Frequency variation

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CPC
G01B9/02002

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02002Frequency variation

Industries

Patents Grantslast 30 patents

Information Patent Grant
Laser interferometer
- Patent number 12,181,277
- Issue date Dec 31, 2024
- Seiko Epson Corporation
- Kohei Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Thickness evaluation method of cell sheet
- Patent number 11,906,301
- Issue date Feb 20, 2024
- SCREEN Holdings Co., Ltd.
- Ryo Hasebe
- G01 - MEASURING TESTING
Information Patent Grant
Laser interferometer having a vibrator to modulate light for displa...
- Patent number 11,879,730
- Issue date Jan 23, 2024
- Seiko Epson Corporation
- Jun Kitagawa
- G02 - OPTICS
Information Patent Grant
Laser interferometer
- Patent number 11,733,027
- Issue date Aug 22, 2023
- Seiko Epson Corporation
- Kohei Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer system, method of determining a mode hop of a laser...
- Patent number 11,719,529
- Issue date Aug 8, 2023
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining a position of a ring within a...
- Patent number 11,721,569
- Issue date Aug 8, 2023
- Andrew Myles
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods for computation-free wideband spectral correlation and anal...
- Patent number 11,567,351
- Issue date Jan 31, 2023
- Raytheon Company
- Vahid Ataie
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength tracking system, method to calibrate a wavelength tracki...
- Patent number 11,525,737
- Issue date Dec 13, 2022
- ASML Netherland B.V.
- Maarten Jozef Jansen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and arrangement for determining a position and/or an alignme...
- Patent number 11,454,493
- Issue date Sep 27, 2022
- Carl Zeiss Industrielle Messtechnik GmbH
- Nils Haverkamp
- G01 - MEASURING TESTING
Information Patent Grant
Optical sensor for surface inspection and metrology
- Patent number 11,442,025
- Issue date Sep 13, 2022
- Arun Anath Aiyer
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, systems, and methods for detecting light
- Patent number 11,441,889
- Issue date Sep 13, 2022
- Nokia Technologies Oy
- Xin Yuan
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Single sideband frequency modulated laser measurement for detecting...
- Patent number 11,415,406
- Issue date Aug 16, 2022
- Mitutoyo Corporation
- Shinji Komatsuzaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for determining the separation distance between a...
- Patent number 11,320,254
- Issue date May 3, 2022
- ADIGE S.P.A.
- Simone Donadello
- G01 - MEASURING TESTING
Information Patent Grant
Optical distance measurement device and processing device
- Patent number 11,248,902
- Issue date Feb 15, 2022
- Mitsubishi Electric Corporation
- Hiroki Goto
- G01 - MEASURING TESTING
Information Patent Grant
All-optical ultrasonic detection device based on light-induced ultr...
- Patent number 11,209,259
- Issue date Dec 28, 2021
- Beihang University
- Jianguo Ma
- G01 - MEASURING TESTING
Information Patent Grant
Stationary devices for determination of magnitude and polarity of e...
- Patent number 11,181,503
- Issue date Nov 23, 2021
- Robert Dickerman
- G01 - MEASURING TESTING
Information Patent Grant
Methods for computation-free wideband spectral correlation and anal...
- Patent number 11,137,627
- Issue date Oct 5, 2021
- Ram Photonics, LLC
- Vahid Ataie
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measuring apparatus comprising an interferometer and an absorption...
- Patent number 11,067,690
- Issue date Jul 20, 2021
- Leica Geosystems AG
- Thomas Lüthi
- G01 - MEASURING TESTING
Information Patent Grant
Position measurement system, zeroing method, lithographic apparatus...
- Patent number 10,883,816
- Issue date Jan 5, 2021
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G01 - MEASURING TESTING
Information Patent Grant
System and method for in-process inspection within advanced manufac...
- Patent number 10,794,836
- Issue date Oct 6, 2020
