...
Patent number
11,650,220
Issue date
May 16, 2023
Seiko Epson Corporation
Satoru Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
Low-noise multi-axis MEMS accelerometer
Patent number
11,467,181
Issue date
Oct 11, 2022
Murata Manufacturing Co., Ltd.
Matti Liukku
G01 - MEASURING TESTING
Information
Patent Grant
Optomechanical structure with corrugated edge
Patent number
11,408,911
Issue date
Aug 9, 2022
Honeywell International Inc.
Neil Krueger
G01 - MEASURING TESTING
Information
Patent Grant
Vibrator device, electronic apparatus, and vehicle
Patent number
11,340,070
Issue date
May 24, 2022
Seiko Epson Corporation
Ryuta Nishizawa
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor, physical quantity sensor device, complex...
Patent number
11,204,367
Issue date
Dec 21, 2021
Seiko Epson Corporation
Satoru Tanaka
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Piezoresistive detection resonant device in particular with large v...
Patent number
11,125,632
Issue date
Sep 21, 2021
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Patrice Rey
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Anchor structure for securing optomechanical structure
Patent number
11,119,114
Issue date
Sep 14, 2021
Honeywell International Inc.
Neil Krueger
G01 - MEASURING TESTING
Information
Patent Grant
Low-noise multi-axis accelerometers and related methods
Patent number
11,099,207
Issue date
Aug 24, 2021
Analog Devices, Inc.
Xin Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor, physical quantity sensor device, electron...
Patent number
11,085,946
Issue date
Aug 10, 2021
Seiko Epson Corporation
Satoru Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor, physical quantity sensor device, portable...
Patent number
11,035,875
Issue date
Jun 15, 2021
Seiko Epson Corporation
Satoru Tanaka
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Inertial sensor with suspension spring structure surrounding anchor
Patent number
11,029,327
Issue date
Jun 8, 2021
NXP USA, INC.
Andrew C. McNeil
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor, physical quantity sensor device, electron...
Patent number
10,969,403
Issue date
Apr 6, 2021
Seiko Epson Corporation
Satoru Tanaka
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Electronic device having a first electrode formed on a movable susp...
Patent number
10,948,513
Issue date
Mar 16, 2021
Infineon Technologies AG
Thoralf Kautzsch
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Physical quantity sensor, electronic device, and vehicle
Patent number
10,935,567
Issue date
Mar 2, 2021
Seiko Epson Corporation
Shuichi Kawano
G01 - MEASURING TESTING
Information
Patent Grant
Temperature-compensated micro-electromechanical device, and method...
Patent number
10,894,713
Issue date
Jan 19, 2021
STMicroelectronics S.r.l.
Ernesto Lasalandra
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Physical quantity sensor having a spring connected to a movable unit
Patent number
10,883,887
Issue date
Jan 5, 2021
Seiko Epson Corporation
Atsuki Naruse
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometer
Patent number
10,884,020
Issue date
Jan 5, 2021
ATLANTIC INERTIAL SYSTEMS, LIMITED
Alan Malvern
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor, physical quantity sensor device, electron...
Patent number
10,830,789
Issue date
Nov 10, 2020
Seiko Epson Corporation
Shota Kigure
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Physical quantity sensor, physical quantity sensor device, electron...
Patent number
10,823,570
Issue date
Nov 3, 2020
Seiko Epson Corporation
Kei Kanemoto
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometers
Patent number
10,775,404
Issue date
Sep 15, 2020
ATLANTIC INERTIAL SYSTEMS, LIMITED.
Kevin Townsend
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometers
Patent number
10,670,623
Issue date
Jun 2, 2020
Atlantic Inertial Systems Limited
Kiran Mysore Harish
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Micromechanical structure for an acceleration sensor
Patent number
10,656,173
Issue date
May 19, 2020
Robert Bosch GmbH
Johannes Classen
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Physical quantity sensor, electronic device, and mobile body
Patent number
10,656,174
Issue date
May 19, 2020
Seiko Epson Corporation
Shota Kigure
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Fabrication process for a symmetrical MEMS accelerometer
Patent number
10,647,570
Issue date
May 12, 2020
Chinese Academy of Sciences Institute of Geology and Geophysics
Lianzhong Yu
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Dual capacitive linearization circuit
Patent number
10,649,001
Issue date
May 12, 2020
Invensense, Inc.
Matthew Julian Thompson
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Resonantly vibrating accelerometer with cross-coupling signal suppr...
Publication number
20230314463
Publication date
Oct 5, 2023
Emcore Corporation
Sergey Alexandrovich Zotov
G01 - MEASURING TESTING
Information
Patent Application
Resonantly vibrating accelerometer driven in multiple vibrational m...
Publication number
20230314467
Publication date
Oct 5, 2023
Emcore Corporation
Sergey Alexandrovich Zotov
G01 - MEASURING TESTING
Information
Patent Application
MICROMECHANICAL DEVICE FOR ENHANCED ACCELERATION MEASUREMENT
Publication number
20230266357
Publication date
Aug 24, 2023
STMicroelectronics S.r.l.
Gabriele GATTERE
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MODE LOCALISED ACCELEROMETER
Publication number
20230204621
Publication date
Jun 29, 2023
CAMBRIDGE ENTERPRISE LIMITED
Ashwin SESHIA
G01 - MEASURING TESTING
Information
Patent Application
ACCELEROMETER DEVICE WITH IMPROVED BIAS STABILITY
Publication number
20220308085
Publication date
Sep 29, 2022
NORTHROP GRUMMAN LITEF GMBH
Stefan König
G01 - MEASURING TESTING
Information
Patent Application
Vibrator Device, Electronic Apparatus, And Vehicle
Publication number
20220236058
Publication date
Jul 28, 2022
SEIKO EPSON CORPORATION
Ryuta Nishizawa
G01 - MEASURING TESTING
Information
Patent Application
LOW-NOISE MULTI-AXIS ACCELEROMETERS AND RELATED METHODS
Publication number
20210349123
Publication date
Nov 11, 2021
Analog Devices, Inc.
