Fourier techniques

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CPC
H01J2237/223

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/223Fourier techniques

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Automated ion-beam alignment for dual-beam instrument
- Patent number 12,154,757
- Issue date Nov 26, 2024
- FEI Company
- Jeremy Graham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation method by means of scanning transmission electron micro...
- Patent number 12,154,758
- Issue date Nov 26, 2024
- The University of Tokyo
- Naoya Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for high-performance electron microscopy
- Patent number 12,073,541
- Issue date Aug 27, 2024
- The Board of Regents of the University of Texas System
- Zbyszek Otwinowski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for image enhancement for a multi-beam charged-...
- Patent number 11,961,700
- Issue date Apr 16, 2024
- ASML Netherlands B.V.
- Maikel Robert Goosen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Freezable fluid cell for cryo-electron microscopy
- Patent number 11,402,308
- Issue date Aug 2, 2022
- Brandeis University
- Joel Meyerson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern measuring method and pattern measuring apparatus
- Patent number 10,665,424
- Issue date May 26, 2020
- HITACHI HIGH-TECH CORPORATION
- Hiroki Kawada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Beam alignment method and electron microscope
- Patent number 10,020,162
- Issue date Jul 10, 2018
- Jeol Ltd.
- Yuko Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for computing amount of drift and charged particl...
- Patent number 9,773,315
- Issue date Sep 26, 2017
- Jeol Ltd.
- Masaki Morita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern matching using a lamella of known shape for automated S/TEM...
- Patent number 9,761,408
- Issue date Sep 12, 2017
- FEI Company
- Paul Plachinda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for automatic correction of astigmatism
- Patent number 9,711,323
- Issue date Jul 18, 2017
- Intelligent Virus Imaging Inc.
- Ida-Maria Sintorn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Correlative optical and charged particle microscope
- Patent number 9,293,297
- Issue date Mar 22, 2016
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determination of elemental composition of substances from ultrahigh...
- Patent number 9,111,735
- Issue date Aug 18, 2015
- Bruker Daltonik GmbH
- Eugene N. Nikolaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,099,283
- Issue date Aug 4, 2015
- Hitachi High-Technologies Corporation
- Yoshinobu Hoshino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diffraction microscopy
- Patent number 8,994,811
- Issue date Mar 31, 2015
- National University Corporation Hokkaido University
- Kazutoshi Gohara
- G01 - MEASURING TESTING
Information Patent Grant
Blocking member for use in the diffraction plane of a TEM
- Patent number 8,637,821
- Issue date Jan 28, 2014
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing a representation of an object by means of a pa...
- Patent number 8,471,202
- Issue date Jun 25, 2013
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and electron microscope for measuring the similarity of two-...
- Patent number 8,351,710
- Issue date Jan 8, 2013
- Forschungszentrum Juelich GmbH
- Andreas Thust
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam equipment and charged particle microscopy
- Patent number 8,304,722
- Issue date Nov 6, 2012
- Hitachi High-Technologies Corporation
- Hiromi Inada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for adjusting optical axis of charged particle radiation and...
- Patent number 8,294,118
- Issue date Oct 23, 2012
- Hitachi High-Technologies Corporation
- Akemi Kono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection system and inspection method
- Patent number 7,755,776
- Issue date Jul 13, 2010
- Hitachi High-Technologies Corporation
- Hiroshi Makino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope
- Patent number 7,683,320
- Issue date Mar 23, 2010
- Jeol Ltd.
- Takumi Sannomiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Evaluation method of fine pattern feature, its equipment, and metho...
- Patent number 7,684,937
- Issue date Mar 23, 2010
- Hitachi, Ltd.
- Atsuko Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam equipment with magnification correction
- Patent number 7,649,172
- Issue date Jan 19, 2010
- Hitachi High-Technologies Corporation
- Masaru Ozawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for observing a specimen in a field of view of an...
- Patent number 7,544,936
- Issue date Jun 9, 2009
- Hitachi, Ltd.
- Hiromi Inada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam equipment and charged particle microscopy
- Patent number 7,435,957
- Issue date Oct 14, 2008
- Hitachi High-Technologies Corporation
- Hiromi Inada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electric charged particle beam microscopy, electric charged particl...
- Patent number 7,372,051
- Issue date May 13, 2008
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation method of fine pattern feature, its equipment, and metho...
- Patent number 7,366,620
- Issue date Apr 29, 2008
- Hitachi High-Technologies Corporation
- Atsuko Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Calibration standards and methods
- Patent number 7,361,941
- Issue date Apr 22, 2008
- KLA-Tencor Technologies Corporation
- Gian F. Lorusso
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for observing a specimen in a field of view of an...
- Patent number 7,164,129
- Issue date Jan 16, 2007
- Hitachi, Ltd.
- Hiromi Inada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for observing a specimen in a field of view of an...
- Patent number 7,022,989
- Issue date Apr 4, 2006
- Hitachi, Ltd.
- Hiromi Inada
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF DETERMINING AN ENERGY SPECTRUM OR ENERGY WIDTH OF A CHARG...
