generating a spatial carrier frequency

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G01B9/02032

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

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G01B9/02032generating a spatial carrier frequency

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for imaging and interferometry measurements
- Patent number 12,163,777
- Issue date Dec 10, 2024
- FOGALE NANOTECH
- Alain Courteville
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Full-field OCT method and system for generating an imaging of an oc...
- Patent number 11,986,242
- Issue date May 21, 2024
- VISOTEC GMBH
- Peter Koch
- G01 - MEASURING TESTING
Information Patent Grant
Frequency-domain interferometric based imaging systems and methods
- Patent number 11,890,052
- Issue date Feb 6, 2024
- Carl Zeiss Meditec, Inc.
- Tilman Schmoll
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems of holographic interferometry
- Patent number 11,892,292
- Issue date Feb 6, 2024
- RD Synergy Ltd.
- Dov Furman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System for spatial multiplexing
- Patent number 11,768,068
- Issue date Sep 26, 2023
- Ramot at Tel Aviv University Ltd.
- Natan Tzvi Shaked
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Surface shape measurement device and surface shape measurement method
- Patent number 11,635,289
- Issue date Apr 25, 2023
- UNIVERSITY OF HYOGO
- Kunihiro Sato
- G01 - MEASURING TESTING
Information Patent Grant
Method for generating a two-dimensional interferogram using a miche...
- Patent number 11,421,979
- Issue date Aug 23, 2022
- VISOTEC GMBH
- Michael Münst
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and system for determining the separation distance between a...
- Patent number 11,320,254
- Issue date May 3, 2022
- ADIGE S.P.A.
- Simone Donadello
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement and method for robust single-shot interferometry
- Patent number 11,231,269
- Issue date Jan 25, 2022
- Universitat Stuttgart
- Klaus Körner
- G01 - MEASURING TESTING
Information Patent Grant
Digital holography range Doppler receiver
- Patent number 11,099,523
- Issue date Aug 24, 2021
- Lockheed Martin Corporation
- Philip Gatt
- G01 - MEASURING TESTING
Information Patent Grant
Optical phase measurement method and system
- Patent number 11,029,258
- Issue date Jun 8, 2021
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
System and method for a displacement measurement
- Patent number 10,845,191
- Issue date Nov 24, 2020
- Nikon Corporation
- Eric Peter Goodwin
- G01 - MEASURING TESTING
Information Patent Grant
Frequency-domain interferometric based imaging systems and methods
- Patent number 10,799,111
- Issue date Oct 13, 2020
- Carl Zeiss Meditec, Inc.
- Tilman Schmoll
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical delay line for coherence imaging
- Patent number 10,782,117
- Issue date Sep 22, 2020
- Canon U.S.A., Inc.
- Badr Elmaanaoui
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems of holographic interferometry
- Patent number 10,725,428
- Issue date Jul 28, 2020
- RD Synergy Ltd.
- Dov Furman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and device for exposing at least one sectional face inside a...
- Patent number 10,682,052
- Issue date Jun 16, 2020
- Medizinisches Laserzentrum Luebeck GmbH
- Peter Koch
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Interferometer using tilted object waves and comprising a Fizeau in...
- Patent number 10,612,905
- Issue date Apr 7, 2020
- Universitaet Stuttgart
- Goran Baer
- G01 - MEASURING TESTING
Information Patent Grant
Multichannel optical receivers
- Patent number 10,533,837
- Issue date Jan 14, 2020
- Steven James Frisken
- G01 - MEASURING TESTING
Information Patent Grant
Method for phase resolved heterodyne shearographic measurements
- Patent number 10,473,452
- Issue date Nov 12, 2019
- UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF THE ARMY
- James D. Perea
- G01 - MEASURING TESTING
Information Patent Grant
Single shot full-field reflection phase microscopy
- Patent number 10,451,402
- Issue date Oct 22, 2019
- Massachusetts Institute of Technology
- Zahid Yaqoob
- G01 - MEASURING TESTING
Information Patent Grant
Optical system phase acquisition method and optical system evaluati...
- Patent number 10,365,164
- Issue date Jul 30, 2019
- Ushio Denki Kabushiki Kaisha
- Masashi Okamoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Interferometric measuring arrangement
- Patent number 10,337,850
- Issue date Jul 2, 2019
- Carl Zeiss SMT GmbH
- Jochen Hetzler
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Systems and methods for wide field-of-view optical coherence tomogr...
- Patent number 10,327,632
- Issue date Jun 25, 2019
- Novartis AG
- Jochen Horn
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
System and method for a displacement measurement
- Patent number 10,302,419
- Issue date May 28, 2019
- Nikon Corporation
- Eric Peter Goodwin
- G01 - MEASURING TESTING
Information Patent Grant
System for performing dual path, two-dimensional optical coherence...
- Patent number 10,288,407
- Issue date May 14, 2019
- ADOM, ADVANCED OPTICAL TECHNOLOGIES, LTD.
- Yoel Arieli
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Noise reduction techniques, fractional bi-spectrum and fractional c...
- Patent number 10,203,195
- Issue date Feb 12, 2019
- University of North Carolina at Charlotte
- Faramarz Farahi
- G01 - MEASURING TESTING
Information Patent Grant
Optical phase measurement method and system
- Patent number 10,161,885
- Issue date Dec 25, 2018
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for motility contrast imaging
- Patent number 10,101,147
- Issue date Oct 16, 2018
- Purdue Research Foundation
- David D. Nolte
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for phase resolved heterodyne shearographic me...
- Patent number 10,088,292
- Issue date Oct 2, 2018