- Triad National Security, LLC
- Eric Flynn
- G01 - MEASURING TESTING
Information Patent Grant
High resolution and high efficiency photonic air data detection
- Patent number 10,788,340
- Issue date Sep 29, 2020
- Honeywell International Inc.
- Steven Tin
- G01 - MEASURING TESTING
Information Patent Grant
Light source failure identification in an optical metrology device
- Patent number 10,775,149
- Issue date Sep 15, 2020
- Onto Innovation Inc.
- George Andrew Antonelli
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring apparatus and shape measuring method using matched...
- Patent number 10,663,288
- Issue date May 26, 2020
- Kobelco Research Institute, Inc.
- Kazuhiko Tahara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Extending the range of spectrally controlled interferometry by supe...
- Patent number 10,641,599
- Issue date May 5, 2020
- APRE INSTRUMENTS, LLC
- Piotr Szwaykowski
- G01 - MEASURING TESTING
Information Patent Grant
Devices, systems, methods and storage mediums using full range opti...
- Patent number 10,578,422
- Issue date Mar 3, 2020
- Canon U.S.A., Inc.
- Daisuke Yamada
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Interferometry system and associated methods
- Patent number 10,514,250
- Issue date Dec 24, 2019
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Optical detection system for determining neural activity in brain b...
- Patent number 10,420,469
- Issue date Sep 24, 2019
- HI LLC
- Daniel Sobek
- G01 - MEASURING TESTING
Information Patent Grant
Optical coherence tomography with a fizeau-type interferometer
- Patent number 10,408,600
- Issue date Sep 10, 2019
- Santec Corporation
- Changho Chong
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus comprising an interferometer and an absorption...
- Patent number 10,338,219
- Issue date Jul 2, 2019
- Leica Geosystems AG
- Thomas Lüthi
- G01 - MEASURING TESTING
Information Patent Grant
Light pulse atom interferometer velocity reference
- Patent number 10,330,459
- Issue date Jun 25, 2019
- AOSense, Inc.
- Michael R. Matthews
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL HETERODYNE INTERFERENCE MEASUREMENT DEVICE AND OPTICAL HETE...
- Publication number 20240361120
- Publication date Oct 31, 2024
- Hamamatsu Photonics K.K.
- Naoaki KATO
- G01 - MEASURING TESTING
Information Patent Application
Laser Interferometer
- Publication number 20240318951
- Publication date Sep 26, 2024
- SEIKO EPSON CORPORATION
- Nobuhito HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
REFLECTIVE INTERFEROMETER SYSTEMS AND METHODS THEREOF
- Publication number 20240230311
- Publication date Jul 11, 2024
- OptiPro Systems, LLC
- Robert D. NIEDERRITER
- G01 - MEASURING TESTING
Information Patent Application
Laser Interferometer
- Publication number 20240175674
- Publication date May 30, 2024
- SEIKO EPSON CORPORATION
- Kohei YAMADA
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE FIBER INTERFEROMETER DISPLACEMENT MEASURING SYSTEM AND M...
- Publication number 20230408250
- Publication date Dec 21, 2023
- BEIJING U-PRECISION TECH CO.. LTD.
- Guohua SUN
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE GRATING INTERFEROMETRY SYSTEM BASED ON SECONDARY DIFFRAC...
- Publication number 20230366667
- Publication date Nov 16, 2023
- TSINGHUA UNIVERSITY
- Yu ZHU
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER...
- Publication number 20230324164
- Publication date Oct 12, 2023
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Laser Interferometer
- Publication number 20230314121
- Publication date Oct 5, 2023
- SEIKO EPSON CORPORATION
- Kohei YAMADA
- G02 - OPTICS
Information Patent Application
Laser Interferometer
- Publication number 20230085489
- Publication date Mar 16, 2023
- SEIKO EPSON CORPORATION
- Kohei YAMADA
- G02 - OPTICS
Information Patent Application
Wavelength Tracking System, Method to Calibrate a Wavelength Tracki...
- Publication number 20230056872
- Publication date Feb 23, 2023
- ASML NETHERLANDS B.V.
- Engelbertus Antonius Fransiscus VAN DER PASCH