- Publication number 20240371600
- Publication date Nov 7, 2024
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- John Breuer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYOGENIC ELECTRON MICROSCOPY FULLY AUTOMATED ACQUISITION FOR SINGL...
- Publication number 20240038488
- Publication date Feb 1, 2024
- Health Technology Innovations, Inc.
- Narasimha KUMAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEM IMAGE ENHANCEMENT
- Publication number 20240005463
- Publication date Jan 4, 2024
- ASML NETHERLANDS B.V.
- Shakeeb Bin HASAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and Scanning Transmission Charged-Particle Microscope
- Publication number 20230352269
- Publication date Nov 2, 2023
- FEI Company
- Eric Bosch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGING METHOD AND APPARATUS FOR DIRECT ELECTRON DETECTION CAMERAS...
- Publication number 20230260743
- Publication date Aug 17, 2023
- INSTITUTE OF BIOPHYSICS,CHINESE ACADEMY OF SCIENCES
- Xinzheng ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE IMAGE-BASED PITCH WALK INSPECTION METH...
- Publication number 20230253179
- Publication date Aug 10, 2023
- Samsung Electronics Co., Ltd.
- SUNG MIN NAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBSERVATION METHOD BY MEANS OF SCANNING TRANSMISSION ELECTRON MICRO...
- Publication number 20230040811
- Publication date Feb 9, 2023
- THE UNIVERSITY OF TOKYO
- Naoya Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR HIGH-PERFORMANCE ELECTRON MICROSCOPY
- Publication number 20220277427
- Publication date Sep 1, 2022
- The Board of Regents of the University of Texas System
- Raquel Bromberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR IMAGE ENHANCEMENT FOR A MULTI-BEAM CHARGED-...
- Publication number 20220199358
- Publication date Jun 23, 2022
- ASML NETHERLANDS B.V.
- Maikel Robert GOOSEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR AUTOMATIC CORRECTION OF ASTIGMATISM
- Publication number 20170018396
- Publication date Jan 19, 2017
- INTELLIGENT VIRUS IMAGING INC.
- Ida-Maria Sintorn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN MATCHING USING A LAMELLA OF KNOWN SHAPE FOR AUTOMATED S/TEM...
- Publication number 20160247661
- Publication date Aug 25, 2016
- FEI Company
- Paul Plachinda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CORRELATIVE OPTICAL AND CHARGED PARTICLE MICROSCOPE
- Publication number 20150214001
- Publication date Jul 30, 2015
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ELECTRON BEAM IMAGING OF A SPECIMEN BY COMBINING IMAGES O...
- Publication number 20140239176
- Publication date Aug 28, 2014
- DIRECT ELECTRON, LP
- Benjamin Eugene Bammes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PRODUCING A REPRESENTATION OF AN OBJECT BY MEANS OF A PA...
- Publication number 20130270437
- Publication date Oct 17, 2013
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIFFRACTION MICROSCOPY
- Publication number 20120320185
- Publication date Dec 20, 2012
- Kazutoshi Gohara
- G02 - OPTICS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20120307038
- Publication date Dec 6, 2012
- Hitachi High-Technologies Corporation
- Yoshinobu Hoshino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Blocking Member for Use in the Diffraction Plane of a TEM
- Publication number 20110315876
- Publication date Dec 29, 2011
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ADJUSTING OPTICAL AXIS OF CHARGED PARTICLE RADIATION AND...
- Publication number 20110284759
- Publication date Nov 24, 2011
- Akemi Kono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING CHARGED PARTICLE MICROSCOPE
- Publication number 20110254944
- Publication date Oct 20, 2011
- Tohru Ishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for producing a representation of an object by means of a pa...
- Publication number 20110198497
- Publication date Aug 18, 2011
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ATOM PROBE DATA PROCESSES AND ASSOCIATED SYSTEMS
- Publication number 20100204927
- Publication date Aug 12, 2010
- Imago Scientific Instruments Corporation
- Brian P. Geiser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND ELECTRON MICROSCOPE FOR MEASURING THE SIMILARITY OF TWO-...
- Publication number 20090268969
- Publication date Oct 29, 2009
- FORSCHUNGSZENTRUM JUELICH GMBH
- Andreas Thust
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM EQUIPMENT AND CHARGED PARTICLE MICROSCOPY
- Publication number 20090084955
- Publication date Apr 2, 2009
- Hitachi High-Technologies Corporation
- Hiromi Inada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Evaluation method of fine pattern feature, its equipment, and metho...
- Publication number 20080215274
- Publication date Sep 4, 2008
- Hitachi High-Technologies Corporation
- Atsuko Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
Inspection system and inspection method
- Publication number 20080073533
- Publication date Mar 27, 2008
- Hitachi High-Technologies Corporation
- Hiroshi Makino
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Charged particle beam equipment
- Publication number 20080067380
- Publication date Mar 20, 2008
- Hitachi High-Technologies Corporation
- Masaru Ozawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Transmission Electron Microscope
- Publication number 20080011949
- Publication date Jan 17, 2008
- JEOL Ltd.
- Takumi Sannomiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and device for observing a specimen in a field of view of an...
- Publication number 20070176103
- Publication date Aug 2, 2007
- Hiromi Inada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus and measuring method of aberration coefficient of scannin...
- Publication number 20070158568
- Publication date Jul 12, 2007
- Taisuke Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and adjusting method for a scanning transmission electron...
- Publication number 20070158567
- Publication date Jul 12, 2007
- Taisuke Nakamura
- H01 - BASIC ELECTRIC ELEMENTS

