Functional testing

Industry

CPC
G01R31/3163

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/3163Functional testing

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Signal path monitor
- Patent number 11,561,257
- Issue date Jan 24, 2023
- ALLEGRO MICROSYSTEMS, LLC
- Ezequiel Rubinsztain
- G01 - MEASURING TESTING
Information Patent Grant
Method for diagnosing analog circuit fault based on vector-valued r...
- Patent number 11,486,925
- Issue date Nov 1, 2022
- HEFEI UNIVERSITY OF TECHNOLOGY
- Yigang He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Digital output monitor circuit and high frequency front-end circuit
- Patent number 11,378,621
- Issue date Jul 5, 2022
- Murata Manufacturing Co., Ltd.
- Satoru Matsuyama
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Vector-valued regularized kernel function approximation based fault...
- Patent number 11,287,470
- Issue date Mar 29, 2022
- HEFEI UNIVERSITY OF TECHNOLOGY
- Yigang He
- G01 - MEASURING TESTING
Information Patent Grant
Analog-test-bus apparatuses involving calibration of comparator cir...
- Patent number 10,866,277
- Issue date Dec 15, 2020
- NXP B.V.
- Jan-Peter Schat
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Deep belief network feature extraction-based analogue circuit fault...
- Patent number 10,776,232
- Issue date Sep 15, 2020
- WUHAN UNIVERSITY
- Yigang He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fingerprint recognition method and apparatus and computer readable...
- Patent number 10,691,965
- Issue date Jun 23, 2020
- BEIJING XIAOMI MOBILE SOFTWARE CO., LTD.
- Xuebin Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analog functional safety with anomaly detection
- Patent number 10,685,159
- Issue date Jun 16, 2020
- Intel Corporation
- Fei Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for testing comparator and device therefor
- Patent number 9,897,649
- Issue date Feb 20, 2018
- NXP USA, INC.
- Juxiang Ren
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test apparatus, test method, calibration device, and calibration me...
- Patent number 9,791,512
- Issue date Oct 17, 2017
- Advantest Corporation
- Shin Masuda
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing comparator and device therefor
- Patent number 9,134,395
- Issue date Sep 15, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Juxiang Ren
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for frequency response measurement
- Patent number 8,854,030
- Issue date Oct 7, 2014
- Tallinn University of Technology
- Olev Märtens
- G01 - MEASURING TESTING
Information Patent Grant
System for testing electronic circuits
- Patent number 8,855,962
- Issue date Oct 7, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Deepak Jindal
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for testing integrated circuits with hysteresis
- Patent number 8,836,366
- Issue date Sep 16, 2014
- Apple Inc.
- Anh T. Hoang
- G01 - MEASURING TESTING
Information Patent Grant
Circuit arrangement and method for testing a reset circuit
- Patent number 8,564,323
- Issue date Oct 22, 2013
- AMS AG
- Karl Georg Waser
- G11 - INFORMATION STORAGE
Information Patent Grant
Analog scan circuit, analog flip-flop, and data processing apparatus
- Patent number 8,458,542
- Issue date Jun 4, 2013
- Sony Corporation
- Kazutoshi Shimizume
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for sub-assembly error detection in high volta...
- Patent number 8,222,910
- Issue date Jul 17, 2012
- Atmel Corporation
- Dilip Sangam
- G01 - MEASURING TESTING
Information Patent Grant
Probing analog signals
- Patent number 8,175,823
- Issue date May 8, 2012
- Intel Corporation
- Amir Mezer
- G01 - MEASURING TESTING
Information Patent Grant
Test probe structure
- Patent number 8,134,380
- Issue date Mar 13, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yung Hsin Kuo
- G01 - MEASURING TESTING
Information Patent Grant
Source-measure unit based on digital control loop
- Patent number 7,903,008
- Issue date Mar 8, 2011
- National Instruments Corporation
- Christopher G. Regier