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING A POSITION OF A RING WITHIN A...
- Publication number 20220406635
- Publication date Dec 22, 2022
- Applied Materials, Inc.
- Andrew MYLES
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSOR FOR SURFACE INSPECTION AND METROLOGY
- Publication number 20220307992
- Publication date Sep 29, 2022
- Arun Anath AIYER
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER...
- Publication number 20220205775
- Publication date Jun 30, 2022
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR COMPUTATION-FREE WIDEBAND SPECTRAL CORRELATION AND ANAL...
- Publication number 20220100008
- Publication date Mar 31, 2022
- RAM Photonics, LLC
- Vahid Ataie
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
THICKNESS EVALUATION METHOD OF CELL SHEET
- Publication number 20220090909
- Publication date Mar 24, 2022
- SCREEN Holdings Co., Ltd.
- Ryo Hasebe
- G01 - MEASURING TESTING
Information Patent Application
LASER INTERFEROMETER
- Publication number 20220065613
- Publication date Mar 3, 2022
- SEIKO EPSON CORPORATION
- Jun KITAGAWA
- G01 - MEASURING TESTING
Information Patent Application
Laser Interferometer
- Publication number 20220065614
- Publication date Mar 3, 2022
- SEIKO EPSON CORPORATION
- Kohei YAMADA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, SYSTEMS, AND METHODS FOR DETECTING LIGHT
- Publication number 20210372767
- Publication date Dec 2, 2021
- Nokia Technologies Oy
- Xin YUAN
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD AND ARRANGEMENT FOR DETERMINING A POSITION AND/OR AN ALIGNME...
- Publication number 20210239454
- Publication date Aug 5, 2021
- Carl Zeiss Industrielle Messtechnik GmbH
- Nils HAVERKAMP
- G01 - MEASURING TESTING
Information Patent Application
LASER APPARATUS, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD
- Publication number 20210190474
- Publication date Jun 24, 2021
- MITUTOYO CORPORATION
- Shinji KOMATSUZAKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING THE SEPARATION DISTANCE BETWEEN A...
- Publication number 20210172721
- Publication date Jun 10, 2021
- Adige S.p.A.
- Simone Donadello
- G01 - MEASURING TESTING
Information Patent Application
POSITION MEASUREMENT SYSTEM, ZEROING METHOD, LITHOGRAPHIC APPARATUS...
- Publication number 20200191552
- Publication date Jun 18, 2020
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASURING APPARATUS AND SHAPE MEASURING METHOD
- Publication number 20190293407
- Publication date Sep 26, 2019
- KOBELCO RESEARCH INSTITUTE, INC.
- Kazuhiko TAHARA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MEASURING APPARATUS COMPRISING AN INTERFEROMETER AND AN ABSORPTION...
- Publication number 20190265355
- Publication date Aug 29, 2019
- Leica Geosystems AG
- Thomas Lüthi
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY SYSTEM AND ASSOCIATED METHODS
- Publication number 20190162526
- Publication date May 30, 2019
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DETECTION SYSTEM FOR DETERMINING NEURAL ACTIVITY IN BRAIN B...
- Publication number 20190150745
- Publication date May 23, 2019
- HI LLC
- Daniel Sobek
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
FREQUENCY MODULATED MULTIPLE WAVELENGTH PARALLEL PHASE SHIFT INTERF...
- Publication number 20190101380
- Publication date Apr 4, 2019
- B.G. NEGEV TECHNOLOGIES AND APPLICATIONS LTD., AT BEN-GURION UNIVERSITY
- Ibrahim ABDULHALIM
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY WITH A FIZEAU-TYPE INTERFEROMETER
- Publication number 20180372478
- Publication date Dec 27, 2018
- SANTEC CORPORATION
- Changho Chong
- G01 - MEASURING TESTING
Information Patent Application
DUAL-HOMODYNE LASER INTERFEROMETRIC NANOMETER DISPLACEMENT MEASURIN...
- Publication number 20180328710
- Publication date Nov 15, 2018
- ZHEJIANG SCI-TECH UNIVERSITY
- Liping YAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASUREMENT OF MULTILAYER STRUCTURES
- Publication number 20180321145
- Publication date Nov 8, 2018
- LUMETRICS, INC.
- Michael A. MARCUS
- H01 - BASIC ELECTRIC ELEMENTS

