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Wafer evaluation method
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Patent number 11,769,697
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Issue date Sep 26, 2023
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SK SILTRON CO., LTD.
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Jung Kil Park
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H01 - BASIC ELECTRIC ELEMENTS
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Doping method
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Patent number 10,566,198
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Issue date Feb 18, 2020
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Infineon Technologies AG
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Hans-Joachim Schulze
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H01 - BASIC ELECTRIC ELEMENTS
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Epitaxial growth method
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Patent number 9,518,339
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Issue date Dec 13, 2016
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Sumco Corporation
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Masayuki Ishibashi
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C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
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Epitaxial growth method
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Patent number 9,127,374
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Issue date Sep 8, 2015
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Sumco Corporation
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Masayuki Ishibashi
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