Fourier techniques

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Automated ion-beam alignment for dual-beam instrument

Observation method by means of scanning transmission electron micro...

Methods for high-performance electron microscopy

Systems and methods for image enhancement for a multi-beam charged-...

Freezable fluid cell for cryo-electron microscopy

Pattern measuring method and pattern measuring apparatus

Beam alignment method and electron microscope

Device and method for computing amount of drift and charged particl...

Pattern matching using a lamella of known shape for automated S/TEM...

Method for automatic correction of astigmatism

Correlative optical and charged particle microscope

Determination of elemental composition of substances from ultrahigh...

Charged particle beam apparatus

Diffraction microscopy

Blocking member for use in the diffraction plane of a TEM

Method for producing a representation of an object by means of a pa...

Method and electron microscope for measuring the similarity of two-...

Charged particle beam equipment and charged particle microscopy

Method for adjusting optical axis of charged particle radiation and...

Inspection system and inspection method

Transmission electron microscope

Evaluation method of fine pattern feature, its equipment, and metho...

Charged particle beam equipment with magnification correction

Method and device for observing a specimen in a field of view of an...

Charged particle beam equipment and charged particle microscopy

Electric charged particle beam microscopy, electric charged particl...

Evaluation method of fine pattern feature, its equipment, and metho...

Calibration standards and methods

Method and device for observing a specimen in a field of view of an...

Method and device for observing a specimen in a field of view of an...

Patents Applicationslast 30 patents

METHOD OF DETERMINING AN ENERGY SPECTRUM OR ENERGY WIDTH OF A CHARG...

CRYOGENIC ELECTRON MICROSCOPY FULLY AUTOMATED ACQUISITION FOR SINGL...

SEM IMAGE ENHANCEMENT

Method and Scanning Transmission Charged-Particle Microscope

IMAGING METHOD AND APPARATUS FOR DIRECT ELECTRON DETECTION CAMERAS...

SCANNING ELECTRON MICROSCOPE IMAGE-BASED PITCH WALK INSPECTION METH...

OBSERVATION METHOD BY MEANS OF SCANNING TRANSMISSION ELECTRON MICRO...

METHODS FOR HIGH-PERFORMANCE ELECTRON MICROSCOPY

SYSTEMS AND METHODS FOR IMAGE ENHANCEMENT FOR A MULTI-BEAM CHARGED-...

METHOD FOR AUTOMATIC CORRECTION OF ASTIGMATISM

PATTERN MATCHING USING A LAMELLA OF KNOWN SHAPE FOR AUTOMATED S/TEM...

CORRELATIVE OPTICAL AND CHARGED PARTICLE MICROSCOPE

METHOD OF ELECTRON BEAM IMAGING OF A SPECIMEN BY COMBINING IMAGES O...

METHOD FOR PRODUCING A REPRESENTATION OF AN OBJECT BY MEANS OF A PA...

DIFFRACTION MICROSCOPY

CHARGED PARTICLE BEAM APPARATUS

Blocking Member for Use in the Diffraction Plane of a TEM

METHOD FOR ADJUSTING OPTICAL AXIS OF CHARGED PARTICLE RADIATION AND...

SCANNING CHARGED PARTICLE MICROSCOPE

Method for producing a representation of an object by means of a pa...

ATOM PROBE DATA PROCESSES AND ASSOCIATED SYSTEMS

METHOD AND ELECTRON MICROSCOPE FOR MEASURING THE SIMILARITY OF TWO-...

CHARGED PARTICLE BEAM EQUIPMENT AND CHARGED PARTICLE MICROSCOPY

Evaluation method of fine pattern feature, its equipment, and metho...

Inspection system and inspection method

Charged particle beam equipment

Transmission Electron Microscope

Method and device for observing a specimen in a field of view of an...

Apparatus and measuring method of aberration coefficient of scannin...

Apparatus and adjusting method for a scanning transmission electron...