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device test system having reduced current leakage
- Patent number 7,589,550
- Issue date Sep 15, 2009
- FREESCALE SEMICONDUCTOR, INC.
- Bradley P. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for testing power down reset function of an electronic device
- Patent number 7,404,119
- Issue date Jul 22, 2008
- Hon Hai Precision Industry Co., Ltd.
- Ming-Chih Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Interface circuit for using a low voltage logic tester to test a hi...
- Patent number 7,383,477
- Issue date Jun 3, 2008
- Princeton Technology Corporation
- Cheng Yung Teng
- G01 - MEASURING TESTING
Information Patent Grant
Power detector for mismatched load
- Patent number 7,348,853
- Issue date Mar 25, 2008
- Avago Technologies Wireless IP Pte. Ltd.
- Lovell H. Camnitz
- G01 - MEASURING TESTING
Information Patent Grant
Voltage access circuit configured for outputting a selected analog...
- Patent number 7,221,192
- Issue date May 22, 2007
- Advanced Micro Devices, Inc.
- Gerald Robert Talbot
- G01 - MEASURING TESTING
Information Patent Grant
Power detector for mismatched load
- Patent number 7,164,315
- Issue date Jan 16, 2007
- Avago Technologies Wirleless IP (Singapore) Pte. Ltd.
- Lovell H. Camnitz
- G01 - MEASURING TESTING
Information Patent Grant
Automatic ATAP test bench generator
- Patent number 7,024,346
- Issue date Apr 4, 2006
- Koninklijke Philips Electronics N.V.
- Claire Allard
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Parametric testing for high pin count ASIC
- Patent number 7,010,733
- Issue date Mar 7, 2006
- International Business Machines Corporation
- Robert W. Bassett
- G01 - MEASURING TESTING
Information Patent Grant
Power detector for mismatched load
- Patent number 6,924,698
- Issue date Aug 2, 2005
- Agilent Technologies, Inc.
- Lovell H. Camnitz
- G01 - MEASURING TESTING
Information Patent Grant
Test instrument with multiple analog modules
- Patent number 6,870,384
- Issue date Mar 22, 2005
- Credence Systems Corporation
- Paolo Dalla Ricca
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST CIRCUIT CAPABLE OF EFFICIENTLY UTILIZING MOUNTING AREA
- Publication number 20240345159
- Publication date Oct 17, 2024
- TECHWIDU CO., LTD.
- Hyoung-Rae KIM
- G01 - MEASURING TESTING
Information Patent Application
RF TESTING METHOD AND TESTING SYSTEM
- Publication number 20240125849
- Publication date Apr 18, 2024
- MEDIATEK INC.
- Jung-Yin CHIEN
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
VECTOR-VALUED REGULARIZED KERNEL FUNCTION APPROXIMATION BASED FAULT...
- Publication number 20210293881
- Publication date Sep 23, 2021
- HEFEI UNIVERSITY OF TECHNOLOGY
- Yigang HE
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE AND TESTING METHOD
- Publication number 20210199716
- Publication date Jul 1, 2021
- KABUSHIKI KAISHA TOKAI RIKA DENKI SEISAKUSHO
- Sunao NAGAI
- G01 - MEASURING TESTING
Information Patent Application
Method for diagnosing analog circuit fault based on vector-valued r...
- Publication number 20200271720
- Publication date Aug 27, 2020
- HEFEI UNIVERSITY OF TECHNOLOGY
- Yigang He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIGITAL OUTPUT MONITOR CIRCUIT AND HIGH FREQUENCY FRONT-END CIRCUIT
- Publication number 20200249274
- Publication date Aug 6, 2020
- MURATA MANUFACTURING CO., LTD.
- Satoru MATSUYAMA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ANALOG-TEST-BUS APPARATUSES INVOLVING CALIBRATION OF COMPARATOR CIR...
- Publication number 20200072900
- Publication date Mar 5, 2020
- NXP B.V.
- Jan-Peter Schat
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DEEP BELIEF NETWORK FEATURE EXTRACTION-BASED ANALOGUE CIRCUIT FAULT...
- Publication number 20190243735
- Publication date Aug 8, 2019
- WUHAN UNIVERSITY
- Yigang HE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FINGERPRINT RECOGNITION METHOD AND APPARATUS AND COMPUTER READABLE...
- Publication number 20190205683
- Publication date Jul 4, 2019
- Beijing Xiaomi Mobile Software Co., Ltd.
- Xuebin HUANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALOG FUNCTIONAL SAFETY WITH ANOMALY DETECTION