- The United States of America, as represented by the Secretary of the Army
- James D. Perea
- G01 - MEASURING TESTING
Information Patent Grant
Metrology method
- Patent number 9,982,999
- Issue date May 29, 2018
- DuPont Teijin Films U.S. Limited Partnership
- Karl Rakos
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20240361253
- Publication date Oct 31, 2024
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
PUPIL IMAGE MEASURING DEVICE AND METHOD
- Publication number 20240167806
- Publication date May 23, 2024
- Samsung Electronics Co., Ltd.
- Seungwoo LEE
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY-DOMAIN INTERFEROMETRIC BASED IMAGING SYSTEMS AND METHODS
- Publication number 20240115128
- Publication date Apr 11, 2024
- Carl Zeiss Meditec, Inc.
- Tilman Schmoll
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Surface Shape Measurement Device and Surface Shape Measurement Method
- Publication number 20220349699
- Publication date Nov 3, 2022
- UNIVERSITY OF HYOGO
- Kunihiro Sato
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR SPATIAL MULTIPLEXING
- Publication number 20220307815
- Publication date Sep 29, 2022
- Ramot at Tel Aviv University Ltd.
- Natan Tzvi SHAKED
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20210364451
- Publication date Nov 25, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
FULL-FIELD OCT METHOD AND SYSTEM FOR GENERATING AN IMAGING OF AN OC...
- Publication number 20210038074
- Publication date Feb 11, 2021
- Visotec GmbH
- Peter Koch
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY-DOMAIN INTERFEROMETRIC BASED IMAGING SYSTEMS AND METHODS
- Publication number 20210007601
- Publication date Jan 14, 2021
- Carl Zeiss Meditec, Inc.
- Tilman SCHMOLL
- G02 - OPTICS
Information Patent Application
Arrangement and Method for Robust Single-Shot Interferometry
- Publication number 20200408505
- Publication date Dec 31, 2020
- UNIVERSITAT STUTTGART
- Klaus Körner
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD FOR GENERATING A TWO-DIMENSIONAL INTERFEROGRAM USING A MICHE...
- Publication number 20200393236
- Publication date Dec 17, 2020
- Michael MÜNST
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHODS AND SYSTEMS OF HOLOGRAPHIC INTERFEROMETRY
- Publication number 20200141715
- Publication date May 7, 2020
- RD Synergy Ltd.
- Dov FURMAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR A DISPLACEMENT MEASUREMENT
- Publication number 20190234729
- Publication date Aug 1, 2019
- Nikon Corporation
- Eric Peter Goodwin
- G01 - MEASURING TESTING
Information Patent Application
System for Performing Dual Path, Two- Dimensional Optical Coherence...
- Publication number 20190226829
- Publication date Jul 25, 2019
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20190154594
- Publication date May 23, 2019
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DELAY LINE FOR COHERENCE IMAGING
- Publication number 20190086192
- Publication date Mar 21, 2019
- Canon U.S.A., Inc.
- Badr Elmaanaoui
- G01 - MEASURING TESTING
Information Patent Application
Method for Phase Resolved Heterodyne Shearographic Measurements
- Publication number 20190011247
- Publication date Jan 10, 2019
- UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF THE ARMY
- James D. Perea
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER USING TILTED OBJECT WAVES AND COMPRISING A FIZEAU IN...
- Publication number 20180328711
- Publication date Nov 15, 2018
- UNIVERSITAET STUTTGART
- Goran Baer
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Phase Resolved Heterodyne Shearographic Me...
- Publication number 20180224266
- Publication date Aug 9, 2018
- UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF THE ARMY
- James D. Perea
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR WIDE FIELD-OF-VIEW OPTICAL COHERENCE TOMOGR...
- Publication number 20180168445
- Publication date Jun 21, 2018
- Novartis AG
- JOCHEN HORN
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
NOISE REDUCTION TECHNIQUES, FRACTIONAL BI-SPECTRUM AND FRACTIONAL C...
- Publication number 20180128591
- Publication date May 10, 2018
- University of North Carolina at Charlotte
- Faramarz FARAHI
- G01 - MEASURING TESTING
Information Patent Application
System for Performing Dual Path, Two-Dimensional Optical Coherence...
- Publication number 20170261308
- Publication date Sep 14, 2017
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20170016835
- Publication date Jan 19, 2017
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR DETECTING A 3D STRUCTURE OF AN OBJECT
- Publication number 20140320865
- Publication date Oct 30, 2014
- Alexander Knüttel
- G02 - OPTICS
Information Patent Application
LENSLESS IMAGING WITH REDUCED APERTURE
- Publication number 20140268162
- Publication date Sep 18, 2014
- John Farah
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS FOR MEASURING SHAPE OF TEST OBJECT AND MEASUR...
- Publication number 20130229664
- Publication date Sep 5, 2013
- Canon Kabushiki Kaisha
- Yuya Nishikawa
- G01 - MEASURING TESTING
Information Patent Application
LENSLESS IMAGING WITH REDUCED APERTURE
- Publication number 20130222814
- Publication date Aug 29, 2013
- John Farah
- G01 - MEASURING TESTING
Information Patent Application
IN SITU CALIBRATION OF INTERFEROMETERS
- Publication number 20130063730
- Publication date Mar 14, 2013
- Zygo Corporation
- Daniel M. Sykora
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY-BASED STRESS ANALYSIS
- Publication number 20130003152
- Publication date Jan 3, 2013
- United Technologies Corporation
- Igor V. Belousov
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-SHOT FULL-FIELD REFLECTION PHASE MICROSCOPY
- Publication number 20120307035
- Publication date Dec 6, 2012
- Zahid Yaqoob
- G02 - OPTICS
Information Patent Application
INTERFEROMETRIC QUASI-AUTOCOLLIMATOR
- Publication number 20120242999
- Publication date Sep 27, 2012
- University of Washington through its Center for Commercialization
- Matthew D. Turner
- G02 - OPTICS