Xin Zhang
G01 - MEASURING TESTING
Information
Patent Application
VIBRATOR DEVICE, ELECTRONIC APPARATUS, AND VEHICLE
Publication number
20210033398
Publication date
Feb 4, 2021
SEIKO EPSON CORPORATION
Ryuta Nishizawa
G01 - MEASURING TESTING
Information
Patent Application
OPTOMECHANICAL STRUCTURE WITH CORRUGATED EDGE
Publication number
20210018531
Publication date
Jan 21, 2021
HONEYWELL INTERNATIONAL INC.
Neil Krueger
G01 - MEASURING TESTING
Information
Patent Application
ANCHOR STRUCTURE FOR SECURING OPTOMECHANICAL STRUCTURE
Publication number
20210018530
Publication date
Jan 21, 2021
HONEYWELL INTERNATIONAL INC.
Neil Krueger
G01 - MEASURING TESTING
Information
Patent Application
ACCELEROMETERS
Publication number
20200041537
Publication date
Feb 6, 2020
Atlantic Inertial Systems Limited
Kevin Townsend
G01 - MEASURING TESTING
Information
Patent Application
FABRICATION PROCESS FOR A SYMMETRICAL MEMS ACCELEROMETER
Publication number
20190382264
Publication date
Dec 19, 2019
Chinese Academy of Sciences Institute of Geology and Geophysics
Lianzhong YU
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
PHYSICAL QUANTITY SENSOR, PHYSICAL QUANTITY SENSOR DEVICE, ELECTRON...
Publication number
20190353678
Publication date
Nov 21, 2019
SEIKO EPSON CORPORATION
Satoru TANAKA
B60 - VEHICLES IN GENERAL
Information
Patent Application
PHYSICAL QUANTITY SENSOR
Publication number
20190301866
Publication date
Oct 3, 2019
DENSO CORPORATION
Takeru KANAZAWA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DUAL CAPACITIVE LINEARIZATION CIRCUIT
Publication number
20190170786
Publication date
Jun 6, 2019
InvenSense, Inc.
Matthew Julian THOMPSON
G01 - MEASURING TESTING
Information
Patent Application
Physical Quantity Sensor, Electronic Device, And Mobile Body
Publication number
20190154727
Publication date
May 23, 2019
SEIKO EPSON CORPORATION
Shota KIGURE
G01 - MEASURING TESTING
Information
Patent Application
MICROMECHANICAL INERTIAL SENSOR
Publication number
20190146003
Publication date
May 16, 2019
ROBERT BOSCH GmbH
Jochen Reinmuth
G01 - MEASURING TESTING
Information
Patent Application
MEMS-BASED THREE-AXIS ACCELERATION SENSOR
Publication number
20190033341
Publication date
Jan 31, 2019
SHIN SUNG C&T CO., LTD.
Ci Moo SONG
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MICROMECHANICAL STRUCTURE FOR AN ACCELERATION SENSOR
Publication number
20180328959
Publication date
Nov 15, 2018
ROBERT BOSCH GmbH
Johannes Classen
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ACCELEROMETERS
Publication number
20180217179
Publication date
Aug 2, 2018
Atlantic Inertial Systems Limited
Kiran Mysore Harish
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MEMS INERTIAL SENSOR AND FORMING METHOD THEREFOR
Publication number
20180210006
Publication date
Jul 26, 2018
MEMSEN ELECTRONICS INC
Lianjun Liu
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
OUT-OF-PLANE-ACCELEROMETER
Publication number
20180164339
Publication date
Jun 14, 2018
Safran Colibrys SA
Pascal Zwahlen
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
TEMPERATURE-COMPENSATED MICRO-ELECTROMECHANICAL DEVICE, AND METHOD...
Publication number
20180118561
Publication date
May 3, 2018
STMicroelectronics S.r.l.
Ernesto LASALANDRA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ELECTRONIC DEVICE, ELECTRONIC DEVICE APPARATUS, ELECTRONIC APPARATU...
Publication number
20180095105
Publication date
Apr 5, 2018
SEIKO EPSON CORPORATION
Shuichi KAWANO
G01 - MEASURING TESTING
Information
Patent Application
FUNCTIONAL ELEMENT, ELECTRONIC APPARATUS AND MOBILE ENTITY
Publication number
20180050899
Publication date
Feb 22, 2018
SEIKO EPSON CORPORATION
Satoru TANAKA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ACCELERATION SENSOR HAVING SPRING FORCE COMPENSATION
Publication number
20180024160
Publication date
Jan 25, 2018
NORTHROP GRUMMAN LITEF GMBH
STEFAN KOENIG
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
FABRICATION PROCESS FOR A SYMMETRICAL MEMS ACCELEROMETER
Publication number
20170336437
Publication date
Nov 23, 2017
Chinese Academy of Sciences Institute of Geology and Geophysics
Lianzhong YU
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ACCELEROMETERS
Publication number
20170153267
Publication date
Jun 1, 2017
Atlantic Inertial Systems Limited
Kevin Townsend
G01 - MEASURING TESTING
Information
Patent Application
ACCELEROMETERS
Publication number
20170089947
Publication date
Mar 30, 2017
Atlantic Inertial Systems Limited
Kevin Townsend
G01 - MEASURING TESTING
Information
Patent Application
MICRO ELECTRO MECHANICAL SYSTEM
Publication number
20170038210
Publication date
Feb 9, 2017
Hitachi, Ltd.
Munenori Degawa
G01 - MEASURING TESTING