- Publication number 20190050515
- Publication date Feb 14, 2019
- Intel Corporation
- Fei Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND FAILURE DETECTION METHOD
- Publication number 20170045578
- Publication date Feb 16, 2017
- RENESAS ELECTRONICS CORPORATION
- Yuichi OKUDA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS, TEST METHOD, CALIBRATION DEVICE, AND CALIBRATION ME...
- Publication number 20150253388
- Publication date Sep 10, 2015
- Advantest Corporation
- Shin MASUDA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING COMPARATOR AND DEVICE THEREFOR
- Publication number 20130234743
- Publication date Sep 12, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Juxiang Ren
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING ELECTRONIC CIRCUITS
- Publication number 20130218508
- Publication date Aug 22, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Deepak JINDAL
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING INTEGRATED CIRCUITS WITH HYSTERESIS
- Publication number 20130088254
- Publication date Apr 11, 2013
- Anh T. Hoang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR FREQUENCY RESPONSE MEASUREMENT
- Publication number 20120007583
- Publication date Jan 12, 2012
- OÜ ELIKO TEHNOLOOGIA ARENDUSKESKUS
- Olev Märtens
- G01 - MEASURING TESTING
Information Patent Application
Circuit Arrangement and Method for Testing a Reset Circuit
- Publication number 20110025365
- Publication date Feb 3, 2011
- AUSTRIAMICROSYSTEMS AG
- Karl Georg Waser
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARTUS FOR SUB-ASSEMBLY ERROR DETECTION IN HIGH VOLTAG...
- Publication number 20110012609
- Publication date Jan 20, 2011
- mSilica Inc
- Dilip S
- G01 - MEASURING TESTING
Information Patent Application
ANALOG SCAN CIRCUIT, ANALOG FLIP-FLOP, AND DATA PROCESSING APPARATUS
- Publication number 20100289549
- Publication date Nov 18, 2010
- SONY CORPORATION
- Kazutoshi Shimizume
- G01 - MEASURING TESTING
Information Patent Application
Probing analog signals
- Publication number 20100153032
- Publication date Jun 17, 2010
- Intel Corporation
- Amir Mezer
- G01 - MEASURING TESTING
Information Patent Application
TEST PROBE STRUCTURE
- Publication number 20100127721
- Publication date May 27, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yung Hsin Kuo
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION TECHNIQUE FOR POWER AMPLIFIERS
- Publication number 20090192738
- Publication date Jul 30, 2009
- Nokia Corporation
- Markus Nentwig
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Source-Measure Unit Based on Digital Control Loop
- Publication number 20090121908
- Publication date May 14, 2009
- Christopher G. Regier
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE TEST SYSTEM HAVING REDUCED CURRENT LEAKAGE
- Publication number 20090066359
- Publication date Mar 12, 2009
- Bradley P. Smith
- G01 - MEASURING TESTING
Information Patent Application
Load Board Based Test Circuits
- Publication number 20080174319
- Publication date Jul 24, 2008
- Marcellus C. Harper
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Integrated semiconductor circuit
- Publication number 20080150608
- Publication date Jun 26, 2008
- Marco Schreiter
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MODEL-BASED TESTING METHOD AND SYSTEM USING EMBEDDED MODELS
- Publication number 20080086668
- Publication date Apr 10, 2008
- Stanley T. Jefferson
- G01 - MEASURING TESTING
Information Patent Application
Interace circuit for using a low voltage logic tester to test a hig...
- Publication number 20070168787
- Publication date Jul 19, 2007
- Princeton Technology Corporation
- Cheng Yung Teng
- G01 - MEASURING TESTING
Information Patent Application
Power detector for mismatched load
- Publication number 20070057664
- Publication date Mar 15, 2007
- Lovell H. Camnitz
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Circuit for testing power down reset function of an electronic device
- Publication number 20060041811
- Publication date Feb 23, 2006
- HON HAI Precision Industry CO., LTD.
- Ming-Chih Hsieh
- G01 - MEASURING TESTING