Frequency variation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Laser interferometer

Thickness evaluation method of cell sheet

Laser interferometer having a vibrator to modulate light for displa...

Laser interferometer

Interferometer system, method of determining a mode hop of a laser...

Method and apparatus for determining a position of a ring within a...

Methods for computation-free wideband spectral correlation and anal...

Wavelength tracking system, method to calibrate a wavelength tracki...

Method and arrangement for determining a position and/or an alignme...

Optical sensor for surface inspection and metrology

Apparatus, systems, and methods for detecting light

Single sideband frequency modulated laser measurement for detecting...

Method and system for determining the separation distance between a...

Optical distance measurement device and processing device

All-optical ultrasonic detection device based on light-induced ultr...

Stationary devices for determination of magnitude and polarity of e...

Methods for computation-free wideband spectral correlation and anal...

Measuring apparatus comprising an interferometer and an absorption...

Position measurement system, zeroing method, lithographic apparatus...

System and method for in-process inspection within advanced manufac...

High resolution and high efficiency photonic air data detection

Light source failure identification in an optical metrology device

Shape measuring apparatus and shape measuring method using matched...

Extending the range of spectrally controlled interferometry by supe...

Devices, systems, methods and storage mediums using full range opti...

Interferometry system and associated methods

Optical detection system for determining neural activity in brain b...

Optical coherence tomography with a fizeau-type interferometer

Measuring apparatus comprising an interferometer and an absorption...

Light pulse atom interferometer velocity reference

Patents Applicationslast 30 patents

OPTICAL HETERODYNE INTERFERENCE MEASUREMENT DEVICE AND OPTICAL HETE...

Laser Interferometer

REFLECTIVE INTERFEROMETER SYSTEMS AND METHODS THEREOF

Laser Interferometer

HETERODYNE FIBER INTERFEROMETER DISPLACEMENT MEASURING SYSTEM AND M...

HETERODYNE GRATING INTERFEROMETRY SYSTEM BASED ON SECONDARY DIFFRAC...

INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER...

Laser Interferometer

Laser Interferometer

Wavelength Tracking System, Method to Calibrate a Wavelength Tracki...

METHOD AND APPARATUS FOR DETERMINING A POSITION OF A RING WITHIN A...

OPTICAL SENSOR FOR SURFACE INSPECTION AND METROLOGY

INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER...

METHODS FOR COMPUTATION-FREE WIDEBAND SPECTRAL CORRELATION AND ANAL...

THICKNESS EVALUATION METHOD OF CELL SHEET

LASER INTERFEROMETER

Laser Interferometer

APPARATUS, SYSTEMS, AND METHODS FOR DETECTING LIGHT

METHOD AND ARRANGEMENT FOR DETERMINING A POSITION AND/OR AN ALIGNME...

LASER APPARATUS, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD

METHOD AND SYSTEM FOR DETERMINING THE SEPARATION DISTANCE BETWEEN A...

POSITION MEASUREMENT SYSTEM, ZEROING METHOD, LITHOGRAPHIC APPARATUS...

SHAPE MEASURING APPARATUS AND SHAPE MEASURING METHOD

MEASURING APPARATUS COMPRISING AN INTERFEROMETER AND AN ABSORPTION...

INTERFEROMETRY SYSTEM AND ASSOCIATED METHODS

OPTICAL DETECTION SYSTEM FOR DETERMINING NEURAL ACTIVITY IN BRAIN B...

FREQUENCY MODULATED MULTIPLE WAVELENGTH PARALLEL PHASE SHIFT INTERF...

OPTICAL COHERENCE TOMOGRAPHY WITH A FIZEAU-TYPE INTERFEROMETER

DUAL-HOMODYNE LASER INTERFEROMETRIC NANOMETER DISPLACEMENT MEASURIN...

METHOD OF MEASUREMENT OF MULTILAYER STRUCTURES