generating a spatial carrier frequency

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device and method for imaging and interferometry measurements

Full-field OCT method and system for generating an imaging of an oc...

Frequency-domain interferometric based imaging systems and methods

Methods and systems of holographic interferometry

System for spatial multiplexing

Surface shape measurement device and surface shape measurement method

Method for generating a two-dimensional interferogram using a miche...

Method and system for determining the separation distance between a...

Arrangement and method for robust single-shot interferometry

Digital holography range Doppler receiver

Optical phase measurement method and system

System and method for a displacement measurement

Frequency-domain interferometric based imaging systems and methods

Optical delay line for coherence imaging

Methods and systems of holographic interferometry

Method and device for exposing at least one sectional face inside a...

Interferometer using tilted object waves and comprising a Fizeau in...

Multichannel optical receivers

Method for phase resolved heterodyne shearographic measurements

Single shot full-field reflection phase microscopy

Optical system phase acquisition method and optical system evaluati...

Interferometric measuring arrangement

Systems and methods for wide field-of-view optical coherence tomogr...

System and method for a displacement measurement

System for performing dual path, two-dimensional optical coherence...

Noise reduction techniques, fractional bi-spectrum and fractional c...

Optical phase measurement method and system

Method and apparatus for motility contrast imaging

Method and apparatus for phase resolved heterodyne shearographic me...

Metrology method

Patents Applicationslast 30 patents

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

PUPIL IMAGE MEASURING DEVICE AND METHOD

FREQUENCY-DOMAIN INTERFEROMETRIC BASED IMAGING SYSTEMS AND METHODS

Surface Shape Measurement Device and Surface Shape Measurement Method

SYSTEM FOR SPATIAL MULTIPLEXING

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

FULL-FIELD OCT METHOD AND SYSTEM FOR GENERATING AN IMAGING OF AN OC...

FREQUENCY-DOMAIN INTERFEROMETRIC BASED IMAGING SYSTEMS AND METHODS

Arrangement and Method for Robust Single-Shot Interferometry

METHOD FOR GENERATING A TWO-DIMENSIONAL INTERFEROGRAM USING A MICHE...

METHODS AND SYSTEMS OF HOLOGRAPHIC INTERFEROMETRY

SYSTEM AND METHOD FOR A DISPLACEMENT MEASUREMENT

System for Performing Dual Path, Two- Dimensional Optical Coherence...

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

OPTICAL DELAY LINE FOR COHERENCE IMAGING

Method for Phase Resolved Heterodyne Shearographic Measurements

INTERFEROMETER USING TILTED OBJECT WAVES AND COMPRISING A FIZEAU IN...

Method and Apparatus for Phase Resolved Heterodyne Shearographic Me...

SYSTEMS AND METHODS FOR WIDE FIELD-OF-VIEW OPTICAL COHERENCE TOMOGR...

NOISE REDUCTION TECHNIQUES, FRACTIONAL BI-SPECTRUM AND FRACTIONAL C...

System for Performing Dual Path, Two-Dimensional Optical Coherence...

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

APPARATUS FOR DETECTING A 3D STRUCTURE OF AN OBJECT

LENSLESS IMAGING WITH REDUCED APERTURE

MEASUREMENT APPARATUS FOR MEASURING SHAPE OF TEST OBJECT AND MEASUR...

LENSLESS IMAGING WITH REDUCED APERTURE

IN SITU CALIBRATION OF INTERFEROMETERS

INTERFEROMETRY-BASED STRESS ANALYSIS

SINGLE-SHOT FULL-FIELD REFLECTION PHASE MICROSCOPY

INTERFEROMETRIC QUASI-AUTOCOLLIMATOR