Functional testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Signal path monitor

Method for diagnosing analog circuit fault based on vector-valued r...

Digital output monitor circuit and high frequency front-end circuit

Vector-valued regularized kernel function approximation based fault...

Analog-test-bus apparatuses involving calibration of comparator cir...

Deep belief network feature extraction-based analogue circuit fault...

Fingerprint recognition method and apparatus and computer readable...

Analog functional safety with anomaly detection

Method for testing comparator and device therefor

Test apparatus, test method, calibration device, and calibration me...

Method for testing comparator and device therefor

Method and device for frequency response measurement

System for testing electronic circuits

Method for testing integrated circuits with hysteresis

Circuit arrangement and method for testing a reset circuit

Analog scan circuit, analog flip-flop, and data processing apparatus

Method and apparatus for sub-assembly error detection in high volta...

Probing analog signals

Test probe structure

Source-measure unit based on digital control loop

Semiconductor device test system having reduced current leakage

Circuit for testing power down reset function of an electronic device

Interface circuit for using a low voltage logic tester to test a hi...

Power detector for mismatched load

Voltage access circuit configured for outputting a selected analog...

Power detector for mismatched load

Automatic ATAP test bench generator

Parametric testing for high pin count ASIC

Power detector for mismatched load

Test instrument with multiple analog modules

Patents Applicationslast 30 patents

TEST CIRCUIT CAPABLE OF EFFICIENTLY UTILIZING MOUNTING AREA

RF TESTING METHOD AND TESTING SYSTEM

VECTOR-VALUED REGULARIZED KERNEL FUNCTION APPROXIMATION BASED FAULT...

TESTING DEVICE AND TESTING METHOD

Method for diagnosing analog circuit fault based on vector-valued r...

DIGITAL OUTPUT MONITOR CIRCUIT AND HIGH FREQUENCY FRONT-END CIRCUIT

ANALOG-TEST-BUS APPARATUSES INVOLVING CALIBRATION OF COMPARATOR CIR...

DEEP BELIEF NETWORK FEATURE EXTRACTION-BASED ANALOGUE CIRCUIT FAULT...

FINGERPRINT RECOGNITION METHOD AND APPARATUS AND COMPUTER READABLE...

ANALOG FUNCTIONAL SAFETY WITH ANOMALY DETECTION

SEMICONDUCTOR DEVICE AND FAILURE DETECTION METHOD

TEST APPARATUS, TEST METHOD, CALIBRATION DEVICE, AND CALIBRATION ME...

METHOD FOR TESTING COMPARATOR AND DEVICE THEREFOR

SYSTEM FOR TESTING ELECTRONIC CIRCUITS

METHOD FOR TESTING INTEGRATED CIRCUITS WITH HYSTERESIS

METHOD AND DEVICE FOR FREQUENCY RESPONSE MEASUREMENT

Circuit Arrangement and Method for Testing a Reset Circuit

METHOD AND APPARTUS FOR SUB-ASSEMBLY ERROR DETECTION IN HIGH VOLTAG...

ANALOG SCAN CIRCUIT, ANALOG FLIP-FLOP, AND DATA PROCESSING APPARATUS

Probing analog signals

TEST PROBE STRUCTURE

CALIBRATION TECHNIQUE FOR POWER AMPLIFIERS

Source-Measure Unit Based on Digital Control Loop

SEMICONDUCTOR DEVICE TEST SYSTEM HAVING REDUCED CURRENT LEAKAGE

Load Board Based Test Circuits

Integrated semiconductor circuit

MODEL-BASED TESTING METHOD AND SYSTEM USING EMBEDDED MODELS

Interace circuit for using a low voltage logic tester to test a hig...

Power detector for mismatched load

Circuit for testing power down reset function of an electronic device